WO2009031394A1 - 電気接続構造、端子装置、ソケット、電子部品試験装置及びソケットの製造方法 - Google Patents

電気接続構造、端子装置、ソケット、電子部品試験装置及びソケットの製造方法 Download PDF

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Publication number
WO2009031394A1
WO2009031394A1 PCT/JP2008/064543 JP2008064543W WO2009031394A1 WO 2009031394 A1 WO2009031394 A1 WO 2009031394A1 JP 2008064543 W JP2008064543 W JP 2008064543W WO 2009031394 A1 WO2009031394 A1 WO 2009031394A1
Authority
WO
WIPO (PCT)
Prior art keywords
socket
connection structure
electric connection
electronic component
terminal device
Prior art date
Application number
PCT/JP2008/064543
Other languages
English (en)
French (fr)
Inventor
Shigeru Murayama
Original Assignee
Advantest Corporation
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corporation filed Critical Advantest Corporation
Priority to JP2009531174A priority Critical patent/JPWO2009031394A1/ja
Publication of WO2009031394A1 publication Critical patent/WO2009031394A1/ja

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Connecting Device With Holders (AREA)
  • Manufacturing Of Electrical Connectors (AREA)

Abstract

　電気接続構造は、電気ケーブル（１１，１２）がそれぞれ電気的に接続された導電プレート（３０，４０）と、当該導電プレート（３０，４０）の間に積層されている第１の絶縁プレート（５１）と、ＩＣデバイス（５）の入出力端子（６）に電気的に接触する複数のコンタクトピン（６０）と、を備えており、複数のコンタクトピン（６０）は、プレート（３０，４０，５１）を貫通しており、コンタクトピン（６０）が挿入された導電プレート（３０，４０）の貫通孔（３２，４２）の大きさに応じて、複数のコンタクトピン（６０）が、導電プレート（３０，４０）の一方と接触し、又は、導電プレート（３０，４０）と非接触となっている。
PCT/JP2008/064543 2007-09-03 2008-08-13 電気接続構造、端子装置、ソケット、電子部品試験装置及びソケットの製造方法 WO2009031394A1 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2009531174A JPWO2009031394A1 (ja) 2007-09-03 2008-08-13 電気接続構造、端子装置、ソケット、電子部品試験装置及びソケットの製造方法

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2007227837 2007-09-03
JP2007-227837 2007-09-03

Publications (1)

Publication Number Publication Date
WO2009031394A1 true WO2009031394A1 (ja) 2009-03-12

Family

ID=40428716

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2008/064543 WO2009031394A1 (ja) 2007-09-03 2008-08-13 電気接続構造、端子装置、ソケット、電子部品試験装置及びソケットの製造方法

Country Status (4)

Country Link
JP (1) JPWO2009031394A1 (ja)
KR (1) KR101149748B1 (ja)
TW (1) TWI383161B (ja)
WO (1) WO2009031394A1 (ja)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016026295A (ja) * 2015-09-14 2016-02-12 スリーエム イノベイティブ プロパティズ カンパニー Ｉｃデバイス用ソケット
JP2016035463A (ja) * 2015-09-14 2016-03-17 スリーエム イノベイティブ プロパティズ カンパニー Ｉｃデバイス用ソケット
US9860973B2 (en) 2015-08-14 2018-01-02 Fujitsu Limited Contactor with cable and wiring board
JP2018021914A (ja) * 2017-08-04 2018-02-08 スリーエム イノベイティブ プロパティズ カンパニー Ｉｃデバイス用ソケット
JP2020008546A (ja) * 2018-07-02 2020-01-16 力成科技股▲分▼有限公司 試験ソケットおよび試験装置

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI747582B (zh) 2020-10-29 2021-11-21 創意電子股份有限公司 檢測裝置
TWI806045B (zh) * 2021-05-04 2023-06-21 博磊科技股份有限公司 半導體積體電路、印刷電路板與測試裝置之連接器總成

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53123872A (en) * 1977-04-05 1978-10-28 Oki Yunibatsuku Kk Multilayer circuit board connecting structure
JPH04233179A (ja) * 1990-10-05 1992-08-21 Internatl Business Mach Corp <Ibm> コネクタ・アセンブリ
JPH11352182A (ja) * 1998-06-10 1999-12-24 Fujitsu Ltd 試験用配線基板
JP2005134337A (ja) * 2003-10-31 2005-05-26 Espec Corp 半導体デバイスの実装部材、半導体デバイスの実装構造、および半導体デバイスの駆動装置
JP2006112891A (ja) * 2004-10-14 2006-04-27 Fujitsu Ltd 半導体試験ボード

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11239017A (ja) 1998-02-23 1999-08-31 Kyocera Corp 積層型開口面アンテナおよびそれを具備する多層配線基板
JP4535828B2 (ja) * 2004-09-30 2010-09-01 株式会社ヨコオ 検査ユニットの製法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53123872A (en) * 1977-04-05 1978-10-28 Oki Yunibatsuku Kk Multilayer circuit board connecting structure
JPH04233179A (ja) * 1990-10-05 1992-08-21 Internatl Business Mach Corp <Ibm> コネクタ・アセンブリ
JPH11352182A (ja) * 1998-06-10 1999-12-24 Fujitsu Ltd 試験用配線基板
JP2005134337A (ja) * 2003-10-31 2005-05-26 Espec Corp 半導体デバイスの実装部材、半導体デバイスの実装構造、および半導体デバイスの駆動装置
JP2006112891A (ja) * 2004-10-14 2006-04-27 Fujitsu Ltd 半導体試験ボード

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9860973B2 (en) 2015-08-14 2018-01-02 Fujitsu Limited Contactor with cable and wiring board
JP2016026295A (ja) * 2015-09-14 2016-02-12 スリーエム イノベイティブ プロパティズ カンパニー Ｉｃデバイス用ソケット
JP2016035463A (ja) * 2015-09-14 2016-03-17 スリーエム イノベイティブ プロパティズ カンパニー Ｉｃデバイス用ソケット
JP2018021914A (ja) * 2017-08-04 2018-02-08 スリーエム イノベイティブ プロパティズ カンパニー Ｉｃデバイス用ソケット
JP2020008546A (ja) * 2018-07-02 2020-01-16 力成科技股▲分▼有限公司 試験ソケットおよび試験装置

Also Published As

Publication number Publication date
JPWO2009031394A1 (ja) 2010-12-09
TWI383161B (zh) 2013-01-21
KR20100052520A (ko) 2010-05-19
TW200925619A (en) 2009-06-16
KR101149748B1 (ko) 2012-06-01

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