JP2014067766A5 - - Google Patents

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Publication number
JP2014067766A5
JP2014067766A5 JP2012210264A JP2012210264A JP2014067766A5 JP 2014067766 A5 JP2014067766 A5 JP 2014067766A5 JP 2012210264 A JP2012210264 A JP 2012210264A JP 2012210264 A JP2012210264 A JP 2012210264A JP 2014067766 A5 JP2014067766 A5 JP 2014067766A5
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JP
Japan
Prior art keywords
thermocouple
tube
processing apparatus
substrate processing
reaction tube
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Application number
JP2012210264A
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English (en)
Japanese (ja)
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JP6080451B2 (ja
JP2014067766A (ja
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Priority claimed from JP2012210264A external-priority patent/JP6080451B2/ja
Priority to JP2012210264A priority Critical patent/JP6080451B2/ja
Application filed filed Critical
Priority to KR1020130103884A priority patent/KR101543375B1/ko
Priority to TW102132387A priority patent/TWI511203B/zh
Priority to TW104129332A priority patent/TW201546905A/zh
Priority to US14/033,880 priority patent/US20140120636A1/en
Publication of JP2014067766A publication Critical patent/JP2014067766A/ja
Priority to KR1020150029724A priority patent/KR101579501B1/ko
Publication of JP2014067766A5 publication Critical patent/JP2014067766A5/ja
Publication of JP6080451B2 publication Critical patent/JP6080451B2/ja
Application granted granted Critical
Priority to US15/789,311 priority patent/US10418293B2/en
Priority to US16/531,540 priority patent/US11049742B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2012210264A 2012-09-25 2012-09-25 基板処理装置、半導体装置の製造方法、及び熱電対支持体 Active JP6080451B2 (ja)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP2012210264A JP6080451B2 (ja) 2012-09-25 2012-09-25 基板処理装置、半導体装置の製造方法、及び熱電対支持体
KR1020130103884A KR101543375B1 (ko) 2012-09-25 2013-08-30 기판 처리 장치, 반도체 장치의 제조 방법 및 온도 검출 방법
TW102132387A TWI511203B (zh) 2012-09-25 2013-09-09 A substrate processing apparatus, a manufacturing method of a semiconductor device, and a temperature detection method
TW104129332A TW201546905A (zh) 2012-09-25 2013-09-09 熱電偶支撐體、基板處理裝置、溫度檢測方法及半導體裝置之製造方法
US14/033,880 US20140120636A1 (en) 2012-09-25 2013-09-23 Substrate processing apparatus, method of manufacturing semiconductor device, and thermocouple support
KR1020150029724A KR101579501B1 (ko) 2012-09-25 2015-03-03 기판 처리 장치, 반도체 장치의 제조 방법 및 온도 검출 방법
US15/789,311 US10418293B2 (en) 2012-09-25 2017-10-20 Substrate processing apparatus, method of manufacturing semiconductor device, and thermocouple support
US16/531,540 US11049742B2 (en) 2012-09-25 2019-08-05 Substrate processing apparatus, method of manufacturing semiconductor device, and thermocouple support

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012210264A JP6080451B2 (ja) 2012-09-25 2012-09-25 基板処理装置、半導体装置の製造方法、及び熱電対支持体

Publications (3)

Publication Number Publication Date
JP2014067766A JP2014067766A (ja) 2014-04-17
JP2014067766A5 true JP2014067766A5 (enExample) 2015-11-12
JP6080451B2 JP6080451B2 (ja) 2017-02-15

Family

ID=50547606

Family Applications (1)

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JP2012210264A Active JP6080451B2 (ja) 2012-09-25 2012-09-25 基板処理装置、半導体装置の製造方法、及び熱電対支持体

Country Status (4)

Country Link
US (3) US20140120636A1 (enExample)
JP (1) JP6080451B2 (enExample)
KR (2) KR101543375B1 (enExample)
TW (2) TWI511203B (enExample)

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KR20190008101A (ko) 2017-07-14 2019-01-23 가부시키가이샤 코쿠사이 엘렉트릭 기판 처리 장치, 기판 보지구 및 반도체 장치의 제조 방법
US10998205B2 (en) * 2018-09-14 2021-05-04 Kokusai Electric Corporation Substrate processing apparatus and manufacturing method of semiconductor device
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JP7117398B2 (ja) * 2019-01-07 2022-08-12 株式会社Kokusai Electric 基板処理装置、半導体装置の製造方法およびヒータユニット
CN114846587A (zh) * 2020-03-02 2022-08-02 株式会社国际电气 基板处理装置、半导体装置的制造方法和存储介质
JP6916920B1 (ja) * 2020-03-04 2021-08-11 株式会社Ｋｏｋｕｓａｉ Ｅｌｅｃｔｒｉｃ 基板処理装置、治具、半導体装置の製造方法および基板処理装置の校正方法
TWI736449B (zh) * 2020-10-19 2021-08-11 中國鋼鐵股份有限公司 熱電偶之修復與固定裝置及其使用方法
JP7236420B2 (ja) * 2020-10-29 2023-03-09 株式会社Kokusai Electric 温度センサ、ヒータユニット、基板処理装置及び半導体装置の製造方法
JP7565885B2 (ja) * 2021-07-27 2024-10-11 三菱電機株式会社 半導体装置の製造方法および半導体製造装置
CN114234763B (zh) * 2021-12-31 2024-07-26 拓荆科技股份有限公司 位置调整量监测装置
CN114527009B (zh) * 2022-02-09 2023-07-04 南京钢铁股份有限公司 一种在热模拟试验机上熔化凝固过程控制方法
WO2025074667A1 (ja) 2023-10-06 2025-04-10 株式会社Kokusai Electric 温度測定アセンブリ、基板処理装置、基板処理方法、半導体装置の製造方法及びプログラム
KR102763912B1 (ko) 2024-07-11 2025-02-10 (주) 예스티 파티클 비산 방지 기능을 갖는 고압 어닐링 장치

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