JP2008515222A - 誘電体層表面処理を有する電子デバイスの製造方法 - Google Patents

誘電体層表面処理を有する電子デバイスの製造方法 Download PDF

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Publication number
JP2008515222A
JP2008515222A JP2007534599A JP2007534599A JP2008515222A JP 2008515222 A JP2008515222 A JP 2008515222A JP 2007534599 A JP2007534599 A JP 2007534599A JP 2007534599 A JP2007534599 A JP 2007534599A JP 2008515222 A JP2008515222 A JP 2008515222A
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layer
polymer layer
plasma
monomer
styrene
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Japanese (ja)
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JP2008515222A5 (https=
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ディー. ダンバー,ティモシー
ダブリュ. ケリー,トミー
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3M Innovative Properties Co
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3M Innovative Properties Co
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/466Lateral bottom-gate IGFETs comprising only a single gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K19/00Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00
    • H10K19/10Integrated devices, or assemblies of multiple devices, comprising at least one organic element specially adapted for rectifying, amplifying, oscillating or switching, covered by group H10K10/00 comprising field-effect transistors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/60Organic compounds having low molecular weight
    • H10K85/615Polycyclic condensed aromatic hydrocarbons, e.g. anthracene
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/63Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
    • H10P14/6326Deposition processes
    • H10P14/6328Deposition from the gas or vapour phase
    • H10P14/6334Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
    • H10P14/6336Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition in the presence of a plasma [PECVD]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/68Organic materials, e.g. photoresists
    • H10P14/683Organic materials, e.g. photoresists carbon-based polymeric organic materials, e.g. polyimides, poly cyclobutene or PVC
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P14/00Formation of materials, e.g. in the shape of layers or pillars
    • H10P14/60Formation of materials, e.g. in the shape of layers or pillars of insulating materials
    • H10P14/68Organic materials, e.g. photoresists
    • H10P14/683Organic materials, e.g. photoresists carbon-based polymeric organic materials, e.g. polyimides, poly cyclobutene or PVC
    • H10P14/687Organic materials, e.g. photoresists carbon-based polymeric organic materials, e.g. polyimides, poly cyclobutene or PVC the materials being fluorocarbon compounds, e.g. (CHxFy) n or polytetrafluoroethylene

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  • Thin Film Transistor (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Formation Of Insulating Films (AREA)
JP2007534599A 2004-09-30 2005-08-26 誘電体層表面処理を有する電子デバイスの製造方法 Withdrawn JP2008515222A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/954,413 US7399668B2 (en) 2004-09-30 2004-09-30 Method for making electronic devices having a dielectric layer surface treatment
PCT/US2005/030412 WO2006039019A1 (en) 2004-09-30 2005-08-26 Method for making electronic devices having a dielectric layer surface treatment

Publications (2)

Publication Number Publication Date
JP2008515222A true JP2008515222A (ja) 2008-05-08
JP2008515222A5 JP2008515222A5 (https=) 2008-09-18

Family

ID=35427645

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007534599A Withdrawn JP2008515222A (ja) 2004-09-30 2005-08-26 誘電体層表面処理を有する電子デバイスの製造方法

Country Status (7)

Country Link
US (2) US7399668B2 (https=)
EP (1) EP1800358A1 (https=)
JP (1) JP2008515222A (https=)
KR (1) KR20070072897A (https=)
CN (1) CN100593249C (https=)
CA (1) CA2582332A1 (https=)
WO (1) WO2006039019A1 (https=)

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JP2022109293A (ja) * 2017-04-18 2022-07-27 東京エレクトロン株式会社 被処理体を処理する方法

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US8871628B2 (en) * 2009-01-21 2014-10-28 Veeco Ald Inc. Electrode structure, device comprising the same and method for forming electrode structure
KR101172147B1 (ko) 2009-02-23 2012-08-07 시너스 테크놀리지, 인코포레이티드 플라즈마에 의한 라디칼을 이용한 박막 형성 방법
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US8758512B2 (en) * 2009-06-08 2014-06-24 Veeco Ald Inc. Vapor deposition reactor and method for forming thin film
KR200448504Y1 (ko) * 2009-07-14 2010-04-21 주식회사 협진아이엔씨 휴대폰용 접속단자
TWI394305B (zh) * 2009-10-08 2013-04-21 Nat Univ Tsing Hua 有機薄膜電晶體之製備方法以及有機薄膜電晶體之閘極介電層表面處理方法
US8637123B2 (en) * 2009-12-29 2014-01-28 Lotus Applied Technology, Llc Oxygen radical generation for radical-enhanced thin film deposition
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US9163310B2 (en) * 2011-02-18 2015-10-20 Veeco Ald Inc. Enhanced deposition of layer on substrate using radicals
KR102046130B1 (ko) * 2012-03-06 2019-11-18 셈블란트 리미티드 코팅된 전기 어셈블리
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GB201814231D0 (en) * 2018-08-31 2018-10-17 Univ Surrey Apparatus for forming a poly(p-xylylene) film on a component
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Publication number Priority date Publication date Assignee Title
JP2022109293A (ja) * 2017-04-18 2022-07-27 東京エレクトロン株式会社 被処理体を処理する方法
JP7320646B2 (ja) 2017-04-18 2023-08-03 東京エレクトロン株式会社 被処理体を処理する方法

Also Published As

Publication number Publication date
CN100593249C (zh) 2010-03-03
US20060068519A1 (en) 2006-03-30
CN101057346A (zh) 2007-10-17
US7399668B2 (en) 2008-07-15
WO2006039019A1 (en) 2006-04-13
EP1800358A1 (en) 2007-06-27
CA2582332A1 (en) 2006-04-13
KR20070072897A (ko) 2007-07-06
US20080145701A1 (en) 2008-06-19

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