TW200925619A - Electric connection structure Terminal device, socket, device for testing electronic component, and method of manufacturing socket - Google Patents

Electric connection structure Terminal device, socket, device for testing electronic component, and method of manufacturing socket Download PDF

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Publication number
TW200925619A
TW200925619A TW97131549A TW97131549A TW200925619A TW 200925619 A TW200925619 A TW 200925619A TW 97131549 A TW97131549 A TW 97131549A TW 97131549 A TW97131549 A TW 97131549A TW 200925619 A TW200925619 A TW 200925619A
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Taiwan
Prior art keywords
conductive
plate
socket
terminal
terminal device
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TW97131549A
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Chinese (zh)
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TWI383161B (en
Inventor
Shigeru Murayama
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Advantest Corp
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Publication of TWI383161B publication Critical patent/TWI383161B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0483Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Manufacturing Of Electrical Connectors (AREA)
  • Connecting Device With Holders (AREA)

Abstract

An electric connection structure has electrically conductive plates (30, 40) to which electric cables (11, 12) are respectively electrically connected, a first insulation plate (51) layered between the electrically conductive plates (30, 40), and contact pins (60) making electrical contact with input/output terminals (6) of an IC device (5). The contact pins (60) penetrate the plates (30, 40, 50). Depending on the size of through holes (32, 43) in the electrically conductive plates (30, 40) into which the contact pins (60) are inserted, the contact pins (60) make contact with either of the electrically conductive plates (30, 40) or do not make contact with the plates (30, 40).

Description

200925619 九、發明說明: 【發明所屬之技術領域】 本發明係有Μ於例如在進行半導體積體電路元 之各種電子元件(以下亦代表性地稱為IC元件)的測試 電子元件測試裝置,例如將接觸端子(以 β Γ办稱為導電構 件或端子)和電纜(以下亦稱為導電體)撰 ^ 肢)遇释性地連接之電 連接構造、端子裝置、插座、電子元件測試裝置以 之製造方法。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a test electronic component test apparatus for, for example, performing various electronic components (hereinafter also referred to as IC components) of a semiconductor integrated circuit element, for example, for example. An electrical connection structure, a terminal device, a socket, and an electronic component testing device that are in contact with a contact terminal (referred to as a conductive member or a terminal as a conductive member) and a cable (hereinafter also referred to as a conductive body) Production method.

ί先前技術】 在1C元件之製程,使用電子元件測試裝置進行1C元 件之性能或功能的測試。在此電子元件測試裝置,將IC 元件壓在測試頭的插座,在使Ic元件之輸出入端子和插 座的接觸端子以電氣接觸之狀態,利用電子元件測試裝置 本體(以下亦稱為測試器),藉由對Ic元件輸出入測試信 號而實施IC元件的測試。 插座設置於稱為插座板的電路板,其設置於測試頭的 上部’經由此插座板和測試頭以電氣連接。於插座板的下 面,組裝電纜之插頭所嵌合的連接器。此電纜和測試頭内 的端子電子卡連接。 於插座板的内部’形成用以將連接器和插座以電氣連 接的電路圖案。插座之各接觸端子經由此電路圖案,各自 和信號傳送用、電力供給用或接地用等之各種電纜選擇性 地連接。 · 2247-9923-PF 5 200925619 使用由這種電路板所構成的插座板時,有如下之缺 點。即,因為插座板内之電路圖案進行很細的配線,所以 有在插座板内難採用同軸構造造的情況。又,因為電力供 給用或接地用的配線亦由插座板内之細的電路圖案所構 成’所以在這些的強化上有一定的極限。 【發明内容】 【發明要解決之課題】 本發明要解決之課題係提供一種電連接構造、端子裝 置、插座、電子元件測試裝置以及插座之製造方法,而該 電連接構造不使用電路板,並可將導電構件(端子)和導電 體(電纜)選擇性地連接。 【解決課題之手段】 U)為了達成該目的,若依據本發明之第i觀點,提 供一種電連接構造(參照申請專利範圍第1項),包括:複 舞片導電板’係由第!導電體各自以電氣連接;絕緣板, 係被疊層於該複數片導電板之間;以及複數個導電構件, 係貫穿該導電板及該絕緣板;因應於該導電構件所插入 該導電板的貫穿孔之大小,而該導雷播 通等電構件和該複數片導雷 的至少一片接觸,或和該導電板不接觸。 在該發明雖未特別限定,具有内徑為該導電# 徑以下的貫穿孔之該導電板和該導電構 ^外 枝 件外么大的貝穿孔之該導電板和該導電接 件不接觸較佳(參照申請專利範圍第2項)。 电構 2247-9923-PF 6 200925619 在該發明雖未特別限定, 該導電板不接觸之該導電構件 專利範圍第3項)。 又包括第2導電體,其對和 以電氣連接較佳(參照申請 在該發明雖未特別限定,該第1及第2導電體包含有 電纜較佳(參照申請專利範圍第4項)。 ⑵為了達成該目的’若依據本發明之第2觀點,提 供一種端子裝置(參照巾請專利範圍第5項),係對被連接先前Previous technique] In the process of 1C component, the performance or function of 1C component is tested using an electronic component tester. In the electronic component testing device, the IC component is pressed against the socket of the test head, and the electronic component test device body (hereinafter also referred to as a tester) is used in an electrical contact state between the input and output terminals of the Ic component and the contact terminal of the socket. The IC component is tested by inputting a test signal to the Ic component. The socket is disposed on a circuit board called a socket board that is disposed at an upper portion of the test head via which the socket board and the test head are electrically connected. Under the socket plate, assemble the connector to which the plug of the cable is fitted. This cable is connected to the terminal electronics card in the test head. A circuit pattern for electrically connecting the connector and the socket is formed in the interior of the socket board. Each of the contact terminals of the socket is selectively connected to each of a plurality of cables for signal transmission, power supply, or grounding via the circuit pattern. · 2247-9923-PF 5 200925619 When using a socket board composed of such a circuit board, there are the following disadvantages. That is, since the circuit pattern in the socket board is finely wired, it is difficult to use a coaxial structure in the socket board. Further, since the wiring for power supply or grounding is also constituted by a thin circuit pattern in the socket board, there is a limit in the reinforcement of these. [Problem to be Solved by the Invention] The problem to be solved by the present invention is to provide an electrical connection structure, a terminal device, a socket, an electronic component testing device, and a method of manufacturing the socket, and the electrical connection structure does not use a circuit board, and The conductive member (terminal) and the conductor (cable) can be selectively connected. [Means for Solving the Problem] U) In order to achieve the object, according to the first aspect of the present invention, an electrical connection structure is provided (refer to the first item of the patent application scope), including: a dance piece conductive plate ’ Each of the electrical conductors is electrically connected; an insulating plate is laminated between the plurality of conductive plates; and a plurality of conductive members are passed through the conductive plate and the insulating plate; and the conductive member is inserted into the conductive plate The through-hole is sized to contact the at least one of the plurality of conductive guides or the conductive plate. In the invention, although the invention is not particularly limited, the conductive plate having the inner diameter of the through hole having the inner diameter of the conductive path and the outer conductive outer member of the conductive outer member are not in contact with the conductive member. Good (refer to item 2 of the patent application scope). Electrical structure 2247-9923-PF 6 200925619 Although the invention is not particularly limited, the conductive member which is not in contact with the conductive plate is the third item of the patent range. Further, the second conductor is included, and the pair is electrically connected. (The application is not particularly limited in the invention, and the first and second conductors are preferably included in the cable (see the fourth item of the patent application scope). In order to achieve the object, according to the second aspect of the present invention, a terminal device (refer to the fifth item of the patent scope of the towel) is provided, and the pair is connected.

體以電氣連接,該端子裝置包括··複數片導電板,係由第 1電瘦各自以電氣連接;第1絕緣板,係被疊層於該複數 片導電板之間’·以及複數個端子,係對該被連接體以電氣 接觸’該複數個端子係貫穿該複數片導電板及該第i絕緣 板;因應於該端子所插入之該導電板的貫穿孔之大小,而 該端子和該複數片導電板的至少一片接觸,或和該導電板 不接觸。 在該發明雖未特別限定,該第i電境包含有用以對該 被連接體供給電力之電力供給用電縵、及用以將該被連接 體和基準電位點連接的接地用電纜較佳(參照申請專利 圍第6項)。 在該發明雖未特別限定,具有内徑為該端子之外徑以 下的貫穿孔之該導電板和該端子接觸;具有内徑比該端子 之外徑大的貫穿孔之料電板和該料不接觸較佳(參昭 申請專利範圍第7項)。 ^ 在該發明雖未特別限定,又包括第2電瘦,其對和該 導電板不接觸之該端子以,電氣連接較佳(參照申請專利= 2247-9923-PF 7 Ο φ 200925619 圍第8項)。 在該發明雖未特別 被連接體傳送電信號上疋該第2電纜包含有用以對該 利範圍第9項)。…L號傳送用電欖較佳(參照申請專 在該發明雖未牲 〆& 特別限定,又包括:第2及笛q姐 係疊層於該複數片導曾 及第3絕緣板, 數片導電板及該第間;及固定手段’係、固定該複 複數片導電板及該第i絕緣板,該複數個端子係貫穿該 圍第1 〇項)。 3絕緣板較佳(參照申請專利範 在該發明雖未特別限定,該 少從兮坌1溢链· 4咖 片導電板之端部係至 緣板突出較佳(參照申請專利範 至 在該發明雖未特別該導電板之端料曲= (參照申請專利範圍第12項)。 佳 在該發明雖未特別限定’又包括電路板,其組裝電子 :至而且和至少2片該導電板以電氣連接;該電路板插 電板的端部之間較佳(參照申請專利範圍 在該發明雖未特別限定,又包括電子元件,其和至少 2片該導電板以電氣連接;豸電子元件插人該至少2片導 電板的端部之間較佳(參照申請專利範圍第14項)。 (3)為了達成該目的,若依據本發明之第3觀點,提 供一種插座(參照申請專利範圍第15項),係在測試被測 试電子7L件時和該被測試電子元件以電氣連接,該插座包 括前述之端子裝置;該被連接體包含有該被測試電子元件 2247-9923-PF 8 200925619 的輸出入端子。 ()為了達成該目的’若依據本發明之第4觀點,提 ,一種電子元件測試裝置(參照申請專利範圍第^項), 係用以進行被測試電子元件的測試,該電子元件測試裳置 包括前述之插座;及測試頭,係裝上該插座。 (5)為了達成該目的,若依據本發明之第5觀點,提 供-種插座之製造方法(參照申請專利範圍第17項),而 該插座係在測試被測試電子元件時和該被測試電子元件 以電氣連接’該製造方法包括:帛1選擇步驟,係從複數 片第1導電板中選擇1片第1導電板;第2選擇步驟,係 從複數片第2導電板中選擇1片帛2導電板;疊層步驟, 係經由絕緣板而將該第1及第2導電板昼層;以及貫穿步 驟’係使端子貫穿該Ρ導電板、該絕緣板以及該第2導 電板。 【發明效果】 在本發明,因應於貫穿孔的大小,使導電構件和導電 板接觸或不接觸,藉此不使用電路板,而可將導電構件(端 子)和導電體(電纜)選擇性地連接。 又,藉由以不使用電路板的方式構成端子裝置(插 座),而至被連接體(被測試電子元件)的附近易採用同軸 構造。此外,替代細的電路圖案,而採用導電板,藉此可 大幅度地強化電力供給用或接地用的配線。 【實施方式】 . 2247-9923-PF 9 200925619 以下,根據圖面說明本發明之實施形態。 第1圖係表.示本發明之第1實施形態的電子元件測試 2置之示意剖面圖,第2圖及第3圖係表示本發明之第J 實施形態的插座之側視圖及平面圖,第4圖係第2圖之jv 部的放大剖面圖,第5圖係第2圖之V部的示意剖面圖, 第6圖係本發明之第2實施形態的插座之示意平面圖。 本發明之實施形態的電子元件測試裝置如第丨圖所 ❹ 不’由用以處理例如被測試1C元件之處理器1、被測試 IC元件以電氣接觸的測試頭10、向測試頭1 〇傳送測試俨 號並執行IC元件之測試的測試器2所構成《本電子元件 測試裝置係-種裝置,其在對1C元件施加高溫或低温之 熱應力的狀態測試(檢查)IC元件是否適當地動作,並因應 於該測試結果將1C元件分類。 如第1圖所示’於測試頭1 0的上部,設置插座2〇, 其於1C元件之測試時,和該Ic元件以電氣連接。此插座 ❹ 20如第1圖所示,經由形成於處理器1之開口 la,面臨 處理器1的内部,並將在處理器i内所搬來的Ic元件壓 在此插座2 0。The body is electrically connected, and the terminal device comprises a plurality of conductive plates which are electrically connected by the first electric thinner; the first insulating plate is laminated between the plurality of conductive plates '· and a plurality of terminals Connecting the plurality of terminals through the plurality of conductive plates and the i-th insulating plate; the terminal and the corresponding hole of the conductive plate inserted into the terminal At least one of the plurality of conductive plates is in contact or not in contact with the conductive plate. The present invention is not particularly limited, and the ith electrical environment includes a power supply power supply for supplying power to the connected body, and a grounding cable for connecting the connected body and the reference potential point. Refer to Section 6 of the Patent Application. The invention is not particularly limited, and the conductive plate having a through hole having an inner diameter equal to or smaller than the outer diameter of the terminal is in contact with the terminal; and the material sheet having a through hole having an inner diameter larger than the outer diameter of the terminal and the material It is better not to contact (refer to item 7 of the patent application scope). The invention is not particularly limited, and includes a second electric thinner, which is preferably electrically connected to the terminal that is not in contact with the conductive plate (refer to the patent application 2247-9923-PF 7 Ο φ 200925619 circumference 8 item). In the invention, although the electrical signal is not specifically transmitted by the connector, the second cable contains useful information for item 9 of the scope. ...L transmission is better. (Refer to the application for the invention, although it is not for the sake of the invention, and the special limitation includes: the 2nd and the Descartes are laminated on the plurality of sheets and the third insulation board, And a plurality of conductive plates and the ith insulating plate are fixed to the conductive plate and the fixing means, and the plurality of terminals are penetrated through the first item). 3 Insulation board is preferable (refer to the patent application specification, although the invention is not particularly limited, it is preferable to extend from the end portion of the 溢1 溢 溢 4 咖 咖 咖 咖 ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( Although the invention does not particularly have the end material of the conductive plate = (refer to claim 12 of the patent application). Although the invention is not particularly limited, it also includes a circuit board that assembles electrons: to and with at least two of the conductive plates. Electrical connection; preferably between the ends of the board insertion board (refer to the patent application scope, although the invention is not particularly limited, and includes an electronic component, which is electrically connected to at least two of the conductive plates; It is preferable that the ends of the at least two conductive plates are provided (refer to claim 14 of the patent application). (3) In order to achieve the object, according to the third aspect of the present invention, a socket is provided (refer to the patent application scope) Item 15) is electrically connected to the electronic component to be tested when testing the 7L of the tested electronic component, and the socket includes the aforementioned terminal device; the connected body includes the electronic component to be tested 2247-9923-PF 8 200925619 Loss In order to achieve the object, 'in accordance with the fourth aspect of the present invention, an electronic component testing device (refer to the patent application scope) is used for testing the electronic component to be tested, the electronic component The test socket includes the aforementioned socket; and the test head is attached to the socket. (5) In order to achieve the object, according to the fifth aspect of the present invention, a method for manufacturing the socket is provided (refer to the 17th article of the patent application scope) And the socket is electrically connected to the electronic component to be tested when testing the electronic component to be tested. The manufacturing method includes: selecting a step of selecting a first conductive plate from the plurality of first conductive plates; In the second selection step, one 帛2 conductive plate is selected from the plurality of second conductive plates; in the laminating step, the first and second conductive plates are layered via the insulating plate; and the step is passed through the step The present invention penetrates the conductive plate, the insulating plate, and the second conductive plate. [Effect of the Invention] In the present invention, the conductive member and the conductive plate are brought into contact with or not in contact with each other in accordance with the size of the through hole, whereby the circuit board is not used. The conductive member (terminal) and the conductor (cable) can be selectively connected. Further, by forming the terminal device (socket) without using a circuit board, to the connected body (tested electronic component) In the vicinity, it is easy to use a coaxial structure. In addition, a conductive plate is used instead of a thin circuit pattern, whereby wiring for power supply or grounding can be greatly enhanced. [Embodiment] 2247-9923-PF 9 200925619 BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic cross-sectional view showing an electronic component test 2 according to a first embodiment of the present invention, and Figs. 2 and 3 are a view showing a Jth embodiment of the present invention. FIG. 4 is an enlarged cross-sectional view of a portion jv of FIG. 2, FIG. 5 is a schematic cross-sectional view of a portion V of FIG. 2, and FIG. 6 is a second embodiment of the present invention. A schematic plan view of the socket. The electronic component testing apparatus according to the embodiment of the present invention is not transmitted by the test head 10 for processing, for example, the processor 1 to be tested, the IC component to be tested, and the test head 1 to the test head 1 The tester 2 that tests the nickname and performs the test of the IC component constitutes the "electronic component test device system" which tests (checks) whether the IC component is properly operated by applying a high-temperature or low-temperature thermal stress to the 1C component. And classify 1C components according to the test results. As shown in Fig. 1, on the upper portion of the test head 10, a socket 2 is provided which is electrically connected to the Ic element during the test of the 1C element. As shown in Fig. 1, the socket ❹ 20 faces the inside of the processor 1 via the opening la formed in the processor 1, and presses the Ic element carried in the processor i to the socket 20.

本實施形態之插座20如第2圖〜第4圖所示,由GND 板 30、pps(pr〇grammabie p〇wer gupply)板 、第卜第 4絕緣板51〜54、多支接觸端子6〇以及電路板7〇所構成。 GND板30係厚度約150〜200 y m的板狀構件,由例如 銅或鋁等之導電性材料所構成。於此GND板3〇之一方的 端邻,連接用以將I c元件5和基準電位點連接的GND電 2247-9923-ΡΓ 10 200925619 10内所收容之端子電子卡 纜1卜此GND電纜11和測試頭 (未圖示)連接。 於GND板30之約中央,张 形成用以插入接觸端子+ 複數個(在本例為35個)第i * 60之 1貝穿孔32。這*第工言 32以對應於1C元件5之輸以端子6的以在= 形態排列成”"行。X’於這些fl貫穿孔32之= 四角落,形成用以插入螺絲91 固As shown in FIGS. 2 to 4, the socket 20 of the present embodiment includes a GND plate 30, a pps (pr〇grammabie p〇wer gupply) plate, a fourth insulating plate 51 to 54, and a plurality of contact terminals 6A. And the circuit board 7〇 is formed. The GND plate 30 is a plate-like member having a thickness of about 150 to 200 μm and is made of a conductive material such as copper or aluminum. Connected to one end of the GND board 3 ,, connected to the GND circuit 2247-9923-ΡΓ 10 200925619 10 used to connect the I c element 5 and the reference potential point 1 GND cable 11 Connect to the test head (not shown). At about the center of the GND board 30, the sheet is formed to be inserted into the contact terminal + a plurality of (in this example, 35) i-th 60-to-one perforation 32. This *the third word 32 is arranged in the form of "" row. X' corresponding to the terminal 6 of the 1C element 5, and is formed in the four corners of the fl through holes 32 to form a screw 91.

個第i貫穿孔32,包含有内- 此外,於複數 牙^ &含有内徑相對於接觸端子6〇之 相對地大的貫穿孔和相對地小之貫穿孔。 PPS板40亦一樣’係厚度約15〇〜2〇Mm的板狀構件, 由例如銅或鋁等之導電性材料所構成。於此咖板4。之 -方的端部,連接用以董"C元件5供給驅動電力的電力 供給電缦12。此電力供給電瘦12亦和測試頭1〇内所收容 之端子電子卡(未圖示)連接。 於PPS板40之約中央,和GND板30 —樣,形成用以 插入接觸端子60之複數個(在本例為35個)第2貫穿孔 42。這些第2貫穿孔42以對應於1(:元件5之輸出入端子 6的方式’在本實施形態排列成5列7行◊又,於這些第 2貫穿孔42之周圍四角落,形成用以插入螺絲91的插入 孔。此外’於複數個第2貫穿孔42,包含有内徑相對於接 觸端子60之外形相對地大的貫穿孔和相對地小之貫穿孔。The i-th through holes 32 include inner-in addition, and the plurality of through-holes having a relatively large inner diameter with respect to the contact terminal 6A and a relatively small through-hole. The PPS board 40 is also made of a plate-like member having a thickness of about 15 〇 to 2 〇 Mm, and is made of a conductive material such as copper or aluminum. This coffee board 4 At the end of the square, the power supply 12 for supplying the driving power to the controller C is connected. The power supply electrode 12 is also connected to a terminal electronic card (not shown) housed in the test head 1A. In the center of the PPS board 40, as in the GND board 30, a plurality of (35 in this example) second through holes 42 for inserting the contact terminals 60 are formed. These second through holes 42 are arranged in five rows and seven rows in accordance with the present embodiment in a manner corresponding to 1 (the output terminal 6 of the element 5), and are formed at four corners around the second through holes 42 to form The insertion hole of the screw 91 is inserted. Further, the plurality of second through holes 42 include a through hole having a relatively large inner diameter with respect to the contact terminal 60 and a relatively small through hole.

第1〜第4絕緣板51〜54由例如液晶聚合物(Uquid Crystal P〇iymer)等之電絕緣性、耐熱性以及成形性優異 的材料所構成。於絕緣板51〜54的約中央,以·對應於gND 2247-9923-Pf 11 200925619 板30及PPS板40之第1及第2貫穿孔32、42的方式, 各自形成貫穿孔51a~54a。 又,於這些貫穿孔42之周圍四角落,各自形成用以 插入螺絲91的插入孔。此外,設置於第卜第4絕緣板5卜54 之全部的貫穿孔51a〜54a具有比接觸端子6〇之外徑更大 的内徑。 將以上之6片板3 0、4 0、51 ~ 5 4從上按照第2絕緣板 52、GND板30、第1絕緣板51、PPS板40、第3絕緣板 ❹The first to fourth insulating sheets 51 to 54 are made of a material excellent in electrical insulating properties, heat resistance, and moldability, such as a liquid crystal polymer (Uquid Crystal Pymer). The through holes 51a to 54a are formed in the center of the insulating plates 51 to 54 so as to correspond to the first and second through holes 32 and 42 of the gND 2247-9923-Pf 11 200925619 plate 30 and the PPS plate 40. Further, insertion holes for inserting the screws 91 are formed in the four corners around the through holes 42. Further, the through holes 51a to 54a provided in all of the fourth insulating sheets 5b 54 have an inner diameter larger than the outer diameter of the contact terminals 6A. The above six plates 30, 40, 51 to 5 4 are placed from the top according to the second insulating plate 52, the GND plate 30, the first insulating plate 51, the PPS plate 40, and the third insulating plate.

53以及第4絕緣板54的順序疊層。尤其,因為第1絕緣 板51插入GND板30和PPS板40之間,所以(JND板30和 PPS板40不會變成導通。此外,為了固定接觸端子6〇, 而僅第4絕緣板54’在接觸端子60插入其他的板3〇、4〇、 51〜53之後被疊層。 此外’ GND板30及奶板4〇的片數各自未限定為1 片’可作成任意片數。又,於本發明之導電板,除了⑽ 板30及PPS板4G以外’亦包含有用於信號傳送用等之其53 and the fourth insulating sheets 54 are laminated in this order. In particular, since the first insulating sheet 51 is inserted between the GND board 30 and the PPS board 40, (the JND board 30 and the PPS board 40 do not become conductive. Further, in order to fix the contact terminal 6〇, only the fourth insulating board 54' The contact terminals 60 are laminated after being inserted into the other plates 3, 4, 51, and 53. Further, the number of the 'the GND plate 30 and the milk plate 4' is not limited to one piece, and can be made into any number. In addition to the (10) board 30 and the PPS board 4G, the conductive board of the present invention also includes a signal transmission or the like.

他的用途之板。又,不必在整個面設置GND板及PM 板40 ’如第6圖所示,例如亦可局部地設置2片板 40A ' 40B ° 根據以下所示的步驟’將板 40 在本實施形態 5 1 ~54疊層。 百先,從預先所準備之複數片GND板中,選擇適合插 座2〇之1片GND板。在本實施形態,預先所準備之: 片GND板雖然都在35個第1貫穿孔形成於約中央上共 224 7-9923-pp· 200925619 同’但是内徑大的貫穿孔和内徑小的貫穿孔之配置彼此相 異,又’在所選擇之GND板30’在35個第1貫穿孔32 中’應和GND電纜11連接並插入接觸端子6〇的第1貫穿 孔具有接觸端子60之外徑以下的内徑,而且除此以外的 第1貫穿孔具有比接觸端子之外徑更大的内徑。The board of his use. Further, it is not necessary to provide the GND board and the PM board 40' over the entire surface. As shown in Fig. 6, for example, two sheets 40A' 40B may be partially provided. According to the procedure shown below, the board 40 is in the present embodiment 5 1 ~54 laminate. For the first time, select one GND board suitable for the Socket 2 from the GND board prepared in advance. In the present embodiment, the chip GND plate is formed in the center of the 224 7-9923-pp·200925619 in the 35 first through holes, but the through hole and the inner diameter are large. The arrangement of the through holes is different from each other, and the first through hole which is connected to the GND cable 11 and inserted into the contact terminal 6 in the 35 first through holes 32 in the selected GND plate 30' has the contact terminal 60. The inner diameter of the outer diameter or less and the other first through holes have an inner diameter larger than the outer diameter of the contact terminal.

接著’從預先所準備之複數片PPS板中,選擇適合插 座20之1片PPS板。在本實施形態,預先所準備之複數 片pps板雖然都在各自將35個第2貫穿孔42形成於約中 央上共同,但是内徑大的貫穿孔和内徑小的貫穿孔之配置 彼此相異’又,在所選擇之㈣板4〇,在Μ個第2貫穿 孔42中’應和電力供給魏12連接並插人接觸端子6〇 的第2貫穿孔具有接觸端子6Q之外稷以下的内徑,而且 除此以外的第2貫穿孔具有比接觸料6〇之外徑更大的 内徑 GND 板 30 和 PPS 板 40 緣板52、53、54疊層 接著,將第1絕緣板51疊層於 之間,而且將第2、f 3以及第4絕 於這些的上下。 如此,藉由從預先所準備 可易於雍杆磁瓶h 板群中選擇板並組合,而 了易於應付種類多樣的1C元件。 如第2圖及第3圖所示,所 利用你笛9紹祕_1· ι層之板30、40、51〜54, 利用從第2絕緣板52側各 在第4解鏠拓入各插入孔的螺絲91、和 在弟4絕緣板54侧和螺 和 外,在太鉻明^ 螺合的螺帽92而固定。此 外在本發明,板30、4〇、51〜5 此 螺絲固定,亦.可#1 i 4的固定方法未限定為以 了使用例如夾板等固定。Next, from the plurality of PPS sheets prepared in advance, one PPS plate suitable for the socket 20 is selected. In the present embodiment, the plurality of pps plates prepared in advance are formed by collectively forming 35 second through holes 42 in the center. However, the through holes having a large inner diameter and the through holes having a small inner diameter are arranged in phase with each other. In addition, in the selected (four) plate 4, in the second through hole 42, the second through hole which is to be connected to the power supply Wei 12 and inserted into the contact terminal 6 is provided with the contact terminal 6Q. The inner diameter, and the other second through hole has an inner diameter GND plate 30 larger than the outer diameter of the contact material 6 和 and the PPS plate 40 edge plates 52, 53, 54 are laminated, and the first insulating plate is placed. 51 is laminated between the two, and the second, f 3, and fourth are above and below these. Thus, it is easy to cope with various types of 1C elements by selecting and combining the boards from the pre-prepared easy-to-make magnetic cylinder h-plate group. As shown in Fig. 2 and Fig. 3, the use of your whistle 9 _1 _1 _1 层 layer 30, 40, 51~54, each from the second insulation board 52 side in the fourth solution The screw 91, which is inserted into the hole, and the nut 92 on the side of the insulating plate 54 and the screw and the screw are fixed to the screw 92 which is screwed. Further, in the present invention, the screws 30, 4, 51, 5 are fixed, and the fixing method of the #1 i 4 is not limited to being fixed by using, for example, a splint.

2247-9923-PF 13 200925619 又,對在所疊層之板30、40、51〜54位於同軸上的各 貫穿孔32、42、51a〜54a,各自插入接觸端子6〇。作為此 接觸端子6G,例如可舉例表示六角形端子、或波紋管式或 者同轴構造的接觸端子等。於接觸端子6〇之後端部,形 成外徑變大的大徑部61,而接觸端子60以此大徑部61 卡止於第4絕緣板54。 在本實把形態,關於第4圖之右端所示的第丄及第2 貫穿孔32a 42a ’第1貫穿孔32a的内徑為接觸端子 的外‘以下’而第2貫穿孔42a的内徑比接觸端子6〇的 外形更大。因而,雖然GND板3〇和接觸端子6〇接觸,但 是pps板和接觸端子60不接觸。因此,第4圖之右端所 示的接觸端子60經由(;帅板3〇僅和GND電纜u以電氣 連接。 另一方面,關於第4圖之中央所示尚第}及第2貫穿 孔32b、42b,第1貫穿孔32b的内徑比接觸端子6〇的外 徑更大,而第2貫穿孔42b的内徑為接觸端子6〇的外徑 以下。因而,雖然板3〇和接觸端子不接觸,但是 PPS板40和接觸端子6〇接觸。因此,第4圖之中央所示 的接觸端子60經由PPS板4〇僅和電力供給電纜12以電 氣連接。 此外,關於第4圖之左端所示的第1及第2貫穿孔 32c 42c,因為第j及第2貫穿孔32c、42c都具有比接 觸端子60之外徑更大的内徑,所以接觸端子60和GND板 3〇及PPS板40.的任一個都不接觸。因而,第4圖之左端 2247-9923-PF 14 200925619 的接觸端子60和GND電纜11及電力供給電纜12的任一 個都未連接,用以向IC元件傳送測試信號的信號傳送電 纜13利用焊接等直接連接。此信號傳送電纜丨3例如為了 可傳送高頻信號而由同軸電纜所構成,並和測試頭1〇内 所收容的端子電子卡(未圖示)連接。 如以上所示,在本實施形態,因應於第丨及第2貫穿 孔32、42的大小,使接觸端子6〇和導電板3〇、4〇接觸 或不接觸’藉此不使用電路板,而可將接觸端子6〇和電 纜11 13選擇性地連接。此外,在本發明,亦可使同一接 觸端子60和複數片導電板接觸。 又’藉由以不使用電路板的方式構成插座2〇,至κ 凡件5的附近易採用同軸構造,而可使測試精度提高。此 外,替代細的電路圖案’而採用導電板30、40,因為藉此 可大Ψ田度地強化電力供給用或接地用的配線,所以可降低 雜訊。 — ❹ 如第2圖所示,從所疊層之板30、40、5卜54的兩端, GND板30和PPS板40各自突出。GND板3〇在其兩端具有 實質上成直角地彎曲之彎曲部31。又,pps板4〇亦一樣, 在其兩端具有實質上成直角地彎曲之彎曲部Ο 4肋板⑽ 之彎曲部31和PPS才反4〇的彎曲部41實質上平行,而電 路板70插入這些彎曲部31、41之間。 電路板70如第5圖所示,在其内部具有電路圖案 71 — 72。第1電路圖案71將gnd板3〇和GND電纜u以 電氣連接。一樣地’第2電路圖案72將PPS板40和電力2247-9923-PF 13 200925619 Further, the respective through holes 32, 42, 51a to 54a on which the laminated plates 30, 40, 51 to 54 are coaxial are inserted into the contact terminals 6A. As the contact terminal 6G, for example, a hexagonal terminal, a bellows type or a contact terminal of a coaxial structure or the like can be given. The large diameter portion 61 having an increased outer diameter is formed at the end portion after the contact terminal 6A, and the contact terminal 60 is locked to the fourth insulating plate 54 by the large diameter portion 61. In the present embodiment, the inner diameter of the first through hole 32a and the second through hole 32a 42a' shown in the right end of the fourth figure is the outer diameter 'below' of the contact terminal and the inner diameter of the second through hole 42a. It is larger than the contact terminal 6〇. Thus, although the GND board 3 is in contact with the contact terminal 6A, the pps board and the contact terminal 60 are not in contact. Therefore, the contact terminal 60 shown at the right end of Fig. 4 is electrically connected only to the GND cable u via the stencil 3. On the other hand, the second and second through holes 32b are shown in the center of Fig. 4; 42b, the inner diameter of the first through hole 32b is larger than the outer diameter of the contact terminal 6〇, and the inner diameter of the second through hole 42b is equal to or smaller than the outer diameter of the contact terminal 6〇. Therefore, although the plate 3〇 and the contact terminal It is not in contact, but the PPS board 40 is in contact with the contact terminal 6A. Therefore, the contact terminal 60 shown in the center of Fig. 4 is electrically connected only to the power supply cable 12 via the PPS board 4's. Further, regarding the left end of Fig. 4 In the first and second through holes 32c to 42c shown, since the jth and second through holes 32c and 42c each have an inner diameter larger than the outer diameter of the contact terminal 60, the contact terminal 60 and the GND plate 3 and the PPS are provided. Any one of the plates 40. is not in contact. Therefore, the contact terminal 60 of the left end 2247-9923-PF 14 200925619 of FIG. 4 is not connected to any of the GND cable 11 and the power supply cable 12 for transmission to the IC component. The signal transmission cable 13 of the test signal is directly connected by soldering, etc. This signal transmission cable 丨3 It is composed of a coaxial cable for transmitting a high-frequency signal, and is connected to a terminal electronic card (not shown) housed in the test head 1A. As described above, in the present embodiment, the third and the third The size of the through holes 32, 42 is such that the contact terminals 6A and the conductive plates 3, 4b are in contact or not in contact 'by thereby not using the circuit board, but the contact terminals 6A and the cables 11 13 can be selectively connected. In addition, in the present invention, the same contact terminal 60 can be brought into contact with a plurality of conductive plates. Further, by forming the socket 2〇 without using a circuit board, it is easy to adopt a coaxial structure in the vicinity of the κ-shaped member 5, and In addition, the conductive plates 30 and 40 are used instead of the thin circuit pattern, and the wiring for power supply or grounding can be reinforced greatly, so that noise can be reduced. 2, the GND board 30 and the PPS board 40 are each protruded from both ends of the laminated boards 30, 40, and 5b. The GND board 3 has a bent portion bent substantially at right angles at both ends thereof. 31. Also, the pps board 4 is the same, with substantial at both ends The curved portion bent at right angles Ο 4 The curved portion 31 of the rib (10) and the curved portion 41 of the PPS are substantially parallel, and the circuit board 70 is inserted between the curved portions 31, 41. The circuit board 70 is as in the fifth As shown in the figure, there are circuit patterns 71-72 therein. The first circuit pattern 71 electrically connects the gnd board 3A and the GND cable u. Similarly, the 'second circuit pattern 72 sets the PPS board 40 and the power.

2247-9923-PF 15 200925619 供給電纜12以電氣連接。此外,將電容器80組裝於此電 路板70。此電容器80各自和第1及第2電路圖案71、72 連接。電容器80係用以對被測試1C元件供给大電流的旁 通電容器。 如此,因為藉由將電谷盗80組裝於插入gnd板30和 PPS板40之間的電路板70 ’而可將旁通電容器80配置於 被測試IC元件的附近’所以可提高測試精度。2247-9923-PF 15 200925619 The supply cable 12 is electrically connected. Further, the capacitor 80 is assembled to the circuit board 70. The capacitors 80 are connected to the first and second circuit patterns 71 and 72, respectively. The capacitor 80 is a bypass capacitor for supplying a large current to the 1C element to be tested. In this manner, by assembling the electric hopper 80 to the circuit board 70' inserted between the gnd board 30 and the PPS board 40, the bypass capacitor 80 can be disposed in the vicinity of the IC component to be tested', so that the test accuracy can be improved.

又,藉由將GND板30及PPS板40之突出的部分彎曲, 而可使插座20變成小型。尤其,在為了同時測試多個jc 元件而將多個插座2 0組裝於測試頭之上部的情況,可提 高插座20的組裝密度。 又’在以往的插座,連接器被組裝於電路板,必須擴 大(fanout)電路圖案,而成為插座之高密度組裝的障礙。 而,在本實施形態’不使用連接器,因為將GND電欖玉丄 及電力供給電纜12和GND板30、PPS板40直接連接,所 以可提高插座20的組裝密度。 此外,在第5圖,雖然為了便於說明,而僅圖示i個 電容器80,但是實際上如第2圖所示,將複數個電容器 80組裝於電路板7〇。又,在本發明,電路板上所組裝的 電子兀件未限定為電容器8〇,亦可將例如用以切換電容器 81之0N/0FF的繼電路組裝於電路板。 第7圖係表示本發明之第 側視圖,第8圖係表示本發明 部的側視圖。如第7圖所示, 3實施形態的插座之端部的 之第4實施形態的插座之端 亦可使電容器80未經由電Further, by bending the protruding portions of the GND board 30 and the PPS board 40, the socket 20 can be made small. In particular, in the case where a plurality of sockets 20 are assembled to the upper portion of the test head in order to simultaneously test a plurality of jc elements, the assembly density of the sockets 20 can be improved. Further, in the conventional socket, the connector is assembled to the circuit board, and the circuit pattern must be fanout, which becomes an obstacle to high-density assembly of the socket. On the other hand, in the present embodiment, the connector is not used, and since the GND switch and the power supply cable 12 are directly connected to the GND board 30 and the PPS board 40, the mounting density of the socket 20 can be improved. Further, in Fig. 5, although only one capacitor 80 is illustrated for convenience of explanation, actually, as shown in Fig. 2, a plurality of capacitors 80 are assembled to the circuit board 7A. Further, in the present invention, the electronic component assembled on the circuit board is not limited to the capacitor 8A, and a relay circuit for switching the ON/OFF of the capacitor 81, for example, may be assembled to the circuit board. Fig. 7 is a side view showing the present invention, and Fig. 8 is a side view showing the portion of the invention. As shown in Fig. 7, the end of the socket of the fourth embodiment of the end portion of the socket of the third embodiment can also make the capacitor 80 unpowered.

2247-9923-PF 16 200925619 路板70而直接配置於板3〇、4〇的彎曲部3i、4ι之間, 將電容器80和GND板30的彎曲部31直接連接,而且和 PPS板4D的彎曲部41直接連接。或者,如第8圖所示, 亦可不將板3G、4G的兩端部彎曲,並將電容器8()插裝於 板30、40的端部。2247-9923-PF 16 200925619 The board 70 is disposed directly between the bent portions 3i and 4i of the boards 3〇, 4〇, and directly connects the capacitor 80 and the bent portion 31 of the GND board 30, and the bending of the PPS board 4D. The part 41 is directly connected. Alternatively, as shown in Fig. 8, the both ends of the plates 3G and 4G may not be bent, and the capacitor 8 () may be inserted into the ends of the plates 30 and 40.

此外,以上所說明的實施形態,係為了易於理解本發 明而記載者,不是為了限定本發明而記载者。因此,在上 述之實施形態所揭示的各要素,係亦包含有屬於本發明之 技術範圍的全部之設計變更或對等物的主 例如,在上述的實施形態,雖然作為導電構件的一 例’舉例表示接觸端子6Q,而作為導電體的—例,舉例表 不電11 ' 12’但是在本發明之電連接構造未限定如此。 又在上述的實施形態,雖然作為端子裝置之一例, 說明插座,但是在本發明 ♦I a之端子裝置未特別限定如此,例 如亦可應用於用以遠接番 運接電路板或電纜之間或連接電路板 和電缓的連接器。 【圖式簡單說明】 1實施形態的電子元件測試 1實施形態的插座之側視 第1圖係表示本發明之第 裝置之示意剖面圖。 第2圖係表示本發明之第 第 圖 系表不本發明之第1實施形態的插座之平In addition, the embodiments described above are described in order to facilitate the understanding of the present invention, and are not intended to limit the present invention. Therefore, each of the elements disclosed in the above-described embodiments includes all design changes or equivalents belonging to the technical scope of the present invention. For example, in the above-described embodiment, an example of the conductive member is described as an example. The contact terminal 6Q is shown, and as an example of the electric conductor, the electric 11' 12' is not exemplified, but the electric connection structure of the present invention is not limited to this. Further, in the above-described embodiment, the socket is described as an example of the terminal device. However, the terminal device of the present invention is not particularly limited, and may be applied, for example, to a remote connection between a circuit board or a cable or Connect the board and the electrical connector. BRIEF DESCRIPTION OF THE DRAWINGS 1. Electronic component test of the embodiment 1 Side view of the socket of the embodiment Fig. 1 is a schematic cross-sectional view showing the first device of the present invention. Fig. 2 is a view showing the first embodiment of the present invention, and the socket of the first embodiment of the present invention is not shown.

2247-9923-PF 17 200925619 第4圖係第2圖之ιν部的放大剖面圖。 第5圖係第2圖之v部的示意剖面圖。 第6圖係本發明之第2實施形態的插座之示意平面 圖。 第7圖係表示本發明之第3實施形態的插座之端部的 側視圖。 第8圖係表示本發明之第4實施形態的插座之端部的 側視圖。 ^ ❹2247-9923-PF 17 200925619 Fig. 4 is an enlarged cross-sectional view of the ιν portion of Fig. 2. Fig. 5 is a schematic cross-sectional view showing a portion v of Fig. 2; Fig. 6 is a schematic plan view showing a socket of a second embodiment of the present invention. Fig. 7 is a side view showing the end portion of the socket of the third embodiment of the present invention. Fig. 8 is a side view showing the end portion of the socket of the fourth embodiment of the present invention. ^ ❹

【主要元件符號說明】 1 處理器 la 開口 2 測試器 5 IC元件 6 輸出入端子 10 測試頭 11 GND電纜 12 電力供給電纜 13信號傳送電纜 20 插座 30 GND 板 31 彎曲部 32、32a〜32c 第1貫穿孔 40、40A、40B PPS 板 · 2247-9923-PF 18 200925619 41 彎曲部 42、 42a〜42c 第 S 51~ 54 第1〜第4 51a 〜54a 貫穿孔 60 接觸端子 61 大徑部 70 電路板 71、 72 電路圖肆 80 電容器 91 螺絲 92 螺帽 :貫穿孔 絕緣板 2247-9923-PF 19[Main component symbol description] 1 Processor la Opening 2 Tester 5 IC component 6 Input/output terminal 10 Test head 11 GND cable 12 Power supply cable 13 Signal transmission cable 20 Socket 30 GND board 31 Bending portion 32, 32a to 32c 1 Through hole 40, 40A, 40B PPS board · 2247-9923-PF 18 200925619 41 Curved portion 42, 42a to 42c S 51 to 54 1st to 4th 51a to 54a through hole 60 contact terminal 61 large diameter portion 70 circuit board 71, 72 Circuit Diagram 肆 80 Capacitor 91 Screw 92 Nut: Through Hole Insulation Board 2247-9923-PF 19

Claims (1)

200925619 十、申請專利範圍: 1· 一種電連接構造,包括: 複數片導電板,係、由第1導電體各自以電氣連接; 絕緣板’係被疊層於該複數片導電板之間;以及 複數個導電構件,係貫穿該導電板及該絕緣板; 因應於該導電構件所插入之該導電板的貫穿孔之大 小’而該導電構件和該複數片導電板的至少一片接觸,或 和該導電板不接觸。 2·如申請專利範圍第1項之電連接構造,其中具有内 徑為該導電構件之外徑以下的貫穿孔之該導電板和該導 電構件接觸; 具有内徑比該導電構件之外徑大的貫穿孔之該導電 板和該導電構件不接觸。 3·如申請專利第1< 2項之電連接構造,其中又200925619 X. Patent application scope: 1. An electrical connection structure comprising: a plurality of conductive plates, each of which is electrically connected by a first electrical conductor; an insulating plate is laminated between the plurality of conductive plates; a plurality of conductive members extending through the conductive plate and the insulating plate; contacting the conductive member and at least one of the plurality of conductive plates in response to a size of the through hole of the conductive plate into which the conductive member is inserted, or The conductive plates are not in contact. 2. The electrical connection structure of claim 1, wherein the conductive plate having a through hole having an inner diameter below the outer diameter of the conductive member is in contact with the conductive member; and having an inner diameter larger than an outer diameter of the conductive member The conductive plate of the through hole does not contact the conductive member. 3. The electrical connection structure of claim 1 < 2, wherein 包括第2導電體,其對和料電板不翻之該導電構件以 電氣連接。 4. 如申請專利範圍第3項之電連接構造,纟中 及第2導電體包含有電鏡。 5. -種端子裝置,對被連接體以電氣連接,其包括: 複數片導電板,係由第1電纜各自以電氣連接;· 第1絕緣板’係被疊層於該複數片導電板之間;以及 複數個端子,係對該被連接體以電氣接觸; 板 該複數個端子係貫穿該複數片導電板及該第!絕緣 2247-9923-PF 20 200925619 因應於該端子所插入之該導電板的貫穿孔之大小,而 該端子和該複數片導電板的至少一片接觸,或和該導電板 不接觸。 6.如申請專利範圍第5項之端子裝置,其中該第1電 纜包含有用以對該被連接體供給電力之電力供給用電 缆、及用以將該被連接體和基準電位點連接的接地用電 纜。 7.如申請專利範圍第5項之端子裝置,其中具有内徑A second electrical conductor is included that is electrically connected to the electrically conductive member that does not turn over the electrical plate. 4. In the electrical connection structure of claim 3, the middle and second conductors comprise an electron microscope. 5. A terminal device for electrically connecting to a connected body, comprising: a plurality of conductive plates, each of which is electrically connected by a first cable; and a first insulating plate is laminated on the plurality of conductive plates And a plurality of terminals for electrically contacting the connected body; the plurality of terminals of the board are penetrating through the plurality of conductive plates and the first! Insulation 2247-9923-PF 20 200925619 Depending on the size of the through hole of the conductive plate into which the terminal is inserted, the terminal contacts at least one of the plurality of conductive plates or does not contact the conductive plate. 6. The terminal device of claim 5, wherein the first cable includes a power supply cable for supplying power to the connected body, and a ground for connecting the connected body to a reference potential point. Use a cable. 7. The terminal device of claim 5, which has an inner diameter 為該端子之外徑以下的貫穿孔之該導電板和該端子接觸; 具有内徑比該端子之外徑大的貫穿孔之該導電板和 該端子不接觸。 8. 如申請專利範圍第5項之端子裝置,其中又包括第 2電鏡,其對和該導電板不接觸之該端子以冑氣連接。 9. 如申請專利範圍第8項之端子裝置,其中該第2電 規包含有用以對該被連接體傳送電信號的信號傳送用電The conductive plate is in contact with the terminal of the through hole below the outer diameter of the terminal; the conductive plate having a through hole having an inner diameter larger than the outer diameter of the terminal does not contact the terminal. 8. The terminal device of claim 5, further comprising a second electron microscope, wherein the terminal not in contact with the conductive plate is connected by helium. 9. The terminal device of claim 8, wherein the second electrical code includes a signal transmission power for transmitting an electrical signal to the connected body 10.如申請專利範圍第5項之端子裝置, 第2及第3絕緣板,係疊層於該複數片 其中又包括: 導電板之間; .固定手段,係固定該複數片導電板及該第卜第3 , 該複數個端子係貫穿該複數 妬。 導電板及該第卜 絕緣 絕緣板 第 1·1·如申請專利範圍第 5項之端子裝置 其中該複數 2247-9923-PF 200925619 片導電板之端部係至少從該第1 12.如申請專利範圍第U項 板之端部彎曲。 ,之端子裝置,其中又包括 電路板’其組裝電子元件’而且和至少2片該導電板以電 氣連接; 該電路板插入該至少2片導電板的端部之間。 ❺ Η.如中請專·圍第η項之端子裝置,其中又包括 電子元件’其和至少2片該導電板以電氣連接; 該電子元件插入該至少2片導電板的端部之間。 15. —種插座,在測試被測試電子元件時和該被測試 電子元件以電氣連接,其包括: 申請專利範圍第5至14項中任一項之端子裝置; 該被連接體包含有該被測試電子元件的輸出入端子 用以進行被測試電子元10. The terminal device of claim 5, wherein the second and third insulating sheets are laminated on the plurality of sheets, further comprising: a conductive plate; and a fixing means for fixing the plurality of conductive plates and the In the third, the plurality of terminals extend through the plurality of turns. The conductive plate and the second insulating insulating plate are the first terminal device of the fifth aspect of the patent application, wherein the end portion of the plurality of 2247-9923-PF 200925619 conductive plates is at least from the first 12. The end of the U-th panel of the range is curved. The terminal device further includes a circuit board 'which assembles the electronic component' and is electrically connected to at least two of the conductive plates; the circuit board is inserted between the ends of the at least two conductive plates.端子 Η. The terminal device of the item η, wherein the electronic component is further electrically connected to at least two of the conductive plates; the electronic component is inserted between the ends of the at least two conductive plates. 15. A socket for electrically connecting to an electronic component to be tested when testing an electronic component to be tested, comprising: the terminal device of any one of claims 5 to 14; the connected body comprising the Testing the input and output terminals of the electronic component for performing the tested electronic element 絕緣板突出。 之端子裝置,其中該導電 1 3 ·如申請專利範圍 1 6. —種電子元件測試裝置 件的測試,其包括: 申請專利範圍第15項之插座;及 測試頭,係裝上該插座。 17. —種插座之製造方法,而該插座係在測試被測試 電子元件時和該被測試電子元件以電氣連接,該製造方法 包括: 第1選擇步驟,係從複數片第丨導電板中選擇丨片第 1導電板; 第2選擇步驟,係從複數片第2導電板中選擇丨片第 2247-9923-ρρ 22 200925619 2導電板, 疊層步驟,係經由絕緣板而將該第1及第2導電板疊 層;以及 貫穿步驟,係使端子貫穿該第1導電板、該絕緣板以 及該第2導電板。The insulation board is protruding. The terminal device, wherein the conductive material is tested according to the patent application scope of the invention, which comprises: a socket of claim 15; and a test head to which the socket is attached. 17. A method of manufacturing a socket, wherein the socket is electrically connected to the electronic component to be tested when testing the electronic component to be tested, the manufacturing method comprising: a first selection step of selecting from a plurality of second conductive plates The first conductive plate of the cymbal sheet; the second selection step is to select the slab 2247-9923-ρρ 22 200925619 2 conductive plate from the plurality of second conductive plates, and the laminating step is performed by the insulating plate. The second conductive plate is laminated; and the step of penetrating the terminal through the first conductive plate, the insulating plate, and the second conductive plate. 2247-9923-PF 232247-9923-PF 23
TW97131549A 2007-09-03 2008-08-19 Electrical connection construction, terminal fittings, sockets, and electronic component test devices TWI383161B (en)

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