JP2008071335A - バンドギャップレファレンス回路とこれを利用した温度情報出力装置 - Google Patents

バンドギャップレファレンス回路とこれを利用した温度情報出力装置 Download PDF

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Publication number
JP2008071335A
JP2008071335A JP2007171934A JP2007171934A JP2008071335A JP 2008071335 A JP2008071335 A JP 2008071335A JP 2007171934 A JP2007171934 A JP 2007171934A JP 2007171934 A JP2007171934 A JP 2007171934A JP 2008071335 A JP2008071335 A JP 2008071335A
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JP
Japan
Prior art keywords
current
temperature
voltage
reference circuit
band gap
Prior art date
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Pending
Application number
JP2007171934A
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English (en)
Japanese (ja)
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JP2008071335A5 (enExample
Inventor
Chun Seok Jeong
椿 錫 鄭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SK Hynix Inc
Original Assignee
Hynix Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Hynix Semiconductor Inc filed Critical Hynix Semiconductor Inc
Publication of JP2008071335A publication Critical patent/JP2008071335A/ja
Publication of JP2008071335A5 publication Critical patent/JP2008071335A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
    • G05F3/02—Regulating voltage or current
    • G05F3/08—Regulating voltage or current wherein the variable is DC
    • G05F3/10—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics
    • G05F3/16—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices
    • G05F3/20—Regulating voltage or current wherein the variable is DC using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
    • G05F3/30—Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S323/00—Electricity: power supply or regulation systems
    • Y10S323/907—Temperature compensation of semiconductor

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Power Engineering (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Nonlinear Science (AREA)
  • Dram (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Control Of Electrical Variables (AREA)
  • Amplifiers (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)
  • Read Only Memory (AREA)
JP2007171934A 2006-09-13 2007-06-29 バンドギャップレファレンス回路とこれを利用した温度情報出力装置 Pending JP2008071335A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060088739A KR100795013B1 (ko) 2006-09-13 2006-09-13 밴드 갭 레퍼런스 회로와 이를 이용한 온도 정보 출력장치

Publications (2)

Publication Number Publication Date
JP2008071335A true JP2008071335A (ja) 2008-03-27
JP2008071335A5 JP2008071335A5 (enExample) 2010-05-20

Family

ID=39168899

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007171934A Pending JP2008071335A (ja) 2006-09-13 2007-06-29 バンドギャップレファレンス回路とこれを利用した温度情報出力装置

Country Status (5)

Country Link
US (1) US7692418B2 (enExample)
JP (1) JP2008071335A (enExample)
KR (1) KR100795013B1 (enExample)
CN (1) CN101145068B (enExample)
TW (1) TWI336477B (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008084514A (ja) * 2006-09-28 2008-04-10 Hynix Semiconductor Inc 温度情報出力装置
KR101043044B1 (ko) 2009-01-23 2011-06-21 (주)카이로넷 공급 전압의 변화에 무관한 기준 전압을 제공할 수 있는 기준 전압 발생기
KR101937263B1 (ko) * 2017-07-28 2019-04-09 현대오트론 주식회사 차량용 카메라를 위한 신호 처리 장치 및 그것의 동작 방법
US10685734B2 (en) 2018-06-12 2020-06-16 Toshiba Memory Corporation Semiconductor integrated circuit and test method

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5361182B2 (ja) * 2007-12-21 2013-12-04 株式会社東芝 半導体記憶装置
KR100950486B1 (ko) * 2008-10-02 2010-03-31 주식회사 하이닉스반도체 내부전압 생성회로
JP2011188224A (ja) * 2010-03-09 2011-09-22 Sony Corp 温度情報出力装置、撮像装置、温度情報出力方法
JP2012084034A (ja) * 2010-10-14 2012-04-26 Toshiba Corp 定電圧定電流発生回路
TWI453894B (zh) * 2011-11-23 2014-09-21 Ncku Res & Dev Foundation 低電壓能階參考位準電路
US8698479B2 (en) * 2012-03-30 2014-04-15 Elite Semiconductor Memory Technology Inc. Bandgap reference circuit for providing reference voltage
KR102033790B1 (ko) * 2013-09-30 2019-11-08 에스케이하이닉스 주식회사 온도센서
KR20190029896A (ko) * 2017-09-13 2019-03-21 에스케이하이닉스 주식회사 온도 센싱 회로
KR102533348B1 (ko) * 2018-01-24 2023-05-19 삼성전자주식회사 온도 감지 장치 및 온도-전압 변환기
US11127437B2 (en) * 2019-10-01 2021-09-21 Macronix International Co., Ltd. Managing startups of bandgap reference circuits in memory systems
CN111399581B (zh) * 2020-03-12 2022-06-24 成都微光集电科技有限公司 一种具有相关双采样功能的高精度温度传感器
US12061493B2 (en) 2020-09-25 2024-08-13 Intel Corporation Low power hybrid reverse bandgap reference and digital temperature sensor

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040155700A1 (en) * 2003-02-10 2004-08-12 Exar Corporation CMOS bandgap reference with low voltage operation
JP2004318235A (ja) * 2003-04-11 2004-11-11 Renesas Technology Corp 基準電圧発生回路
JP2005242450A (ja) * 2004-02-24 2005-09-08 Yasuhiro Sugimoto 定電圧および定電流発生回路
JP2005537528A (ja) * 2001-12-06 2005-12-08 スカイワークス ソリューションズ、 インコーポレイテッド 低電力バンドギャップ回路
JP2006512682A (ja) * 2002-12-27 2006-04-13 アナログ・デバイシズ・インコーポレーテッド 高電源電圧除去比（ｐｓｒｒ）を有し曲線補正されたバンドギャップ型電圧基準回路
JP2006519433A (ja) * 2003-02-27 2006-08-24 アナログ ディヴァイスィズ インク バンドギャップ基準電圧回路および温度曲率補正された基準電圧の生成方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5784328A (en) * 1996-12-23 1998-07-21 Lsi Logic Corporation Memory system including an on-chip temperature sensor for regulating the refresh rate of a DRAM array
US6281760B1 (en) * 1998-07-23 2001-08-28 Texas Instruments Incorporated On-chip temperature sensor and oscillator for reduced self-refresh current for dynamic random access memory
US6181121B1 (en) 1999-03-04 2001-01-30 Cypress Semiconductor Corp. Low supply voltage BICMOS self-biased bandgap reference using a current summing architecture
KR100338103B1 (ko) 1999-06-23 2002-05-24 박종섭 펌핑 전압 레귤레이션 회로
US6921199B2 (en) * 2002-03-22 2005-07-26 Ricoh Company, Ltd. Temperature sensor
US6720755B1 (en) * 2002-05-16 2004-04-13 Lattice Semiconductor Corporation Band gap reference circuit
US7009904B2 (en) * 2003-11-19 2006-03-07 Infineon Technologies Ag Back-bias voltage generator with temperature control
JP4380343B2 (ja) 2004-01-30 2009-12-09 ソニー株式会社 バンドギャップレファレンス回路及び同回路を有する半導体装置
KR100596978B1 (ko) * 2004-11-15 2006-07-05 삼성전자주식회사 온도-비례 전류 제공회로, 온도-반비례 전류 제공회로 및이를 이용한 기준전류 제공회로
US7127368B2 (en) * 2004-11-19 2006-10-24 Stmicroelectronics Asia Pacific Pte. Ltd. On-chip temperature sensor for low voltage operation
US7138823B2 (en) * 2005-01-20 2006-11-21 Micron Technology, Inc. Apparatus and method for independent control of on-die termination for output buffers of a memory device
US7413342B2 (en) * 2005-02-22 2008-08-19 Micron Technology, Inc. DRAM temperature measurement system

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005537528A (ja) * 2001-12-06 2005-12-08 スカイワークス ソリューションズ、 インコーポレイテッド 低電力バンドギャップ回路
JP2006512682A (ja) * 2002-12-27 2006-04-13 アナログ・デバイシズ・インコーポレーテッド 高電源電圧除去比（ｐｓｒｒ）を有し曲線補正されたバンドギャップ型電圧基準回路
US20040155700A1 (en) * 2003-02-10 2004-08-12 Exar Corporation CMOS bandgap reference with low voltage operation
JP2006519433A (ja) * 2003-02-27 2006-08-24 アナログ ディヴァイスィズ インク バンドギャップ基準電圧回路および温度曲率補正された基準電圧の生成方法
JP2004318235A (ja) * 2003-04-11 2004-11-11 Renesas Technology Corp 基準電圧発生回路
JP2005242450A (ja) * 2004-02-24 2005-09-08 Yasuhiro Sugimoto 定電圧および定電流発生回路

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008084514A (ja) * 2006-09-28 2008-04-10 Hynix Semiconductor Inc 温度情報出力装置
KR101043044B1 (ko) 2009-01-23 2011-06-21 (주)카이로넷 공급 전압의 변화에 무관한 기준 전압을 제공할 수 있는 기준 전압 발생기
KR101937263B1 (ko) * 2017-07-28 2019-04-09 현대오트론 주식회사 차량용 카메라를 위한 신호 처리 장치 및 그것의 동작 방법
US10685734B2 (en) 2018-06-12 2020-06-16 Toshiba Memory Corporation Semiconductor integrated circuit and test method

Also Published As

Publication number Publication date
US20080061760A1 (en) 2008-03-13
TWI336477B (en) 2011-01-21
CN101145068A (zh) 2008-03-19
KR100795013B1 (ko) 2008-01-16
TW200814079A (en) 2008-03-16
US7692418B2 (en) 2010-04-06
CN101145068B (zh) 2010-09-01

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