JP2024139916A5 - - Google Patents

Info

Publication number
JP2024139916A5
JP2024139916A5 JP2023050864A JP2023050864A JP2024139916A5 JP 2024139916 A5 JP2024139916 A5 JP 2024139916A5 JP 2023050864 A JP2023050864 A JP 2023050864A JP 2023050864 A JP2023050864 A JP 2023050864A JP 2024139916 A5 JP2024139916 A5 JP 2024139916A5
Authority
JP
Japan
Prior art keywords
layer
insulating layer
semiconductor device
region
metal oxide
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2023050864A
Other languages
English (en)
Japanese (ja)
Other versions
JP2024139916A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2023050864A priority Critical patent/JP2024139916A/ja
Priority claimed from JP2023050864A external-priority patent/JP2024139916A/ja
Priority to KR1020240034928A priority patent/KR102878611B1/ko
Priority to TW113109858A priority patent/TWI898488B/zh
Priority to CN202410305656.8A priority patent/CN118738136A/zh
Priority to US18/618,022 priority patent/US20240332429A1/en
Publication of JP2024139916A publication Critical patent/JP2024139916A/ja
Publication of JP2024139916A5 publication Critical patent/JP2024139916A5/ja
Pending legal-status Critical Current

Links

JP2023050864A 2023-03-28 2023-03-28 半導体装置、表示装置、及び半導体装置の製造方法 Pending JP2024139916A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2023050864A JP2024139916A (ja) 2023-03-28 2023-03-28 半導体装置、表示装置、及び半導体装置の製造方法
KR1020240034928A KR102878611B1 (ko) 2023-03-28 2024-03-13 반도체 장치, 표시 장치, 및 반도체 장치의 제조 방법
TW113109858A TWI898488B (zh) 2023-03-28 2024-03-18 半導體裝置、顯示裝置及半導體裝置之製造方法
CN202410305656.8A CN118738136A (zh) 2023-03-28 2024-03-18 半导体装置、显示装置及半导体装置的制造方法
US18/618,022 US20240332429A1 (en) 2023-03-28 2024-03-27 Semiconductor device and method for manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2023050864A JP2024139916A (ja) 2023-03-28 2023-03-28 半導体装置、表示装置、及び半導体装置の製造方法

Publications (2)

Publication Number Publication Date
JP2024139916A JP2024139916A (ja) 2024-10-10
JP2024139916A5 true JP2024139916A5 (enExample) 2026-03-19

Family

ID=92853996

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023050864A Pending JP2024139916A (ja) 2023-03-28 2023-03-28 半導体装置、表示装置、及び半導体装置の製造方法

Country Status (5)

Country Link
US (1) US20240332429A1 (enExample)
JP (1) JP2024139916A (enExample)
KR (1) KR102878611B1 (enExample)
CN (1) CN118738136A (enExample)
TW (1) TWI898488B (enExample)

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8871565B2 (en) 2010-09-13 2014-10-28 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing semiconductor device
KR102099445B1 (ko) * 2012-06-29 2020-04-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
EP2880690B1 (en) 2012-08-03 2019-02-27 Semiconductor Energy Laboratory Co. Ltd. Semiconductor device with oxide semiconductor stacked film
TWI761605B (zh) * 2012-09-14 2022-04-21 日商半導體能源研究所股份有限公司 半導體裝置及其製造方法
KR102220279B1 (ko) 2012-10-19 2021-02-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 산화물 반도체막을 포함하는 다층막 및 반도체 장치의 제작 방법
JP6345023B2 (ja) * 2013-08-07 2018-06-20 株式会社半導体エネルギー研究所 半導体装置およびその作製方法
US9425217B2 (en) 2013-09-23 2016-08-23 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
TWI685116B (zh) * 2014-02-07 2020-02-11 日商半導體能源研究所股份有限公司 半導體裝置
KR102593883B1 (ko) * 2015-06-19 2023-10-24 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 그 제작 방법, 및 전자 기기
CN109121438B (zh) 2016-02-12 2022-02-18 株式会社半导体能源研究所 半导体装置以及包括该半导体装置的显示装置
WO2019087002A1 (ja) * 2017-11-02 2019-05-09 株式会社半導体エネルギー研究所 半導体装置

Similar Documents

Publication Publication Date Title
KR101813176B1 (ko) 그래핀 전자 소자 및 제조방법
JP2005086024A5 (enExample)
JP3543117B2 (ja) 二重ゲート電界効果トランジスタ
JP2009524242A5 (enExample)
JP7179916B2 (ja) 半導体装置
TWI434353B (zh) 形成自對準接觸物之方法及具有自對準接觸物之積體電路
JP2007510308A5 (enExample)
JP2023554134A5 (enExample)
JP2007088010A (ja) 半導体装置およびその製造方法
JP2024139916A5 (enExample)
CN100576546C (zh) 具有改良的槽沟道栅极的半导体器件及其制作方法
KR20080026517A (ko) 반도체장치 및 그 제조방법
US9570353B1 (en) Method for manufacturing semiconductor device
JP2008182165A5 (enExample)
KR100780618B1 (ko) 반도체 소자의 제조 방법
JP2011138885A (ja) 半導体装置及び半導体装置の製造方法
TWI627749B (zh) 半導體結構與半導體圖案結構
TWI914975B (zh) 半導體裝置及製造半導體裝置的方法
US9269768B2 (en) Insulation wall between transistors on SOI
KR100792394B1 (ko) 반도체 소자 제조 방법
CN113903806B (zh) 半导体结构及其形成方法
TW201314751A (zh) 形成具有較小高差之半導體元件導電接觸的方法,形成半導體元件之方法
KR100413483B1 (ko) 반도체소자의 커패시터 및 그 제조방법
KR20090103508A (ko) 반도체 소자
KR100824532B1 (ko) 반도체 소자 및 그의 제조방법