JP2008182165A5 - - Google Patents

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Publication number
JP2008182165A5
JP2008182165A5 JP2007016259A JP2007016259A JP2008182165A5 JP 2008182165 A5 JP2008182165 A5 JP 2008182165A5 JP 2007016259 A JP2007016259 A JP 2007016259A JP 2007016259 A JP2007016259 A JP 2007016259A JP 2008182165 A5 JP2008182165 A5 JP 2008182165A5
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JP
Japan
Prior art keywords
pair
crystalline semiconductor
semiconductor layer
region
impurity regions
Prior art date
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Application number
JP2007016259A
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English (en)
Japanese (ja)
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JP5337346B2 (ja
JP2008182165A (ja
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Priority to JP2007016259A priority Critical patent/JP5337346B2/ja
Priority claimed from JP2007016259A external-priority patent/JP5337346B2/ja
Publication of JP2008182165A publication Critical patent/JP2008182165A/ja
Publication of JP2008182165A5 publication Critical patent/JP2008182165A5/ja
Application granted granted Critical
Publication of JP5337346B2 publication Critical patent/JP5337346B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007016259A 2007-01-26 2007-01-26 半導体装置の作製方法 Active JP5337346B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007016259A JP5337346B2 (ja) 2007-01-26 2007-01-26 半導体装置の作製方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007016259A JP5337346B2 (ja) 2007-01-26 2007-01-26 半導体装置の作製方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2012248182A Division JP5674747B2 (ja) 2012-11-12 2012-11-12 半導体装置

Publications (3)

Publication Number Publication Date
JP2008182165A JP2008182165A (ja) 2008-08-07
JP2008182165A5 true JP2008182165A5 (enExample) 2010-03-04
JP5337346B2 JP5337346B2 (ja) 2013-11-06

Family

ID=39725812

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007016259A Active JP5337346B2 (ja) 2007-01-26 2007-01-26 半導体装置の作製方法

Country Status (1)

Country Link
JP (1) JP5337346B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5337380B2 (ja) 2007-01-26 2013-11-06 株式会社半導体エネルギー研究所 半導体装置及びその作製方法
KR102290801B1 (ko) * 2013-06-21 2021-08-17 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제작 방법
JP2015207639A (ja) 2014-04-18 2015-11-19 ソニー株式会社 高周波スイッチ用半導体装置、高周波スイッチおよび高周波モジュール

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3127253B2 (ja) * 1991-09-17 2001-01-22 日本電信電話株式会社 Soi型半導体装置およびその製造方法
JPH06268224A (ja) * 1993-03-12 1994-09-22 Mitsubishi Electric Corp 電界効果型トランジスタを含む半導体装置
JPH06275832A (ja) * 1993-03-18 1994-09-30 Toshiba Corp 薄膜トランジスタおよびその製造方法
JPH1048610A (ja) * 1996-07-31 1998-02-20 Furontetsuku:Kk 液晶表示素子
JP2000216391A (ja) * 1999-01-25 2000-08-04 Sony Corp Soi型半導体装置の製造方法
JP2005236202A (ja) * 2004-02-23 2005-09-02 Seiko Epson Corp 半導体装置およびその製造方法

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