JP2023554134A5 - - Google Patents

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Publication number
JP2023554134A5
JP2023554134A5 JP2023537658A JP2023537658A JP2023554134A5 JP 2023554134 A5 JP2023554134 A5 JP 2023554134A5 JP 2023537658 A JP2023537658 A JP 2023537658A JP 2023537658 A JP2023537658 A JP 2023537658A JP 2023554134 A5 JP2023554134 A5 JP 2023554134A5
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JP
Japan
Prior art keywords
layer
silicon carbide
main surface
forming
insulating material
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Application number
JP2023537658A
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English (en)
Japanese (ja)
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JP7788457B2 (ja
JP2023554134A (ja
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Priority claimed from EP20216084.2A external-priority patent/EP4016645B1/en
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Publication of JP2023554134A publication Critical patent/JP2023554134A/ja
Publication of JP2023554134A5 publication Critical patent/JP2023554134A5/ja
Application granted granted Critical
Publication of JP7788457B2 publication Critical patent/JP7788457B2/ja
Active legal-status Critical Current
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JP2023537658A 2020-12-21 2021-12-02 炭化珪素パワーデバイスおよびその製造方法 Active JP7788457B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP20216084.2A EP4016645B1 (en) 2020-12-21 2020-12-21 Silicon carbide power device and method for manufacturing the same
EP20216084.2 2020-12-21
PCT/EP2021/083908 WO2022135862A1 (en) 2020-12-21 2021-12-02 Silicon carbide power device and method for manufacturing the same

Publications (3)

Publication Number Publication Date
JP2023554134A JP2023554134A (ja) 2023-12-26
JP2023554134A5 true JP2023554134A5 (enExample) 2025-06-16
JP7788457B2 JP7788457B2 (ja) 2025-12-18

Family

ID=73856416

Family Applications (1)

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JP2023537658A Active JP7788457B2 (ja) 2020-12-21 2021-12-02 炭化珪素パワーデバイスおよびその製造方法

Country Status (5)

Country Link
US (1) US20240079454A1 (enExample)
EP (1) EP4016645B1 (enExample)
JP (1) JP7788457B2 (enExample)
CN (1) CN116615806A (enExample)
WO (1) WO2022135862A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN115497917B (zh) * 2022-08-05 2025-04-22 北京智慧能源研究院 一种碳化硅芯片封装结构
JP2024104186A (ja) * 2023-01-23 2024-08-02 株式会社デンソー 炭化珪素基板、炭化珪素ウェハ、炭化珪素半導体装置
US20240290879A1 (en) * 2023-02-27 2024-08-29 Globalfoundries U.S. Inc. Field-effect transistors with deposited gate dielectric layers
WO2025126658A1 (ja) * 2023-12-15 2025-06-19 富士電機株式会社 半導体装置および半導体装置の製造方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0851203A (ja) * 1994-08-08 1996-02-20 Mitsubishi Electric Corp 半導体装置およびその製造方法
DE19640308A1 (de) 1996-09-30 1998-04-02 Siemens Ag Leistungs-MOS-Bauelement
WO2017047286A1 (ja) * 2015-09-16 2017-03-23 富士電機株式会社 半導体装置
EP3227924B1 (en) 2016-02-02 2020-07-22 ABB Power Grids Switzerland AG Power semiconductor device
JP6662092B2 (ja) 2016-02-23 2020-03-11 株式会社デンソー 化合物半導体装置の製造方法
JP7144329B2 (ja) * 2017-01-25 2022-09-29 ローム株式会社 半導体装置
CN110366783B (zh) * 2017-03-03 2023-04-21 日立能源瑞士股份公司 碳化硅超结功率半导体器件及用于制造该器件的方法
US10056289B1 (en) * 2017-04-20 2018-08-21 International Business Machines Corporation Fabrication of vertical transport fin field effect transistors with a self-aligned separator and an isolation region with an air gap
JP6932997B2 (ja) 2017-05-25 2021-09-08 富士電機株式会社 半導体装置及びその製造方法
JP7327905B2 (ja) * 2017-07-07 2023-08-16 株式会社デンソー 半導体装置およびその製造方法
JP2019102556A (ja) * 2017-11-29 2019-06-24 富士電機株式会社 半導体装置および半導体装置の製造方法
GB2572442A (en) * 2018-03-29 2019-10-02 Cambridge Entpr Ltd Power semiconductor device with a double gate structure
JP7259215B2 (ja) 2018-06-01 2023-04-18 富士電機株式会社 絶縁ゲート型半導体装置及び絶縁ゲート型半導体装置の製造方法
WO2020114666A1 (en) * 2018-12-07 2020-06-11 Abb Schweiz Ag A vertical silicon carbide power mosfet and igbt and a method of manufacturing the same

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