JP2007335581A - 半導体装置の製造方法 - Google Patents

半導体装置の製造方法 Download PDF

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Publication number
JP2007335581A
JP2007335581A JP2006164822A JP2006164822A JP2007335581A JP 2007335581 A JP2007335581 A JP 2007335581A JP 2006164822 A JP2006164822 A JP 2006164822A JP 2006164822 A JP2006164822 A JP 2006164822A JP 2007335581 A JP2007335581 A JP 2007335581A
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JP
Japan
Prior art keywords
wiring
semiconductor device
manufacturing
main surface
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2006164822A
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English (en)
Japanese (ja)
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JP2007335581A5 (enExample
Inventor
Tetsuji Tagami
哲治 田上
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renesas Technology Corp
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Renesas Technology Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority to JP2006164822A priority Critical patent/JP2007335581A/ja
Application filed by Renesas Technology Corp filed Critical Renesas Technology Corp
Priority to TW096114262A priority patent/TW200807666A/zh
Priority to CNA2007101065554A priority patent/CN101090081A/zh
Priority to US11/759,290 priority patent/US7659146B2/en
Priority to KR1020070057541A priority patent/KR101296572B1/ko
Publication of JP2007335581A publication Critical patent/JP2007335581A/ja
Publication of JP2007335581A5 publication Critical patent/JP2007335581A5/ja
Priority to US12/545,964 priority patent/US7915086B2/en
Priority to US13/021,284 priority patent/US8048722B2/en
Priority to US13/226,607 priority patent/US8258018B2/en
Priority to US13/551,487 priority patent/US8420451B2/en
Pending legal-status Critical Current

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    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15311Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a ball array, e.g. BGA
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Ceramic Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Geometry (AREA)
  • Wire Bonding (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
JP2006164822A 2006-06-14 2006-06-14 半導体装置の製造方法 Pending JP2007335581A (ja)

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JP2006164822A JP2007335581A (ja) 2006-06-14 2006-06-14 半導体装置の製造方法
TW096114262A TW200807666A (en) 2006-06-14 2007-04-23 Manufacturing Method of Semiconductor Device
CNA2007101065554A CN101090081A (zh) 2006-06-14 2007-06-06 半导体器件的制造方法
US11/759,290 US7659146B2 (en) 2006-06-14 2007-06-07 Manufacturing method of semiconductor device
KR1020070057541A KR101296572B1 (ko) 2006-06-14 2007-06-13 반도체 장치의 제조 방법
US12/545,964 US7915086B2 (en) 2006-06-14 2009-08-24 Manufacturing method of semiconductor device
US13/021,284 US8048722B2 (en) 2006-06-14 2011-02-04 Manufacturing method of semiconductor device
US13/226,607 US8258018B2 (en) 2006-06-14 2011-09-07 Manufacturing method of semiconductor device
US13/551,487 US8420451B2 (en) 2006-06-14 2012-07-17 Manufacturing method of semiconductor device

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012079854A (ja) * 2010-09-30 2012-04-19 Renesas Electronics Corp 半導体装置の製造方法
JP2016122802A (ja) * 2014-12-25 2016-07-07 ルネサスエレクトロニクス株式会社 半導体装置
JP2017069573A (ja) * 2016-12-12 2017-04-06 ルネサスエレクトロニクス株式会社 半導体装置および半導体装置の製造方法

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5692952B2 (ja) * 2007-12-11 2015-04-01 シチズン電子株式会社 発光ダイオード
JP5188289B2 (ja) * 2008-06-26 2013-04-24 ラピスセミコンダクタ株式会社 プリント基板の製造方法
US8749074B2 (en) * 2009-11-30 2014-06-10 Micron Technology, Inc. Package including an interposer having at least one topological feature
US9082780B2 (en) * 2012-03-23 2015-07-14 Stats Chippac, Ltd. Semiconductor device and method of forming a robust fan-out package including vertical interconnects and mechanical support layer
JP6068175B2 (ja) * 2013-02-12 2017-01-25 新光電気工業株式会社 配線基板、発光装置、配線基板の製造方法及び発光装置の製造方法
KR20160000293A (ko) * 2014-06-24 2016-01-04 삼성전자주식회사 탭 핀에 타이바가 없는 반도체 모듈
CN110112117A (zh) * 2018-02-01 2019-08-09 爱思开海力士有限公司 半导体封装
KR20190093488A (ko) * 2018-02-01 2019-08-09 에스케이하이닉스 주식회사 반도체 패키지
US10879160B2 (en) * 2018-02-01 2020-12-29 SK Hynix Inc. Semiconductor package with packaging substrate
CN110112116B (zh) 2018-02-01 2023-06-06 爱思开海力士有限公司 半导体封装件和形成半导体封装件的方法
KR102509051B1 (ko) * 2018-02-01 2023-03-10 에스케이하이닉스 주식회사 반도체 패키지
US11462501B2 (en) * 2019-10-25 2022-10-04 Shinko Electric Industries Co., Ltd. Interconnect substrate and method of making the same
CN116130445A (zh) * 2021-11-12 2023-05-16 合肥本源量子计算科技有限责任公司 一种量子器件及其制备方法、一种量子计算机

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6450450A (en) * 1987-08-20 1989-02-27 Toshiba Corp Package for semiconductor integrated circuit
JP2001068588A (ja) * 1999-08-26 2001-03-16 Nec Corp パッケージ基板、該パッケージ基板を備える半導体装置及びそれらの製造方法
JP2002050715A (ja) * 2000-08-03 2002-02-15 Shinko Electric Ind Co Ltd 半導体パッケージの製造方法
JP2003086735A (ja) * 2001-06-27 2003-03-20 Shinko Electric Ind Co Ltd 位置情報付配線基板及びその製造方法並びに半導体装置の製造方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3619773B2 (ja) * 2000-12-20 2005-02-16 株式会社ルネサステクノロジ 半導体装置の製造方法
KR100868419B1 (ko) * 2001-06-07 2008-11-11 가부시끼가이샤 르네사스 테크놀로지 반도체장치 및 그 제조방법
MY131114A (en) * 2001-06-27 2007-07-31 Shinko Electric Ind Co Wiring substrate having position information
JP2005079129A (ja) 2003-08-28 2005-03-24 Sumitomo Metal Electronics Devices Inc プラスチックパッケージ及びその製造方法
KR100557540B1 (ko) * 2004-07-26 2006-03-03 삼성전기주식회사 Bga 패키지 기판 및 그 제작 방법
JP4651359B2 (ja) 2004-10-29 2011-03-16 ルネサスエレクトロニクス株式会社 半導体装置およびその製造方法
JP2006261485A (ja) * 2005-03-18 2006-09-28 Renesas Technology Corp 半導体装置およびその製造方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6450450A (en) * 1987-08-20 1989-02-27 Toshiba Corp Package for semiconductor integrated circuit
JP2001068588A (ja) * 1999-08-26 2001-03-16 Nec Corp パッケージ基板、該パッケージ基板を備える半導体装置及びそれらの製造方法
JP2002050715A (ja) * 2000-08-03 2002-02-15 Shinko Electric Ind Co Ltd 半導体パッケージの製造方法
JP2003086735A (ja) * 2001-06-27 2003-03-20 Shinko Electric Ind Co Ltd 位置情報付配線基板及びその製造方法並びに半導体装置の製造方法

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012079854A (ja) * 2010-09-30 2012-04-19 Renesas Electronics Corp 半導体装置の製造方法
US8389339B2 (en) 2010-09-30 2013-03-05 Renesas Electronics Corporation Method of manufacturing semiconductor device
JP2016122802A (ja) * 2014-12-25 2016-07-07 ルネサスエレクトロニクス株式会社 半導体装置
JP2017069573A (ja) * 2016-12-12 2017-04-06 ルネサスエレクトロニクス株式会社 半導体装置および半導体装置の製造方法

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CN101090081A (zh) 2007-12-19
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US20090311833A1 (en) 2009-12-17
US7915086B2 (en) 2011-03-29
KR20070119521A (ko) 2007-12-20
US7659146B2 (en) 2010-02-09
US8048722B2 (en) 2011-11-01
KR101296572B1 (ko) 2013-08-13
US20110124159A1 (en) 2011-05-26
US8420451B2 (en) 2013-04-16
US20120282737A1 (en) 2012-11-08
US20120083072A1 (en) 2012-04-05
TW200807666A (en) 2008-02-01

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