JP2012039095A5 - - Google Patents
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- Publication number
- JP2012039095A5 JP2012039095A5 JP2011146293A JP2011146293A JP2012039095A5 JP 2012039095 A5 JP2012039095 A5 JP 2012039095A5 JP 2011146293 A JP2011146293 A JP 2011146293A JP 2011146293 A JP2011146293 A JP 2011146293A JP 2012039095 A5 JP2012039095 A5 JP 2012039095A5
- Authority
- JP
- Japan
- Prior art keywords
- wafers
- wafer
- bonding
- contacting
- series
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000000977 initiatory effect Effects 0.000 claims description 3
- 235000012431 wafers Nutrition 0.000 claims 25
- 238000000034 method Methods 0.000 claims 10
- 125000006850 spacer group Chemical group 0.000 claims 3
- 239000000758 substrate Substances 0.000 claims 2
- 239000011165 3D composite Substances 0.000 claims 1
- 238000005304 joining Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 230000010070 molecular adhesion Effects 0.000 claims 1
- 238000003466 welding Methods 0.000 claims 1
- 230000000644 propagated effect Effects 0.000 description 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1056566A FR2963848B1 (fr) | 2010-08-11 | 2010-08-11 | Procede de collage par adhesion moleculaire a basse pression |
| FR1056566 | 2010-08-11 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012039095A JP2012039095A (ja) | 2012-02-23 |
| JP2012039095A5 true JP2012039095A5 (enExample) | 2013-07-25 |
| JP5419929B2 JP5419929B2 (ja) | 2014-02-19 |
Family
ID=43617963
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011146293A Active JP5419929B2 (ja) | 2010-08-11 | 2011-06-30 | 低圧での分子接着接合方法 |
Country Status (7)
| Country | Link |
|---|---|
| EP (1) | EP2418678B1 (enExample) |
| JP (1) | JP5419929B2 (enExample) |
| KR (1) | KR101238679B1 (enExample) |
| CN (1) | CN102376623B (enExample) |
| FR (2) | FR2963848B1 (enExample) |
| SG (1) | SG178659A1 (enExample) |
| TW (2) | TW201428859A (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2978297A1 (fr) * | 2011-07-23 | 2013-01-25 | Soitec Silicon On Insulator | Reduction d'interferences mecaniques dans un systeme de collage de substrats a basse pression |
| FR2992772B1 (fr) | 2012-06-28 | 2014-07-04 | Soitec Silicon On Insulator | Procede de realisation de structure composite avec collage de type metal/metal |
| FR2997224B1 (fr) * | 2012-10-18 | 2015-12-04 | Soitec Silicon On Insulator | Procede de collage par adhesion moleculaire |
| DE112014007212A5 (de) * | 2014-12-23 | 2017-08-24 | Ev Group E. Thallner Gmbh | Verfahren und Vorrichtung zur Vorfixierung von Substraten |
| CN109075037B (zh) | 2016-02-16 | 2023-11-07 | Ev 集团 E·索尔纳有限责任公司 | 用于接合衬底的方法与设备 |
| FR3079532B1 (fr) * | 2018-03-28 | 2022-03-25 | Soitec Silicon On Insulator | Procede de fabrication d'une couche monocristalline de materiau ain et substrat pour croissance par epitaxie d'une couche monocristalline de materiau ain |
| CN110767589B (zh) * | 2019-10-31 | 2021-11-19 | 长春长光圆辰微电子技术有限公司 | 一种soi硅片对准键合的方法 |
| CN112635362B (zh) * | 2020-12-17 | 2023-12-22 | 武汉新芯集成电路制造有限公司 | 晶圆键合方法及晶圆键合系统 |
Family Cites Families (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3720515B2 (ja) * | 1997-03-13 | 2005-11-30 | キヤノン株式会社 | 基板処理装置及びその方法並びに基板の製造方法 |
| EP0886306A1 (en) * | 1997-06-16 | 1998-12-23 | IMEC vzw | Low temperature adhesion bonding method for composite substrates |
| EP1052687B1 (en) * | 1998-02-02 | 2016-06-29 | Nippon Steel & Sumitomo Metal Corporation | Method for manufacturing an soi substrate. |
| US6008113A (en) * | 1998-05-19 | 1999-12-28 | Kavlico Corporation | Process for wafer bonding in a vacuum |
| JP2000199883A (ja) * | 1998-10-29 | 2000-07-18 | Fujitsu Ltd | 反射型プロジェクタ装置 |
| US6958255B2 (en) * | 2002-08-08 | 2005-10-25 | The Board Of Trustees Of The Leland Stanford Junior University | Micromachined ultrasonic transducers and method of fabrication |
| WO2006038030A2 (en) * | 2004-10-09 | 2006-04-13 | Applied Microengineering Limited | Equipment for wafer bonding |
| JP2009094164A (ja) * | 2007-10-04 | 2009-04-30 | Toshiba Corp | インバータ装置における電力用半導体素子 |
| JP5354900B2 (ja) * | 2007-12-28 | 2013-11-27 | 株式会社半導体エネルギー研究所 | 半導体基板の作製方法 |
| FR2931014B1 (fr) * | 2008-05-06 | 2010-09-03 | Soitec Silicon On Insulator | Procede d'assemblage de plaques par adhesion moleculaire |
| JP2010021326A (ja) * | 2008-07-10 | 2010-01-28 | Sumco Corp | 貼り合わせウェーハの製造方法 |
| FR2935537B1 (fr) * | 2008-08-28 | 2010-10-22 | Soitec Silicon On Insulator | Procede d'initiation d'adhesion moleculaire |
| EP2200077B1 (en) * | 2008-12-22 | 2012-12-05 | Soitec | Method for bonding two substrates |
| JP5668275B2 (ja) * | 2009-04-08 | 2015-02-12 | 株式会社Sumco | Soiウェーハの製造方法及び貼り合わせ装置 |
-
2010
- 2010-08-11 FR FR1056566A patent/FR2963848B1/fr not_active Expired - Fee Related
-
2011
- 2011-06-29 TW TW103113917A patent/TW201428859A/zh unknown
- 2011-06-29 TW TW100122921A patent/TWI527131B/zh active
- 2011-06-30 JP JP2011146293A patent/JP5419929B2/ja active Active
- 2011-07-01 SG SG2011048584A patent/SG178659A1/en unknown
- 2011-07-12 EP EP11173513.0A patent/EP2418678B1/en active Active
- 2011-08-02 KR KR1020110076876A patent/KR101238679B1/ko active Active
- 2011-08-09 CN CN201110229518.9A patent/CN102376623B/zh active Active
-
2012
- 2012-01-24 FR FR1250663A patent/FR2969378A1/fr active Pending
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