JP4570437B2 - 表面粗さ／輪郭形状測定装置 - Google Patents

表面粗さ／輪郭形状測定装置 Download PDF

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Publication number
JP4570437B2
JP4570437B2 JP2004305253A JP2004305253A JP4570437B2 JP 4570437 B2 JP4570437 B2 JP 4570437B2 JP 2004305253 A JP2004305253 A JP 2004305253A JP 2004305253 A JP2004305253 A JP 2004305253A JP 4570437 B2 JP4570437 B2 JP 4570437B2
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Japan
Prior art keywords
connecting member
drive unit
measuring element
contour shape
surface roughness
Prior art date
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Expired - Fee Related
Application number
JP2004305253A
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English (en)
Japanese (ja)
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JP2006118911A5 (enExample
JP2006118911A (ja
Inventor
信幸 谷内
和浩 久保田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Seimitsu Co Ltd
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Tokyo Seimitsu Co Ltd
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Publication date
Application filed by Tokyo Seimitsu Co Ltd filed Critical Tokyo Seimitsu Co Ltd
Priority to JP2004305253A priority Critical patent/JP4570437B2/ja
Priority to US11/228,442 priority patent/US7328518B2/en
Priority to EP05256082A priority patent/EP1650527B1/en
Priority to DE602005004092T priority patent/DE602005004092T2/de
Publication of JP2006118911A publication Critical patent/JP2006118911A/ja
Publication of JP2006118911A5 publication Critical patent/JP2006118911A5/ja
Application granted granted Critical
Publication of JP4570437B2 publication Critical patent/JP4570437B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
JP2004305253A 2004-10-20 2004-10-20 表面粗さ／輪郭形状測定装置 Expired - Fee Related JP4570437B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004305253A JP4570437B2 (ja) 2004-10-20 2004-10-20 表面粗さ／輪郭形状測定装置
US11/228,442 US7328518B2 (en) 2004-10-20 2005-09-15 Surface roughness/contour shape measuring apparatus
EP05256082A EP1650527B1 (en) 2004-10-20 2005-09-29 Apparatus for measuring the surface roughness or the contour of an object
DE602005004092T DE602005004092T2 (de) 2004-10-20 2005-09-29 Gerät zum Messen der Oberflächenrauhigkeit oder der Kontur eines Objektes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004305253A JP4570437B2 (ja) 2004-10-20 2004-10-20 表面粗さ／輪郭形状測定装置

Publications (3)

Publication Number Publication Date
JP2006118911A JP2006118911A (ja) 2006-05-11
JP2006118911A5 JP2006118911A5 (enExample) 2007-10-18
JP4570437B2 true JP4570437B2 (ja) 2010-10-27

Family

ID=35427274

Family Applications (1)

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JP2004305253A Expired - Fee Related JP4570437B2 (ja) 2004-10-20 2004-10-20 表面粗さ／輪郭形状測定装置

Country Status (4)

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US (1) US7328518B2 (enExample)
EP (1) EP1650527B1 (enExample)
JP (1) JP4570437B2 (enExample)
DE (1) DE602005004092T2 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006300823A (ja) * 2005-04-22 2006-11-02 Tokyo Seimitsu Co Ltd 表面粗さ／輪郭形状測定装置
JP4884091B2 (ja) * 2005-11-08 2012-02-22 株式会社ミツトヨ 形状測定機
CN101424507B (zh) * 2007-10-30 2010-12-08 鸿富锦精密工业（深圳）有限公司 平面度测量装置
JP4611403B2 (ja) * 2008-06-03 2011-01-12 パナソニック株式会社 形状測定装置及び形状測定方法
CN101846508B (zh) * 2009-03-24 2012-09-19 鸿富锦精密工业（深圳）有限公司 定位装置
US8196306B2 (en) * 2009-07-09 2012-06-12 General Electric Company Post-weld offset gage
US8701301B2 (en) * 2011-04-19 2014-04-22 Mitutoyo Corporation Surface texture measuring instrument
US9333604B1 (en) * 2012-07-19 2016-05-10 Western Digital Technologies, Inc. Manually adjustable bracket for use with a fastener mechanism
CN104316019A (zh) * 2014-11-21 2015-01-28 奇瑞汽车股份有限公司 一种粗糙度比较样块校准固定微调装置
CN107525489A (zh) * 2016-11-22 2017-12-29 浙江大学台州研究院 轴的清洗和检测装置
DE102017113709B4 (de) * 2017-06-21 2019-01-24 Carl Mahr Holding Gmbh Messarmaufnahmeeinrichtung eines Messsystems
CN113295127B (zh) * 2020-02-21 2024-06-14 核工业理化工程研究院 圆柱面与其他曲面或平面相交处圆角半径的测量方法和测量装置
WO2023276637A1 (ja) 2021-06-28 2023-01-05 コニカミノルタ株式会社 測定器、表面評価指標の演算方法及びプログラム
CN115613428A (zh) * 2022-10-13 2023-01-17 朱思静 一种道路检测装置及检测工艺

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3129918A (en) * 1963-03-28 1964-04-21 Bradley Owen Adjustable indicator holder
US3283586A (en) * 1964-06-24 1966-11-08 Gen Precision Inc Accelerometer damping control
US4166323A (en) * 1973-09-14 1979-09-04 Maag Gear-Wheel & Machine Co. Ltd. Gear tester for profile and lead testing
US4377911A (en) * 1981-02-18 1983-03-29 Mitutoyo Mfg. Co., Ltd. Contour measuring instrument
US4765181A (en) 1985-08-08 1988-08-23 Tokyo Seimitsu Co., Ltd. Surface texture measuring instrument
CH667726A5 (fr) * 1986-04-30 1988-10-31 Tesa Sa Dispositif de palpage pour un appareil autonome de mesure de grandeurs lineaires.
DE3740070A1 (de) 1987-11-26 1989-06-08 Zeiss Carl Fa Dreh-schwenk-einrichtung fuer tastkoepfe von koordinatenmessgeraeten
DE3823993A1 (de) 1988-07-15 1990-01-18 Zeiss Carl Fa Verfahren zur koordinatenmessung an werkstuecken
JP2738408B2 (ja) 1992-01-30 1998-04-08 株式会社東京精密 座標測定機
US5621978A (en) * 1993-07-14 1997-04-22 Sarauer; Alan J. Bar for coordinate measuring machine
JPH0716107U (ja) * 1993-08-25 1995-03-17 株式会社東京精密 三次元表面粗さ・輪郭形状測定機
JP2701141B2 (ja) * 1995-05-23 1998-01-21 株式会社ミツトヨ 真円度測定装置
US6032381A (en) 1996-12-02 2000-03-07 Miller; Walter R Dovetail accessory for a dial test indicator
JP3992853B2 (ja) * 1998-09-30 2007-10-17 株式会社ミツトヨ 表面追従型測定機
JP3525432B2 (ja) * 2000-09-29 2004-05-10 株式会社東京精密 粗さ測定方法及び粗さ測定装置
JP2002340503A (ja) * 2001-05-16 2002-11-27 Mitsutoyo Corp 表面性状測定機における被測定物の相対姿勢調整方法
FR2853056B1 (fr) * 2003-03-28 2005-07-15 Snecma Moteurs Dispositif et procede de mesure de profil
JP4113991B2 (ja) 2003-03-28 2008-07-09 株式会社東京精密 １軸駆動装置を用いた表面形状測定装置
US6901677B2 (en) * 2003-05-05 2005-06-07 University Of North Carolina At Charlotte Method and apparatus using a closed loop controlled actuator for surface profilometry
US7036238B2 (en) * 2003-12-22 2006-05-02 Mitutoyo Corporation Width-measuring method and surface texture measuring instrument
US6944965B1 (en) * 2004-10-06 2005-09-20 Abe Watamura Inline indicator holder

Also Published As

Publication number Publication date
US7328518B2 (en) 2008-02-12
EP1650527B1 (en) 2008-01-02
DE602005004092T2 (de) 2008-12-18
US20060080852A1 (en) 2006-04-20
DE602005004092D1 (de) 2008-02-14
EP1650527A1 (en) 2006-04-26
JP2006118911A (ja) 2006-05-11

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