JP2017026354A5 - - Google Patents

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JP2017026354A5
JP2017026354A5 JP2015142390A JP2015142390A JP2017026354A5 JP 2017026354 A5 JP2017026354 A5 JP 2017026354A5 JP 2015142390 A JP2015142390 A JP 2015142390A JP 2015142390 A JP2015142390 A JP 2015142390A JP 2017026354 A5 JP2017026354 A5 JP 2017026354A5
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defect
magnetic
tube
cross
range
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JP2015142390A
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JP6579840B2 (ja
JP2017026354A (ja
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Priority claimed from JP2015142390A external-priority patent/JP6579840B2/ja
Priority to JP2015142390A priority Critical patent/JP6579840B2/ja
Priority to SG11201800262YA priority patent/SG11201800262YA/en
Priority to PCT/JP2016/067808 priority patent/WO2017010215A1/ja
Priority to KR1020187003583A priority patent/KR102501069B1/ko
Priority to EP16824195.8A priority patent/EP3336533B1/en
Priority to CN201680041554.3A priority patent/CN107850571B/zh
Priority to US15/744,700 priority patent/US10539535B2/en
Publication of JP2017026354A publication Critical patent/JP2017026354A/ja
Priority to SA518390730A priority patent/SA518390730B1/ar
Publication of JP2017026354A5 publication Critical patent/JP2017026354A5/ja
Publication of JP6579840B2 publication Critical patent/JP6579840B2/ja
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JP2015142390A 2015-07-16 2015-07-16 欠陥測定方法、欠陥測定装置、および検査プローブ Active JP6579840B2 (ja)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP2015142390A JP6579840B2 (ja) 2015-07-16 2015-07-16 欠陥測定方法、欠陥測定装置、および検査プローブ
US15/744,700 US10539535B2 (en) 2015-07-16 2016-06-15 Defect measurement method, defect measurement device, and testing probe
PCT/JP2016/067808 WO2017010215A1 (ja) 2015-07-16 2016-06-15 欠陥測定方法、欠陥測定装置、および検査プローブ
KR1020187003583A KR102501069B1 (ko) 2015-07-16 2016-06-15 결함 측정 방법, 결함 측정 장치 및 검사 프로브
EP16824195.8A EP3336533B1 (en) 2015-07-16 2016-06-15 Defect measurement method and defect measurement device
CN201680041554.3A CN107850571B (zh) 2015-07-16 2016-06-15 缺陷测量方法、缺陷测量装置及检查探针
SG11201800262YA SG11201800262YA (en) 2015-07-16 2016-06-15 Defect measurement method, defect measurement device, and testing probe
SA518390730A SA518390730B1 (ar) 2015-07-16 2018-01-11 طريقة لقياس العيوب، وجهاز لقياسها، ومسبار اختبار

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2015142390A JP6579840B2 (ja) 2015-07-16 2015-07-16 欠陥測定方法、欠陥測定装置、および検査プローブ

Publications (3)

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JP2017026354A JP2017026354A (ja) 2017-02-02
JP2017026354A5 true JP2017026354A5 (enrdf_load_stackoverflow) 2018-04-12
JP6579840B2 JP6579840B2 (ja) 2019-09-25

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JP2015142390A Active JP6579840B2 (ja) 2015-07-16 2015-07-16 欠陥測定方法、欠陥測定装置、および検査プローブ

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US (1) US10539535B2 (enrdf_load_stackoverflow)
EP (1) EP3336533B1 (enrdf_load_stackoverflow)
JP (1) JP6579840B2 (enrdf_load_stackoverflow)
KR (1) KR102501069B1 (enrdf_load_stackoverflow)
CN (1) CN107850571B (enrdf_load_stackoverflow)
SA (1) SA518390730B1 (enrdf_load_stackoverflow)
SG (1) SG11201800262YA (enrdf_load_stackoverflow)
WO (1) WO2017010215A1 (enrdf_load_stackoverflow)

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CN113777154B (zh) * 2021-09-09 2024-06-07 国家石油天然气管网集团有限公司华南分公司 一种增强涡流传感器线圈灵敏度的方法
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