JP2005103103A5 - - Google Patents

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Publication number
JP2005103103A5
JP2005103103A5 JP2003342618A JP2003342618A JP2005103103A5 JP 2005103103 A5 JP2005103103 A5 JP 2005103103A5 JP 2003342618 A JP2003342618 A JP 2003342618A JP 2003342618 A JP2003342618 A JP 2003342618A JP 2005103103 A5 JP2005103103 A5 JP 2005103103A5
Authority
JP
Japan
Prior art keywords
pupil
fundus
ring
refractive power
eye
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003342618A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005103103A (ja
JP4233426B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2003342618A priority Critical patent/JP4233426B2/ja
Priority claimed from JP2003342618A external-priority patent/JP4233426B2/ja
Priority to US10/949,297 priority patent/US7316480B2/en
Priority to EP04023244A priority patent/EP1520512B1/en
Priority to DE602004031317T priority patent/DE602004031317D1/de
Publication of JP2005103103A publication Critical patent/JP2005103103A/ja
Publication of JP2005103103A5 publication Critical patent/JP2005103103A5/ja
Application granted granted Critical
Publication of JP4233426B2 publication Critical patent/JP4233426B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2003342618A 2003-09-30 2003-09-30 眼屈折力測定装置 Expired - Fee Related JP4233426B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2003342618A JP4233426B2 (ja) 2003-09-30 2003-09-30 眼屈折力測定装置
US10/949,297 US7316480B2 (en) 2003-09-30 2004-09-27 Eye refractive power measurement apparatus
EP04023244A EP1520512B1 (en) 2003-09-30 2004-09-29 Eye refractive power measurement apparatus
DE602004031317T DE602004031317D1 (de) 2003-09-30 2004-09-29 Gerät zur Messung der Brechkraft der Augen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003342618A JP4233426B2 (ja) 2003-09-30 2003-09-30 眼屈折力測定装置

Publications (3)

Publication Number Publication Date
JP2005103103A JP2005103103A (ja) 2005-04-21
JP2005103103A5 true JP2005103103A5 (enExample) 2006-09-14
JP4233426B2 JP4233426B2 (ja) 2009-03-04

Family

ID=34309100

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003342618A Expired - Fee Related JP4233426B2 (ja) 2003-09-30 2003-09-30 眼屈折力測定装置

Country Status (4)

Country Link
US (1) US7316480B2 (enExample)
EP (1) EP1520512B1 (enExample)
JP (1) JP4233426B2 (enExample)
DE (1) DE602004031317D1 (enExample)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7883505B2 (en) 2004-04-20 2011-02-08 Wavetec Vision Systems, Inc. Integrated surgical microscope and wavefront sensor
JP4458937B2 (ja) * 2004-06-02 2010-04-28 株式会社ニデック 眼屈折力測定装置
JP4492859B2 (ja) * 2004-07-30 2010-06-30 株式会社ニデック 眼屈折力測定装置
EP1834576B1 (en) * 2005-01-07 2015-08-19 Nidek Co., Ltd. Eye refractive power measuring system
JP4630126B2 (ja) * 2005-05-16 2011-02-09 株式会社トプコン 眼光学特性測定装置
JP4653576B2 (ja) * 2005-07-01 2011-03-16 株式会社ニデック 眼屈折力測定装置
JP5085858B2 (ja) 2005-09-27 2012-11-28 株式会社ニデック 眼屈折力測定装置
JP4987276B2 (ja) 2005-10-11 2012-07-25 株式会社ニデック 眼科装置
US7594729B2 (en) 2007-10-31 2009-09-29 Wf Systems, Llc Wavefront sensor
US20090141237A1 (en) * 2007-11-02 2009-06-04 Bioptigen, Inc. Integrated Optical Coherence Imaging Systems for Use in Ophthalmic Applications and Related Methods and Computer Program Products
JP5435698B2 (ja) * 2009-02-24 2014-03-05 株式会社ニデック 眼底カメラ
KR101730675B1 (ko) 2009-07-14 2017-05-11 웨이브텍 비젼 시스템스, 인크. 안과 수술 측정 시스템
US8696125B2 (en) * 2009-09-30 2014-04-15 Nidek Co., Ltd. Eye refractive power measurement apparatus
JP2013165818A (ja) * 2012-02-15 2013-08-29 Canon Inc 眼科装置および眼科制御方法並びにプログラム
JP6116122B2 (ja) * 2012-02-15 2017-04-19 キヤノン株式会社 眼科装置および眼科制御方法並びにプログラム
JP6003292B2 (ja) * 2012-06-29 2016-10-05 株式会社ニデック 眼底撮影装置
US9072462B2 (en) 2012-09-27 2015-07-07 Wavetec Vision Systems, Inc. Geometric optical power measurement device
JP5650810B2 (ja) * 2013-06-24 2015-01-07 株式会社ニデック 眼軸長測定装置
WO2016037980A1 (en) * 2014-09-12 2016-03-17 Centervue S.P.A. Eye examination apparatus
CN106725297B (zh) * 2016-12-21 2019-02-19 中国科学院苏州生物医学工程技术研究所 用于眼科装置的双层光路高精度快速对准光学系统
JP6513747B2 (ja) * 2017-07-27 2019-05-15 株式会社トプコン 眼科装置
JP2019058437A (ja) * 2017-09-27 2019-04-18 株式会社トプコン 眼科装置
JP7248770B2 (ja) * 2017-09-27 2023-03-29 株式会社トプコン 眼科装置
EP3719743A4 (en) * 2017-11-29 2021-08-11 Nec Corporation INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHODS AND STORAGE MEDIUM
US10768431B2 (en) * 2017-12-20 2020-09-08 Aperture In Motion, LLC Light control devices and methods for regional variation of visual information and sampling
US11950844B2 (en) * 2019-09-30 2024-04-09 Alcon Inc. Ocular aberrometer characterization systems and methods
WO2024154480A1 (ja) * 2023-01-17 2024-07-25 株式会社ニデック 眼科測定装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3206936B2 (ja) 1991-07-25 2001-09-10 キヤノン株式会社 眼屈折計
US5463430A (en) 1992-07-31 1995-10-31 Nidek Co., Ltd. Examination apparatus for examining an object having a spheroidal reflective surface
US5523809A (en) 1992-08-25 1996-06-04 Canon Kabushiki Kaisha Eye refraction measuring apparatus including optical path separating member light beam separating member, and/or light diameter changing means
JPH08103413A (ja) 1994-10-03 1996-04-23 Canon Inc 眼科測定装置
JP3599523B2 (ja) * 1997-03-04 2004-12-08 株式会社ニデック 眼科装置
JPH11225963A (ja) 1998-02-13 1999-08-24 Canon Inc 検眼測定装置
AU4687099A (en) 1998-06-22 2000-01-10 Schepens Eye Research Institute Coaxial spatially resolved refractometer
JP2000333905A (ja) * 1999-05-31 2000-12-05 Nidek Co Ltd 眼科装置
US6002484A (en) 1999-06-18 1999-12-14 Rozema; Jos J. Phase contrast aberroscope
JP4267133B2 (ja) 1999-07-15 2009-05-27 株式会社トプコン 眼屈折力測定装置

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