JP2010193291A5 - - Google Patents

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Publication number
JP2010193291A5
JP2010193291A5 JP2009036771A JP2009036771A JP2010193291A5 JP 2010193291 A5 JP2010193291 A5 JP 2010193291A5 JP 2009036771 A JP2009036771 A JP 2009036771A JP 2009036771 A JP2009036771 A JP 2009036771A JP 2010193291 A5 JP2010193291 A5 JP 2010193291A5
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JP
Japan
Prior art keywords
impedance
circuit
drive circuit
determination
flip
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Application number
JP2009036771A
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English (en)
Japanese (ja)
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JP2010193291A (ja
JP5642935B2 (ja
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Priority to JP2009036771A priority Critical patent/JP5642935B2/ja
Priority claimed from JP2009036771A external-priority patent/JP5642935B2/ja
Priority to US12/707,354 priority patent/US8278973B2/en
Publication of JP2010193291A publication Critical patent/JP2010193291A/ja
Publication of JP2010193291A5 publication Critical patent/JP2010193291A5/ja
Application granted granted Critical
Publication of JP5642935B2 publication Critical patent/JP5642935B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2009036771A 2009-02-19 2009-02-19 インピーダンス調整回路及びこれを備える半導体装置 Expired - Fee Related JP5642935B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009036771A JP5642935B2 (ja) 2009-02-19 2009-02-19 インピーダンス調整回路及びこれを備える半導体装置
US12/707,354 US8278973B2 (en) 2009-02-19 2010-02-17 Impedance control circuit and semiconductor device including the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009036771A JP5642935B2 (ja) 2009-02-19 2009-02-19 インピーダンス調整回路及びこれを備える半導体装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2014220946A Division JP2015043620A (ja) 2014-10-30 2014-10-30 半導体装置においてオンダイターミネーションを提供するための方法

Publications (3)

Publication Number Publication Date
JP2010193291A JP2010193291A (ja) 2010-09-02
JP2010193291A5 true JP2010193291A5 (cg-RX-API-DMAC7.html) 2012-01-26
JP5642935B2 JP5642935B2 (ja) 2014-12-17

Family

ID=42559345

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009036771A Expired - Fee Related JP5642935B2 (ja) 2009-02-19 2009-02-19 インピーダンス調整回路及びこれを備える半導体装置

Country Status (2)

Country Link
US (1) US8278973B2 (cg-RX-API-DMAC7.html)
JP (1) JP5642935B2 (cg-RX-API-DMAC7.html)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100921832B1 (ko) * 2008-03-03 2009-10-16 주식회사 하이닉스반도체 반도체 메모리장치의 온 다이 터미네이션 제어회로
KR101166643B1 (ko) * 2010-09-07 2012-07-23 에스케이하이닉스 주식회사 데이터 출력 회로
KR101086884B1 (ko) 2010-09-30 2011-11-25 주식회사 하이닉스반도체 임피던스 제어신호 발생 회로 및 반도체 회로의 임피던스 제어 방법
JP2013081079A (ja) * 2011-10-04 2013-05-02 Elpida Memory Inc 半導体装置
KR101950319B1 (ko) * 2012-06-27 2019-02-20 에스케이하이닉스 주식회사 온 다이 터미네이션 회로
KR20140120101A (ko) * 2013-04-02 2014-10-13 에스케이하이닉스 주식회사 데이터송신회로
KR102083005B1 (ko) 2013-10-31 2020-02-28 삼성전자주식회사 종단 저항을 보정하는 반도체 메모리 장치 및 그것의 종단 저항 보정 방법
JP2015154316A (ja) * 2014-02-17 2015-08-24 マイクロン テクノロジー， インク． 半導体装置
US10554450B2 (en) * 2018-03-14 2020-02-04 Samsung Display Co., Ltd. High resolution voltage-mode driver
JP2024531851A (ja) * 2022-07-27 2024-09-03 チャンシン メモリー テクノロジーズ インコーポレイテッド インピーダンス較正回路
US12431872B2 (en) * 2023-06-16 2025-09-30 Taiwan Semiconductor Manufacturing Company Ltd. Semiconductor circuit and method for operating the same

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Publication number Priority date Publication date Assignee Title
US5606275A (en) * 1995-09-05 1997-02-25 Motorola, Inc. Buffer circuit having variable output impedance
JP2001217705A (ja) * 2000-01-31 2001-08-10 Fujitsu Ltd Ｌｓｉデバイス
US6356105B1 (en) * 2000-06-28 2002-03-12 Intel Corporation Impedance control system for a center tapped termination bus
KR100391148B1 (ko) * 2000-11-02 2003-07-16 삼성전자주식회사 프로그래머블 임피던스 제어회로 및 방법
US6509778B2 (en) * 2001-03-15 2003-01-21 International Business Machines Corporation BIST circuit for variable impedance system
US6690211B1 (en) * 2002-11-28 2004-02-10 Jmicron Technology Corp. Impedance matching circuit
JP4428504B2 (ja) * 2003-04-23 2010-03-10 株式会社ルネサステクノロジ 半導体集積回路装置
JP3885773B2 (ja) * 2003-06-30 2007-02-28 日本電気株式会社 インピーダンス調整回路及び調整方法、インピーダンス調整回路を備える半導体装置
KR100610007B1 (ko) * 2004-06-14 2006-08-08 삼성전자주식회사 임피던스 랜지 시프팅 기능을 갖는 반도체 장치의프로그래머블 임피던스 콘트롤 회로 및 그에 따른임피던스 랜지 시프팅 방법
KR100558559B1 (ko) * 2004-07-07 2006-03-10 삼성전자주식회사 프로그래머블 임피던스 컨트롤 장치 및 그의 동작 방법
US7221193B1 (en) * 2005-01-20 2007-05-22 Altera Corporation On-chip termination with calibrated driver strength
JP2006270331A (ja) * 2005-03-23 2006-10-05 Nec Corp インピーダンス調整回路及び集積回路装置
KR100655083B1 (ko) * 2005-05-11 2006-12-08 삼성전자주식회사 반도체 장치에서의 임피던스 콘트롤 회로 및 임피던스콘트롤 방법
KR100588601B1 (ko) * 2005-06-09 2006-06-14 삼성전자주식회사 임피던스 제어 회로
JP4916699B2 (ja) * 2005-10-25 2012-04-18 エルピーダメモリ株式会社 Ｚｑキャリブレーション回路及びこれを備えた半導体装置
JP4205741B2 (ja) * 2006-08-21 2009-01-07 エルピーダメモリ株式会社 キャリブレーション回路を有する半導体装置及びキャリブレーション方法
JP4920512B2 (ja) * 2007-07-04 2012-04-18 エルピーダメモリ株式会社 キャリブレーション回路及びこれを備える半導体装置、並びに、データ処理システム
US7973553B1 (en) * 2010-03-11 2011-07-05 Altera Corporation Techniques for on-chip termination

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