JP2011522120A5 - - Google Patents
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- JP2011522120A5 JP2011522120A5 JP2011511113A JP2011511113A JP2011522120A5 JP 2011522120 A5 JP2011522120 A5 JP 2011522120A5 JP 2011511113 A JP2011511113 A JP 2011511113A JP 2011511113 A JP2011511113 A JP 2011511113A JP 2011522120 A5 JP2011522120 A5 JP 2011522120A5
- Authority
- JP
- Japan
- Prior art keywords
- tellurium
- precursor
- sime
- geme
- reactor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 239000002243 precursor Substances 0.000 claims description 36
- 229910052714 tellurium Inorganic materials 0.000 claims description 35
- 238000000034 method Methods 0.000 claims description 34
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 claims description 32
- 239000000758 substrate Substances 0.000 claims description 10
- 229910052732 germanium Chemical group 0.000 claims description 8
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical group [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 8
- 229910052787 antimony Inorganic materials 0.000 claims description 6
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 6
- 239000010408 film Substances 0.000 claims description 6
- 229910052799 carbon Inorganic materials 0.000 claims description 4
- -1 perfluorophenyl carbon Chemical compound 0.000 claims description 4
- 125000004191 (C1-C6) alkoxy group Chemical group 0.000 claims description 2
- 125000004169 (C1-C6) alkyl group Chemical group 0.000 claims description 2
- 125000004890 (C1-C6) alkylamino group Chemical group 0.000 claims description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 2
- 125000000217 alkyl group Chemical group 0.000 claims description 2
- 125000005103 alkyl silyl group Chemical group 0.000 claims description 2
- 238000000231 atomic layer deposition Methods 0.000 claims description 2
- 238000005229 chemical vapour deposition Methods 0.000 claims description 2
- 238000000151 deposition Methods 0.000 claims description 2
- XPXMKIXDFWLRAA-UHFFFAOYSA-N hydrazinide Chemical compound [NH-]N XPXMKIXDFWLRAA-UHFFFAOYSA-N 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 239000010703 silicon Chemical group 0.000 claims description 2
- 239000010409 thin film Substances 0.000 claims description 2
- 239000007789 gas Substances 0.000 claims 5
- 239000000126 substance Substances 0.000 claims 2
- YZCKVEUIGOORGS-IGMARMGPSA-N Protium Chemical compound [1H] YZCKVEUIGOORGS-IGMARMGPSA-N 0.000 claims 1
- 101000996032 Xenopus laevis Nodal homolog Proteins 0.000 description 2
- 239000000203 mixture Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US5712808P | 2008-05-29 | 2008-05-29 | |
| US61/057,128 | 2008-05-29 | ||
| US12/475,204 US8101237B2 (en) | 2008-05-29 | 2009-05-29 | Tellurium precursors for film deposition |
| PCT/IB2009/008067 WO2010055423A2 (en) | 2008-05-29 | 2009-05-29 | Tellurium precursors for film deposition |
| US12/475,204 | 2009-05-29 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2011522120A JP2011522120A (ja) | 2011-07-28 |
| JP2011522120A5 true JP2011522120A5 (OSRAM) | 2011-09-08 |
Family
ID=41380625
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011511113A Pending JP2011522120A (ja) | 2008-05-29 | 2009-05-29 | 膜堆積用のテルル前駆体 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8101237B2 (OSRAM) |
| JP (1) | JP2011522120A (OSRAM) |
| KR (1) | KR20110014160A (OSRAM) |
| CN (1) | CN102046838A (OSRAM) |
| TW (1) | TWI480411B (OSRAM) |
| WO (1) | WO2010055423A2 (OSRAM) |
Families Citing this family (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2018642A4 (en) | 2006-05-12 | 2009-05-27 | Advanced Tech Materials | LOW TEMPERATURE DEPOSITION OF STORAGE MATERIALS |
| CN102352488B (zh) | 2006-11-02 | 2016-04-06 | 诚实公司 | 对于金属薄膜的cvd/ald有用的锑及锗复合物 |
| US8834968B2 (en) | 2007-10-11 | 2014-09-16 | Samsung Electronics Co., Ltd. | Method of forming phase change material layer using Ge(II) source, and method of fabricating phase change memory device |
| KR101458953B1 (ko) | 2007-10-11 | 2014-11-07 | 삼성전자주식회사 | Ge(Ⅱ)소오스를 사용한 상변화 물질막 형성 방법 및상변화 메모리 소자 제조 방법 |
| SG152203A1 (en) * | 2007-10-31 | 2009-05-29 | Advanced Tech Materials | Amorphous ge/te deposition process |
| US20090215225A1 (en) | 2008-02-24 | 2009-08-27 | Advanced Technology Materials, Inc. | Tellurium compounds useful for deposition of tellurium containing materials |
| US8802194B2 (en) | 2008-05-29 | 2014-08-12 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Tellurium precursors for film deposition |
| JP2011522120A (ja) | 2008-05-29 | 2011-07-28 | レール・リキード−ソシエテ・アノニム・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード | 膜堆積用のテルル前駆体 |
| US8636845B2 (en) | 2008-06-25 | 2014-01-28 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Metal heterocyclic compounds for deposition of thin films |
| US8691668B2 (en) | 2009-09-02 | 2014-04-08 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Dihalide germanium(II) precursors for germanium-containing film depositions |
| WO2011095849A1 (en) * | 2010-02-03 | 2011-08-11 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Chalcogenide-containing precursors, methods of making, and methods of using the same for thin film deposition |
| KR101163046B1 (ko) * | 2010-07-08 | 2012-07-05 | 에스케이하이닉스 주식회사 | 상변화 메모리 소자의 제조 방법 |
| RU2440640C1 (ru) * | 2010-11-10 | 2012-01-20 | Государственное образовательное учреждение высшего профессионального образования Дагестанский государственный университет | Способ получения монокристаллических пленок и слоев теллура |
| CN105849221B (zh) | 2013-09-27 | 2019-06-18 | 乔治洛德方法研究和开发液化空气有限公司 | 胺取代的三甲硅烷基胺和三-二甲硅烷基胺化合物 |
| US9543144B2 (en) * | 2014-12-31 | 2017-01-10 | L'air Liquide, Societe Anonyme Pour L'etude Et L'exploitation Des Procedes Georges Claude | Vapor deposition of chalcogenide-containing films |
| US11124876B2 (en) | 2015-03-30 | 2021-09-21 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploitation des Procédés Georges Claude | Si-containing film forming precursors and methods of using the same |
| US9777025B2 (en) | 2015-03-30 | 2017-10-03 | L'Air Liquide, Société pour l'Etude et l'Exploitation des Procédés Georges Claude | Si-containing film forming precursors and methods of using the same |
| US10192734B2 (en) | 2016-12-11 | 2019-01-29 | L'Air Liquide, Société Anonyme pour l'Etude et l'Exploration des Procédés Georges Claude | Short inorganic trisilylamine-based polysilazanes for thin film deposition |
| TWI848976B (zh) * | 2018-10-04 | 2024-07-21 | 日商Adeka股份有限公司 | 原子層堆積法用薄膜形成用原料、薄膜形成用原料、薄膜之製造方法及化合物 |
| TWI889746B (zh) * | 2020-02-20 | 2025-07-11 | 美商應用材料股份有限公司 | 含碲薄膜之沉積 |
| KR102444272B1 (ko) * | 2020-05-18 | 2022-09-16 | 서울대학교산학협력단 | 원자층 증착 공정을 이용한 칼코게나이드계 박막의 형성 방법, 이를 이용한 스위칭 소자의 형성 방법 및 메모리 소자의 제조 방법 |
| KR102444266B1 (ko) * | 2020-05-18 | 2022-09-16 | 서울대학교산학협력단 | 원자층 증착 공정을 이용한 칼코게나이드계 박막의 형성 방법, 이를 적용한 상변화 물질층의 형성 방법 및 상변화 메모리 소자의 제조 방법 |
| US12356873B2 (en) | 2020-05-18 | 2025-07-08 | Seoul National University R&DBFoundation | Method of forming chalcogenide-based thin film using atomic layer deposition process, method of forming phase change material layer and switching device, and method of fabricating memory device using the same |
| CN115216748B (zh) * | 2022-09-19 | 2022-12-30 | 中国科学院苏州纳米技术与纳米仿生研究所 | 碲薄膜的制备方法和半导体器件 |
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| CN102352488B (zh) * | 2006-11-02 | 2016-04-06 | 诚实公司 | 对于金属薄膜的cvd/ald有用的锑及锗复合物 |
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| US8765223B2 (en) * | 2008-05-08 | 2014-07-01 | Air Products And Chemicals, Inc. | Binary and ternary metal chalcogenide materials and method of making and using same |
| JP2011522120A (ja) | 2008-05-29 | 2011-07-28 | レール・リキード−ソシエテ・アノニム・プール・レテュード・エ・レクスプロワタシオン・デ・プロセデ・ジョルジュ・クロード | 膜堆積用のテルル前駆体 |
| TWM372771U (en) * | 2009-05-20 | 2010-01-21 | Legend Lifestyle Products Corp | Torque detection display device for tool |
-
2009
- 2009-05-29 JP JP2011511113A patent/JP2011522120A/ja active Pending
- 2009-05-29 CN CN200980119838XA patent/CN102046838A/zh active Pending
- 2009-05-29 WO PCT/IB2009/008067 patent/WO2010055423A2/en not_active Ceased
- 2009-05-29 KR KR1020107026546A patent/KR20110014160A/ko not_active Ceased
- 2009-05-29 US US12/475,204 patent/US8101237B2/en active Active
- 2009-06-01 TW TW098118134A patent/TWI480411B/zh not_active IP Right Cessation
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