JP2017536248A5 - - Google Patents
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- Publication number
- JP2017536248A5 JP2017536248A5 JP2017514278A JP2017514278A JP2017536248A5 JP 2017536248 A5 JP2017536248 A5 JP 2017536248A5 JP 2017514278 A JP2017514278 A JP 2017514278A JP 2017514278 A JP2017514278 A JP 2017514278A JP 2017536248 A5 JP2017536248 A5 JP 2017536248A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- sacrificial release
- mems
- providing
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims 19
- 239000000463 material Substances 0.000 claims 18
- 238000000034 method Methods 0.000 claims 11
- 239000000758 substrate Substances 0.000 claims 10
- 238000000151 deposition Methods 0.000 claims 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 6
- 238000005229 chemical vapour deposition Methods 0.000 claims 4
- 238000005240 physical vapour deposition Methods 0.000 claims 4
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 claims 4
- 229910004298 SiO 2 Inorganic materials 0.000 claims 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 claims 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 2
- 229910052732 germanium Inorganic materials 0.000 claims 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims 2
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium oxide Inorganic materials O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 claims 2
- 229910052750 molybdenum Inorganic materials 0.000 claims 2
- 239000011733 molybdenum Substances 0.000 claims 2
- PVADDRMAFCOOPC-UHFFFAOYSA-N oxogermanium Chemical compound [Ge]=O PVADDRMAFCOOPC-UHFFFAOYSA-N 0.000 claims 2
- 229910052710 silicon Inorganic materials 0.000 claims 2
- 239000010703 silicon Substances 0.000 claims 2
- 235000012239 silicon dioxide Nutrition 0.000 claims 2
- 239000000377 silicon dioxide Substances 0.000 claims 2
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 claims 2
- 229910052814 silicon oxide Inorganic materials 0.000 claims 2
- 238000002513 implantation Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14/498,965 | 2014-09-26 | ||
| US14/498,965 US9922956B2 (en) | 2014-09-26 | 2014-09-26 | Microelectromechanical system (MEMS) bond release structure and method of wafer transfer for three-dimensional integrated circuit (3D IC) integration |
| PCT/US2015/048930 WO2016048649A1 (en) | 2014-09-26 | 2015-09-08 | Microelectromechanical system (mems) bond release structure and method of wafer transfer for three-dimensional integrated circuit (3d ic) integration |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2017536248A JP2017536248A (ja) | 2017-12-07 |
| JP2017536248A5 true JP2017536248A5 (enExample) | 2018-09-27 |
Family
ID=54186292
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017514278A Pending JP2017536248A (ja) | 2014-09-26 | 2015-09-08 | ３次元集積回路（３ｄ ｉｃ）集積化のためのマイクロ電気機械システム（ｍｅｍｓ）結合剥離構造およびウェハ移載の方法 |
Country Status (10)
| Country | Link |
|---|---|
| US (1) | US9922956B2 (enExample) |
| EP (1) | EP3198634A1 (enExample) |
| JP (1) | JP2017536248A (enExample) |
| KR (1) | KR20170066354A (enExample) |
| CN (1) | CN106688077A (enExample) |
| BR (1) | BR112017006167A2 (enExample) |
| HK (1) | HK1232339A1 (enExample) |
| SG (1) | SG11201700918RA (enExample) |
| TW (1) | TWI585820B (enExample) |
| WO (1) | WO2016048649A1 (enExample) |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3007224A1 (en) * | 2014-10-08 | 2016-04-13 | Nxp B.V. | Metallisation for semiconductor device |
| US10049915B2 (en) * | 2015-01-09 | 2018-08-14 | Silicon Genesis Corporation | Three dimensional integrated circuit |
| JP6784969B2 (ja) * | 2015-10-22 | 2020-11-18 | 天馬微電子有限公司 | 薄膜デバイスとその製造方法 |
| FR3053159B1 (fr) * | 2016-06-23 | 2019-05-10 | Commissariat A L'energie Atomique Et Aux Energies Alternatives | Procede de fabrication d'une structure de transistors comportant une etape de bouchage |
| US10438838B2 (en) * | 2016-09-01 | 2019-10-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor structure and related method |
| US10714446B2 (en) | 2017-03-30 | 2020-07-14 | Intel Corporation | Apparatus with multi-wafer based device comprising embedded active and/or passive devices and method for forming such |
| US11211328B2 (en) * | 2017-10-16 | 2021-12-28 | SK Hynix Inc. | Semiconductor memory device of three-dimensional structure |
| DE102019102323A1 (de) * | 2018-02-02 | 2019-08-08 | Infineon Technologies Ag | Waferverbund und Verfahren zur Herstellung von Halbleiterbauteilen |
| DE102018214017B4 (de) * | 2018-02-07 | 2022-08-25 | Infineon Technologies Ag | Verfahren zum herstellen von dünnschichten und mikrosystemen mit dünnschichten |
| US20190371681A1 (en) * | 2018-06-01 | 2019-12-05 | Synaptics Incorporated | Stacked wafer integrated circuit |
| US10504873B1 (en) * | 2018-06-25 | 2019-12-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | 3DIC structure with protective structure and method of fabricating the same and package |
| US10734285B2 (en) | 2018-06-28 | 2020-08-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Bonding support structure (and related process) for wafer stacking |
| KR102538181B1 (ko) | 2018-10-24 | 2023-06-01 | 삼성전자주식회사 | 반도체 패키지 |
| US10796976B2 (en) * | 2018-10-31 | 2020-10-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Semiconductor device and method of forming the same |
| US10804202B2 (en) * | 2019-02-18 | 2020-10-13 | Sandisk Technologies Llc | Bonded assembly including a semiconductor-on-insulator die and methods for making the same |
| US11195818B2 (en) * | 2019-09-12 | 2021-12-07 | Taiwan Semiconductor Manufacturing Company, Ltd. | Backside contact for thermal displacement in a multi-wafer stacked integrated circuit |
| US11063022B2 (en) * | 2019-09-17 | 2021-07-13 | Taiwan Semiconductor Manufacturing Company, Ltd. | Package and manufacturing method of reconstructed wafer |
| US11158580B2 (en) * | 2019-10-18 | 2021-10-26 | Taiwan Semiconductor Manufacturing Co., Ltd. | Semiconductor devices with backside power distribution network and frontside through silicon via |
| US10910272B1 (en) * | 2019-10-22 | 2021-02-02 | Sandisk Technologies Llc | Reusable support substrate for formation and transfer of semiconductor devices and methods of using the same |
| US11239204B2 (en) * | 2019-11-25 | 2022-02-01 | Sandisk Technologies Llc | Bonded assembly containing laterally bonded bonding pads and methods of forming the same |
| US11088116B2 (en) * | 2019-11-25 | 2021-08-10 | Sandisk Technologies Llc | Bonded assembly containing horizontal and vertical bonding interfaces and methods of forming the same |
| US11488939B2 (en) * | 2020-01-20 | 2022-11-01 | Monolithic 3D Inc. | 3D semiconductor devices and structures with at least one vertical bus |
| US11270988B2 (en) * | 2020-01-20 | 2022-03-08 | Monolithic 3D Inc. | 3D semiconductor device(s) and structure(s) with electronic control units |
| US12021028B2 (en) * | 2020-01-20 | 2024-06-25 | Monolithic 3D Inc. | 3D semiconductor devices and structures with electronic circuit units |
| US11315903B2 (en) * | 2020-03-05 | 2022-04-26 | Nanya Technology Corporation | Semiconductor device with connecting structure and method for fabricating the same |
| US11127628B1 (en) * | 2020-03-16 | 2021-09-21 | Nanya Technology Corporation | Semiconductor device with connecting structure having a step-shaped conductive feature and method for fabricating the same |
| US11715755B2 (en) | 2020-06-15 | 2023-08-01 | Taiwan Semiconductor Manufacturing Co., Ltd. | Structure and method for forming integrated high density MIM capacitor |
| KR102777683B1 (ko) * | 2020-08-04 | 2025-03-10 | 에스케이하이닉스 주식회사 | 웨이퍼 대 웨이퍼 본딩 구조를 갖는 반도체 장치 및 그 제조방법 |
| US11817392B2 (en) | 2020-09-28 | 2023-11-14 | Taiwan Semiconductor Manufacturing Co., Ltd. | Integrated circuit |
| US11552055B2 (en) * | 2020-11-20 | 2023-01-10 | Qualcomm Incorporated | Integrated circuit (IC) packages employing front side back-end-of-line (FS-BEOL) to back side back-end-of-line (BS-BEOL) stacking for three-dimensional (3D) die stacking, and related fabrication methods |
| US11682652B2 (en) * | 2021-03-10 | 2023-06-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Notched wafer and bonding support structure to improve wafer stacking |
| CN113912005B (zh) * | 2021-10-08 | 2023-02-03 | 天津大学 | 一种基于柔性铰链结构的xy全解耦微运动平台 |
| WO2025235300A1 (en) * | 2024-05-08 | 2025-11-13 | Micron Technology, Inc. | Corrosion-susceptible bonding layer in assisting semiconductor wafer debonding |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6888608B2 (en) | 1995-09-06 | 2005-05-03 | Kabushiki Kaisha Toshiba | Liquid crystal display device |
| US6525415B2 (en) | 1999-12-28 | 2003-02-25 | Fuji Xerox Co., Ltd. | Three-dimensional semiconductor integrated circuit apparatus and manufacturing method therefor |
| US7045878B2 (en) | 2001-05-18 | 2006-05-16 | Reveo, Inc. | Selectively bonded thin film layer and substrate layer for processing of useful devices |
| US7420147B2 (en) | 2001-09-12 | 2008-09-02 | Reveo, Inc. | Microchannel plate and method of manufacturing microchannel plate |
| US7435651B2 (en) * | 2005-09-12 | 2008-10-14 | Texas Instruments Incorporated | Method to obtain uniform nitrogen profile in gate dielectrics |
| US7785938B2 (en) | 2006-04-28 | 2010-08-31 | Semiconductor Energy Laboratory Co., Ltd | Semiconductor integrated circuit, manufacturing method thereof, and semiconductor device using semiconductor integrated circuit |
| WO2008036837A2 (en) | 2006-09-20 | 2008-03-27 | The Board Of Trustees Of The University Of Illinois | Release strategies for making transferable semiconductor structures, devices and device components |
| US20080291767A1 (en) | 2007-05-21 | 2008-11-27 | International Business Machines Corporation | Multiple wafer level multiple port register file cell |
| US7897428B2 (en) | 2008-06-03 | 2011-03-01 | International Business Machines Corporation | Three-dimensional integrated circuits and techniques for fabrication thereof |
| US8742476B1 (en) | 2012-11-27 | 2014-06-03 | Monolithic 3D Inc. | Semiconductor device and structure |
| US8330559B2 (en) | 2010-09-10 | 2012-12-11 | Taiwan Semiconductor Manufacturing Company, Ltd. | Wafer level packaging |
| KR101913322B1 (ko) * | 2010-12-24 | 2018-10-30 | 퀄컴 인코포레이티드 | 반도체 소자들을 위한 트랩 리치 층 |
| US8563396B2 (en) | 2011-01-29 | 2013-10-22 | International Business Machines Corporation | 3D integration method using SOI substrates and structures produced thereby |
| US8970045B2 (en) | 2011-03-31 | 2015-03-03 | Soitec | Methods for fabrication of semiconductor structures including interposers with conductive vias, and related structures and devices |
| US8368152B2 (en) | 2011-04-18 | 2013-02-05 | Taiwan Semiconductor Manufacturing Company, Ltd. | MEMS device etch stop |
| US8729673B1 (en) | 2011-09-21 | 2014-05-20 | Sandia Corporation | Structured wafer for device processing |
| US8906803B2 (en) | 2013-03-15 | 2014-12-09 | Sandia Corporation | Method of forming through substrate vias (TSVs) and singulating and releasing die having the TSVs from a mechanical support substrate |
-
2014
- 2014-09-26 US US14/498,965 patent/US9922956B2/en not_active Expired - Fee Related
-
2015
- 2015-09-08 SG SG11201700918RA patent/SG11201700918RA/en unknown
- 2015-09-08 WO PCT/US2015/048930 patent/WO2016048649A1/en not_active Ceased
- 2015-09-08 CN CN201580048185.6A patent/CN106688077A/zh active Pending
- 2015-09-08 JP JP2017514278A patent/JP2017536248A/ja active Pending
- 2015-09-08 HK HK17105914.3A patent/HK1232339A1/zh unknown
- 2015-09-08 EP EP15767645.3A patent/EP3198634A1/en not_active Withdrawn
- 2015-09-08 BR BR112017006167A patent/BR112017006167A2/pt not_active Application Discontinuation
- 2015-09-08 KR KR1020177007903A patent/KR20170066354A/ko not_active Withdrawn
- 2015-09-21 TW TW104131176A patent/TWI585820B/zh not_active IP Right Cessation
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