JP3854042B2 - フラッシュメモリ装置及びそのプログラム方法 - Google Patents
フラッシュメモリ装置及びそのプログラム方法 Download PDFInfo
- Publication number
- JP3854042B2 JP3854042B2 JP2000184960A JP2000184960A JP3854042B2 JP 3854042 B2 JP3854042 B2 JP 3854042B2 JP 2000184960 A JP2000184960 A JP 2000184960A JP 2000184960 A JP2000184960 A JP 2000184960A JP 3854042 B2 JP3854042 B2 JP 3854042B2
- Authority
- JP
- Japan
- Prior art keywords
- memory cells
- program
- flash memory
- threshold voltage
- programmed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
- G11C16/12—Programming voltage switching circuits
Landscapes
- Read Only Memory (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1019990029786A KR100322470B1 (ko) | 1999-07-22 | 1999-07-22 | 고밀도 노어형 플래시 메모리 장치 및 그것의 프로그램 방법 |
| KR99-29786 | 1999-07-22 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001052486A JP2001052486A (ja) | 2001-02-23 |
| JP2001052486A5 JP2001052486A5 (enExample) | 2004-07-29 |
| JP3854042B2 true JP3854042B2 (ja) | 2006-12-06 |
Family
ID=19603702
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000184960A Expired - Lifetime JP3854042B2 (ja) | 1999-07-22 | 2000-06-20 | フラッシュメモリ装置及びそのプログラム方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6212101B1 (enExample) |
| JP (1) | JP3854042B2 (enExample) |
| KR (1) | KR100322470B1 (enExample) |
| CN (2) | CN1542858B (enExample) |
| DE (1) | DE10034743B4 (enExample) |
| FR (1) | FR2798218B1 (enExample) |
| TW (1) | TW526495B (enExample) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE60139670D1 (de) | 2001-04-10 | 2009-10-08 | St Microelectronics Srl | Verfahren zur Programmierung nichtflüchtiger Speicherzellen mit Programmier- und Prüfalgorithmus unter Verwendung treppenförmiger Spannungsimpulse mit variablem Stufenabstand |
| US6434048B1 (en) | 2001-07-20 | 2002-08-13 | Hewlett-Packard Company | Pulse train writing of worm storage device |
| US6781877B2 (en) * | 2002-09-06 | 2004-08-24 | Sandisk Corporation | Techniques for reducing effects of coupling between storage elements of adjacent rows of memory cells |
| KR100546343B1 (ko) * | 2003-07-18 | 2006-01-26 | 삼성전자주식회사 | 플래시 메모리 장치의 프로그램 방법 |
| KR100587702B1 (ko) * | 2004-07-09 | 2006-06-08 | 삼성전자주식회사 | 피크 전류의 감소 특성을 갖는 상변화 메모리 장치 및그에 따른 데이터 라이팅 방법 |
| US20060067127A1 (en) * | 2004-09-30 | 2006-03-30 | Matrix Semiconductor, Inc. | Method of programming a monolithic three-dimensional memory |
| US7149119B2 (en) * | 2004-09-30 | 2006-12-12 | Matrix Semiconductor, Inc. | System and method of controlling a three-dimensional memory |
| KR100645049B1 (ko) | 2004-10-21 | 2006-11-10 | 삼성전자주식회사 | 프로그램 특성을 향상시킬 수 있는 불 휘발성 메모리 장치및 그것의 프로그램 방법 |
| US7092290B2 (en) * | 2004-11-16 | 2006-08-15 | Sandisk Corporation | High speed programming system with reduced over programming |
| JP2007213664A (ja) | 2006-02-08 | 2007-08-23 | Nec Electronics Corp | 不揮発性半導体記憶装置、及び不揮発性半導体記憶装置の書込み方法 |
| KR100771517B1 (ko) * | 2006-02-17 | 2007-10-30 | 삼성전자주식회사 | 칩 사이즈를 줄일 수 있는 플래시 메모리 장치 |
| US7684247B2 (en) * | 2006-09-29 | 2010-03-23 | Sandisk Corporation | Reverse reading in non-volatile memory with compensation for coupling |
| US7447076B2 (en) * | 2006-09-29 | 2008-11-04 | Sandisk Corporation | Systems for reverse reading in non-volatile memory with compensation for coupling |
| US7606070B2 (en) * | 2006-12-29 | 2009-10-20 | Sandisk Corporation | Systems for margined neighbor reading for non-volatile memory read operations including coupling compensation |
| US7518923B2 (en) | 2006-12-29 | 2009-04-14 | Sandisk Corporation | Margined neighbor reading for non-volatile memory read operations including coupling compensation |
| KR100888844B1 (ko) * | 2007-06-28 | 2009-03-17 | 삼성전자주식회사 | 프로그램 성능을 향상시킬 수 있는 플래시 메모리 장치 및그것의 프로그램 방법 |
| KR101177278B1 (ko) * | 2007-10-08 | 2012-08-24 | 삼성전자주식회사 | 비휘발성 메모리 셀 프로그래밍 방법 |
| US7848144B2 (en) * | 2008-06-16 | 2010-12-07 | Sandisk Corporation | Reverse order page writing in flash memories |
| KR101552209B1 (ko) * | 2008-10-17 | 2015-09-11 | 삼성전자주식회사 | 멀티 비트를 프로그램하는 가변 저항 메모리 장치 |
| CN102097130B (zh) * | 2009-12-10 | 2014-03-05 | 辉芒微电子(深圳)有限公司 | Eeprom擦写方法和装置 |
| US8391073B2 (en) | 2010-10-29 | 2013-03-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | Adaptive control of programming currents for memory cells |
| US8391069B2 (en) * | 2011-05-11 | 2013-03-05 | Elite Semiconductor Memory Technology Inc. | Programming method for nonvolatile semiconductor memory device |
| US9570175B2 (en) * | 2013-08-05 | 2017-02-14 | Jonker Llc | Incrementally programmable non-volatile memory |
| CN109427399A (zh) * | 2017-08-31 | 2019-03-05 | 北京兆易创新科技股份有限公司 | 一种NOR Flash的编程方法和编程装置 |
| CN111798905B (zh) * | 2020-07-01 | 2021-03-16 | 深圳市芯天下技术有限公司 | 减少非型闪存编程时间的方法、系统、存储介质和终端 |
| CN114203242B (zh) * | 2021-12-02 | 2024-11-29 | 普冉半导体(上海)股份有限公司 | Nor型闪存编程电路 |
| TWI882752B (zh) * | 2024-04-01 | 2025-05-01 | 華邦電子股份有限公司 | 程式化電壓供應器以及程式化電壓的產生方法 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3626221B2 (ja) * | 1993-12-13 | 2005-03-02 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| US5537350A (en) * | 1993-09-10 | 1996-07-16 | Intel Corporation | Method and apparatus for sequential programming of the bits in a word of a flash EEPROM memory array |
| KR0170296B1 (ko) * | 1995-09-19 | 1999-03-30 | 김광호 | 비휘발성 메모리소자 |
| KR100252476B1 (ko) * | 1997-05-19 | 2000-04-15 | 윤종용 | 플레이트 셀 구조의 전기적으로 소거 및 프로그램 가능한 셀들을 구비한 불 휘발성 반도체 메모리 장치및 그것의 프로그램 방법 |
| GB2325546B (en) * | 1997-05-21 | 2001-10-17 | Motorola Inc | Electrically programmable memory and method of programming |
-
1999
- 1999-07-22 KR KR1019990029786A patent/KR100322470B1/ko not_active Expired - Fee Related
-
2000
- 2000-06-20 JP JP2000184960A patent/JP3854042B2/ja not_active Expired - Lifetime
- 2000-07-13 FR FR0009191A patent/FR2798218B1/fr not_active Expired - Fee Related
- 2000-07-15 TW TW089114179A patent/TW526495B/zh not_active IP Right Cessation
- 2000-07-18 DE DE10034743A patent/DE10034743B4/de not_active Expired - Fee Related
- 2000-07-20 US US09/620,020 patent/US6212101B1/en not_active Expired - Fee Related
- 2000-07-21 CN CN2004100335529A patent/CN1542858B/zh not_active Expired - Fee Related
- 2000-07-21 CN CNB001216872A patent/CN1168095C/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN1542858A (zh) | 2004-11-03 |
| KR20010010734A (ko) | 2001-02-15 |
| CN1542858B (zh) | 2010-05-26 |
| FR2798218B1 (fr) | 2007-04-27 |
| JP2001052486A (ja) | 2001-02-23 |
| KR100322470B1 (ko) | 2002-02-07 |
| TW526495B (en) | 2003-04-01 |
| CN1282077A (zh) | 2001-01-31 |
| US6212101B1 (en) | 2001-04-03 |
| DE10034743B4 (de) | 2006-08-31 |
| CN1168095C (zh) | 2004-09-22 |
| FR2798218A1 (fr) | 2001-03-09 |
| DE10034743A1 (de) | 2001-02-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP3854042B2 (ja) | フラッシュメモリ装置及びそのプログラム方法 | |
| KR100332001B1 (ko) | 반도체불휘발성기억장치 | |
| KR100632940B1 (ko) | 프로그램 사이클 시간을 가변시킬 수 있는 불 휘발성반도체 메모리 장치 | |
| JP5280679B2 (ja) | メモリのラッチプログラミングおよびその方法 | |
| US7489566B2 (en) | High voltage generator and related flash memory device | |
| KR100423894B1 (ko) | 저전압 반도체 메모리 장치 | |
| JP2002251896A (ja) | プログラミング用のビットラインセットアップ及びディスチャージ回路を有する不揮発性メモリ装置及びそのプログラミング方法 | |
| JP2011522348A (ja) | 不揮発性メモリのための高速センスアンプアレイおよび方法 | |
| JP3662725B2 (ja) | 単一ビットセル及び多量ビットセル動作の同時的な遂行が可能な不揮発性半導体メモリ装置 | |
| JP4426082B2 (ja) | 読出時間を短縮させる不揮発性半導体メモリ装置 | |
| US6990021B2 (en) | Low voltage sense amplifier for operation under a reduced bit line bias voltage | |
| KR100338549B1 (ko) | 고밀도 노어형 플래시 메모리 장치 및 그것의 프로그램 방법 | |
| JP2573116B2 (ja) | 不揮発性半導体記憶装置 | |
| JP4012144B2 (ja) | 半導体記憶装置 | |
| US6987695B2 (en) | Writing data to nonvolatile memory | |
| JP3145981B2 (ja) | 半導体不揮発性記憶装置 | |
| JP2004014052A (ja) | 不揮発性半導体記憶装置 | |
| JPH04192196A (ja) | 不揮発性半導体記憶装置 | |
| JP2007095233A (ja) | 不揮発性メモリ |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20051107 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20051118 |
|
| A601 | Written request for extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A601 Effective date: 20060216 |
|
| A602 | Written permission of extension of time |
Free format text: JAPANESE INTERMEDIATE CODE: A602 Effective date: 20060221 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060518 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20060814 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20060907 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20100915 Year of fee payment: 4 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110915 Year of fee payment: 5 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20120915 Year of fee payment: 6 |