TW200518622A - Apparatus for testing electroluminescent display - Google Patents

Apparatus for testing electroluminescent display

Info

Publication number
TW200518622A
TW200518622A TW093129845A TW93129845A TW200518622A TW 200518622 A TW200518622 A TW 200518622A TW 093129845 A TW093129845 A TW 093129845A TW 93129845 A TW93129845 A TW 93129845A TW 200518622 A TW200518622 A TW 200518622A
Authority
TW
Taiwan
Prior art keywords
subset
electrode extensions
electrode
connector
extensions
Prior art date
Application number
TW093129845A
Other languages
English (en)
Chinese (zh)
Inventor
Hisashi Abe
Derek Luke
Original Assignee
Ifire Technology Corp
Sanyo Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ifire Technology Corp, Sanyo Electric Co filed Critical Ifire Technology Corp
Publication of TW200518622A publication Critical patent/TW200518622A/zh

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10—OLED displays
    • H10K59/17—Passive-matrix OLED displays
    • H10K59/179—Interconnections, e.g. wiring lines or terminals
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00—Electroluminescent light sources
    • H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/70—Testing, e.g. accelerated lifetime tests
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0421—Structural details of the set of electrodes
    • G09G2300/0426—Layout of electrodes and connections
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Electroluminescent Light Sources (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW093129845A 2003-10-03 2004-10-01 Apparatus for testing electroluminescent display TW200518622A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US50860203P 2003-10-03 2003-10-03

Publications (1)

Publication Number Publication Date
TW200518622A true TW200518622A (en) 2005-06-01

Family

ID=34421763

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093129845A TW200518622A (en) 2003-10-03 2004-10-01 Apparatus for testing electroluminescent display

Country Status (7)

Country Link
US (1) US7497755B2 (enExample)
JP (1) JP4943152B2 (enExample)
KR (1) KR20070015110A (enExample)
CN (1) CN1891015A (enExample)
CA (1) CA2539589A1 (enExample)
TW (1) TW200518622A (enExample)
WO (1) WO2005034584A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008541349A (ja) * 2005-05-04 2008-11-20 オーテーベー、グループ、ベスローテン、フェンノートシャップ Ｏｌｅｄを製造するための方法、ｏｌｅｄを製造するための中間生成物、およびｏｌｅｄ
CN102947498A (zh) 2010-06-04 2013-02-27 尚和手套株式会社 织针引导结构、织针、编织方法、编织物和手套
WO2014162454A1 (ja) * 2013-04-01 2014-10-09 パイオニア株式会社 接合構造および発光装置
CN105355633B (zh) * 2015-10-26 2018-08-03 京东方科技集团股份有限公司 制作阵列基板的方法和阵列基板
WO2020039554A1 (ja) * 2018-08-23 2020-02-27 シャープ株式会社 アクティブマトリクス基板、表示装置及び母基板
CN208805652U (zh) * 2018-10-30 2019-04-30 惠科股份有限公司 一种引脚组件及显示面板

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3028442A (en) * 1959-10-01 1962-04-03 Owens Corning Fiberglass Corp Method and apparatus for melting and feeding heat-softenable materials
JPH0685341B2 (ja) * 1991-09-27 1994-10-26 帝国通信工業株式会社 フレキシブル基板の端子構造
US5432015A (en) 1992-05-08 1995-07-11 Westaim Technologies, Inc. Electroluminescent laminate with thick film dielectric
JP3213472B2 (ja) 1994-04-26 2001-10-02 シャープ株式会社 アクティブマトリクス基板又はアクティブマトリクス液晶パネルの欠陥検出検査方法、欠陥検出検査装置
JP3031527B2 (ja) * 1995-06-19 2000-04-10 カシオ計算機株式会社 液晶表示装置
KR0182184B1 (en) 1996-04-24 1999-04-15 Samsung Electronics Co Ltd Disconnection/short test apparatus and its method of signal line using metrix
US6111424A (en) 1997-09-04 2000-08-29 Lucent Technologies Inc. Testing method and apparatus for flat panel displays using infrared imaging
US6407502B2 (en) 1997-09-16 2002-06-18 Lite Array, Inc. EL display with electrodes normal to the surface
JP4128677B2 (ja) * 1998-11-24 2008-07-30 東芝松下ディスプレイテクノロジー株式会社 液晶表示装置の検査方法
JP2000200053A (ja) * 1999-01-07 2000-07-18 Futaba Corp 表示素子用基板の製造方法及び表示素子用基板
US6771019B1 (en) 1999-05-14 2004-08-03 Ifire Technology, Inc. Electroluminescent laminate with patterned phosphor structure and thick film dielectric with improved dielectric properties
TW589455B (en) 2000-11-24 2004-06-01 Hannstar Display Corp Testing method for LCD panel
KR100353955B1 (ko) 2000-12-20 2002-09-28 엘지.필립스 엘시디 주식회사 신호라인 검사를 위한 액정표시장치
KR100800330B1 (ko) 2001-12-20 2008-02-01 엘지.필립스 엘시디 주식회사 라인 온 글래스형 신호라인 검사를 위한 액정표시패널
JP2005513741A (ja) 2001-12-21 2005-05-12 アイファイア テクノロジー コーポレーション エレクトロルミネセンス表示装置の薄膜層をパターン形成するレーザ・アブレーション法
WO2003056879A1 (en) 2001-12-21 2003-07-10 Ifire Technology Inc. Low firing temperature thick film dielectric layer for electroluminescent display
JP2006505764A (ja) 2002-01-23 2006-02-16 マレナ システムズ コーポレーション 欠陥検出及び解析用赤外線サーモグラフィ
KR100777724B1 (ko) * 2002-02-07 2007-11-19 삼성에스디아이 주식회사 유기전자 발광소자와, 이의 기판 및 그 절단방법
JP4490820B2 (ja) * 2002-09-20 2010-06-30 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 電気装置および電気装置を製作する方法

Also Published As

Publication number Publication date
WO2005034584A1 (en) 2005-04-14
JP2007507836A (ja) 2007-03-29
KR20070015110A (ko) 2007-02-01
JP4943152B2 (ja) 2012-05-30
US7497755B2 (en) 2009-03-03
CN1891015A (zh) 2007-01-03
WO2005034584A9 (en) 2005-10-27
WO2005034584B1 (en) 2005-06-02
US20050073250A1 (en) 2005-04-07
CA2539589A1 (en) 2005-04-14

Similar Documents

Publication Publication Date Title
MY145688A (en) Printing material, container, and board mounted on printing material container
MY144946A (en) Electrical connector
DE60320988D1 (de) Verbinder und verfahren zum ein- und ausschalten von elektrischen kontakten
EP1031840A3 (en) Electric resistance measuring apparatus and method for circuit board
TW200506372A (en) Connector for measurement of electrical resistance and production process thereof, and measuring apparatus and measuring method of electrical resistance for circuit board
EP1863138A3 (en) Connector system for an insulated switch with provision for grounding and visible break
TW200518622A (en) Apparatus for testing electroluminescent display
TW200604916A (en) A touch control panel and a protect panel of display window for an electric machine provided with the touch control panel
TW200506803A (en) Display device and method for testing the same
TWI256512B (en) Active matrix substrate, liquid crystal display apparatus having the same, and method for manufacturing the same
WO2009031394A1 (ja) 電気接続構造、端子装置、ソケット、電子部品試験装置及びソケットの製造方法
TW200717677A (en) Semiconductor apparatus testing arrangement and semiconductor apparatus testing method
TW200623833A (en) Image reading apparatus
DE60328655D1 (de) Energieverteileranordnung für elektrische Geräte
WO2004027868A3 (en) Electrical device, a method for manufacturing an electrical device, test structure, a method for manufacturing such a test structure and a method for testing a display panel
TW200641493A (en) Mounting structure and mounting method of a semiconductor device, and liquid crystal display device
CN212380685U (zh) 用于车辆的连接器以及具有其的车辆
TW200618302A (en) Liquid crystal display device
TW200609634A (en) Active matrix substrate, method of manufacturing active matrix substrate, electro-optical device, and electronic
JP2007507836A5 (enExample)
DE602007003174D1 (de) Pfeilerstruktur für einen Signalisierungsindikator und Signalisierungsindikator damit
TW200613853A (en) Flat-type light source device and liquid crystal display device having the same
TW200717001A (en) Contact-making apparatus
TWI266136B (en) Liquid crystal display device
TWI353469B (en) Liquid crystal display panel and probe for testing