TWI732047B - Method for manufacturing light-emitting diode chip and light-emitting diode chip - Google Patents
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- 238000002360 preparation method Methods 0.000 claims abstract description 6
- 238000005520 cutting process Methods 0.000 claims description 24
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- 239000004065 semiconductor Substances 0.000 claims description 7
- 239000005304 optical glass Substances 0.000 claims description 4
- 239000011347 resin Substances 0.000 claims description 4
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- 239000000919 ceramic Substances 0.000 claims description 3
- 238000005488 sandblasting Methods 0.000 claims description 3
- 238000005530 etching Methods 0.000 claims description 2
- 239000003795 chemical substances by application Substances 0.000 claims 1
- 235000012431 wafers Nutrition 0.000 description 69
- 230000003287 optical effect Effects 0.000 description 9
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 5
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- 229910002601 GaN Inorganic materials 0.000 description 2
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- 238000002679 ablation Methods 0.000 description 2
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- 239000006061 abrasive grain Substances 0.000 description 1
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- 230000007423 decrease Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
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- 238000001020 plasma etching Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
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- H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
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Abstract
[課題]提供一種可得到充分的亮度的發光二極體晶片的製造方法及發光二極體晶片。 [解決手段]一種發光二極體晶片的製造方法,其特徵在於具備有晶圓準備步驟、透明基板加工步驟、一體化步驟、及分割步驟;該晶圓準備步驟是準備晶圓,該晶圓在結晶成長用之透明基板上具有積層體層,並於該積層體層的正面以相互交叉之複數條分割預定線所區劃出之各區域中各自形成有LED電路,其中該積層體層形成有包含發光層的複數層半導體層,該透明基板加工步驟是在於內部形成有複數個氣泡的透明基板的正面對應該晶圓的各LED電路來形成複數個凹陷,該一體化步驟是實施該透明基板加工步驟後,將該透明基板的正面貼附於該晶圓的背面以形成一體化晶圓,該分割步驟是沿著該分割預定線將該晶圓和該透明基板一起切斷以將該一體化晶圓分割成一個個的發光二極體晶片。[Problem] To provide a method for manufacturing a light-emitting diode wafer that can obtain sufficient brightness, and a light-emitting diode wafer. [Solution] A method for manufacturing a light-emitting diode wafer, which is characterized by having a wafer preparation step, a transparent substrate processing step, an integration step, and a dividing step; the wafer preparation step is to prepare a wafer, the wafer There is a laminate layer on a transparent substrate for crystal growth, and LED circuits are formed in each area divided by a plurality of predetermined dividing lines crossing each other on the front surface of the laminate layer, wherein the laminate layer is formed with a light-emitting layer The transparent substrate processing step is to form a plurality of recesses corresponding to each LED circuit of the wafer on the front surface of the transparent substrate with a plurality of bubbles formed inside, and the integration step is after the transparent substrate processing step Attach the front surface of the transparent substrate to the back surface of the wafer to form an integrated wafer, and the dividing step is to cut the wafer and the transparent substrate together along the predetermined dividing line to form the integrated wafer Divided into one LED chip.
Description
發明領域 本發明是有關於一種發光二極體晶片的製造方法及發光二極體晶片。FIELD OF THE INVENTION The present invention relates to a method for manufacturing a light-emitting diode chip and a light-emitting diode chip.
發明背景 在藍寶石基板、GaN基板、SiC基板等的結晶成長用基板的正面上形成有將n型半導體層、發光層、p型半導體層積層複數層而成的積層體層,並且在此積層體層上藉由交叉的複數條分割預定線所區劃出的區域中形成有複數個LED(發光二極體(Light Emitting Diode))等之發光元件的晶圓,是沿著分割預定線切斷而分割成一個個的發光元件晶片,已分割的發光元件晶片可廣泛地應用在手機、個人電腦、照明機器等的各種電氣機器上。BACKGROUND OF THE INVENTION On the front surface of a substrate for crystal growth such as a sapphire substrate, a GaN substrate, and a SiC substrate, a laminate layer is formed by laminating a plurality of n-type semiconductor layers, a light-emitting layer, and a p-type semiconductor layer, and on this laminate layer A wafer in which a plurality of light-emitting elements such as LEDs (Light Emitting Diode) are formed in an area divided by a plurality of intersecting planned dividing lines is cut along the planned dividing line to be divided into One by one light-emitting element chips, the divided light-emitting element chips can be widely used in various electrical equipment such as mobile phones, personal computers, and lighting equipment.
由於從發光元件晶片的發光層射出的光具有各向同性,所以即使被照射到結晶成長用基板的內部也會使光從基板的背面及側面射出。然而,由於已被照射到基板之內部的光之中在與空氣層之間的界面上的入射角為臨界角以上的光會在界面上進行全反射而被封閉在基板內部,並不會有從基板射出到外部之情形,所以會有導致發光元件晶片的亮度降低的問題。Since the light emitted from the light-emitting layer of the light-emitting element wafer is isotropic, even if it is irradiated inside the substrate for crystal growth, the light is emitted from the back and side surfaces of the substrate. However, because of the light that has been irradiated inside the substrate, the light whose incident angle on the interface with the air layer is above the critical angle will be totally reflected at the interface and be enclosed inside the substrate. In the case where it is emitted from the substrate to the outside, there is a problem that the brightness of the light-emitting device chip is reduced.
為了解決此問題,在日本專利特開2014-175354號公報中已記載有下述之發光二極體(LED):為了抑制從發光層射出的光被封閉在基板的內部,而形成為在基板的背面貼附透明構件來謀求亮度的提升。 先前技術文獻 專利文獻In order to solve this problem, Japanese Patent Laid-Open No. 2014-175354 has described the following light-emitting diode (LED): In order to prevent the light emitted from the light-emitting layer from being confined inside the substrate, it is formed on the substrate A transparent member is attached to the back of the device to improve the brightness. Prior Art Documents Patent Documents
專利文獻1:日本專利特開2014-175354號公報Patent Document 1: Japanese Patent Laid-Open No. 2014-175354
發明概要 發明欲解決之課題 然而,在專利文獻1所揭示的發光二極體中,雖然可藉由在基板的背面貼附透明構件而使亮度稍微提升,但是仍有無法得到充分的亮度的問題。SUMMARY OF THE INVENTION Problems to be solved by the invention. However, in the light-emitting diode disclosed in Patent Document 1, although the brightness can be slightly improved by attaching a transparent member to the back of the substrate, there is still a problem that sufficient brightness cannot be obtained. .
本發明是有鑒於像這樣的點而作成的發明,其目的在於提供一種能夠得到充分的亮度的發光二極體晶片的製造方法及發光二極體晶片。 用以解決課題之手段The present invention is an invention made in view of such points, and its object is to provide a method of manufacturing a light-emitting diode wafer and a light-emitting diode wafer capable of obtaining sufficient brightness. Means to solve the problem
依據請求項1記載的發明,可提供一種發光二極體晶片的製造方法,該發光二極體晶片的製造方法之特徵在於具備有: 晶圓準備步驟,準備晶圓,該晶圓是在結晶成長用之透明基板上具有積層體層,並於該積層體層的正面以相互交叉之複數條分割預定線所區劃出之各區域中各自形成有LED電路,該積層體層形成有包含發光層的複數層半導體層; 透明基板加工步驟,在內部形成有複數個氣泡之透明基板的正面對應該晶圓的各LED電路來形成複數個凹陷; 一體化步驟,在實施該透明基板加工步驟後,將該透明基板的正面貼附到該晶圓的背面以形成一體化晶圓;及 分割步驟,沿著該分割預定線將該晶圓和該透明基板一起切斷,以將該一體化晶圓分割成一個個的發光二極體晶片。According to the invention described in claim 1, it is possible to provide a method for manufacturing a light-emitting diode chip, the method for manufacturing a light-emitting diode chip is characterized by comprising: a wafer preparation step, preparing a wafer, the wafer being crystallized The transparent substrate for growth has a laminate layer, and on the front surface of the laminate layer, an LED circuit is formed in each area divided by a plurality of predetermined dividing lines that cross each other, and the laminate layer is formed with a plurality of layers including a light-emitting layer The semiconductor layer; the transparent substrate processing step, in which a plurality of bubbles are formed on the front surface of the transparent substrate corresponding to each LED circuit of the wafer to form a plurality of recesses; the integration step, after the transparent substrate processing step is performed, the transparent substrate The front surface of the substrate is attached to the back surface of the wafer to form an integrated wafer; and the dividing step is to cut the wafer and the transparent substrate together along the predetermined dividing line to divide the integrated wafer into one A light-emitting diode chip.
較理想的是,在透明基板加工步驟中所形成之凹陷的截面形狀為三角形、四角形、或圓形的任一種。較理想的是,在透明基板加工步驟中所形成的凹陷是藉由蝕刻、噴砂、雷射的任一種方式而形成。Preferably, the cross-sectional shape of the depression formed in the processing step of the transparent substrate is any one of a triangle, a quadrangle, or a circle. Preferably, the recesses formed in the transparent substrate processing step are formed by any of etching, sandblasting, and laser.
較理想的是,該透明基板是以透明陶瓷、光學玻璃、藍寶石、透明樹脂的任一種所形成,並且在該一體化步驟中該透明基板是利用透明接著劑來接著於晶圓。Preferably, the transparent substrate is formed of any one of transparent ceramics, optical glass, sapphire, and transparent resin, and in the integration step, the transparent substrate is bonded to the wafer with a transparent adhesive.
依據請求項5記載的發明,可提供一種發光二極體晶片,該發光二極體晶片具備:於正面形成有LED電路的發光二極體、及貼附在該發光二極體的背面之透明構件,該透明構件於內部形成有複數個氣泡,且在該透明構件之與該發光二極體的貼附面上形成有凹陷。 發明效果According to the invention described in
由於本發明的發光二極體晶片是在貼附於LED的背面之於內部具有複數個氣泡的透明構件的正面形成有凹陷,所以除了會使透明構件的表面積增大之外,也會使從LED的發光層照射而入射到透明構件的光在凹陷部分複雜地折射,因而會使從透明構件射出時在透明構件與空氣層之間的界面上之入射角為臨界角以上之光的比例減少,而使從透明構件射出之光的量增大並使發光二極體晶片的亮度提升。Since the light-emitting diode chip of the present invention is attached to the back of the LED and has a recess formed on the front surface of a transparent member with a plurality of bubbles inside, it will not only increase the surface area of the transparent member, but also increase the surface area of the transparent member The light that is irradiated by the light-emitting layer of the LED and incident on the transparent member is complicatedly refracted in the recessed part, which reduces the proportion of light whose incident angle is above the critical angle at the interface between the transparent member and the air layer when emitted from the transparent member , And increase the amount of light emitted from the transparent member and increase the brightness of the light-emitting diode chip.
用以實施發明之形態 以下,參照圖式詳細地說明本發明的實施形態。參照圖1,所示為光元件晶圓(以下,有時會簡稱為晶圓)11的正面側立體圖。Modes for Carrying Out the Invention Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. 1, there is shown a front perspective view of an optical element wafer (hereinafter, sometimes simply referred to as a wafer) 11.
光元件晶圓11是在藍寶石基板13上積層氮化鎵(GaN)等的晶膜層(epitaxial layer)(積層體層)15而構成的。光元件晶圓11具有積層有晶膜層15的正面11a、和露出藍寶石基板13的背面11b。The
在此,在本實施形態的光元件晶圓11中,雖然是採用藍寶石基板13作為結晶成長用基板,但是也可以採用GaN基板或SiC基板等來替代藍寶石基板13。Here, in the optical element wafer 11 of the present embodiment, although the
積層體層(晶膜層)15是藉由依序使電子成為多數載子(carrier)的n型半導體層(例如n型GaN層)、成為發光層的半導體層(例如InGaN層)、電洞成為多數載子的p型半導體層(例如p型GaN層)進行晶膜生長而形成。The laminate layer (crystalline film layer) 15 is an n-type semiconductor layer (e.g., n-type GaN layer) that sequentially turns electrons into a majority carrier (carrier), a semiconductor layer that becomes a light-emitting layer (e.g., InGaN layer), and a plurality of holes. The carrier p-type semiconductor layer (for example, p-type GaN layer) is formed by crystal film growth.
藍寶石基板13具有例如100μm的厚度,且積層體層15具有例如5μm的厚度。於積層體層15上以形成為格子狀的複數條分割預定線17來區劃而形成有複數個LED電路19。晶圓11具有形成有LED電路19的正面11a、和露出了藍寶石基板13的背面11b。The
依據本發明實施形態的發光二極體晶片的製造方法,首先會實施準備如圖1所示的光元件晶圓11的晶圓準備步驟。然後,實施透明基板加工步驟,該透明基板加工步驟是在要貼附於晶圓11的背面11b之透明基板21的正面21a對應於LED電路19來形成複數個凹陷,其中該透明基板21於內部具有複數個氣泡29。According to the method for manufacturing a light-emitting diode wafer according to an embodiment of the present invention, first, a wafer preparation step of preparing the
在此透明基板加工步驟中,是例如圖2(A)所示,使用具有對應於晶圓11之LED電路19的複數個孔4的遮罩2。如圖2(B)所示,使遮罩2的孔4對應於晶圓11之各LED電路19來貼附於透明基板21的正面21a。In this transparent substrate processing step, for example, as shown in FIG. 2(A), a mask 2 having a plurality of holes 4 corresponding to the
然後,藉由濕蝕刻(wet etching)或電漿蝕刻(plasma etching)在透明基板21的正面21a形成如圖2(C)所示,對應於遮罩2的孔4之形狀的三角形的凹陷(凹部)5。Then, by wet etching or plasma etching, a triangular depression corresponding to the shape of the hole 4 of the mask 2 is formed on the
亦可作成:藉由將遮罩2的孔4之形狀變更成四角形、或圓形,而在透明基板21的正面21a形成如圖2(D)所示的四角形的凹陷5A,或如圖2(E)所示的在透明基板21的正面21a形成圓形的凹陷5B。It can also be made: by changing the shape of the hole 4 of the mask 2 to a quadrangular or circular shape, a
透明基板21是由透明樹脂、光學玻璃、藍寶石、透明陶瓷的任一種所形成。在本實施形態中,是由比光學玻璃更有耐久性之聚碳酸酯、丙烯酸等之透明樹脂來形成透明基板21。The
作為本實施形態的變形例,亦可作成:藉由將遮罩2貼附在透明基板21的正面21a之後,實施噴砂加工,而在透明基板21的正面21a形成如圖2(C)所示的三角形的凹陷5、或如圖2(D)所示的四角形的凹陷5A、或如圖2(E)所示的圓形的凹陷5B。As a modified example of this embodiment, it can also be made: by attaching the mask 2 to the
亦可作成將雷射加工裝置利用於在透明基板21的正面21a形成對應於LED電路19的複數個凹陷上,其中該透明基板21於內部具有複數個氣泡29。在藉由雷射加工進行之實施形態中,如圖3(A)所示,是一邊將對透明基板21具有吸收性之波長(例如266nm)的雷射光束間歇性地從聚光器(雷射頭)24照射到透明基板21的正面21a,一邊使已保持有透明基板21之圖未示的工作夾台朝箭頭X1方向加工進給,藉此以燒蝕(ablation)在透明基板21的正面21a形成對應於晶圓11之LED電路19的複數個凹陷9。The laser processing device can also be used to form a plurality of recesses corresponding to the
將透明基板21朝與箭頭X1方向正交的方向按晶圓11的分割預定線17的每個間距來分度進給,並且對透明基板21的正面21a進行燒蝕加工,以逐次地形成複數個凹陷9。凹陷9的截面形狀,通常是成為與雷射光束之光斑形狀相對應之如圖3(B)所示的圓形。The
實施透明基板加工步驟之後,實施一體化步驟,該一體化步驟是將透明基板21的正面21a貼附到晶圓11的背面11b以形成一體化晶圓25。在此一體化步驟中,是如圖4(A)所示,藉由透明接著劑將晶圓11的背面11b接著於已在正面21a形成有對應於晶圓11的LED電路19的複數個凹陷9之透明基板21的正面21a,以如圖4(B)所示,將晶圓11與透明基板21一體化而形成一體化晶圓25。After the transparent substrate processing step is performed, an integration step is performed. The integration step is to attach the
實施一體化步驟後,實施支撐步驟,該支撐步驟是如圖5所示,將一體化晶圓25的透明基板21貼附到外周部已貼附於環狀框架F上之切割膠帶T來形成框架單元,並透過切割膠帶T以環狀框架F支撐一體化晶圓25。After the integration step is implemented, the support step is implemented. As shown in FIG. 5, the support step is to attach the
實施支撐步驟之後,實施分割步驟,該分割步驟是將框架單元投入切削裝置,並且利用切削裝置來將一體化晶圓25切削以分割成一個個的發光二極體晶片。參照圖6來說明此分割步驟。After the supporting step is performed, a dividing step is performed. The dividing step is to put the frame unit into the cutting device, and use the cutting device to cut the integrated
如圖6所示,切削裝置的切削單元10包含有主軸殼體12、可旋轉地插入主軸殼體12中的圖未示的主軸、及裝設在主軸的前端的切削刀14。As shown in FIG. 6, the
切削刀14的切割刃是以例如用鍍鎳方式(Nickel plating)來將鑽石磨粒固定而成的電鑄磨石所形成,且其前端形狀是做成三角形、四角形、或半圓形。The cutting edge of the
切削刀14的大致上半部分是以刀片罩(blade cover)(輪罩(wheel cover))16來覆蓋,在刀片罩16上配設有於切削刀14的裏側及近前側水平地伸長的一對(圖中僅顯示1個)冷卻噴嘴18。Roughly the upper half of the
在分割步驟中,是隔著框架單元的切割膠帶T而在切削裝置的工作夾台20上吸引保持一體化晶圓25,而環狀框架F是以圖未示的夾具夾持並固定。In the dividing step, the integrated
然後,使切削刀14一邊朝箭頭R方向高速旋轉一邊切入晶圓11的分割預定線17直到切削刀14的前端到達切割膠帶T為止,並且從冷卻噴嘴18朝向切削刀14及晶圓11的加工點一邊供給切削液一邊將一體化晶圓25朝箭頭X1方向加工進給,藉此形成沿著晶圓11的分割預定線17切斷晶圓11及透明基板21的切斷溝27。Then, the
將切削單元10在Y軸方向上分度進給,並且沿著朝第1方向伸長的分割預定線17逐次地形成同樣的切斷溝27。其次,將工作夾台20旋轉90°之後,沿著於與第1方向正交的第2方向上伸長之全部的分割預定線17形成同樣的切斷溝27,以形成圖7所示之狀態,藉此將一體化晶圓25分割成如圖8所示的發光二極體晶片31。The
在上述之實施形態中,雖然是將切削裝置使用在將一體化晶圓25分割成一個個的發光二極體晶片31上,但是也可以作成:將對晶圓11及透明基板21具有穿透性之波長的雷射光束沿著分割預定線13朝晶圓11照射,並且在晶圓11及透明基板21的內部於厚度方向上形成複數層的改質層,接著,對一體化晶圓25賦與外力,來以改質層為分割起點將一體化晶圓25分割成一個個的發光二極體晶片31。In the above-mentioned embodiment, although the cutting device is used on the light-emitting
圖8所示的發光二極體晶片31是在正面具有LED電路19之LED13A的背面貼附有透明構件21A,且該透明構件21A於內部形成有複數個氣泡29。此外,在透明構件21A的正面形成有凹陷5、5A、5B或凹陷9。The light emitting
因此,在圖8所示之發光二極體晶片31上,由於在透明構件21A的正面形成有凹陷,所以會使透明構件21A的表面積增大。此外,從發光二極體晶片31的LED電路19射出並朝透明構件21A入射之光的一部分是在凹陷部分折射後進入透明構件21A內。Therefore, in the light-emitting
從而,在光從透明構件21A朝外部折射而射出之時,在透明構件21A與空氣層之間的界面上之入射角成為臨界角以上光的比例會減少,而使從透明構件21A射出之光的量增大,並使發光二極體晶片31的亮度提升。Therefore, when light is refracted and emitted from the
2‧‧‧遮罩4‧‧‧孔5、5A、5B、9‧‧‧凹陷10‧‧‧切削單元11‧‧‧光元件晶圓(晶圓)11a、21a‧‧‧正面11b‧‧‧背面12‧‧‧主軸殼體13‧‧‧藍寶石基板13A‧‧‧LED14‧‧‧切削刀15‧‧‧積層體層16‧‧‧刀片罩17‧‧‧分割預定線18‧‧‧冷卻噴嘴19‧‧‧LED電路20‧‧‧工作夾台21‧‧‧透明基板21A‧‧‧透明構件24‧‧‧聚光器(雷射頭)25‧‧‧一體化晶圓27‧‧‧切斷溝29‧‧‧氣泡31‧‧‧發光二極體晶片R、X1‧‧‧箭頭T‧‧‧切割膠帶F‧‧‧環狀框架X、Y、Z‧‧‧方向2‧‧‧Mask 4‧‧‧
圖1是光元件晶圓的正面側立體圖。 圖2(A)是顯示將具有對應於光元件晶圓的各LED電路之複數個孔的遮罩貼附到透明基板之正面的情形的立體圖,圖2(B)是已將遮罩貼附在透明基板之正面的狀態之立體圖,圖2(C)~圖2(E)是顯示形成在透明基板之正面的凹陷之形狀的局部立體圖。 圖3(A)是顯示藉由雷射光束的照射而在透明基板之正面形成對應於光元件晶圓之各LED電路的複數個凹陷的情形的立體圖,圖3(B)是顯示凹陷之形狀的局部立體圖。 圖4(A)是顯示將於正面具有複數個凹陷之透明基板貼附到晶圓之背面而形成一體化之一體化步驟的立體圖,圖4(B)是一體化晶圓的立體圖。 圖5是顯示透過切割膠帶而以環狀框架支撐一體化晶圓的支撐步驟的立體圖。 圖6是顯示將一體化晶圓分割成發光二極體晶片的分割步驟的立體圖。 圖7是分割步驟結束後之一體化晶圓的立體圖。 圖8是本發明實施形態之發光二極體晶片的立體圖。Fig. 1 is a front perspective view of an optical element wafer. Fig. 2(A) is a perspective view showing a situation in which a mask having a plurality of holes corresponding to each LED circuit of the light element wafer is attached to the front surface of a transparent substrate, and Fig. 2(B) is a case where the mask has been attached Fig. 2(C)~Fig. 2(E) are partial perspective views showing the shape of the recess formed on the front surface of the transparent substrate. Fig. 3(A) is a perspective view showing a situation where a plurality of recesses corresponding to each LED circuit of the optical element wafer are formed on the front surface of the transparent substrate by the irradiation of a laser beam, and Fig. 3(B) is a perspective view showing the shape of the recesses Partial three-dimensional view. 4(A) is a perspective view showing the integration step of attaching a transparent substrate with a plurality of recesses on the front surface to the back surface of the wafer to form an integration, and FIG. 4(B) is a perspective view of the integrated wafer. FIG. 5 is a perspective view showing a supporting step of supporting the integrated wafer with a ring frame through a dicing tape. FIG. 6 is a perspective view showing the dividing step of dividing the integrated wafer into light-emitting diode chips. FIG. 7 is a perspective view of the integrated wafer after the dividing step is completed. Fig. 8 is a perspective view of a light emitting diode chip according to an embodiment of the present invention.
9‧‧‧凹陷 9‧‧‧Sag
11‧‧‧光元件晶圓(晶圓) 11‧‧‧Optical component wafer (wafer)
11a、21a‧‧‧正面 11a, 21a‧‧‧Front
11b‧‧‧背面 11b‧‧‧Back
21‧‧‧透明基板 21‧‧‧Transparent substrate
25‧‧‧一體化晶圓 25‧‧‧Integrated wafer
29‧‧‧氣泡 29‧‧‧Bubble
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