JP2794138B2 - 半導体記憶装置 - Google Patents

半導体記憶装置

Info

Publication number
JP2794138B2
JP2794138B2 JP3202882A JP20288291A JP2794138B2 JP 2794138 B2 JP2794138 B2 JP 2794138B2 JP 3202882 A JP3202882 A JP 3202882A JP 20288291 A JP20288291 A JP 20288291A JP 2794138 B2 JP2794138 B2 JP 2794138B2
Authority
JP
Japan
Prior art keywords
refresh mode
word line
signal
bit line
refresh
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP3202882A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0547176A (ja
Inventor
功一 長瀬
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP3202882A priority Critical patent/JP2794138B2/ja
Priority to KR1019920013923A priority patent/KR950009229B1/ko
Priority to US07/924,878 priority patent/US5373475A/en
Priority to EP92113765A priority patent/EP0528352B1/de
Priority to DE69224245T priority patent/DE69224245T2/de
Publication of JPH0547176A publication Critical patent/JPH0547176A/ja
Application granted granted Critical
Publication of JP2794138B2 publication Critical patent/JP2794138B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406—Management or control of the refreshing or charge-regeneration cycles
JP3202882A 1991-08-13 1991-08-13 半導体記憶装置 Expired - Lifetime JP2794138B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP3202882A JP2794138B2 (ja) 1991-08-13 1991-08-13 半導体記憶装置
KR1019920013923A KR950009229B1 (ko) 1991-08-13 1992-08-03 반도체 기억장치
US07/924,878 US5373475A (en) 1991-08-13 1992-08-06 Semiconductor device in which the number of word lines selected simultaneously in a refresh mode is externally selectable and method of manufacturing the same
EP92113765A EP0528352B1 (de) 1991-08-13 1992-08-12 Halbleiter-Speichereinrichtung
DE69224245T DE69224245T2 (de) 1991-08-13 1992-08-12 Halbleiter-Speichereinrichtung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3202882A JP2794138B2 (ja) 1991-08-13 1991-08-13 半導体記憶装置

Publications (2)

Publication Number Publication Date
JPH0547176A JPH0547176A (ja) 1993-02-26
JP2794138B2 true JP2794138B2 (ja) 1998-09-03

Family

ID=16464769

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3202882A Expired - Lifetime JP2794138B2 (ja) 1991-08-13 1991-08-13 半導体記憶装置

Country Status (5)

Country Link
US (1) US5373475A (de)
EP (1) EP0528352B1 (de)
JP (1) JP2794138B2 (de)
KR (1) KR950009229B1 (de)
DE (1) DE69224245T2 (de)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3776461B2 (ja) * 1991-08-30 2006-05-17 株式会社東芝 半導体集積回路装置およびチップ選別方法
JP2967021B2 (ja) * 1993-01-25 1999-10-25 株式会社東芝 半導体メモリ装置
KR950010624B1 (ko) * 1993-07-14 1995-09-20 삼성전자주식회사 반도체 메모리장치의 셀프리프레시 주기조절회로
JP3090833B2 (ja) * 1993-12-28 2000-09-25 株式会社東芝 半導体記憶装置
JP3426693B2 (ja) * 1994-03-07 2003-07-14 株式会社日立製作所 半導体記憶装置
US5442588A (en) * 1994-08-16 1995-08-15 Cirrus Logic, Inc. Circuits and methods for refreshing a dual bank memory
US5835436A (en) * 1995-07-03 1998-11-10 Mitsubishi Denki Kabushiki Kaisha Dynamic type semiconductor memory device capable of transferring data between array blocks at high speed
KR100372245B1 (ko) * 1995-08-24 2004-02-25 삼성전자주식회사 워드라인순차제어반도체메모리장치
JPH09161478A (ja) * 1995-12-12 1997-06-20 Mitsubishi Electric Corp 半導体記憶装置
US5920517A (en) * 1996-09-30 1999-07-06 Advanced Micro Devices, Inc. Memory array test and characterization using isolated memory cell power supply
US5835401A (en) * 1996-12-05 1998-11-10 Cypress Semiconductor Corporation Dram with hidden refresh
US5781483A (en) * 1996-12-31 1998-07-14 Micron Technology, Inc. Device and method for repairing a memory array by storing each bit in multiple memory cells in the array
KR100234365B1 (ko) * 1997-01-30 1999-12-15 윤종용 반도체 메모리장치의 리프레쉬 방법 및 회로
KR100465636B1 (ko) * 1997-09-30 2005-04-06 주식회사 하이닉스반도체 디램의 리프레쉬 제어회로
US6549476B2 (en) 2001-04-09 2003-04-15 Micron Technology, Inc. Device and method for using complementary bits in a memory array
KR100499639B1 (ko) * 2003-04-21 2005-07-05 주식회사 하이닉스반도체 로오 리던던시 회로
KR100689863B1 (ko) * 2005-12-22 2007-03-08 삼성전자주식회사 반도체 메모리 장치 및 그에 따른 방법
JP5146457B2 (ja) * 2007-10-05 2013-02-20 富士通株式会社 情報処理装置、記憶部制御装置、記憶部制御方法
US9601193B1 (en) * 2015-09-14 2017-03-21 Intel Corporation Cross point memory control
KR102441031B1 (ko) * 2016-04-01 2022-09-07 에스케이하이닉스 주식회사 리프레쉬 제어 장치 및 이를 포함하는 반도체 장치
US10978134B1 (en) * 2019-12-30 2021-04-13 Alibaba Group Holding Limited Method and device for refreshing memory

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0632217B2 (ja) * 1981-06-29 1994-04-27 富士通株式会社 半導体記憶装置
JPS59140694A (ja) * 1983-01-31 1984-08-13 Sharp Corp ダイナミツクｒａｍのリフレツシユ方法
JPS61145636A (ja) * 1984-12-19 1986-07-03 Nec Corp 記号列照合装置
JPH0612610B2 (ja) * 1986-06-24 1994-02-16 日本電気株式会社 ダイナミツク型半導体メモリ
US4819207A (en) * 1986-09-30 1989-04-04 Kabushiki Kaisha Toshiba High-speed refreshing rechnique for highly-integrated random-access memory
JPS643896A (en) * 1987-06-24 1989-01-09 Mitsubishi Electric Corp Semiconductor dynamic ram
US4933907A (en) * 1987-12-03 1990-06-12 Mitsubishi Denki Kabushiki Kaisha Dynamic random access memory device and operating method therefor
JP2561640B2 (ja) * 1988-05-27 1996-12-11 株式会社日立製作所 半導体記憶装置
JPH0229989A (ja) * 1988-07-19 1990-01-31 Mitsubishi Electric Corp ダイナミックランダムアクセスメモリ装置
US4961167A (en) * 1988-08-26 1990-10-02 Mitsubishi Denki Kabushiki Kaisha Substrate bias generator in a dynamic random access memory with auto/self refresh functions and a method of generating a substrate bias therein
US5161124A (en) * 1988-10-27 1992-11-03 Texas Instruments Incorporated Bond programmable integrated circuit
JPH03149852A (ja) * 1989-11-07 1991-06-26 Fujitsu Ltd 半導体集積回路

Also Published As

Publication number Publication date
EP0528352A1 (de) 1993-02-24
DE69224245D1 (de) 1998-03-05
KR950009229B1 (ko) 1995-08-18
JPH0547176A (ja) 1993-02-26
US5373475A (en) 1994-12-13
EP0528352B1 (de) 1998-01-28
DE69224245T2 (de) 1998-07-09
KR930005015A (ko) 1993-03-23

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