JP2008071335A5 - - Google Patents

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Publication number
JP2008071335A5
JP2008071335A5 JP2007171934A JP2007171934A JP2008071335A5 JP 2008071335 A5 JP2008071335 A5 JP 2008071335A5 JP 2007171934 A JP2007171934 A JP 2007171934A JP 2007171934 A JP2007171934 A JP 2007171934A JP 2008071335 A5 JP2008071335 A5 JP 2008071335A5
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JP
Japan
Prior art keywords
current
temperature
voltage
reference circuit
proportional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2007171934A
Other languages
English (en)
Japanese (ja)
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JP2008071335A (ja
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Publication date
Priority claimed from KR1020060088739A external-priority patent/KR100795013B1/ko
Application filed filed Critical
Publication of JP2008071335A publication Critical patent/JP2008071335A/ja
Publication of JP2008071335A5 publication Critical patent/JP2008071335A5/ja
Pending legal-status Critical Current

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JP2007171934A 2006-09-13 2007-06-29 バンドギャップレファレンス回路とこれを利用した温度情報出力装置 Pending JP2008071335A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060088739A KR100795013B1 (ko) 2006-09-13 2006-09-13 밴드 갭 레퍼런스 회로와 이를 이용한 온도 정보 출력장치

Publications (2)

Publication Number Publication Date
JP2008071335A JP2008071335A (ja) 2008-03-27
JP2008071335A5 true JP2008071335A5 (enExample) 2010-05-20

Family

ID=39168899

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007171934A Pending JP2008071335A (ja) 2006-09-13 2007-06-29 バンドギャップレファレンス回路とこれを利用した温度情報出力装置

Country Status (5)

Country Link
US (1) US7692418B2 (enExample)
JP (1) JP2008071335A (enExample)
KR (1) KR100795013B1 (enExample)
CN (1) CN101145068B (enExample)
TW (1) TWI336477B (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100807594B1 (ko) * 2006-09-28 2008-02-28 주식회사 하이닉스반도체 온도 정보 출력장치 및 그를 구비하는 반도체소자
JP5361182B2 (ja) * 2007-12-21 2013-12-04 株式会社東芝 半導体記憶装置
KR100950486B1 (ko) * 2008-10-02 2010-03-31 주식회사 하이닉스반도체 내부전압 생성회로
KR101043044B1 (ko) 2009-01-23 2011-06-21 (주)카이로넷 공급 전압의 변화에 무관한 기준 전압을 제공할 수 있는 기준 전압 발생기
JP2011188224A (ja) * 2010-03-09 2011-09-22 Sony Corp 温度情報出力装置、撮像装置、温度情報出力方法
JP2012084034A (ja) * 2010-10-14 2012-04-26 Toshiba Corp 定電圧定電流発生回路
TWI453894B (zh) * 2011-11-23 2014-09-21 Ncku Res & Dev Foundation 低電壓能階參考位準電路
US8698479B2 (en) * 2012-03-30 2014-04-15 Elite Semiconductor Memory Technology Inc. Bandgap reference circuit for providing reference voltage
KR102033790B1 (ko) * 2013-09-30 2019-11-08 에스케이하이닉스 주식회사 온도센서
KR101937263B1 (ko) * 2017-07-28 2019-04-09 현대오트론 주식회사 차량용 카메라를 위한 신호 처리 장치 및 그것의 동작 방법
KR20190029896A (ko) * 2017-09-13 2019-03-21 에스케이하이닉스 주식회사 온도 센싱 회로
KR102533348B1 (ko) * 2018-01-24 2023-05-19 삼성전자주식회사 온도 감지 장치 및 온도-전압 변환기
JP2019215944A (ja) 2018-06-12 2019-12-19 東芝メモリ株式会社 半導体集積回路および検査方法
US11127437B2 (en) * 2019-10-01 2021-09-21 Macronix International Co., Ltd. Managing startups of bandgap reference circuits in memory systems
CN111399581B (zh) * 2020-03-12 2022-06-24 成都微光集电科技有限公司 一种具有相关双采样功能的高精度温度传感器
US12061493B2 (en) 2020-09-25 2024-08-13 Intel Corporation Low power hybrid reverse bandgap reference and digital temperature sensor

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5784328A (en) * 1996-12-23 1998-07-21 Lsi Logic Corporation Memory system including an on-chip temperature sensor for regulating the refresh rate of a DRAM array
US6281760B1 (en) * 1998-07-23 2001-08-28 Texas Instruments Incorporated On-chip temperature sensor and oscillator for reduced self-refresh current for dynamic random access memory
US6181121B1 (en) 1999-03-04 2001-01-30 Cypress Semiconductor Corp. Low supply voltage BICMOS self-biased bandgap reference using a current summing architecture
KR100338103B1 (ko) 1999-06-23 2002-05-24 박종섭 펌핑 전압 레귤레이션 회로
US6788041B2 (en) * 2001-12-06 2004-09-07 Skyworks Solutions Inc Low power bandgap circuit
US6921199B2 (en) * 2002-03-22 2005-07-26 Ricoh Company, Ltd. Temperature sensor
US6720755B1 (en) * 2002-05-16 2004-04-13 Lattice Semiconductor Corporation Band gap reference circuit
US6891358B2 (en) * 2002-12-27 2005-05-10 Analog Devices, Inc. Bandgap voltage reference circuit with high power supply rejection ratio (PSRR) and curvature correction
US7078958B2 (en) * 2003-02-10 2006-07-18 Exar Corporation CMOS bandgap reference with low voltage operation
US6828847B1 (en) * 2003-02-27 2004-12-07 Analog Devices, Inc. Bandgap voltage reference circuit and method for producing a temperature curvature corrected voltage reference
JP2004318235A (ja) * 2003-04-11 2004-11-11 Renesas Technology Corp 基準電圧発生回路
US7009904B2 (en) * 2003-11-19 2006-03-07 Infineon Technologies Ag Back-bias voltage generator with temperature control
JP4380343B2 (ja) 2004-01-30 2009-12-09 ソニー株式会社 バンドギャップレファレンス回路及び同回路を有する半導体装置
JP4517062B2 (ja) * 2004-02-24 2010-08-04 泰博 杉本 定電圧発生回路
KR100596978B1 (ko) * 2004-11-15 2006-07-05 삼성전자주식회사 온도-비례 전류 제공회로, 온도-반비례 전류 제공회로 및이를 이용한 기준전류 제공회로
US7127368B2 (en) * 2004-11-19 2006-10-24 Stmicroelectronics Asia Pacific Pte. Ltd. On-chip temperature sensor for low voltage operation
US7138823B2 (en) * 2005-01-20 2006-11-21 Micron Technology, Inc. Apparatus and method for independent control of on-die termination for output buffers of a memory device
US7413342B2 (en) * 2005-02-22 2008-08-19 Micron Technology, Inc. DRAM temperature measurement system

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