JP4853477B2 - 異方形状セラミック粒子及びその製造方法 - Google Patents
異方形状セラミック粒子及びその製造方法 Download PDFInfo
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Description
ここで、x、y、z、及びaは下記数式(2)〜(5)を満足している。
0≦y≦0.3 …(3)
0≦z≦0.3 …(4)
0.001≦a≦0.1 …(5)
すなわち、本発明の異方形状セラミック粒子は、主成分が、一般式(K1-x-yNaxLiy)4(Nb1-zTaz)6O17で表わされると共に、該主成分1モルに対しaモル、すなわち0.001〜0.1モルの特定の酸化物MeObが含有されている。
Kの一部をNaで置換することにより、セラミック粒子の平均粒径やアスペクト比を大きくすることが可能であり、したがって必要に応じてKの一部をNaで置換するのも好ましい。しかしながら、Naの置換モル比xが0.5を超えると、平均粒径やアスペクト比は飽和し、これら平均粒径やアスペクト比の向上が期待できない。
Kの一部をLiで置換することにより、セラミック粒子の平均粒径やアスペクト比を大きくすることが可能であることから、必要に応じてKの一部をLiで置換するのも好ましい。しかしながら、Liの置換モル比yが0.3になると、平均粒径やアスペクト比は低下傾向となり、これ以上Liの含有モル量を増加させても平均粒径やアスペクト比を向上させるのが困難である。
Nbの一部をTaで置換することにより、セラミック粒子の平均粒径やアスペクト比を大きくすることが可能であることから、必要に応じてNbの一部をTaで置換するのも好ましい。しかしながら、Taの置換モル比zが0.3を超えた場合は、平均粒径やアスペクト比は飽和し、これら平均粒径やアスペクト比の向上が期待できない。
副成分として特定の酸化物MeObをセラミック粒子に含有させることにより、該セラミック粒子の平均粒径やアスペクト比を大きくすることができる。しかしながら、特定の酸化物MeObの含有量が主成分1モルに対し0.001モル未満の場合は、特定の酸化物MeObの含有量が少なすぎるため、平均粒径やアスペクト比の向上効果を発揮することができない。一方、特定の酸化物MeObの含有量が主成分1モルに対し0.1モルを超えて含有させても平均粒径やアスペクト比は低下傾向となる。また、この異方形状セラミック粒子は、反応性テンプレートとして結晶配向セラミックの作製に使用されるため、該副成分の含有量は少ない方が好ましいと考えられる。
Claims (4)
- 板状の異方形状セラミック粒子であって、
一般式{(K1-x-yNaxLiy)4(Nb1-zTaz)6O17+aMeOb}(ただし、MeはSb、Cu、Mn、V、Si、Ti、及びWからなる群から選択される少なくとも1種の元素を示し、bはMeの価数によって決まる正の数を示す。)で表され、前記x、y、z、及びaは、
0≦x≦0.5、
0≦y≦0.3、
0≦z≦0.3、
0.001≦a≦0.1
であることを特徴とする異方形状セラミック粒子。 - 平均粒径が1〜100μmであって、主面の最大径Dと該主面に対する垂直方向の厚みtとの比D/tが2以上であることを特徴とする請求項1記載の異方形状セラミック粒子。
- 板状の異方形状セラミック粒子を製造する異方形状セラミック粒子の製造方法であって、
主成分が一般式(K1-x-yNaxLiy)4(Nb1-zTaz)6O17(ただし、0≦x≦0.5、0≦y≦0.3、0≦z≦0.3)で表わされるように、主成分素原料を秤量して混合し、仮焼処理を施して仮焼粉末を得る仮焼工程と、
Sb、Cu、Mn、V、Si、Ti、及びWからなる群から選択された少なくとも1種の元素を含有した酸化物からなる副成分が、前記主成分1モルに対し前記元素を基準に0.001〜0.1モルの割合で含有されるように、副成分素原料を秤量し、前記仮焼粉末と混合して混合粉末を得る混合工程と、
前記混合粉末にフラックス成分を添加して熱処理を行う熱処理工程と、
前記熱処理後に前記フラックス成分を除去するフラックス除去工程とを含むことを特徴とする異方形状セラミック粒子の製造方法。 - 前記フラックス成分は、KCl、NaCl、及びこれらの混合物のうちのいずれかであることを特徴とする請求項3記載の異方形状セラミック粒子の製造方法。
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US7911117B2 (en) * | 2007-11-08 | 2011-03-22 | Ngk Insulators, Ltd. | Piezoelectric/electrostrictive body, and piezoelectric/electrostrictive element |
JP5578504B2 (ja) * | 2009-04-09 | 2014-08-27 | 堺化学工業株式会社 | ニオブ酸アルカリ金属塩粒子の製造方法、およびニオブ酸アルカリ金属塩粒子 |
JP5582281B2 (ja) * | 2009-04-09 | 2014-09-03 | 堺化学工業株式会社 | ニオブ酸アルカリ金属塩粒子の製造方法、およびニオブ酸アルカリ金属塩粒子 |
US8471442B2 (en) | 2009-05-08 | 2013-06-25 | Taiyo Yuden Co., Ltd. | Piezoelectric ceramic, method for producing same, and piezoelectric device |
JP6097219B2 (ja) * | 2010-11-10 | 2017-03-15 | 中国科学院上海硅酸塩研究所 | シート状ニオブ酸チタン酸リチウム(Li−Nb−Ti−O)のテンプレート結晶粒、それを含む組織化ニオブ酸チタン酸リチウム(Li−Nb−Ti−O)のマイクロ波媒質セラミックス、及びその製造方法 |
JP2013219250A (ja) * | 2012-04-10 | 2013-10-24 | Murata Mfg Co Ltd | 圧電セラミック電子部品、及び該圧電セラミック電子部品の製造方法 |
CN105164827B (zh) * | 2013-05-10 | 2018-01-02 | 株式会社村田制作所 | 压电陶瓷电子部件 |
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JP4259660B2 (ja) | 1999-01-19 | 2009-04-30 | 株式会社豊田中央研究所 | 板状粒子及びその製造方法 |
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