JP2016534556A5 - - Google Patents

Download PDF

Info

Publication number
JP2016534556A5
JP2016534556A5 JP2016533318A JP2016533318A JP2016534556A5 JP 2016534556 A5 JP2016534556 A5 JP 2016534556A5 JP 2016533318 A JP2016533318 A JP 2016533318A JP 2016533318 A JP2016533318 A JP 2016533318A JP 2016534556 A5 JP2016534556 A5 JP 2016534556A5
Authority
JP
Japan
Prior art keywords
heating elements
electrostatic chuck
insulating base
yttrium
electrode assembly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016533318A
Other languages
English (en)
Japanese (ja)
Other versions
JP2016534556A (ja
JP6441927B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US2014/048182 external-priority patent/WO2015020813A1/en
Publication of JP2016534556A publication Critical patent/JP2016534556A/ja
Publication of JP2016534556A5 publication Critical patent/JP2016534556A5/ja
Application granted granted Critical
Publication of JP6441927B2 publication Critical patent/JP6441927B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2016533318A 2013-08-06 2014-07-25 局部的に加熱されるマルチゾーン式の基板支持体 Expired - Fee Related JP6441927B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201361862866P 2013-08-06 2013-08-06
US61/862,866 2013-08-06
PCT/US2014/048182 WO2015020813A1 (en) 2013-08-06 2014-07-25 Locally heated multi-zone substrate support

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2018219072A Division JP2019047132A (ja) 2013-08-06 2018-11-22 局部的に加熱されるマルチゾーン式の基板支持体

Publications (3)

Publication Number Publication Date
JP2016534556A JP2016534556A (ja) 2016-11-04
JP2016534556A5 true JP2016534556A5 (enExample) 2017-04-27
JP6441927B2 JP6441927B2 (ja) 2018-12-19

Family

ID=52448462

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2016533318A Expired - Fee Related JP6441927B2 (ja) 2013-08-06 2014-07-25 局部的に加熱されるマルチゾーン式の基板支持体
JP2018219072A Pending JP2019047132A (ja) 2013-08-06 2018-11-22 局部的に加熱されるマルチゾーン式の基板支持体

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2018219072A Pending JP2019047132A (ja) 2013-08-06 2018-11-22 局部的に加熱されるマルチゾーン式の基板支持体

Country Status (6)

Country Link
US (3) US9472434B2 (enExample)
JP (2) JP6441927B2 (enExample)
KR (2) KR101905158B1 (enExample)
CN (1) CN105408993A (enExample)
TW (3) TWI641074B (enExample)
WO (1) WO2015020813A1 (enExample)

Families Citing this family (76)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW201436091A (zh) * 2013-01-30 2014-09-16 京瓷股份有限公司 試料保持具及使用其之電漿蝕刻裝置
CN105408993A (zh) * 2013-08-06 2016-03-16 应用材料公司 局部加热的多区域基板支撑件
US9923259B2 (en) 2013-08-15 2018-03-20 Ooo Siemens Device for radio-frequency power coupling and method of using the device
US9754809B2 (en) * 2013-11-11 2017-09-05 Western Alliance Bank Tri-modal carrier for a semiconductive wafer
US10236202B2 (en) * 2013-11-11 2019-03-19 Diablo Capital, Inc. System and method for adhering a semiconductive wafer to a mobile electrostatic carrier through a vacuum
US9460950B2 (en) 2013-12-06 2016-10-04 Applied Materials, Inc. Wafer carrier for smaller wafers and wafer pieces
US9873180B2 (en) 2014-10-17 2018-01-23 Applied Materials, Inc. CMP pad construction with composite material properties using additive manufacturing processes
KR20240015167A (ko) 2014-10-17 2024-02-02 어플라이드 머티어리얼스, 인코포레이티드 애디티브 제조 프로세스들을 이용한 복합 재료 특성들을 갖는 cmp 패드 구성
US10875153B2 (en) 2014-10-17 2020-12-29 Applied Materials, Inc. Advanced polishing pad materials and formulations
US11745302B2 (en) 2014-10-17 2023-09-05 Applied Materials, Inc. Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process
US9776361B2 (en) 2014-10-17 2017-10-03 Applied Materials, Inc. Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles
KR102398067B1 (ko) * 2014-11-05 2022-05-13 삼성디스플레이 주식회사 정전 척
JP6129451B1 (ja) * 2015-08-20 2017-05-17 日本碍子株式会社 静電チャックヒータ
US10237916B2 (en) 2015-09-30 2019-03-19 Tokyo Electron Limited Systems and methods for ESC temperature control
US10154542B2 (en) * 2015-10-19 2018-12-11 Watlow Electric Manufacturing Company Composite device with cylindrical anisotropic thermal conductivity
US20180317554A1 (en) 2015-10-30 2018-11-08 British American Tobacco (Investments) Limited Article for use with apparatus for heating smokable material
US20170119051A1 (en) * 2015-10-30 2017-05-04 British American Tobacco (Investments) Limited Article for Use with Apparatus for Heating Smokable Material
US10593574B2 (en) 2015-11-06 2020-03-17 Applied Materials, Inc. Techniques for combining CMP process tracking data with 3D printed CMP consumables
US10391605B2 (en) 2016-01-19 2019-08-27 Applied Materials, Inc. Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process
KR102329513B1 (ko) * 2016-05-10 2021-11-23 램 리써치 코포레이션 적층된 히터와 히터 전압 입력부들 사이의 연결부들
KR102903953B1 (ko) 2016-06-29 2025-12-23 니코벤처스 트레이딩 리미티드 흡연가능 물질을 가열하기 위한 장치
CN109414072A (zh) 2016-06-29 2019-03-01 英美烟草(投资)有限公司 用于加热可抽吸材料的装置
KR102581356B1 (ko) 2016-08-30 2023-09-21 삼성전자주식회사 기판 처리 장치의 이상 진단 방법 및 이를 수행하기 위한 장치
US11631597B2 (en) * 2017-02-01 2023-04-18 Ngk Spark Plug Co., Ltd. Holding apparatus
JP6341457B1 (ja) * 2017-03-29 2018-06-13 Toto株式会社 静電チャック
KR101983353B1 (ko) * 2017-04-04 2019-05-29 (주)티티에스 기판 지지대
KR101983344B1 (ko) * 2017-04-04 2019-05-29 (주)티티에스 기판 지지대
US11289355B2 (en) * 2017-06-02 2022-03-29 Lam Research Corporation Electrostatic chuck for use in semiconductor processing
KR102435888B1 (ko) * 2017-07-04 2022-08-25 삼성전자주식회사 정전 척, 기판 처리 장치 및 그를 이용한 반도체 소자의 제조방법
US11471999B2 (en) 2017-07-26 2022-10-18 Applied Materials, Inc. Integrated abrasive polishing pads and manufacturing methods
US11469084B2 (en) 2017-09-05 2022-10-11 Lam Research Corporation High temperature RF connection with integral thermal choke
US10811296B2 (en) 2017-09-20 2020-10-20 Applied Materials, Inc. Substrate support with dual embedded electrodes
US10510575B2 (en) * 2017-09-20 2019-12-17 Applied Materials, Inc. Substrate support with multiple embedded electrodes
CN212365925U (zh) * 2017-11-21 2021-01-15 沃特洛电气制造公司 一种支撑基座
DE102017223592B4 (de) * 2017-12-21 2023-11-09 Meyer Burger (Germany) Gmbh System zur elektrisch entkoppelten, homogenen Temperierung einer Elektrode mittels Wärmeleitrohren sowie Bearbeitungsanlage mit einem solchen System
EP3749215A4 (en) * 2018-02-07 2021-12-01 Atherosys, Inc. DEVICE AND METHOD FOR CONTROLLING THE ULTRASONIC RECORDING OF THE PERIPHERAL ARTERIES IN THE TRANSVERSAL PLANE
US11848177B2 (en) 2018-02-23 2023-12-19 Lam Research Corporation Multi-plate electrostatic chucks with ceramic baseplates
KR20250028527A (ko) * 2018-04-12 2025-02-28 에이에스엠엘 네델란즈 비.브이. 정전 클램프를 포함하는 장치 및 그 장치의 작동 방법
EP3787480A4 (en) 2018-04-30 2022-01-26 Atherosys, Inc. METHOD AND APPARATUS FOR THE AUTOMATIC DETECTION OF ATHEROMAS IN PERIPHERAL ARTERIES
US10555412B2 (en) 2018-05-10 2020-02-04 Applied Materials, Inc. Method of controlling ion energy distribution using a pulse generator with a current-return output stage
US11183368B2 (en) 2018-08-02 2021-11-23 Lam Research Corporation RF tuning systems including tuning circuits having impedances for setting and adjusting parameters of electrodes in electrostatic chucks
KR20210042171A (ko) 2018-09-04 2021-04-16 어플라이드 머티어리얼스, 인코포레이티드 진보한 폴리싱 패드들을 위한 제형들
US11476145B2 (en) 2018-11-20 2022-10-18 Applied Materials, Inc. Automatic ESC bias compensation when using pulsed DC bias
US11430639B2 (en) * 2018-12-13 2022-08-30 Xia Tai Xin Semiconductor (Qing Dao) Ltd. Plasma processing system
JP2022514524A (ja) * 2018-12-17 2022-02-14 アプライド マテリアルズ インコーポレイテッド 局所加熱によるエッチング深さの制御方法
KR20250100790A (ko) 2019-01-22 2025-07-03 어플라이드 머티어리얼스, 인코포레이티드 펄스 전압 파형을 제어하기 위한 피드백 루프
US11508554B2 (en) 2019-01-24 2022-11-22 Applied Materials, Inc. High voltage filter assembly
CN113439330A (zh) 2019-02-12 2021-09-24 朗姆研究公司 具有陶瓷单体的静电卡盘
US11488796B2 (en) 2019-04-24 2022-11-01 Applied Materials, Inc. Thermal break for high-frequency antennae
CN112071734B (zh) * 2019-06-11 2023-10-31 中微半导体设备(上海)股份有限公司 绝缘材料窗及其制造方法及电感耦合等离子体处理装置
US11462388B2 (en) 2020-07-31 2022-10-04 Applied Materials, Inc. Plasma processing assembly using pulsed-voltage and radio-frequency power
JP2022048089A (ja) * 2020-09-14 2022-03-25 東京エレクトロン株式会社 載置台、基板処理装置及び吸着方法
US11798790B2 (en) 2020-11-16 2023-10-24 Applied Materials, Inc. Apparatus and methods for controlling ion energy distribution
US11901157B2 (en) 2020-11-16 2024-02-13 Applied Materials, Inc. Apparatus and methods for controlling ion energy distribution
WO2022146667A1 (en) 2020-12-29 2022-07-07 Mattson Technology, Inc. Electrostatic chuck assembly for plasma processing apparatus
US11881423B2 (en) 2021-02-09 2024-01-23 Applied Materials, Inc. Electrostatic chuck with metal bond
US11495470B1 (en) 2021-04-16 2022-11-08 Applied Materials, Inc. Method of enhancing etching selectivity using a pulsed plasma
US11791138B2 (en) 2021-05-12 2023-10-17 Applied Materials, Inc. Automatic electrostatic chuck bias compensation during plasma processing
US11948780B2 (en) 2021-05-12 2024-04-02 Applied Materials, Inc. Automatic electrostatic chuck bias compensation during plasma processing
US11967483B2 (en) 2021-06-02 2024-04-23 Applied Materials, Inc. Plasma excitation with ion energy control
US12525441B2 (en) 2021-06-09 2026-01-13 Applied Materials, Inc. Plasma chamber and chamber component cleaning methods
US12148595B2 (en) 2021-06-09 2024-11-19 Applied Materials, Inc. Plasma uniformity control in pulsed DC plasma chamber
US12525433B2 (en) 2021-06-09 2026-01-13 Applied Materials, Inc. Method and apparatus to reduce feature charging in plasma processing chamber
US11810760B2 (en) 2021-06-16 2023-11-07 Applied Materials, Inc. Apparatus and method of ion current compensation
US11569066B2 (en) 2021-06-23 2023-01-31 Applied Materials, Inc. Pulsed voltage source for plasma processing applications
US11776788B2 (en) 2021-06-28 2023-10-03 Applied Materials, Inc. Pulsed voltage boost for substrate processing
US11476090B1 (en) 2021-08-24 2022-10-18 Applied Materials, Inc. Voltage pulse time-domain multiplexing
US12106938B2 (en) 2021-09-14 2024-10-01 Applied Materials, Inc. Distortion current mitigation in a radio frequency plasma processing chamber
CN115831699A (zh) * 2021-09-17 2023-03-21 东京毅力科创株式会社 等离子体处理装置
KR20230071629A (ko) * 2021-11-16 2023-05-23 삼성전자주식회사 플라즈마 처리 장치 및 이를 이용한 반도체 소자 제조 방법
US11694876B2 (en) 2021-12-08 2023-07-04 Applied Materials, Inc. Apparatus and method for delivering a plurality of waveform signals during plasma processing
US11972924B2 (en) 2022-06-08 2024-04-30 Applied Materials, Inc. Pulsed voltage source for plasma processing applications
US12315732B2 (en) 2022-06-10 2025-05-27 Applied Materials, Inc. Method and apparatus for etching a semiconductor substrate in a plasma etch chamber
CN115172231B (zh) * 2022-09-08 2022-11-25 西北电子装备技术研究所(中国电子科技集团公司第二研究所) 一种带有气氛保护的快速升降温共晶加热台
US12272524B2 (en) 2022-09-19 2025-04-08 Applied Materials, Inc. Wideband variable impedance load for high volume manufacturing qualification and on-site diagnostics
US12111341B2 (en) 2022-10-05 2024-10-08 Applied Materials, Inc. In-situ electric field detection method and apparatus

Family Cites Families (78)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63257481A (ja) 1987-04-14 1988-10-25 Abisare:Kk 静電保持装置
JP2582410B2 (ja) * 1988-04-26 1997-02-19 東陶機器株式会社 静電チャック基板
JP3095790B2 (ja) * 1991-01-22 2000-10-10 富士電機株式会社 静電チャック
JPH07106317A (ja) * 1993-10-08 1995-04-21 Sony Corp 試料台
US5646814A (en) 1994-07-15 1997-07-08 Applied Materials, Inc. Multi-electrode electrostatic chuck
JPH08315965A (ja) 1994-09-29 1996-11-29 Tokyo Electron Ltd 加熱装置及びその製造方法、並びに処理装置
US5595241A (en) * 1994-10-07 1997-01-21 Sony Corporation Wafer heating chuck with dual zone backplane heating and segmented clamping member
US5671116A (en) 1995-03-10 1997-09-23 Lam Research Corporation Multilayered electrostatic chuck and method of manufacture thereof
JP3161310B2 (ja) 1995-12-14 2001-04-25 松下電器産業株式会社 電 池
JP3972379B2 (ja) 1995-12-14 2007-09-05 信越半導体株式会社 加熱炉
JPH09223729A (ja) * 1996-02-19 1997-08-26 Kyocera Corp 静電チャック
US6055150A (en) 1996-05-02 2000-04-25 Applied Materials, Inc. Multi-electrode electrostatic chuck having fuses in hollow cavities
JP3831009B2 (ja) 1996-06-25 2006-10-11 アプライド マテリアルズ インコーポレイテッド 半導体製造装置
US5846375A (en) * 1996-09-26 1998-12-08 Micron Technology, Inc. Area specific temperature control for electrode plates and chucks used in semiconductor processing equipment
JPH11354504A (ja) * 1998-06-08 1999-12-24 Sony Corp ガラス基板処理装置
JP3805134B2 (ja) * 1999-05-25 2006-08-02 東陶機器株式会社 絶縁性基板吸着用静電チャック
JP2001035907A (ja) * 1999-07-26 2001-02-09 Ulvac Japan Ltd 吸着装置
CN1207939C (zh) * 1999-09-29 2005-06-22 东京电子株式会社 多区电阻加热器
US6891263B2 (en) * 2000-02-07 2005-05-10 Ibiden Co., Ltd. Ceramic substrate for a semiconductor production/inspection device
JP2003234262A (ja) * 2000-02-08 2003-08-22 Ibiden Co Ltd 半導体製造・検査装置用セラミック基板
KR20020046214A (ko) 2000-12-11 2002-06-20 어드밴스드 세라믹스 인터내셔날 코포레이션 정전척 및 그 제조방법
US20050211385A1 (en) * 2001-04-30 2005-09-29 Lam Research Corporation, A Delaware Corporation Method and apparatus for controlling spatial temperature distribution
US6847014B1 (en) * 2001-04-30 2005-01-25 Lam Research Corporation Method and apparatus for controlling the spatial temperature distribution across the surface of a workpiece support
US7161121B1 (en) * 2001-04-30 2007-01-09 Lam Research Corporation Electrostatic chuck having radial temperature control capability
JP2002357838A (ja) 2001-05-31 2002-12-13 Hitachi Industries Co Ltd 基板貼り合わせ方法及びその装置
TW540583U (en) * 2001-08-20 2003-07-01 Helix Technology Inc Vapor deposition device
JP2003179128A (ja) 2001-12-11 2003-06-27 Ngk Spark Plug Co Ltd 静電チャック
JP2003243493A (ja) 2002-02-15 2003-08-29 Taiheiyo Cement Corp 双極型静電チャック
JP4067858B2 (ja) * 2002-04-16 2008-03-26 東京エレクトロン株式会社 Ald成膜装置およびald成膜方法
JP2004001993A (ja) * 2002-04-26 2004-01-08 Iwatani Internatl Corp 粒状ドライアイスの分配供給装置
JP3904986B2 (ja) * 2002-06-26 2007-04-11 京セラ株式会社 ウェハ支持部材
US6780294B1 (en) 2002-08-19 2004-08-24 Set, Tosoh Shield assembly for substrate processing chamber
US6770852B1 (en) * 2003-02-27 2004-08-03 Lam Research Corporation Critical dimension variation compensation across a wafer by means of local wafer temperature control
JP3491637B2 (ja) 2003-04-17 2004-01-26 松下電工株式会社 高周波リレー
JP2004356350A (ja) * 2003-05-28 2004-12-16 Kyocera Corp 静電チャック
JP2005012144A (ja) * 2003-06-23 2005-01-13 Kyocera Corp 静電チャック
US7916447B2 (en) 2003-07-08 2011-03-29 Future Vision Inc. Electrostatic chuck for substrate stage, electrode used for the chuck, and treating system having the chuck and electrode
JP4278046B2 (ja) * 2003-11-10 2009-06-10 モメンティブ・パフォーマンス・マテリアルズ・ジャパン合同会社 ヒータ機構付き静電チャック
JP2004253799A (ja) * 2004-02-16 2004-09-09 Ibiden Co Ltd 半導体製造・検査装置
DE112005000621B4 (de) 2004-03-19 2019-01-31 Creative Technology Corporation Bipolare elektrostatische Haltevorrichtung
JP4761723B2 (ja) * 2004-04-12 2011-08-31 日本碍子株式会社 基板加熱装置
JP4237148B2 (ja) 2005-02-17 2009-03-11 住友大阪セメント株式会社 黒色微粒子分散液とそれを用いた黒色遮光膜及び黒色遮光膜付き基材
US20060096946A1 (en) * 2004-11-10 2006-05-11 General Electric Company Encapsulated wafer processing device and process for making thereof
JP2007088411A (ja) * 2005-06-28 2007-04-05 Hitachi High-Technologies Corp 静電吸着装置およびウエハ処理装置ならびにプラズマ処理方法
JP2007106317A (ja) 2005-10-14 2007-04-26 Toyota Motor Corp タンク
WO2007066572A1 (ja) 2005-12-06 2007-06-14 Creative Technology Corporation 静電チャック用電極シート及び静電チャック
JP2007324260A (ja) * 2006-05-31 2007-12-13 Tomoegawa Paper Co Ltd 静電チャック部材および静電チャック装置
JP2008052246A (ja) 2006-07-28 2008-03-06 Olympus Imaging Corp デジタルカメラ
JP2008041993A (ja) * 2006-08-08 2008-02-21 Shinko Electric Ind Co Ltd 静電チャック
US20080062609A1 (en) 2006-08-10 2008-03-13 Shinji Himori Electrostatic chuck device
JP2008227001A (ja) 2007-03-09 2008-09-25 Rohm Co Ltd 赤外線リフレクター及び加熱装置
JP5018244B2 (ja) * 2007-05-30 2012-09-05 住友大阪セメント株式会社 静電チャック
US7667944B2 (en) 2007-06-29 2010-02-23 Praxair Technology, Inc. Polyceramic e-chuck
US7989022B2 (en) 2007-07-20 2011-08-02 Micron Technology, Inc. Methods of processing substrates, electrostatic carriers for retaining substrates for processing, and assemblies comprising electrostatic carriers having substrates electrostatically bonded thereto
JP5112808B2 (ja) 2007-10-15 2013-01-09 筑波精工株式会社 静電型補強装置
JP5307445B2 (ja) * 2008-04-28 2013-10-02 日本碍子株式会社 基板保持体及びその製造方法
TWI475594B (zh) 2008-05-19 2015-03-01 恩特格林斯公司 靜電夾頭
WO2010004915A1 (ja) * 2008-07-08 2010-01-14 株式会社クリエイティブ テクノロジー 双極型静電チャック
US8064185B2 (en) 2008-09-05 2011-11-22 Applied Materials, Inc. Electrostatic chuck electrical balancing circuit repair
JP5620090B2 (ja) 2008-12-15 2014-11-05 キヤノンアネルバ株式会社 基板処理装置、熱処理基板の製造方法及び半導体デバイスの製造方法
KR101001454B1 (ko) 2009-01-23 2010-12-14 삼성모바일디스플레이주식회사 정전척 및 이를 구비한 유기전계발광 소자의 제조장치
SG180882A1 (en) * 2009-12-15 2012-07-30 Lam Res Corp Adjusting substrate temperature to improve cd uniformity
JP5423632B2 (ja) * 2010-01-29 2014-02-19 住友大阪セメント株式会社 静電チャック装置
JP5644161B2 (ja) * 2010-04-12 2014-12-24 住友電気工業株式会社 半導体保持用の静電チャックおよびその製造方法
CN103081088B (zh) 2010-08-06 2016-04-06 应用材料公司 静电夹盘和使用静电夹盘的方法
US8546732B2 (en) * 2010-11-10 2013-10-01 Lam Research Corporation Heating plate with planar heater zones for semiconductor processing
US20120227886A1 (en) 2011-03-10 2012-09-13 Taipei Semiconductor Manufacturing Company, Ltd. Substrate Assembly Carrier Using Electrostatic Force
KR101981766B1 (ko) 2011-06-02 2019-05-23 어플라이드 머티어리얼스, 인코포레이티드 정전기 척 aln 유전체 수리
US9117867B2 (en) 2011-07-01 2015-08-25 Applied Materials, Inc. Electrostatic chuck assembly
US8624168B2 (en) * 2011-09-20 2014-01-07 Lam Research Corporation Heating plate with diode planar heater zones for semiconductor processing
JP6223983B2 (ja) 2011-09-30 2017-11-01 アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated 温度制御付き静電チャック
US20130086809A1 (en) 2011-10-05 2013-04-11 Agostino Difante Combined handi-hold serving spoon
KR102047001B1 (ko) 2012-10-16 2019-12-03 삼성디스플레이 주식회사 정전 척
WO2015013142A1 (en) * 2013-07-22 2015-01-29 Applied Materials, Inc. An electrostatic chuck for high temperature process applications
CN105408993A (zh) * 2013-08-06 2016-03-16 应用材料公司 局部加热的多区域基板支撑件
US9740111B2 (en) 2014-05-16 2017-08-22 Applied Materials, Inc. Electrostatic carrier for handling substrates for processing
US10978334B2 (en) 2014-09-02 2021-04-13 Applied Materials, Inc. Sealing structure for workpiece to substrate bonding in a processing chamber
US10707110B2 (en) * 2015-11-23 2020-07-07 Lam Research Corporation Matched TCR joule heater designs for electrostatic chucks

Similar Documents

Publication Publication Date Title
JP2016534556A5 (enExample)
JP6441927B2 (ja) 局部的に加熱されるマルチゾーン式の基板支持体
KR102348108B1 (ko) 온도 편차 특성이 개선된 기판 가열 장치
US9711386B2 (en) Electrostatic chuck for high temperature process applications
JP3582518B2 (ja) 抵抗発熱体回路パターンとそれを用いた基板処理装置
JP2011222977A5 (enExample)
JP6239894B2 (ja) 静電チャック
KR20170045105A (ko) 가열부재, 정전 척 및 세라믹 히터
JP2016529718A5 (enExample)
JP2015509280A5 (enExample)
KR20180005742A (ko) 투명한 정전 캐리어
JP2017506433A5 (enExample)
JP6877301B2 (ja) セラミックスヒータ
JP2015070166A (ja) チップ抵抗器およびその製造方法
US10679873B2 (en) Ceramic heater
JP2017174713A (ja) マルチゾーンに区分された加熱ヒータ
JP2019533309A (ja) 熱接触が制御された加熱装置
JP2016529735A5 (ja) 静電チャック
JP2015008189A (ja) 薄膜チップ抵抗器の製造方法
KR20170001497A (ko) 세라믹 히터
WO2020262368A1 (ja) 静電チャックヒータ
CN108695229A (zh) 陶瓷加热器
JP2010177698A (ja) 静電チャックの製造方法
KR101829227B1 (ko) 정전 플레이트의 구조가 개선된 정전척
KR101575859B1 (ko) 캡형 정전척의 제조방법