JP2009239300A - 陽極酸化処理された基板支持体 - Google Patents
陽極酸化処理された基板支持体 Download PDFInfo
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- 238000000034 method Methods 0.000 claims abstract description 42
- 238000000576 coating method Methods 0.000 claims abstract description 38
- 239000011248 coating agent Substances 0.000 claims abstract description 36
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 22
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 22
- 238000010438 heat treatment Methods 0.000 claims description 23
- 239000011324 bead Substances 0.000 claims description 12
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- 230000008569 process Effects 0.000 claims description 9
- 238000007743 anodising Methods 0.000 claims description 8
- 238000005422 blasting Methods 0.000 claims description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 5
- 238000005229 chemical vapour deposition Methods 0.000 claims description 4
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 3
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 3
- 239000004642 Polyimide Substances 0.000 claims description 2
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 2
- VXAUWWUXCIMFIM-UHFFFAOYSA-M aluminum;oxygen(2-);hydroxide Chemical compound [OH-].[O-2].[Al+3] VXAUWWUXCIMFIM-UHFFFAOYSA-M 0.000 claims description 2
- BPUBBGLMJRNUCC-UHFFFAOYSA-N oxygen(2-);tantalum(5+) Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ta+5].[Ta+5] BPUBBGLMJRNUCC-UHFFFAOYSA-N 0.000 claims description 2
- 229920001721 polyimide Polymers 0.000 claims description 2
- 235000012239 silicon dioxide Nutrition 0.000 claims description 2
- 239000000377 silicon dioxide Substances 0.000 claims description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 2
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 claims 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims 4
- 229910052710 silicon Inorganic materials 0.000 claims 4
- 239000010703 silicon Substances 0.000 claims 4
- 230000005484 gravity Effects 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 12
- 239000004020 conductor Substances 0.000 abstract 1
- 239000010408 film Substances 0.000 description 17
- 230000008021 deposition Effects 0.000 description 10
- 239000007789 gas Substances 0.000 description 10
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 10
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- 238000005530 etching Methods 0.000 description 4
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- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 4
- 238000005270 abrasive blasting Methods 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 238000004049 embossing Methods 0.000 description 3
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- 239000004065 semiconductor Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- AZDRQVAHHNSJOQ-UHFFFAOYSA-N alumane Chemical group [AlH3] AZDRQVAHHNSJOQ-UHFFFAOYSA-N 0.000 description 1
- 238000002048 anodisation reaction Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000006227 byproduct Substances 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 230000003116 impacting effect Effects 0.000 description 1
- 238000005468 ion implantation Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
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- 238000007750 plasma spraying Methods 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 239000011253 protective coating Substances 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
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- 238000009827 uniform distribution Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4581—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber characterised by material of construction or surface finish of the means for supporting the substrate
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D11/00—Electrolytic coating by surface reaction, i.e. forming conversion layers
- C25D11/02—Anodisation
- C25D11/04—Anodisation of aluminium or alloys based thereon
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D11/00—Electrolytic coating by surface reaction, i.e. forming conversion layers
- C25D11/02—Anodisation
- C25D11/04—Anodisation of aluminium or alloys based thereon
- C25D11/16—Pretreatment, e.g. desmutting
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D11/00—Electrolytic coating by surface reaction, i.e. forming conversion layers
- C25D11/02—Anodisation
- C25D11/04—Anodisation of aluminium or alloys based thereon
- C25D11/18—After-treatment, e.g. pore-sealing
Abstract
【解決手段】本発明の一実施形態において、基板支持体は、電気的絶縁性被膜により覆われている基板支持面を有する伝導体を含む。基板支持面の中心にある被膜の少なくとも一部は、約80から約200ミクロインチ間の表面仕上げを有する。他の実施形態において、基板支持体は、メッキ処理されたアルミニウム本体を含み、そのアルミニウム本体は、上部に基板を支持するように適合された本体の一部に、約80から約200ミクロインチの表面仕上げ処理部を有する。
【選択図】図2
Description
Claims (20)
- 重力により大領域基板を支持するように適合された基板支持体であって、
大領域ガラス基板を上部に支持するように構成された基板支持面を有し、少なくとも1つの加熱素子を含むアルミニウム本体と、
前記基板支持面上に配置された陽極酸化処理された被膜と、
のみから実質的になり、
前記被膜が、0.3ミル〜2.16ミルの厚さと、基板接触領域とを有し、
前記基板接触領域は、前記基板支持面を88ミクロインチ〜230ミクロインチの表面粗さに準備して、続いて前記基板表面を前記厚さまで陽極酸化処理することによって得られる、基板支持体。 - 前記基板支持面を準備するステップは、前記基板支持面をビードブラスト処理するステップを備える、請求項1記載の基板支持体。
- 前記基板支持体は、前記基板接触領域に隣接する周辺領域を更に含み、
前記周辺領域は、前記基板表面を陽極酸化処理する前において130ミクロインチ未満の表面粗さを有する、請求項1記載の基板支持体。 - 前記基板支持体は、ガス分配用プレートと対向配置されている、請求項1記載の基板支持体。
- 前記ガス分配用プレートは、化学気相堆積チャンバにシリコン含有ガスを供給するように適合されている、請求項4記載の基板支持体。
- ガラス基板を支持する方法であって、
基板支持体を供給するステップであって、前記基板支持体が、電気的導電性本体と、前記基板支持体の表面に形成される基板接触領域とを備え、前記基板接触領域を形成するプロセスが、
前記電気的導電性本体の表面領域上に電気的に絶縁性の被膜を形成する工程であって、前記被膜が0.3ミル〜2.16ミルの厚さを有し、前記表面領域が前記基板接触領域に実質的に対応する、前記工程と、
前記表面領域を88ミクロインチ〜230ミクロインチの表面粗さに準備する工程と、
を備える、前記ステップと、
基板処理チャンバ内の基板処理領域に隣接して前記基板支持体を位置決めするステップであって、前記基板接触領域が前記基板処理領域に隣接する、前記ステップと、
前記基板接触領域上に基板を位置決めするステップと、
を備える、方法。 - 前記基板支持体の前記電気的導電性本体は、アルミニウム本体である、請求項6記載の方法。
- 電気的に絶縁性の被膜を形成する工程は、前記基板支持体の少なくとも前記表面領域を陽極酸化処理する工程を含む、請求項7記載の方法。
- 前記表面領域を準備する工程は、ビードブラスト処理する工程のみから実質的になる、請求項8記載の方法。
- 前記ビードブラスト処理する工程は、陽極酸化処理する工程の前に行われる、請求項9記載の方法。
- 前記電気的に絶縁性の被膜は、窒化珪素、二酸化珪素、二酸化アルミニウム、五酸化タンタル、シリコンカーバイド、ポリイミドから成るグループから選択される、請求項6記載の方法。
- 前記基板接触領域は、前記基板支持体の表面のうち、処理中に基板に接触する全ての領域を含む、請求項6記載の方法。
- 前記基板支持体は、少なくとも1つの加熱素子を含む、請求項6記載の方法。
- 前記基板支持体は、前記基板接触領域に隣接する周辺領域を更に含み、
前記周辺領域は、130ミクロインチ未満の表面粗さを有する、請求項6記載の方法。 - 基板処理領域に隣接して前記基板支持体を位置決めするステップは、前記基板支持体をガス分配用プレートと対向配置するステップを備える、請求項6記載の方法。
- ガラス基板を支持する方法であって、
アルミニウム本体を有する基板支持体上に基板接触領域を形成するステップであって、前記基板接触領域を形成するステップが、
前記基板支持体の表面領域を88ミクロインチ〜230ミクロインチの表面粗さに準備する工程であって、前記表面領域が前記基板接触領域に実質的に対応する、前記工程と、
前記表面領域を準備する工程の後に、前記基板支持体の少なくとも前記表面領域を、0.3ミル〜2.16ミルの厚さまで陽極酸化処理する工程と、
を備える、前記ステップと、
基板処理チャンバ内の基板処理領域に隣接して前記基板支持体を位置決めするステップであって、前記基板接触領域が前記基板処理領域に隣接する、前記ステップと、
前記基板接触領域上にガラス基板を位置決めするステップと、
前記基板処理領域にシリコン含有ガスを導入するステップと、
前記シリコン含有ガスを励起するために前記基板処理領域内にプラズマを生成するステップと、
前記基板上にシリコン含有膜を堆積するステップと、
を備える、方法。 - 前記基板支持面を準備する工程は、前記基板支持面をビードブラスト処理する工程を備える、請求項16記載の方法。
- 前記基板支持体は、前記基板接触領域に隣接する周辺領域を備え、
前記周辺領域は、前記基板支持面を陽極酸化処理する前において130ミクロインチ未満の表面粗さを有する、請求項16記載の方法。 - 前記基板接触領域は、前記基板支持体の表面のうち、処理中に基板に接触する全ての領域を含む、請求項16記載の方法。
- 前記基板支持体は、少なくとも1つの加熱素子を含む、請求項16記載の方法。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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US10/435,182 US20040221959A1 (en) | 2003-05-09 | 2003-05-09 | Anodized substrate support |
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JP2004140365A Division JP2005051200A (ja) | 2003-05-09 | 2004-05-10 | メッキ処理された基板支持体 |
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JP2004140365A Pending JP2005051200A (ja) | 2003-05-09 | 2004-05-10 | メッキ処理された基板支持体 |
JP2009149983A Pending JP2009239300A (ja) | 2003-05-09 | 2009-06-24 | 陽極酸化処理された基板支持体 |
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US (2) | US20040221959A1 (ja) |
EP (1) | EP1475460A1 (ja) |
JP (2) | JP2005051200A (ja) |
KR (2) | KR20040096785A (ja) |
CN (1) | CN100385640C (ja) |
TW (1) | TW200507157A (ja) |
Cited By (1)
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JP2012222287A (ja) * | 2011-04-13 | 2012-11-12 | Shimadzu Corp | プラズマcvd成膜装置および基板搭載装置 |
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2004
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- 2004-05-08 KR KR1020040032489A patent/KR20040096785A/ko not_active Application Discontinuation
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TW200507157A (en) | 2005-02-16 |
CN100385640C (zh) | 2008-04-30 |
KR20060100302A (ko) | 2006-09-20 |
US7732010B2 (en) | 2010-06-08 |
JP2005051200A (ja) | 2005-02-24 |
EP1475460A1 (en) | 2004-11-10 |
US20060185795A1 (en) | 2006-08-24 |
US20040221959A1 (en) | 2004-11-11 |
CN1551326A (zh) | 2004-12-01 |
KR20040096785A (ko) | 2004-11-17 |
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