JP2020120115A - ウェーハ剥離洗浄装置 - Google Patents
ウェーハ剥離洗浄装置 Download PDFInfo
- Publication number
- JP2020120115A JP2020120115A JP2020006835A JP2020006835A JP2020120115A JP 2020120115 A JP2020120115 A JP 2020120115A JP 2020006835 A JP2020006835 A JP 2020006835A JP 2020006835 A JP2020006835 A JP 2020006835A JP 2020120115 A JP2020120115 A JP 2020120115A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- peeling
- wafers
- suction pad
- cleaning
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 144
- 235000012431 wafers Nutrition 0.000 claims description 490
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 59
- 238000000926 separation method Methods 0.000 claims description 34
- 239000000853 adhesive Substances 0.000 claims description 18
- 230000001070 adhesive effect Effects 0.000 claims description 17
- 239000005871 repellent Substances 0.000 claims description 6
- 239000000463 material Substances 0.000 claims 1
- 238000001514 detection method Methods 0.000 abstract description 20
- 230000002265 prevention Effects 0.000 abstract description 14
- 230000004044 response Effects 0.000 abstract description 2
- 239000007788 liquid Substances 0.000 description 23
- 238000011084 recovery Methods 0.000 description 18
- 238000000034 method Methods 0.000 description 17
- 238000005520 cutting process Methods 0.000 description 12
- 238000001179 sorption measurement Methods 0.000 description 11
- 230000002950 deficient Effects 0.000 description 10
- 238000003825 pressing Methods 0.000 description 9
- 238000005192 partition Methods 0.000 description 7
- 230000008569 process Effects 0.000 description 7
- 239000011347 resin Substances 0.000 description 6
- 229920005989 resin Polymers 0.000 description 6
- 230000007246 mechanism Effects 0.000 description 5
- 230000002940 repellent Effects 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 3
- 239000010935 stainless steel Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000004299 exfoliation Methods 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 239000003463 adsorbent Substances 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- NBVXSUQYWXRMNV-UHFFFAOYSA-N fluoromethane Chemical compound FC NBVXSUQYWXRMNV-UHFFFAOYSA-N 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000011435 rock Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000000638 solvent extraction Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/67706—Mechanical details, e.g. roller, belt
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G49/00—Conveying systems characterised by their application for specified purposes not otherwise provided for
- B65G49/05—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
- B65G49/07—Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for semiconductor wafers Not used, see H01L21/677
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Mechanical Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- General Engineering & Computer Science (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019007570 | 2019-01-21 | ||
JP2019007568 | 2019-01-21 | ||
JP2019007570 | 2019-01-21 | ||
JP2019007569 | 2019-01-21 | ||
JP2019007568 | 2019-01-21 | ||
JP2019007569 | 2019-01-21 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020120115A true JP2020120115A (ja) | 2020-08-06 |
JP7504596B2 JP7504596B2 (ja) | 2024-06-24 |
Family
ID=71735589
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2020006835A Active JP7504596B2 (ja) | 2019-01-21 | 2020-01-20 | ウェーハ剥離洗浄装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7504596B2 (ko) |
KR (2) | KR102654129B1 (ko) |
CN (1) | CN113302720A (ko) |
WO (1) | WO2020153307A1 (ko) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102507055B1 (ko) * | 2022-10-28 | 2023-03-07 | 손귀욱 | 변위센서를 기반으로 한 웨이퍼 낱장 분리장치 |
KR102519871B1 (ko) * | 2022-10-28 | 2023-04-11 | 손귀욱 | 반도체 웨이퍼 낱장 분리시스템 |
KR102507049B1 (ko) * | 2022-10-28 | 2023-03-07 | 손귀욱 | 듀얼 박리 시스템을 기반으로 한 웨이퍼 낱장 분리장치 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1022238A (ja) * | 1996-06-29 | 1998-01-23 | Komatsu Electron Metals Co Ltd | 半導体ウェハのエアーブロー装置 |
JP4126571B2 (ja) * | 1998-04-01 | 2008-07-30 | 株式会社東京精密 | ウェーハ剥離洗浄装置 |
JP2000208449A (ja) | 1999-01-12 | 2000-07-28 | Mitsubishi Materials Corp | ウェ―ハの剥離方法および剥離装置 |
JP2001189293A (ja) | 2000-01-05 | 2001-07-10 | Enya Systems Ltd | ウエ−ハ貼付方法及び装置 |
JP2002016032A (ja) * | 2000-06-30 | 2002-01-18 | Yasunaga Corp | ウェハー洗浄装置 |
JP2002103262A (ja) | 2000-09-27 | 2002-04-09 | Nippei Toyama Corp | 半導体ウェーハの吸着装置 |
JP2007119216A (ja) * | 2005-10-31 | 2007-05-17 | Toyama Kikai Kk | 太陽電池セルの吸着装置 |
JP3149712U (ja) * | 2009-01-27 | 2009-04-09 | 株式会社チャレンジ | ウエハ剥離装置 |
KR101127655B1 (ko) * | 2010-04-16 | 2012-07-16 | 금오공과대학교 산학협력단 | 워터젯을 이용한 태양전지용 실리콘 웨이퍼 박판 분리장치 및 이를 이용한 분리 방법 |
JP5296741B2 (ja) * | 2010-05-24 | 2013-09-25 | トヤマキカイ株式会社 | 太陽電池セルの移送装置およびその移送方法 |
JP5715540B2 (ja) | 2011-10-06 | 2015-05-07 | 秀和工業株式会社 | 固形接着剤を用いたウエーハの貼付方法及び貼付装置 |
JP5909453B2 (ja) | 2013-03-07 | 2016-04-26 | 東京エレクトロン株式会社 | 剥離装置、剥離システムおよび剥離方法 |
JP5849201B2 (ja) * | 2013-05-28 | 2016-01-27 | パナソニックIpマネジメント株式会社 | 切り残し部除去装置 |
JP6233570B2 (ja) | 2013-10-03 | 2017-11-22 | パナソニックIpマネジメント株式会社 | ウエハ洗浄装置 |
JP5982650B2 (ja) * | 2013-12-06 | 2016-08-31 | パナソニックIpマネジメント株式会社 | ウエハ剥離装置 |
JP6064015B2 (ja) | 2015-10-14 | 2017-01-18 | 東京エレクトロン株式会社 | 剥離装置、剥離システムおよび剥離方法 |
JP6978840B2 (ja) | 2017-02-28 | 2021-12-08 | 株式会社Screenホールディングス | 基板処理装置および基板保持装置 |
-
2020
- 2020-01-20 KR KR1020217022130A patent/KR102654129B1/ko active IP Right Grant
- 2020-01-20 JP JP2020006835A patent/JP7504596B2/ja active Active
- 2020-01-20 WO PCT/JP2020/001753 patent/WO2020153307A1/ja active Application Filing
- 2020-01-20 CN CN202080009605.0A patent/CN113302720A/zh active Pending
- 2020-01-20 KR KR1020237045329A patent/KR20240007692A/ko active Application Filing
Also Published As
Publication number | Publication date |
---|---|
KR102654129B1 (ko) | 2024-04-04 |
KR20240007692A (ko) | 2024-01-16 |
CN113302720A (zh) | 2021-08-24 |
KR20210100185A (ko) | 2021-08-13 |
WO2020153307A1 (ja) | 2020-07-30 |
JP7504596B2 (ja) | 2024-06-24 |
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