TWI336477B - Band gap reference circuit and temperature information output apparatus using the same - Google Patents

Band gap reference circuit and temperature information output apparatus using the same Download PDF

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Publication number
TWI336477B
TWI336477B TW096111879A TW96111879A TWI336477B TW I336477 B TWI336477 B TW I336477B TW 096111879 A TW096111879 A TW 096111879A TW 96111879 A TW96111879 A TW 96111879A TW I336477 B TWI336477 B TW I336477B
Authority
TW
Taiwan
Prior art keywords
temperature
voltage
current
adc
temperature information
Prior art date
Application number
TW096111879A
Other languages
English (en)
Chinese (zh)
Other versions
TW200814079A (en
Inventor
Chun-Seok Jeong
Original Assignee
Hynix Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hynix Semiconductor Inc filed Critical Hynix Semiconductor Inc
Publication of TW200814079A publication Critical patent/TW200814079A/zh
Application granted granted Critical
Publication of TWI336477B publication Critical patent/TWI336477B/zh

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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is DC
    • G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S323/00—Electricity: power supply or regulation systems
    • Y10S323/907—Temperature compensation of semiconductor

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Nonlinear Science (AREA)
  • Dram (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)
  • Amplifiers (AREA)
  • Read Only Memory (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
TW096111879A 2006-09-13 2007-04-03 Band gap reference circuit and temperature information output apparatus using the same TWI336477B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060088739A KR100795013B1 (ko) 2006-09-13 2006-09-13 밴드 갭 레퍼런스 회로와 이를 이용한 온도 정보 출력장치

Publications (2)

Publication Number Publication Date
TW200814079A TW200814079A (en) 2008-03-16
TWI336477B true TWI336477B (en) 2011-01-21

Family

ID=39168899

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096111879A TWI336477B (en) 2006-09-13 2007-04-03 Band gap reference circuit and temperature information output apparatus using the same

Country Status (5)

Country Link
US (1) US7692418B2 (enExample)
JP (1) JP2008071335A (enExample)
KR (1) KR100795013B1 (enExample)
CN (1) CN101145068B (enExample)
TW (1) TWI336477B (enExample)

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KR100807594B1 (ko) * 2006-09-28 2008-02-28 주식회사 하이닉스반도체 온도 정보 출력장치 및 그를 구비하는 반도체소자
JP5361182B2 (ja) * 2007-12-21 2013-12-04 株式会社東芝 半導体記憶装置
KR100950486B1 (ko) * 2008-10-02 2010-03-31 주식회사 하이닉스반도체 내부전압 생성회로
KR101043044B1 (ko) 2009-01-23 2011-06-21 (주)카이로넷 공급 전압의 변화에 무관한 기준 전압을 제공할 수 있는 기준 전압 발생기
JP2011188224A (ja) * 2010-03-09 2011-09-22 Sony Corp 温度情報出力装置、撮像装置、温度情報出力方法
JP2012084034A (ja) * 2010-10-14 2012-04-26 Toshiba Corp 定電圧定電流発生回路
TWI453894B (zh) * 2011-11-23 2014-09-21 Ncku Res & Dev Foundation 低電壓能階參考位準電路
US8698479B2 (en) * 2012-03-30 2014-04-15 Elite Semiconductor Memory Technology Inc. Bandgap reference circuit for providing reference voltage
KR102033790B1 (ko) * 2013-09-30 2019-11-08 에스케이하이닉스 주식회사 온도센서
KR101937263B1 (ko) * 2017-07-28 2019-04-09 현대오트론 주식회사 차량용 카메라를 위한 신호 처리 장치 및 그것의 동작 방법
KR20190029896A (ko) * 2017-09-13 2019-03-21 에스케이하이닉스 주식회사 온도 센싱 회로
KR102533348B1 (ko) * 2018-01-24 2023-05-19 삼성전자주식회사 온도 감지 장치 및 온도-전압 변환기
JP2019215944A (ja) 2018-06-12 2019-12-19 東芝メモリ株式会社 半導体集積回路および検査方法
US11127437B2 (en) * 2019-10-01 2021-09-21 Macronix International Co., Ltd. Managing startups of bandgap reference circuits in memory systems
KR102804069B1 (ko) 2019-12-27 2025-05-09 삼성전자주식회사 빌트-인 셀프 테스트 회로 및 이를 포함하는 온도 측정 회로
CN111399581B (zh) * 2020-03-12 2022-06-24 成都微光集电科技有限公司 一种具有相关双采样功能的高精度温度传感器
US12061493B2 (en) 2020-09-25 2024-08-13 Intel Corporation Low power hybrid reverse bandgap reference and digital temperature sensor

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US5784328A (en) * 1996-12-23 1998-07-21 Lsi Logic Corporation Memory system including an on-chip temperature sensor for regulating the refresh rate of a DRAM array
US6281760B1 (en) * 1998-07-23 2001-08-28 Texas Instruments Incorporated On-chip temperature sensor and oscillator for reduced self-refresh current for dynamic random access memory
US6181121B1 (en) 1999-03-04 2001-01-30 Cypress Semiconductor Corp. Low supply voltage BICMOS self-biased bandgap reference using a current summing architecture
KR100338103B1 (ko) 1999-06-23 2002-05-24 박종섭 펌핑 전압 레귤레이션 회로
US6788041B2 (en) * 2001-12-06 2004-09-07 Skyworks Solutions Inc Low power bandgap circuit
US6921199B2 (en) * 2002-03-22 2005-07-26 Ricoh Company, Ltd. Temperature sensor
US6720755B1 (en) * 2002-05-16 2004-04-13 Lattice Semiconductor Corporation Band gap reference circuit
US6891358B2 (en) * 2002-12-27 2005-05-10 Analog Devices, Inc. Bandgap voltage reference circuit with high power supply rejection ratio (PSRR) and curvature correction
US7078958B2 (en) * 2003-02-10 2006-07-18 Exar Corporation CMOS bandgap reference with low voltage operation
US6828847B1 (en) * 2003-02-27 2004-12-07 Analog Devices, Inc. Bandgap voltage reference circuit and method for producing a temperature curvature corrected voltage reference
JP2004318235A (ja) * 2003-04-11 2004-11-11 Renesas Technology Corp 基準電圧発生回路
US7009904B2 (en) * 2003-11-19 2006-03-07 Infineon Technologies Ag Back-bias voltage generator with temperature control
JP4380343B2 (ja) 2004-01-30 2009-12-09 ソニー株式会社 バンドギャップレファレンス回路及び同回路を有する半導体装置
JP4517062B2 (ja) * 2004-02-24 2010-08-04 泰博 杉本 定電圧発生回路
KR100596978B1 (ko) * 2004-11-15 2006-07-05 삼성전자주식회사 온도-비례 전류 제공회로, 온도-반비례 전류 제공회로 및이를 이용한 기준전류 제공회로
US7127368B2 (en) * 2004-11-19 2006-10-24 Stmicroelectronics Asia Pacific Pte. Ltd. On-chip temperature sensor for low voltage operation
US7138823B2 (en) * 2005-01-20 2006-11-21 Micron Technology, Inc. Apparatus and method for independent control of on-die termination for output buffers of a memory device
US7413342B2 (en) * 2005-02-22 2008-08-19 Micron Technology, Inc. DRAM temperature measurement system

Also Published As

Publication number Publication date
US7692418B2 (en) 2010-04-06
CN101145068B (zh) 2010-09-01
US20080061760A1 (en) 2008-03-13
KR100795013B1 (ko) 2008-01-16
CN101145068A (zh) 2008-03-19
TW200814079A (en) 2008-03-16
JP2008071335A (ja) 2008-03-27

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