CA2539589A1 - Electrode arrangement for testing electroluminescent display - Google Patents
Electrode arrangement for testing electroluminescent display Download PDFInfo
- Publication number
- CA2539589A1 CA2539589A1 CA002539589A CA2539589A CA2539589A1 CA 2539589 A1 CA2539589 A1 CA 2539589A1 CA 002539589 A CA002539589 A CA 002539589A CA 2539589 A CA2539589 A CA 2539589A CA 2539589 A1 CA2539589 A1 CA 2539589A1
- Authority
- CA
- Canada
- Prior art keywords
- electrode
- substrate
- extensions
- fabricating
- subset
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000012360 testing method Methods 0.000 title abstract description 36
- 239000000758 substrate Substances 0.000 claims description 79
- 238000000034 method Methods 0.000 claims description 26
- 238000000151 deposition Methods 0.000 claims description 25
- 239000011159 matrix material Substances 0.000 claims description 24
- 239000004020 conductor Substances 0.000 claims description 22
- 239000010408 film Substances 0.000 description 11
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- 238000005259 measurement Methods 0.000 description 4
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 238000004377 microelectronic Methods 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000002241 glass-ceramic Substances 0.000 description 1
- 238000007731 hot pressing Methods 0.000 description 1
- 238000003331 infrared imaging Methods 0.000 description 1
- 239000012212 insulator Substances 0.000 description 1
- 238000003698 laser cutting Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/17—Passive-matrix OLED displays
- H10K59/179—Interconnections, e.g. wiring lines or terminals
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/70—Testing, e.g. accelerated lifetime tests
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G2300/00—Aspects of the constitution of display devices
- G09G2300/04—Structural and physical details of display devices
- G09G2300/0421—Structural details of the set of electrodes
- G09G2300/0426—Layout of electrodes and connections
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Electroluminescent Light Sources (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US50860203P | 2003-10-03 | 2003-10-03 | |
| US60/508,602 | 2003-10-03 | ||
| PCT/CA2004/001716 WO2005034584A1 (en) | 2003-10-03 | 2004-09-21 | Electrode arrangement for testing electroluminescent display |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2539589A1 true CA2539589A1 (en) | 2005-04-14 |
Family
ID=34421763
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002539589A Abandoned CA2539589A1 (en) | 2003-10-03 | 2004-09-21 | Electrode arrangement for testing electroluminescent display |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7497755B2 (enExample) |
| JP (1) | JP4943152B2 (enExample) |
| KR (1) | KR20070015110A (enExample) |
| CN (1) | CN1891015A (enExample) |
| CA (1) | CA2539589A1 (enExample) |
| TW (1) | TW200518622A (enExample) |
| WO (1) | WO2005034584A1 (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008541349A (ja) * | 2005-05-04 | 2008-11-20 | オーテーベー、グループ、ベスローテン、フェンノートシャップ | Ｏｌｅｄを製造するための方法、ｏｌｅｄを製造するための中間生成物、およびｏｌｅｄ |
| JP2012012757A (ja) | 2010-06-04 | 2012-01-19 | Showa Glove Kk | 編針案内構造、編針、編成方法、編み地、および手袋 |
| WO2014162454A1 (ja) * | 2013-04-01 | 2014-10-09 | パイオニア株式会社 | 接合構造および発光装置 |
| CN105355633B (zh) * | 2015-10-26 | 2018-08-03 | 京东方科技集团股份有限公司 | 制作阵列基板的方法和阵列基板 |
| WO2020039554A1 (ja) * | 2018-08-23 | 2020-02-27 | シャープ株式会社 | アクティブマトリクス基板、表示装置及び母基板 |
| CN208805652U (zh) * | 2018-10-30 | 2019-04-30 | 惠科股份有限公司 | 一种引脚组件及显示面板 |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3028442A (en) * | 1959-10-01 | 1962-04-03 | Owens Corning Fiberglass Corp | Method and apparatus for melting and feeding heat-softenable materials |
| JPH0685341B2 (ja) * | 1991-09-27 | 1994-10-26 | 帝国通信工業株式会社 | フレキシブル基板の端子構造 |
| US5432015A (en) * | 1992-05-08 | 1995-07-11 | Westaim Technologies, Inc. | Electroluminescent laminate with thick film dielectric |
| JP3213472B2 (ja) * | 1994-04-26 | 2001-10-02 | シャープ株式会社 | アクティブマトリクス基板又はアクティブマトリクス液晶パネルの欠陥検出検査方法、欠陥検出検査装置 |
| JP3031527B2 (ja) * | 1995-06-19 | 2000-04-10 | カシオ計算機株式会社 | 液晶表示装置 |
| KR0182184B1 (en) | 1996-04-24 | 1999-04-15 | Samsung Electronics Co Ltd | Disconnection/short test apparatus and its method of signal line using metrix |
| US6111424A (en) * | 1997-09-04 | 2000-08-29 | Lucent Technologies Inc. | Testing method and apparatus for flat panel displays using infrared imaging |
| US6407502B2 (en) * | 1997-09-16 | 2002-06-18 | Lite Array, Inc. | EL display with electrodes normal to the surface |
| JP4128677B2 (ja) * | 1998-11-24 | 2008-07-30 | 東芝松下ディスプレイテクノロジー株式会社 | 液晶表示装置の検査方法 |
| JP2000200053A (ja) * | 1999-01-07 | 2000-07-18 | Futaba Corp | 表示素子用基板の製造方法及び表示素子用基板 |
| US6771019B1 (en) | 1999-05-14 | 2004-08-03 | Ifire Technology, Inc. | Electroluminescent laminate with patterned phosphor structure and thick film dielectric with improved dielectric properties |
| TW589455B (en) * | 2000-11-24 | 2004-06-01 | Hannstar Display Corp | Testing method for LCD panel |
| KR100353955B1 (ko) * | 2000-12-20 | 2002-09-28 | 엘지.필립스 엘시디 주식회사 | 신호라인 검사를 위한 액정표시장치 |
| KR100800330B1 (ko) * | 2001-12-20 | 2008-02-01 | 엘지.필립스 엘시디 주식회사 | 라인 온 글래스형 신호라인 검사를 위한 액정표시패널 |
| EP1455985A1 (en) | 2001-12-21 | 2004-09-15 | iFire Technology Inc. | Method of laser ablation for patterning thin film layers for electroluminescent displays |
| WO2003056879A1 (en) | 2001-12-21 | 2003-07-10 | Ifire Technology Inc. | Low firing temperature thick film dielectric layer for electroluminescent display |
| JP2006505764A (ja) * | 2002-01-23 | 2006-02-16 | マレナ システムズ コーポレーション | 欠陥検出及び解析用赤外線サーモグラフィ |
| KR100777724B1 (ko) * | 2002-02-07 | 2007-11-19 | 삼성에스디아이 주식회사 | 유기전자 발광소자와, 이의 기판 및 그 절단방법 |
| CN100401518C (zh) * | 2002-09-20 | 2008-07-09 | 皇家飞利浦电子股份有限公司 | 一种电子器件以及制造电子器件的方法 |
-
2004
- 2004-09-21 CA CA002539589A patent/CA2539589A1/en not_active Abandoned
- 2004-09-21 WO PCT/CA2004/001716 patent/WO2005034584A1/en not_active Ceased
- 2004-09-21 JP JP2006529510A patent/JP4943152B2/ja not_active Expired - Fee Related
- 2004-09-21 KR KR1020067008645A patent/KR20070015110A/ko not_active Withdrawn
- 2004-09-21 CN CNA2004800287951A patent/CN1891015A/zh active Pending
- 2004-09-29 US US10/952,642 patent/US7497755B2/en not_active Expired - Fee Related
- 2004-10-01 TW TW093129845A patent/TW200518622A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| WO2005034584A1 (en) | 2005-04-14 |
| WO2005034584B1 (en) | 2005-06-02 |
| CN1891015A (zh) | 2007-01-03 |
| KR20070015110A (ko) | 2007-02-01 |
| US20050073250A1 (en) | 2005-04-07 |
| US7497755B2 (en) | 2009-03-03 |
| WO2005034584A9 (en) | 2005-10-27 |
| TW200518622A (en) | 2005-06-01 |
| JP2007507836A (ja) | 2007-03-29 |
| JP4943152B2 (ja) | 2012-05-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FZDE | Discontinued |