JP3872081B2 - 研磨用パッド - Google Patents
研磨用パッド Download PDFInfo
- Publication number
- JP3872081B2 JP3872081B2 JP2004383013A JP2004383013A JP3872081B2 JP 3872081 B2 JP3872081 B2 JP 3872081B2 JP 2004383013 A JP2004383013 A JP 2004383013A JP 2004383013 A JP2004383013 A JP 2004383013A JP 3872081 B2 JP3872081 B2 JP 3872081B2
- Authority
- JP
- Japan
- Prior art keywords
- groove
- polishing
- polishing pad
- back surface
- pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005498 polishing Methods 0.000 title claims description 577
- 230000002093 peripheral effect Effects 0.000 claims description 22
- 239000004065 semiconductor Substances 0.000 claims description 17
- 239000000758 substrate Substances 0.000 description 123
- 239000000463 material Substances 0.000 description 76
- 239000011295 pitch Substances 0.000 description 47
- 239000007788 liquid Substances 0.000 description 27
- 238000004519 manufacturing process Methods 0.000 description 25
- 238000007517 polishing process Methods 0.000 description 17
- 239000002184 metal Substances 0.000 description 16
- 229910052751 metal Inorganic materials 0.000 description 16
- 238000012545 processing Methods 0.000 description 15
- 238000000034 method Methods 0.000 description 9
- 239000002002 slurry Substances 0.000 description 9
- 230000000694 effects Effects 0.000 description 7
- 229920003002 synthetic resin Polymers 0.000 description 6
- 239000000057 synthetic resin Substances 0.000 description 6
- 229920001875 Ebonite Polymers 0.000 description 5
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 5
- 239000002657 fibrous material Substances 0.000 description 5
- 229910010272 inorganic material Inorganic materials 0.000 description 5
- 239000011147 inorganic material Substances 0.000 description 5
- 238000006073 displacement reaction Methods 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 229910052745 lead Inorganic materials 0.000 description 4
- 229910052697 platinum Inorganic materials 0.000 description 4
- 238000010008 shearing Methods 0.000 description 4
- 230000005489 elastic deformation Effects 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000032798 delamination Effects 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000006260 foam Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 239000013013 elastic material Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 239000013589 supplement Substances 0.000 description 1
- 239000002344 surface layer Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004383013A JP3872081B2 (ja) | 2004-12-29 | 2004-12-29 | 研磨用パッド |
| US11/813,141 US7867066B2 (en) | 2004-12-29 | 2005-12-19 | Polishing pad |
| TW094145011A TWI375606B (en) | 2004-12-29 | 2005-12-19 | Polishing pad |
| CN200580048296.3A CN100562401C (zh) | 2004-12-29 | 2005-12-19 | 抛光垫 |
| PCT/JP2005/023255 WO2006070629A1 (ja) | 2004-12-29 | 2005-12-19 | 研磨用パッド |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004383013A JP3872081B2 (ja) | 2004-12-29 | 2004-12-29 | 研磨用パッド |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006187819A JP2006187819A (ja) | 2006-07-20 |
| JP2006187819A5 JP2006187819A5 (enExample) | 2006-08-31 |
| JP3872081B2 true JP3872081B2 (ja) | 2007-01-24 |
Family
ID=36614748
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004383013A Expired - Fee Related JP3872081B2 (ja) | 2004-12-29 | 2004-12-29 | 研磨用パッド |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7867066B2 (enExample) |
| JP (1) | JP3872081B2 (enExample) |
| CN (1) | CN100562401C (enExample) |
| TW (1) | TWI375606B (enExample) |
| WO (1) | WO2006070629A1 (enExample) |
Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD559066S1 (en) * | 2004-10-26 | 2008-01-08 | Jsr Corporation | Polishing pad |
| JP5105095B2 (ja) * | 2006-10-27 | 2012-12-19 | Jsr株式会社 | 化学機械研磨パッドの製造方法および被研磨体の加工方法 |
| US9180570B2 (en) | 2008-03-14 | 2015-11-10 | Nexplanar Corporation | Grooved CMP pad |
| TWI360459B (en) * | 2008-04-11 | 2012-03-21 | Bestac Advanced Material Co Ltd | A polishing pad having groove structure for avoidi |
| JP5230328B2 (ja) | 2008-09-30 | 2013-07-10 | スピードファム株式会社 | ウエハノッチ部の研磨パッド |
| JP2012533888A (ja) * | 2009-07-16 | 2012-12-27 | キャボット マイクロエレクトロニクス コーポレイション | 溝付きcmp研磨pad |
| RU2012116583A (ru) * | 2009-11-12 | 2013-12-20 | 3М Инновейтив Пропертиз Компани | Вращающаяся полировальная подушка |
| JP2012106328A (ja) * | 2010-03-25 | 2012-06-07 | Toyo Tire & Rubber Co Ltd | 積層研磨パッド |
| KR101440175B1 (ko) | 2010-06-30 | 2014-09-12 | 코오롱인더스트리 주식회사 | 연마패드 및 그 제조방법 |
| TWI532565B (zh) * | 2011-03-21 | 2016-05-11 | 智勝科技股份有限公司 | 研磨方法以及研磨系統 |
| WO2013103142A1 (ja) * | 2012-01-06 | 2013-07-11 | 東レ株式会社 | 研磨パッド |
| US9421669B2 (en) * | 2012-07-30 | 2016-08-23 | Globalfoundries Singapore Pte. Ltd. | Single grooved polishing pad |
| JP5935168B2 (ja) | 2012-08-20 | 2016-06-15 | 東邦エンジニアリング株式会社 | 基板研磨装置 |
| CN102990535A (zh) * | 2012-11-27 | 2013-03-27 | 无锡市彩云机械设备有限公司 | 一种抛光垫 |
| US9308620B2 (en) * | 2013-09-18 | 2016-04-12 | Texas Instruments Incorporated | Permeated grooving in CMP polishing pads |
| TWI599447B (zh) | 2013-10-18 | 2017-09-21 | 卡博特微電子公司 | 具有偏移同心溝槽圖樣之邊緣排除區的cmp拋光墊 |
| WO2015186076A2 (en) * | 2014-06-04 | 2015-12-10 | Paolo Baratti | Abrasive tool for machining surfaces |
| WO2016108284A1 (ja) | 2014-12-31 | 2016-07-07 | 東邦エンジニアリング株式会社 | 平坦加工方法および平坦加工装置 |
| US10092998B2 (en) * | 2015-06-26 | 2018-10-09 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Method of making composite polishing layer for chemical mechanical polishing pad |
| US10189143B2 (en) * | 2015-11-30 | 2019-01-29 | Taiwan Semiconductor Manufacturing Company Limited | Polishing pad, method for manufacturing polishing pad, and polishing method |
| JP6754519B2 (ja) * | 2016-02-15 | 2020-09-16 | 国立研究開発法人海洋研究開発機構 | 研磨方法 |
| JP6187948B1 (ja) | 2016-03-11 | 2017-08-30 | 東邦エンジニアリング株式会社 | 平坦加工装置、その動作方法および加工物の製造方法 |
| JP7026942B2 (ja) * | 2018-04-26 | 2022-03-01 | 丸石産業株式会社 | 研磨パッド用の下敷及び該下敷を使用する研磨方法 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5441598A (en) * | 1993-12-16 | 1995-08-15 | Motorola, Inc. | Polishing pad for chemical-mechanical polishing of a semiconductor substrate |
| JP3042593B2 (ja) | 1995-10-25 | 2000-05-15 | 日本電気株式会社 | 研磨パッド |
| JP3324643B2 (ja) | 1995-10-25 | 2002-09-17 | 日本電気株式会社 | 研磨パッド |
| US5913713A (en) * | 1997-07-31 | 1999-06-22 | International Business Machines Corporation | CMP polishing pad backside modifications for advantageous polishing results |
| JP3152188B2 (ja) | 1997-11-28 | 2001-04-03 | 日本電気株式会社 | 研磨パッド |
| DE60039054D1 (de) * | 1999-03-30 | 2008-07-10 | Nikon Corp | Gt-polierkörper, poliervorrichtung, polierverfahren und verfahren zum herstellen einer halbleitervorrichtung (2002/23) |
| US6217426B1 (en) | 1999-04-06 | 2001-04-17 | Applied Materials, Inc. | CMP polishing pad |
| WO2002043921A1 (en) | 2000-12-01 | 2002-06-06 | Toyo Boseki Kabushiki Kaisha | Polishing pad, method of manufacturing the polishing pad, and cushion layer for polishing pad |
| AU2003236328A1 (en) | 2002-04-03 | 2003-10-13 | Toho Engineering Kabushiki Kaisha | Polishing pad and semiconductor substrate manufacturing method using the polishing pad |
| CN1504315A (zh) * | 2002-12-05 | 2004-06-16 | 智胜科技股份有限公司 | 研磨垫的制造方法 |
| JP2004202666A (ja) | 2002-12-26 | 2004-07-22 | Sony Corp | 研磨装置、研磨部材、および研磨方法 |
| JP4292025B2 (ja) * | 2003-05-23 | 2009-07-08 | Jsr株式会社 | 研磨パッド |
| US20040259479A1 (en) * | 2003-06-23 | 2004-12-23 | Cabot Microelectronics Corporation | Polishing pad for electrochemical-mechanical polishing |
| US7442116B2 (en) | 2003-11-04 | 2008-10-28 | Jsr Corporation | Chemical mechanical polishing pad |
| JP4616571B2 (ja) | 2004-03-31 | 2011-01-19 | 東洋ゴム工業株式会社 | 研磨パッド |
-
2004
- 2004-12-29 JP JP2004383013A patent/JP3872081B2/ja not_active Expired - Fee Related
-
2005
- 2005-12-19 TW TW094145011A patent/TWI375606B/zh not_active IP Right Cessation
- 2005-12-19 CN CN200580048296.3A patent/CN100562401C/zh not_active Expired - Fee Related
- 2005-12-19 US US11/813,141 patent/US7867066B2/en not_active Expired - Fee Related
- 2005-12-19 WO PCT/JP2005/023255 patent/WO2006070629A1/ja not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| TWI375606B (en) | 2012-11-01 |
| TW200700187A (en) | 2007-01-01 |
| WO2006070629A1 (ja) | 2006-07-06 |
| CN101119829A (zh) | 2008-02-06 |
| US7867066B2 (en) | 2011-01-11 |
| JP2006187819A (ja) | 2006-07-20 |
| CN100562401C (zh) | 2009-11-25 |
| US20080064311A1 (en) | 2008-03-13 |
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