JP4233426B2 - 眼屈折力測定装置 - Google Patents

眼屈折力測定装置 Download PDF

Info

Publication number
JP4233426B2
JP4233426B2 JP2003342618A JP2003342618A JP4233426B2 JP 4233426 B2 JP4233426 B2 JP 4233426B2 JP 2003342618 A JP2003342618 A JP 2003342618A JP 2003342618 A JP2003342618 A JP 2003342618A JP 4233426 B2 JP4233426 B2 JP 4233426B2
Authority
JP
Japan
Prior art keywords
ring
pupil
eye
size
refractive power
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2003342618A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005103103A (ja
JP2005103103A5 (enExample
Inventor
昌明 羽根渕
光宏 郷野
幹雄 倉地
直己 磯貝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nidek Co Ltd
Original Assignee
Nidek Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nidek Co Ltd filed Critical Nidek Co Ltd
Priority to JP2003342618A priority Critical patent/JP4233426B2/ja
Priority to US10/949,297 priority patent/US7316480B2/en
Priority to EP04023244A priority patent/EP1520512B1/en
Priority to DE602004031317T priority patent/DE602004031317D1/de
Publication of JP2005103103A publication Critical patent/JP2005103103A/ja
Publication of JP2005103103A5 publication Critical patent/JP2005103103A5/ja
Application granted granted Critical
Publication of JP4233426B2 publication Critical patent/JP4233426B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/103—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for determining refraction, e.g. refractometers, skiascopes

Landscapes

  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Medical Informatics (AREA)
  • Biophysics (AREA)
  • Ophthalmology & Optometry (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Physics & Mathematics (AREA)
  • Molecular Biology (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Public Health (AREA)
  • Veterinary Medicine (AREA)
  • Eye Examination Apparatus (AREA)
JP2003342618A 2003-09-30 2003-09-30 眼屈折力測定装置 Expired - Fee Related JP4233426B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2003342618A JP4233426B2 (ja) 2003-09-30 2003-09-30 眼屈折力測定装置
US10/949,297 US7316480B2 (en) 2003-09-30 2004-09-27 Eye refractive power measurement apparatus
EP04023244A EP1520512B1 (en) 2003-09-30 2004-09-29 Eye refractive power measurement apparatus
DE602004031317T DE602004031317D1 (de) 2003-09-30 2004-09-29 Gerät zur Messung der Brechkraft der Augen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003342618A JP4233426B2 (ja) 2003-09-30 2003-09-30 眼屈折力測定装置

Publications (3)

Publication Number Publication Date
JP2005103103A JP2005103103A (ja) 2005-04-21
JP2005103103A5 JP2005103103A5 (enExample) 2006-09-14
JP4233426B2 true JP4233426B2 (ja) 2009-03-04

Family

ID=34309100

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003342618A Expired - Fee Related JP4233426B2 (ja) 2003-09-30 2003-09-30 眼屈折力測定装置

Country Status (4)

Country Link
US (1) US7316480B2 (enExample)
EP (1) EP1520512B1 (enExample)
JP (1) JP4233426B2 (enExample)
DE (1) DE602004031317D1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9357914B2 (en) 2012-02-15 2016-06-07 Canon Kabushiki Kaisha Ophthalmologic apparatus, method for controlling ophthalmologic apparatus, and storage medium

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7883505B2 (en) 2004-04-20 2011-02-08 Wavetec Vision Systems, Inc. Integrated surgical microscope and wavefront sensor
JP4458937B2 (ja) * 2004-06-02 2010-04-28 株式会社ニデック 眼屈折力測定装置
JP4492859B2 (ja) * 2004-07-30 2010-06-30 株式会社ニデック 眼屈折力測定装置
EP1834576B1 (en) * 2005-01-07 2015-08-19 Nidek Co., Ltd. Eye refractive power measuring system
JP4630126B2 (ja) * 2005-05-16 2011-02-09 株式会社トプコン 眼光学特性測定装置
JP4653576B2 (ja) * 2005-07-01 2011-03-16 株式会社ニデック 眼屈折力測定装置
JP5085858B2 (ja) 2005-09-27 2012-11-28 株式会社ニデック 眼屈折力測定装置
JP4987276B2 (ja) 2005-10-11 2012-07-25 株式会社ニデック 眼科装置
US7594729B2 (en) 2007-10-31 2009-09-29 Wf Systems, Llc Wavefront sensor
US20090141237A1 (en) * 2007-11-02 2009-06-04 Bioptigen, Inc. Integrated Optical Coherence Imaging Systems for Use in Ophthalmic Applications and Related Methods and Computer Program Products
JP5435698B2 (ja) * 2009-02-24 2014-03-05 株式会社ニデック 眼底カメラ
KR101730675B1 (ko) 2009-07-14 2017-05-11 웨이브텍 비젼 시스템스, 인크. 안과 수술 측정 시스템
US8696125B2 (en) * 2009-09-30 2014-04-15 Nidek Co., Ltd. Eye refractive power measurement apparatus
JP2013165818A (ja) * 2012-02-15 2013-08-29 Canon Inc 眼科装置および眼科制御方法並びにプログラム
JP6003292B2 (ja) * 2012-06-29 2016-10-05 株式会社ニデック 眼底撮影装置
US9072462B2 (en) 2012-09-27 2015-07-07 Wavetec Vision Systems, Inc. Geometric optical power measurement device
JP5650810B2 (ja) * 2013-06-24 2015-01-07 株式会社ニデック 眼軸長測定装置
WO2016037980A1 (en) * 2014-09-12 2016-03-17 Centervue S.P.A. Eye examination apparatus
CN106725297B (zh) * 2016-12-21 2019-02-19 中国科学院苏州生物医学工程技术研究所 用于眼科装置的双层光路高精度快速对准光学系统
JP6513747B2 (ja) * 2017-07-27 2019-05-15 株式会社トプコン 眼科装置
JP2019058437A (ja) * 2017-09-27 2019-04-18 株式会社トプコン 眼科装置
JP7248770B2 (ja) * 2017-09-27 2023-03-29 株式会社トプコン 眼科装置
EP3719743A4 (en) * 2017-11-29 2021-08-11 Nec Corporation INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHODS AND STORAGE MEDIUM
US10768431B2 (en) * 2017-12-20 2020-09-08 Aperture In Motion, LLC Light control devices and methods for regional variation of visual information and sampling
US11950844B2 (en) * 2019-09-30 2024-04-09 Alcon Inc. Ocular aberrometer characterization systems and methods
WO2024154480A1 (ja) * 2023-01-17 2024-07-25 株式会社ニデック 眼科測定装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3206936B2 (ja) 1991-07-25 2001-09-10 キヤノン株式会社 眼屈折計
US5463430A (en) 1992-07-31 1995-10-31 Nidek Co., Ltd. Examination apparatus for examining an object having a spheroidal reflective surface
US5523809A (en) 1992-08-25 1996-06-04 Canon Kabushiki Kaisha Eye refraction measuring apparatus including optical path separating member light beam separating member, and/or light diameter changing means
JPH08103413A (ja) 1994-10-03 1996-04-23 Canon Inc 眼科測定装置
JP3599523B2 (ja) * 1997-03-04 2004-12-08 株式会社ニデック 眼科装置
JPH11225963A (ja) 1998-02-13 1999-08-24 Canon Inc 検眼測定装置
AU4687099A (en) 1998-06-22 2000-01-10 Schepens Eye Research Institute Coaxial spatially resolved refractometer
JP2000333905A (ja) * 1999-05-31 2000-12-05 Nidek Co Ltd 眼科装置
US6002484A (en) 1999-06-18 1999-12-14 Rozema; Jos J. Phase contrast aberroscope
JP4267133B2 (ja) 1999-07-15 2009-05-27 株式会社トプコン 眼屈折力測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9357914B2 (en) 2012-02-15 2016-06-07 Canon Kabushiki Kaisha Ophthalmologic apparatus, method for controlling ophthalmologic apparatus, and storage medium

Also Published As

Publication number Publication date
JP2005103103A (ja) 2005-04-21
US20050068497A1 (en) 2005-03-31
EP1520512B1 (en) 2011-02-09
EP1520512A1 (en) 2005-04-06
DE602004031317D1 (de) 2011-03-24
US7316480B2 (en) 2008-01-08

Similar Documents

Publication Publication Date Title
JP4233426B2 (ja) 眼屈折力測定装置
JP4492847B2 (ja) 眼屈折力測定装置
JP3523453B2 (ja) 検眼装置
JP5987477B2 (ja) 眼科撮影装置
US7413305B2 (en) Ophthalmologic apparatus and related positioning method
JP2001095760A (ja) 眼の光学特性測定装置
JP3703310B2 (ja) 手持ち型眼科装置
JP2003245300A (ja) 眼科装置
JP5301908B2 (ja) 眼屈折力測定装置
JP3636886B2 (ja) 眼科装置
JPH10243923A (ja) 眼科装置
JP4469205B2 (ja) 眼科装置
JP3636917B2 (ja) 眼屈折力測定装置
JP5601614B2 (ja) 眼屈折力測定装置
JP3660145B2 (ja) 眼科装置
JP3576656B2 (ja) 眼科器械用位置合わせ検出装置
JP6221249B2 (ja) 眼屈折力測定装置
JP3323559B2 (ja) 眼屈折測定装置
JP3441156B2 (ja) 眼科装置
JP3927873B2 (ja) 眼屈折力測定装置
JP2001231753A (ja) 検眼装置
JP2001231754A (ja) 検眼装置
JP4630107B2 (ja) 眼光学特性測定装置
JPH0523302A (ja) 検眼装置
JP4436914B2 (ja) 眼屈折力測定装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060728

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20060728

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20080714

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080723

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080922

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20081126

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20081209

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111219

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4233426

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20111219

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121219

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121219

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131219

Year of fee payment: 5

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees