JP2014239123A - Processing method - Google Patents

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JP2014239123A
JP2014239123A JP2013120243A JP2013120243A JP2014239123A JP 2014239123 A JP2014239123 A JP 2014239123A JP 2013120243 A JP2013120243 A JP 2013120243A JP 2013120243 A JP2013120243 A JP 2013120243A JP 2014239123 A JP2014239123 A JP 2014239123A
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wafer
light
division
light emitting
starting point
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鈴木 稔
Minoru Suzuki
稔 鈴木
卓 岡村
Taku Okamura
卓 岡村
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Disco Corp
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Disco Abrasive Systems Ltd
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Abstract

PROBLEM TO BE SOLVED: To provide a processing method capable of efficiently producing the light-emitting chip which can efficiently extracting light mainly radiated from a back surface of a light-emitting layer.SOLUTION: A processing method comprises a division start point formation step; an adhesion step; a translucent substrate division step; and a wafer division step. In the division start point formation step, modified layers K are formed along division schedule lines on a wafer where light-emitting layers 2a are formed on each regions defined by a plurality of division schedule lines on a surface. In the adhesion step, the translucent substrate formed of a material transmitting light radiated from the light-emitting layer 2a, is adhered to a back surface of a wafer with a translucent resin 2e transmitting light radiated from the light-emitting layer 2a. In the translucent substrate division step, the translucent substrate is cut along the division schedule lines by a cutting blade to divide into a plurality of translucent members 2c. In the wafer division step, the wafer is divided into a plurality of chips 2b by applying external force to the wafer along the division schedule lines and using the modified layer K as a starting point.

Description

本発明は、発光ダイオード等の発光デバイスを形成する発光チップを製造する加工方法に関する。   The present invention relates to a processing method for manufacturing a light emitting chip for forming a light emitting device such as a light emitting diode.

LED(Light Emitting Diode)、LD(Laser Diode)等の光デバイスは、結晶成長用基板上にエピタキシャル層(結晶層)を成長させ、更に格子状の分割予定ラインで区画された各領域に形成される。その後、例えば結晶成長用基板を分割予定ラインに沿って分割して個片化することで、個々の光デバイスが製造されている。   Optical devices such as LEDs (Light Emitting Diodes) and LDs (Laser Diodes) are formed on each crystal growth substrate by growing an epitaxial layer (crystal layer) and partitioned by grid-shaped division lines. The Thereafter, for example, the individual optical devices are manufactured by dividing the crystal growth substrate along the planned division lines into individual pieces.

緑色や青色の光を出射する発光層がInGaN系のチップでは、サファイアが結晶成長用基板に一般的に用いられ、このサファイア基板上に順次n型GaN半導体層、InGaN発光層、p型GaN半導体層をエピタキシャル成長させる。そして、n型GaN半導体層とp型GaN半導体層のそれぞれに外部取り出し用電極が形成されて光デバイスが形成される。   In an InGaN-based chip that emits green or blue light, sapphire is generally used as a crystal growth substrate, and an n-type GaN semiconductor layer, an InGaN light-emitting layer, and a p-type GaN semiconductor are sequentially formed on the sapphire substrate. The layer is grown epitaxially. An external extraction electrode is formed on each of the n-type GaN semiconductor layer and the p-type GaN semiconductor layer to form an optical device.

LED等の光デバイスにおいては、より高い輝度が求められており、光の取り出し効率の向上が要望されている(例えば、特許文献1参照)。サファイア基板の厚みが薄すぎる場合には、GaN半導体層(発光層)の裏面側から出射した光が、サファイア基板を透過して、パッケージ基板で反射しGaN半導体層(発光層)側に再入斜してしまい、輝度がその分低下してしまうという問題がある。   In an optical device such as an LED, higher luminance is required, and an improvement in light extraction efficiency is desired (for example, see Patent Document 1). If the sapphire substrate is too thin, the light emitted from the back side of the GaN semiconductor layer (light emitting layer) is transmitted through the sapphire substrate, reflected by the package substrate, and reentered the GaN semiconductor layer (light emitting layer) side. There is a problem that the luminance is lowered and the luminance is lowered accordingly.

一方で、サファイア基板を厚くすることでGaN半導体層(発光層)の裏面側から出射する光が、パッケージ基板で反射しても再度GaN半導体層(発光層)に入斜することなく外部へ発光されるため、輝度の向上が図れるが、厚いサファイア基板を加工することは困難を極める。そのため、本発明の出願人は、表面に発光層が形成された薄いパッケージ基板の裏面側に透光性部材を貼着することで、GaN半導体層(発光層)の主に裏面から出射される光を効率よく取り出すことができる発光チップを提案している。   On the other hand, by increasing the thickness of the sapphire substrate, light emitted from the back side of the GaN semiconductor layer (light emitting layer) is emitted to the outside without entering the GaN semiconductor layer (light emitting layer) again even if it is reflected by the package substrate. Therefore, although the brightness can be improved, it is extremely difficult to process a thick sapphire substrate. Therefore, the applicant of the present invention emits light mainly from the back surface of the GaN semiconductor layer (light emitting layer) by sticking a translucent member to the back surface side of the thin package substrate having the light emitting layer formed on the front surface. A light-emitting chip that can efficiently extract light is proposed.

特開平4−10670号公報Japanese Patent Laid-Open No. 4-10670

しかし、発光チップ及び透光性部材は微細であるため、発光チップの裏面に透光性部材を樹脂で一つ一つ貼着することは相当な時間を要し、作業も繁雑であり生産性が悪い、という問題がある。   However, since the light-emitting chip and the light-transmitting member are fine, it takes a considerable amount of time to attach the light-transmitting members to the back surface of the light-emitting chip with resin, and the work is complicated and the productivity is high. There is a problem that is bad.

本発明は、上記問題に鑑みなされたもので、その目的は、発光層の主に裏面から出射される光を効率よく取り出すことができる発光チップを効率的に生産することができる加工方法を提供することである。   The present invention has been made in view of the above problems, and an object thereof is to provide a processing method capable of efficiently producing a light-emitting chip that can efficiently extract light emitted mainly from the back surface of the light-emitting layer. It is to be.

上述した課題を解決し、目的を達成するために、本発明の加工方法は、表面に発光層を備えたチップと、該チップの裏面側に透光性を有する透光性樹脂で貼着され且つ該発光層から発光された光を透過する材質で形成された透光性部材と、から形成された発光チップを製造する加工方法であって、基板の表面に複数の分割予定ラインによって複数の領域が区画され、この区画された領域に発光層が形成されたウエーハに、該ウエーハを分割するための、該分割予定ラインに沿って分割起点を形成する分割起点形成工程と、該分割起点形成工程を実施した後に、ウエーハの裏面に少なくともウエーハと同等の面積を有し且つ該発光層から発光される光を透過する材質で形成された透光性基板を、該発光層から発光された光を透過する透光性樹脂で貼着する貼着工程と、該貼着工程を実施した後に、該透光性基板を該分割予定ラインに沿って切削ブレードにより切削を行い、複数の透光性部材に分割する透光性基板分割工程と、該透光性基板分割工程を実施した後に、該ウエーハの該分割予定ラインに沿って外力を付与し該分割起点を起点に該ウエーハを複数のチップに分割するウエーハ分割工程と、を備えることを特徴とする。   In order to solve the above-described problems and achieve the object, the processing method of the present invention includes a chip having a light emitting layer on the surface and a translucent resin having translucency on the back side of the chip. And a light-emitting chip formed from a light-transmitting member formed of a material that transmits light emitted from the light-emitting layer, and a plurality of division lines on the surface of the substrate. A division starting point forming step for forming a division starting point along the planned division line for dividing the wafer into a wafer in which a region is divided and a light emitting layer is formed in the divided region, and formation of the division starting point After the process is performed, the light emitted from the light-emitting layer is formed on a translucent substrate formed of a material having at least an area equivalent to the wafer on the back surface of the wafer and transmitting light emitted from the light-emitting layer. Translucent resin that passes through Adhering step for adhering, and translucent substrate that, after carrying out the adhering step, cuts the translucent substrate with a cutting blade along the planned dividing line and divides the translucent substrate into a plurality of translucent members A wafer dividing step of applying an external force along the scheduled dividing line of the wafer and dividing the wafer into a plurality of chips starting from the dividing starting point after performing the dividing step and the translucent substrate dividing step; It is characterized by providing.

また、前記加工方法は、該分割起点形成工程における該分割起点は、該発光層側から該ウエーハにアブレーション加工又は切削ブレードを用いた切削加工を施すことにより、該表面に形成された分割起点溝であることが好ましい。   Further, in the processing method, the division starting point in the division starting point forming step is a division starting groove formed on the surface by subjecting the wafer to ablation processing or cutting using a cutting blade from the light emitting layer side. It is preferable that

また、前記加工方法は、該分割起点形成工程における該分割起点は、該裏面側から該ウエーハを透過する波長のレーザー光線を該分割予定ラインに沿って照射して、該ウエーハの内部に形成された改質層であることが好ましい。   Further, in the processing method, the division starting point in the division starting point forming step is formed inside the wafer by irradiating a laser beam having a wavelength that passes through the wafer from the back side along the planned dividing line. A modified layer is preferred.

本願発明の加工方法によれば、発光層を有する基板に透光性を有する透光性基板を貼着し、透光性基板を分割する。このために、輝度向上が可能なGaN半導体層(発光層)を有する基板の裏面に透光性部材を貼着した発光チップを効率的に生産することができる。   According to the processing method of the present invention, a translucent substrate having translucency is attached to a substrate having a light emitting layer, and the translucent substrate is divided. For this reason, it is possible to efficiently produce a light-emitting chip in which a translucent member is attached to the back surface of a substrate having a GaN semiconductor layer (light-emitting layer) capable of improving luminance.

図1(a)は、実施形態に係る加工方法により製造される発光チップを含んで構成される発光ダイオードの構成例を模式的に示す斜視図、図1(b)は、実施形態に係る加工方法により発光チップに加工されるウエーハの構成例を示す斜視図である。FIG. 1A is a perspective view schematically showing a configuration example of a light-emitting diode including a light-emitting chip manufactured by the processing method according to the embodiment, and FIG. 1B is a processing according to the embodiment. It is a perspective view which shows the structural example of the wafer processed into the light emitting chip by the method. 図2は、実施形態に係る加工方法の分割起点形成工程の概要を示す側断面図である。FIG. 2 is a side cross-sectional view illustrating an outline of a division starting point forming step of the processing method according to the embodiment. 図3は、実施形態に係る加工方法の貼着工程の概要を示す側断面図である。FIG. 3 is a side cross-sectional view illustrating an outline of a sticking step of the processing method according to the embodiment. 図4は、実施形態に係る加工方法の透光性基板分割工程の概要を示す側断面図である。FIG. 4 is a side sectional view showing an outline of a translucent substrate dividing step of the processing method according to the embodiment. 図5は、実施形態に係る加工方法のウエーハ分割工程の概要を示す側断面図である。FIG. 5 is a side sectional view showing an outline of the wafer dividing step of the processing method according to the embodiment. 図6は、実施形態に係る加工方法のウエーハ分割工程の要部の概要を示す側断面図である。FIG. 6 is a side sectional view showing an outline of a main part of the wafer dividing step of the processing method according to the embodiment. 図7は、実施形態の変形例1に係る加工方法の分割起点形成工程の概要を示す側断面図である。FIG. 7 is a side cross-sectional view illustrating an outline of the division starting point forming step of the processing method according to the first modification of the embodiment. 図8は、実施形態の変形例2に係る加工方法の分割起点形成工程の概要を示す側断面図である。FIG. 8 is a side cross-sectional view illustrating an outline of the division start point forming step of the processing method according to the second modification of the embodiment.

本発明を実施するための形態(実施形態)につき、図面を参照しつつ詳細に説明する。以下の実施形態に記載した内容により本発明が限定されるものではない。また、以下に記載した構成要素には、当業者が容易に想定できるもの、実質的に同一のものが含まれる。さらに、以下に記載した構成は適宜組み合わせることが可能である。また、本発明の要旨を逸脱しない範囲で構成の種々の省略、置換又は変更を行うことができる。   DESCRIPTION OF EMBODIMENTS Embodiments (embodiments) for carrying out the present invention will be described in detail with reference to the drawings. The present invention is not limited by the contents described in the following embodiments. The constituent elements described below include those that can be easily assumed by those skilled in the art and those that are substantially the same. Furthermore, the structures described below can be combined as appropriate. Various omissions, substitutions, or changes in the configuration can be made without departing from the scope of the present invention.

〔実施形態〕
実施形態に係る加工方法を、図1から図6に基づいて説明する。図1(a)は、実施形態に係る加工方法により製造される発光チップを含んで構成される発光ダイオードの構成例を模式的に示す斜視図、図1(b)は、実施形態に係る加工方法により発光チップに加工されるウエーハの構成例を示す斜視図、図2は、実施形態に係る加工方法の分割起点形成工程の概要を示す側断面図、図3は、実施形態に係る加工方法の貼着工程の概要を示す側断面図、図4は、実施形態に係る加工方法の透光性基板分割工程の概要を示す側断面図、図5は、実施形態に係る加工方法のウエーハ分割工程の概要を示す側断面図、図6は、実施形態に係る加工方法のウエーハ分割工程の要部の概要を示す側断面図である。
Embodiment
A processing method according to the embodiment will be described with reference to FIGS. FIG. 1A is a perspective view schematically showing a configuration example of a light-emitting diode including a light-emitting chip manufactured by the processing method according to the embodiment, and FIG. 1B is a processing according to the embodiment. FIG. 2 is a side cross-sectional view illustrating an outline of a division starting point forming step of the processing method according to the embodiment, and FIG. 3 is a processing method according to the embodiment. 4 is a side sectional view showing the outline of the translucent substrate dividing step of the processing method according to the embodiment, and FIG. 5 is a wafer division of the processing method according to the embodiment. FIG. 6 is a side sectional view showing an outline of the main part of the wafer dividing step of the processing method according to the embodiment.

実施形態に係る加工方法は、図1(a)に示す発光ダイオード1の発光チップ2を製造する加工方法である。発光ダイオード1は、図1(a)に示すように、基台となるリードフレーム3と、リードフレーム3に支持固定される発光チップ2とを備えている。   The processing method which concerns on embodiment is a processing method which manufactures the light emitting chip 2 of the light emitting diode 1 shown to Fig.1 (a). As shown in FIG. 1A, the light emitting diode 1 includes a lead frame 3 serving as a base and a light emitting chip 2 supported and fixed to the lead frame 3.

リードフレーム3は、円柱状に形成されており、底面に配線(不図示)等を介して外部の電源(不図示)に接続される2本のリード部材3a,3aが設けられている。リードフレーム3の表面には、互いに絶縁された2本の接続端子3b,3bが所定の間隔をあけて配置され、接続端子3b,3b間に透光性を有する樹脂(不図示)により発光チップ2が接着されて固定される。なお、接続端子3b,3bとリード部材3a,3aとは、1対1で対応し、対応したもの同士が接続されている。   The lead frame 3 is formed in a columnar shape, and two lead members 3a and 3a connected to an external power source (not shown) via wiring (not shown) or the like are provided on the bottom surface. Two connection terminals 3b and 3b that are insulated from each other are arranged on the surface of the lead frame 3 at a predetermined interval, and a light emitting chip is formed by a translucent resin (not shown) between the connection terminals 3b and 3b. 2 is bonded and fixed. The connection terminals 3b, 3b and the lead members 3a, 3a correspond one-to-one, and the corresponding ones are connected.

発光チップ2は、表面に発光層2aを備えたチップ2bと、チップ2bの裏面側に透光性を有する透光性樹脂2eで貼着された透光性部材2cと、から形成されている。チップ2bは、平面形状が矩形状の基板層2dと、基板層2dの表面に設けられた発光層2aとを備えている。基板層2dは、実施形態では、GaN(窒化ガリウム)で構成されたGAN基板、SiC(炭化珪素)で構成されたSiC基板、サファイアで構成されたサファイア基板などが用いられる。   The light emitting chip 2 is formed of a chip 2b having a light emitting layer 2a on the surface, and a translucent member 2c attached to the back side of the chip 2b with a translucent resin 2e having translucency. . The chip 2b includes a substrate layer 2d having a rectangular planar shape and a light emitting layer 2a provided on the surface of the substrate layer 2d. In the embodiment, the substrate layer 2d is a GAN substrate made of GaN (gallium nitride), a SiC substrate made of SiC (silicon carbide), a sapphire substrate made of sapphire, or the like.

発光層2aは、GaN系の半導体材料を用いて形成される複数の半導体層(GaN半導体層)を含む。発光層2aは、電子が多数キャリアとなるn型半導体層(例えば、n型GaN層)、半導体層(例えば、InGaN層)、正孔が多数キャリアとなるp型半導体層(例えば、p型GaN層)を順にエピタキシャル成長させることで形成される。また、発光チップ2の表面には、n型半導体層及びp型半導体層のそれぞれと接続され、発光層2aに電圧を印加する2個の電極(不図示)が形成される。なお、これらの電極は、リード線4a,4aを介して、接続端子3b,3bと接続される。発光層2aは、電圧が印加されると発光する即ち光を出射する。   The light emitting layer 2a includes a plurality of semiconductor layers (GaN semiconductor layers) formed using a GaN-based semiconductor material. The light emitting layer 2a includes an n-type semiconductor layer (for example, n-type GaN layer) in which electrons are majority carriers, a semiconductor layer (for example, InGaN layer), and a p-type semiconductor layer (for example, p-type GaN) in which holes are majority carriers. Layer) is sequentially epitaxially grown. Further, two electrodes (not shown) are formed on the surface of the light-emitting chip 2 and are connected to the n-type semiconductor layer and the p-type semiconductor layer, respectively, and apply a voltage to the light-emitting layer 2a. These electrodes are connected to connection terminals 3b and 3b via lead wires 4a and 4a. The light emitting layer 2a emits light when a voltage is applied, that is, emits light.

透光性部材2cは、発光チップ2の基板層2dの裏面に配置されている。透光性部材2cは、発光層2aから発光された光を透過する材質で形成されている。透光性部材2cを形成する材質としては、ガラスや透明な樹脂を用いることができる。透光性部材2cは、基板層2dと同等以上の厚みを有することが望ましい。   The translucent member 2 c is disposed on the back surface of the substrate layer 2 d of the light emitting chip 2. The translucent member 2c is formed of a material that transmits light emitted from the light emitting layer 2a. As a material for forming the translucent member 2c, glass or transparent resin can be used. It is desirable that the translucent member 2c has a thickness equal to or greater than that of the substrate layer 2d.

発光ダイオード1は、発光チップ2の透光性部材2cが透光性を有する樹脂(不図示)でリードフレーム3の表面に接着され、接続端子3b,3bにリード線4a,4aを介して発光チップ2の電極に接続されて得られる。また、発光ダイオード1は、リードフレーム3の外周縁に発光チップ2の表面側を覆い発光層2aから放出される光を所定方向へと導くドーム状のレンズ部材5が取り付けられている。   In the light emitting diode 1, the light transmissive member 2c of the light emitting chip 2 is adhered to the surface of the lead frame 3 with a light transmissive resin (not shown), and light is emitted to the connection terminals 3b and 3b through the lead wires 4a and 4a. It is obtained by connecting to the electrode of the chip 2. The light emitting diode 1 has a dome-shaped lens member 5 attached to the outer peripheral edge of the lead frame 3 so as to cover the surface side of the light emitting chip 2 and guide light emitted from the light emitting layer 2a in a predetermined direction.

発光ダイオード1は、発光層2aに電圧が印加されると、半導体層にはn型半導体層から電子が流れ込むと共に、p型半導体層から正孔が流れ込む。その結果、半導体層において電子と正孔との再結合が生じ、所定の波長の光が放出される。実施形態では、GaN系の半導体材料を用いて発光層となる半導体層を形成しているので、GaN系の半導体材料のバンドギャップに相当する青色や緑色の光が放出される。半導体層で生じた光は、主に、発光層2aの表面及び裏面から放出される。発光層2aの表面から放出された光は、レンズ部材5等を通じて発光ダイオード1の外部に取り出される。   In the light emitting diode 1, when a voltage is applied to the light emitting layer 2a, electrons flow from the n-type semiconductor layer and holes flow from the p-type semiconductor layer to the semiconductor layer. As a result, recombination of electrons and holes occurs in the semiconductor layer, and light having a predetermined wavelength is emitted. In the embodiment, since the semiconductor layer to be the light emitting layer is formed using a GaN-based semiconductor material, blue or green light corresponding to the band gap of the GaN-based semiconductor material is emitted. Light generated in the semiconductor layer is mainly emitted from the front and back surfaces of the light emitting layer 2a. The light emitted from the surface of the light emitting layer 2a is extracted outside the light emitting diode 1 through the lens member 5 and the like.

一方、発光ダイオード1において、発光層2aの裏面から放出された光は、一部が基板層2dと透光性樹脂2eとの界面及び透光性樹脂2eと透光性部材2cとの界面において反射するが、別の一部がこれらの界面を透過して透光性部材2cの側面等から外部に取り出される。このように、実施形態に係る発光ダイオード1は、表面に発光層2aを備える発光チップ2の裏面側に、発光層2aから発光された光を透過させる透光性部材2cを備えるので、リードフレーム3との界面で反射して発光層2aに戻る光の割合を低く抑え、発光層2aの主に裏面から出射される光を効率よく取り出すことができ、光の取り出し効率を高めることができるものである。   On the other hand, in the light emitting diode 1, a part of the light emitted from the back surface of the light emitting layer 2a is at the interface between the substrate layer 2d and the translucent resin 2e and at the interface between the translucent resin 2e and the translucent member 2c. Although reflected, another part permeate | transmits these interfaces and is taken out outside from the side surface etc. of the translucent member 2c. As described above, the light emitting diode 1 according to the embodiment includes the translucent member 2c that transmits the light emitted from the light emitting layer 2a on the back side of the light emitting chip 2 including the light emitting layer 2a on the front surface. The ratio of the light reflected at the interface with the light 3 and returning to the light emitting layer 2a can be kept low, the light emitted mainly from the back surface of the light emitting layer 2a can be efficiently extracted, and the light extraction efficiency can be increased. It is.

実施形態に係る加工方法は、表面Waに前述した発光層2aが複数形成されたウエーハWに、分割起点形成加工、貼着加工、透光性基板分割加工、ウエーハ分割加工を施す加工方法であって、分割起点形成工程、貼着工程、透光性基板分割工程、ウエーハ分割工程とを備える。なお、加工対象であるウエーハWは、基板層2dを構成するものであって、GaN(窒化ガリウム)、SiC(炭化珪素)、サファイアなどで構成されている。ウエーハWは、図1(b)に示すように、基板の表面Waに複数の分割予定ラインによって複数の領域が区画され、この区画された各領域に発光層2aが形成されたものである。   The processing method according to the embodiment is a processing method for subjecting a wafer W on which a plurality of the light emitting layers 2a described above are formed on the surface Wa to division start point formation processing, pasting processing, translucent substrate division processing, and wafer division processing. And a dividing starting point forming step, a sticking step, a translucent substrate dividing step, and a wafer dividing step. The wafer W to be processed constitutes the substrate layer 2d and is composed of GaN (gallium nitride), SiC (silicon carbide), sapphire, or the like. As shown in FIG. 1B, the wafer W is formed by dividing a plurality of regions on a surface Wa of the substrate by a plurality of division lines, and a light emitting layer 2a is formed in each of the divided regions.

まず、分割起点形成加工では、図2に示すように、ウエーハW(図1(b)に示す)の表面Waに保護テープT1を貼着し、保護テープT1の外縁部に環状フレームFを貼着する。そして、ウエーハWの表面Waを保護テープT1を介して、レーザー加工装置10のチャックテーブル(不図示)に保持させる。そして、ウエーハWを保持したチャックテーブルとレーザ加工装置10のレーザー光線照射手段12とを分割予定ラインに沿って相対的に移動させながら、裏面Wb側からウエーハWを透過する波長のレーザー光線を分割予定ラインに沿って照射する。そして、ウエーハWの内部に、分割予定ラインに沿って改質層K(分割起点に相当)を形成する。   First, in the division starting point forming process, as shown in FIG. 2, the protective tape T1 is attached to the surface Wa of the wafer W (shown in FIG. 1B), and the annular frame F is attached to the outer edge of the protective tape T1. To wear. Then, the surface Wa of the wafer W is held on the chuck table (not shown) of the laser processing apparatus 10 via the protective tape T1. Then, while moving the chuck table holding the wafer W and the laser beam irradiating means 12 of the laser processing apparatus 10 along the planned dividing line, the laser beam having a wavelength that passes through the wafer W from the back surface Wb side is scheduled to be split. Irradiate along. Then, a modified layer K (corresponding to a division starting point) is formed along the planned division line inside the wafer W.

なお、改質層Kとは、ウエーハWを分割するための分割起点であって、密度、屈折率、機械的強度やその他の物理的特性が周囲のそれとは異なる状態になった領域のことを意味し、溶融処理領域、クラック領域、絶縁破壊領域、屈折率変化領域、及びこれらの領域が混在した領域等を例示できる。このように、分割起点は、裏面Wb側からウエーハWを透過する波長のレーザー光線を分割予定ラインに沿って照射して、ウエーハWの内部に形成された改質層Kである。分割起点形成工程の後に、貼着工程に進む。   The modified layer K is a starting point for dividing the wafer W and is a region where the density, refractive index, mechanical strength and other physical characteristics are different from those of the surroundings. This means, for example, a melt treatment region, a crack region, a dielectric breakdown region, a refractive index change region, and a region in which these regions are mixed. As described above, the division starting point is the modified layer K formed inside the wafer W by irradiating a laser beam having a wavelength that passes through the wafer W from the back surface Wb side along the planned division line. It progresses to the sticking process after a division | segmentation starting point formation process.

貼着工程では、分割起点形成工程を実施した後に、少なくともウエーハWと同等の面積を有する透光性基板Rの表面に液状の透光性樹脂2eを塗布し、図3に示すように、透光性樹脂2eをウエーハWの裏面Wbと対向させる。透光性基板RをウエーハWの裏面Wbに近づけて、ウエーハWの裏面Wbに透光性基板Rを透光性樹脂2eで貼着する。透光性基板Rは、ガラスや透明な樹脂などの発光層2aから発光される光を透過する材質で形成された基板である。透光性樹脂2eは、発光層2aから発光される光を透過するものである。透光性樹脂2eが硬化すると、ウエーハWに透光性基板Rが固定される。そして、透光性基板分割工程に進む。   In the sticking step, after the split starting point forming step is performed, a liquid translucent resin 2e is applied to the surface of the translucent substrate R having at least an area equivalent to the wafer W, and as shown in FIG. The photosensitive resin 2e is opposed to the back surface Wb of the wafer W. The translucent substrate R is brought close to the back surface Wb of the wafer W, and the translucent substrate R is adhered to the back surface Wb of the wafer W with the translucent resin 2e. The translucent substrate R is a substrate formed of a material that transmits light emitted from the light emitting layer 2a such as glass or transparent resin. The translucent resin 2e transmits light emitted from the light emitting layer 2a. When the translucent resin 2e is cured, the translucent substrate R is fixed to the wafer W. Then, the process proceeds to the translucent substrate dividing step.

そして、透光性基板分割工程では、貼着工程を実施した後に、ウエーハWの表面Waを保護テープT1を介して、切削装置20のチャックテーブル(不図示)に保持させる。チャックテーブルと切削装置20の切削ブレード22とを分割予定ラインに沿って相対的に移動させながら、透光性基板Rを分割予定ラインに沿って切削ブレード22により切削を行う。透光性基板Rを切削ブレード22により分割予定ラインに沿って個片化して、複数の透光性部材2cに分割する。そして、ウエーハ分割工程に進む。   And in a translucent board | substrate division | segmentation process, after implementing a sticking process, the surface Wa of the wafer W is hold | maintained on the chuck table (not shown) of the cutting device 20 via the protective tape T1. While the chuck table and the cutting blade 22 of the cutting apparatus 20 are relatively moved along the scheduled division line, the translucent substrate R is cut by the cutting blade 22 along the planned division line. The translucent board | substrate R is separated into pieces along the division | segmentation planned line with the cutting blade 22, and is divided | segmented into the some translucent member 2c. Then, the process proceeds to the wafer dividing step.

ウエーハ分割工程では、透光性基板分割工程を実施した後に、まず、ウエーハWを環状フレームF毎、図5に示すように、保護テープT1が上方に位置する状態でブレーキング装置50の保持台51に保持させる。そして、ブレーキング装置50の押圧ブレード52を、ウエーハWの各分割予定ラインに押圧させて、ウエーハWの各分割予定ラインに沿って外力を付与する。そして、図6に示すように、改質層Kを起点にウエーハWを複数のチップ2b即ち発光チップ2に分割する。ウエーハWをすべての分割予定ラインに沿って分割した後、個々に分割された発光チップ2を保護テープT1から取り外す。   In the wafer dividing step, after the translucent substrate dividing step is performed, first, the wafer W is held in the annular frame F, as shown in FIG. 51. Then, the pressing blade 52 of the braking device 50 is pressed against each division line of the wafer W, and an external force is applied along each division line of the wafer W. Then, as shown in FIG. 6, the wafer W is divided into a plurality of chips 2 b, that is, the light emitting chips 2, starting from the modified layer K. After dividing the wafer W along all the division lines, the individually divided light emitting chips 2 are removed from the protective tape T1.

実施形態に係る加工方法によれば、GaN半導体層(発光層)を有するウエーハWに透光性を有する透光性基板Rを貼着し、透光性基板Rを分割する。このために、実施形態に係る加工方法は、厚さの均一な透光性部材2cを容易に形成することができ、発光層2aの主に裏面から出射される光を効率よく取り出すことができる発光チップ2を効率的に生産することができる。また、実施形態に係る加工方法によれば、改質層Kを起点にウエーハWを分割するので、ウエーハWを硬質なサファイアなどで構成しても、容易に分割でき、発光チップ2を効率的に生産することができる。   According to the processing method which concerns on embodiment, the translucent board | substrate R which has translucency is affixed on the wafer W which has a GaN semiconductor layer (light emitting layer), and the translucent board | substrate R is divided | segmented. For this reason, the processing method according to the embodiment can easily form the transparent member 2c having a uniform thickness, and can efficiently extract light emitted mainly from the back surface of the light emitting layer 2a. The light emitting chip 2 can be produced efficiently. Further, according to the processing method according to the embodiment, since the wafer W is divided starting from the modified layer K, even if the wafer W is made of hard sapphire or the like, it can be easily divided and the light emitting chip 2 can be efficiently manufactured. Can be produced.

〔変形例1〕
本発明の実施形態の変形例1に係る加工方法を、図7に基づいて説明する。図7は、実施形態の変形例1に係る加工方法の分割起点形成工程の概要を示す側断面図である。なお、実施形態と同一部分には、同一符号を付して説明を省略する。
[Modification 1]
A processing method according to Modification 1 of the embodiment of the present invention will be described with reference to FIG. FIG. 7 is a side cross-sectional view illustrating an outline of the division starting point forming step of the processing method according to the first modification of the embodiment. In addition, the same code | symbol is attached | subjected to the part same as embodiment, and description is abbreviate | omitted.

実施形態の変形例1に係る加工方法の分割起点形成工程では、ウエーハWの裏面Wb側を切削装置20のチャックテーブル(不図示)に保持させる。そして、ウエーハWを保持したチャックテーブルと切削装置20の切削ブレード22とを分割予定ラインに沿って相対的に移動させながら、発光層2a側からウエーハWに切削ブレード22を用いた切削加工を施す。そして、ウエーハWの表面Waに、分割予定ラインに沿って分割起点溝S(分割起点に相当)を形成する。   In the split starting point forming step of the processing method according to the first modification of the embodiment, the back surface Wb side of the wafer W is held on a chuck table (not shown) of the cutting device 20. Then, the wafer W is subjected to cutting using the cutting blade 22 from the light emitting layer 2a side while relatively moving the chuck table holding the wafer W and the cutting blade 22 of the cutting device 20 along the scheduled dividing line. . Then, a division start groove S (corresponding to the division start point) is formed on the surface Wa of the wafer W along the planned division line.

このように、実施形態の変形例1に係る加工方法では、分割起点は、発光層2a側からウエーハWに切削ブレード22を用いた切削加工を施すことにより、表面Waに形成された分割起点溝Sである。分割起点形成工程の後には、ウエーハWの表面Waに保護テープT1を貼着し、保護テープT1の外縁部に環状フレームFを貼着した後に、実施形態と同様に、貼着工程、透光性基板分割工程、ウエーハ分割工程に順に進む。   As described above, in the processing method according to the first modification of the embodiment, the division starting point is the division starting groove formed on the surface Wa by cutting the wafer W using the cutting blade 22 from the light emitting layer 2a side. S. After the division starting point forming step, the protective tape T1 is attached to the surface Wa of the wafer W, and the annular frame F is attached to the outer edge portion of the protective tape T1, and then the attaching step and the light-transmitting effect as in the embodiment. The process proceeds sequentially to the substrate splitting process and the wafer splitting process.

実施形態の変形例1に係る加工方法によれば、前述した実施形態と同様に、容易に厚さの均一な透光性部材2cを形成することができ、発光層2aの主に裏面から出射される光を効率よく取り出すことができる発光チップ2を効率的に生産することができる。また、実施形態の変形例1に係る加工方法によれば、ウエーハWを硬質なサファイアで構成しても、発光チップ2を効率的に生産することができる。   According to the processing method according to the first modification of the embodiment, the translucent member 2c having a uniform thickness can be easily formed as in the above-described embodiment, and the light is emitted mainly from the back surface of the light emitting layer 2a. The light-emitting chip 2 that can efficiently extract the emitted light can be efficiently produced. Moreover, according to the processing method which concerns on the modification 1 of embodiment, even if the wafer W is comprised with hard sapphire, the light emitting chip 2 can be produced efficiently.

〔変形例2〕
本発明の実施形態の変形例2に係る加工方法を、図8に基づいて説明する。図8は、実施形態の変形例2に係る加工方法の分割起点形成工程の概要を示す側断面図である。なお、実施形態と同一部分には、同一符号を付して説明を省略する。
[Modification 2]
A processing method according to Modification 2 of the embodiment of the present invention will be described with reference to FIG. FIG. 8 is a side cross-sectional view illustrating an outline of the division start point forming step of the processing method according to the second modification of the embodiment. In addition, the same code | symbol is attached | subjected to the part same as embodiment, and description is abbreviate | omitted.

実施形態の変形例2に係る加工方法の分割起点形成工程では、ウエーハWの裏面Wb側をアブレーション加工装置30のチャックテーブル(不図示)に保持させる。そして、ウエーハWを保持したチャックテーブルとアブレーション加工装置30のレーザー光線照射手段32とを分割予定ラインに沿って相対的に移動させながら、発光層2a側からウエーハWにレーザー光線照射手段32からレーザー光線を照射し、アブレーション加工を施す。そして、ウエーハWの表面Waに、分割予定ラインに沿って分割起点溝S(分割起点に相当)を形成する。   In the split starting point forming step of the processing method according to the second modification of the embodiment, the back surface Wb side of the wafer W is held on a chuck table (not shown) of the ablation processing device 30. Then, the wafer W is irradiated with the laser beam from the laser beam irradiation means 32 from the light emitting layer 2a side while the chuck table holding the wafer W and the laser beam irradiation means 32 of the ablation processing device 30 are relatively moved along the division line. Then, ablation processing is performed. Then, a division start groove S (corresponding to the division start point) is formed on the surface Wa of the wafer W along the planned division line.

このように、実施形態の変形例2に係る加工方法では、分割起点は、発光層2a側からウエーハWにアブレーション加工を施すことにより、表面Waに形成された分割起点溝Sである。分割起点形成工程の後には、ウエーハWの表面Waに保護テープT1を貼着し、保護テープT1の外縁部に環状フレームFを貼着した後に、実施形態と同様に、貼着工程、透光性基板分割工程、ウエーハ分割工程に順に進む。   As described above, in the processing method according to the second modification of the embodiment, the division starting point is the division starting groove S formed on the surface Wa by ablating the wafer W from the light emitting layer 2a side. After the division starting point forming step, the protective tape T1 is attached to the surface Wa of the wafer W, and the annular frame F is attached to the outer edge portion of the protective tape T1, and then the attaching step and the light-transmitting effect as in the embodiment. The process proceeds sequentially to the substrate splitting process and the wafer splitting process.

実施形態の変形例2に係る加工方法によれば、前述した実施形態と同様に、容易に厚さの均一な透光性部材2cを形成することができ、発光層2aの主に裏面から出射される光を効率よく取り出すことができる発光チップ2を効率的に生産することができる。また、実施形態の変形例2に係る加工方法によれば、ウエーハWを硬質なサファイアで構成しても、発光チップ2を効率的に生産することができる。   According to the processing method according to the second modification of the embodiment, similarly to the above-described embodiment, it is possible to easily form the transparent member 2c having a uniform thickness and emit light mainly from the back surface of the light emitting layer 2a. The light-emitting chip 2 that can efficiently extract the emitted light can be efficiently produced. Moreover, according to the processing method which concerns on the modification 2 of embodiment, even if the wafer W is comprised with hard sapphire, the light emitting chip 2 can be produced efficiently.

なお、本発明は上記実施形態などに限定されるものではない。即ち、本発明の骨子を逸脱しない範囲で種々変形して実施することができる。   The present invention is not limited to the above embodiment. That is, various modifications can be made without departing from the scope of the present invention.

2 発光チップ
2a 発光層
2b チップ
2c 透光性部材
2e 透光性樹脂
22 切削ブレード
W ウエーハ
Wa 表面
Wb 裏面
K 改質層(分割起点)
S 分割起点溝(分割起点)
R 透光性基板
2 Light-Emitting Chip 2a Light-Emitting Layer 2b Chip 2c Translucent Member 2e Translucent Resin 22 Cutting Blade W Wafer Wa Front Wb Back K Modified Layer (Division Start)
S Dividing origin groove (dividing origin)
R translucent substrate

Claims (3)

表面に発光層を備えたチップと、該チップの裏面側に透光性を有する透光性樹脂で貼着され且つ該発光層から発光された光を透過する材質で形成された透光性部材と、から形成された発光チップを製造する加工方法であって、
基板の表面に複数の分割予定ラインによって複数の領域が区画され、この区画された領域に発光層が形成されたウエーハに、該ウエーハを分割するための、該分割予定ラインに沿って分割起点を形成する分割起点形成工程と、
該分割起点形成工程を実施した後に、ウエーハの裏面に少なくともウエーハと同等の面積を有し且つ該発光層から発光される光を透過する材質で形成された透光性基板を、該発光層から発光された光を透過する透光性樹脂で貼着する貼着工程と、
該貼着工程を実施した後に、該透光性基板を該分割予定ラインに沿って切削ブレードにより切削を行い、複数の透光性部材に分割する透光性基板分割工程と、
該透光性基板分割工程を実施した後に、該ウエーハの該分割予定ラインに沿って外力を付与し該分割起点を起点に該ウエーハを複数のチップに分割するウエーハ分割工程と、
を備える加工方法。
A chip having a light emitting layer on the surface, and a translucent member formed of a material that is attached to the back side of the chip with a light transmitting resin and transmits light emitted from the light emitting layer And a processing method for manufacturing a light emitting chip formed from:
A plurality of regions are defined by a plurality of scheduled division lines on the surface of the substrate, and a division starting point is formed along the planned division lines for dividing the wafer into a wafer in which a light emitting layer is formed in the partitioned regions. A split starting point forming step to be formed;
After performing the division starting point forming step, a translucent substrate formed of a material having an area equivalent to at least the wafer on the back surface of the wafer and transmitting light emitted from the light emitting layer is formed from the light emitting layer. A sticking step of sticking with a translucent resin that transmits the emitted light;
After carrying out the attaching step, the translucent substrate is cut by a cutting blade along the planned dividing line, and is divided into a plurality of translucent members;
After performing the translucent substrate dividing step, a wafer dividing step of applying an external force along the scheduled dividing line of the wafer and dividing the wafer into a plurality of chips starting from the dividing starting point;
A processing method comprising:
該分割起点形成工程における該分割起点は、該発光層側から該ウエーハにアブレーション加工又は切削ブレードを用いた切削加工を施すことにより、該表面に形成された分割起点溝である、請求項1記載の加工方法。   2. The division starting point in the division starting point forming step is a division starting point groove formed on the surface by subjecting the wafer to ablation or cutting using a cutting blade from the light emitting layer side. Processing method. 該分割起点形成工程における該分割起点は、該裏面側から該ウエーハを透過する波長のレーザー光線を該分割予定ラインに沿って照射して、該ウエーハの内部に形成された改質層である、請求項1記載の加工方法。   The split starting point in the split starting point forming step is a modified layer formed inside the wafer by irradiating a laser beam having a wavelength that passes through the wafer from the back side along the planned split line. Item 1. The processing method according to Item 1.
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