JP2013530407A5 - - Google Patents

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Publication number
JP2013530407A5
JP2013530407A5 JP2013518632A JP2013518632A JP2013530407A5 JP 2013530407 A5 JP2013530407 A5 JP 2013530407A5 JP 2013518632 A JP2013518632 A JP 2013518632A JP 2013518632 A JP2013518632 A JP 2013518632A JP 2013530407 A5 JP2013530407 A5 JP 2013530407A5
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JP
Japan
Prior art keywords
image
particles
particle
measurement
response
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JP2013518632A
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English (en)
Japanese (ja)
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JP5715249B2 (ja
JP2013530407A (ja
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Priority claimed from US12/827,837 external-priority patent/US8767069B2/en
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Publication of JP2013530407A5 publication Critical patent/JP2013530407A5/ja
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Publication of JP5715249B2 publication Critical patent/JP5715249B2/ja
Expired - Fee Related legal-status Critical Current
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JP2013518632A 2010-06-30 2011-06-29 光分布を利用する粒子画像生成デバイスにおける測定精度を向上するためのシステム及び方法 Expired - Fee Related JP5715249B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/827,837 2010-06-30
US12/827,837 US8767069B2 (en) 2010-06-30 2010-06-30 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device using light distribution
PCT/US2011/042333 WO2012012168A2 (en) 2010-06-30 2011-06-29 Apparatus, system, and method for increasing measurement accuracy in a particle imaging device using light distribution

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2015049806A Division JP5986246B2 (ja) 2010-06-30 2015-03-12 光分布を利用する粒子画像生成デバイスにおける測定精度を向上するためのシステム及び方法

Publications (3)

Publication Number Publication Date
JP2013530407A JP2013530407A (ja) 2013-07-25
JP2013530407A5 true JP2013530407A5 (enExample) 2014-08-14
JP5715249B2 JP5715249B2 (ja) 2015-05-07

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ID=45399426

Family Applications (2)

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JP2013518632A Expired - Fee Related JP5715249B2 (ja) 2010-06-30 2011-06-29 光分布を利用する粒子画像生成デバイスにおける測定精度を向上するためのシステム及び方法
JP2015049806A Active JP5986246B2 (ja) 2010-06-30 2015-03-12 光分布を利用する粒子画像生成デバイスにおける測定精度を向上するためのシステム及び方法

Family Applications After (1)

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JP2015049806A Active JP5986246B2 (ja) 2010-06-30 2015-03-12 光分布を利用する粒子画像生成デバイスにおける測定精度を向上するためのシステム及び方法

Country Status (7)

Country Link
US (2) US8767069B2 (enExample)
EP (1) EP2588846B1 (enExample)
JP (2) JP5715249B2 (enExample)
CN (2) CN104764684B (enExample)
AU (1) AU2011279976B2 (enExample)
CA (1) CA2803610A1 (enExample)
WO (1) WO2012012168A2 (enExample)

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