JP2007115320A5 - - Google Patents

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Publication number
JP2007115320A5
JP2007115320A5 JP2005304494A JP2005304494A JP2007115320A5 JP 2007115320 A5 JP2007115320 A5 JP 2007115320A5 JP 2005304494 A JP2005304494 A JP 2005304494A JP 2005304494 A JP2005304494 A JP 2005304494A JP 2007115320 A5 JP2007115320 A5 JP 2007115320A5
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JP
Japan
Prior art keywords
current
data
memory cell
lines
magnetization
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Application number
JP2005304494A
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English (en)
Japanese (ja)
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JP2007115320A (ja
JP4883982B2 (ja
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Priority claimed from JP2005304494A external-priority patent/JP4883982B2/ja
Priority to JP2005304494A priority Critical patent/JP4883982B2/ja
Application filed filed Critical
Priority to TW095138313A priority patent/TW200723275A/zh
Priority to CNA2006101373917A priority patent/CN1953096A/zh
Priority to US11/582,983 priority patent/US7394685B2/en
Publication of JP2007115320A publication Critical patent/JP2007115320A/ja
Priority to US12/133,519 priority patent/US20080239795A1/en
Publication of JP2007115320A5 publication Critical patent/JP2007115320A5/ja
Publication of JP4883982B2 publication Critical patent/JP4883982B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2005304494A 2005-10-19 2005-10-19 不揮発性記憶装置 Expired - Fee Related JP4883982B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2005304494A JP4883982B2 (ja) 2005-10-19 2005-10-19 不揮発性記憶装置
TW095138313A TW200723275A (en) 2005-10-19 2006-10-18 Nonvolatile memory device
CNA2006101373917A CN1953096A (zh) 2005-10-19 2006-10-19 抑制数据读出时的误写入的非易失存储装置
US11/582,983 US7394685B2 (en) 2005-10-19 2006-10-19 Nonvolatile memory device with write error suppressed in reading data
US12/133,519 US20080239795A1 (en) 2005-10-19 2008-06-05 Nonvolatile memory device with write error suppressed in reading data

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005304494A JP4883982B2 (ja) 2005-10-19 2005-10-19 不揮発性記憶装置

Publications (3)

Publication Number Publication Date
JP2007115320A JP2007115320A (ja) 2007-05-10
JP2007115320A5 true JP2007115320A5 (enExample) 2008-11-13
JP4883982B2 JP4883982B2 (ja) 2012-02-22

Family

ID=37985203

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005304494A Expired - Fee Related JP4883982B2 (ja) 2005-10-19 2005-10-19 不揮発性記憶装置

Country Status (4)

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US (2) US7394685B2 (enExample)
JP (1) JP4883982B2 (enExample)
CN (1) CN1953096A (enExample)
TW (1) TW200723275A (enExample)

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JP5260041B2 (ja) * 2007-12-19 2013-08-14 株式会社日立製作所 スピントルク磁気メモリ及びそのオフセット磁界補正方法
US8144509B2 (en) 2008-06-27 2012-03-27 Qualcomm Incorporated Write operation for spin transfer torque magnetoresistive random access memory with reduced bit cell size
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US8625339B2 (en) 2011-04-11 2014-01-07 Grandis, Inc. Multi-cell per memory-bit circuit and method
US9099181B2 (en) 2009-08-19 2015-08-04 Grandis, Inc. Non-volatile static ram cell circuit and timing method
US8456926B2 (en) 2010-11-18 2013-06-04 Grandis, Inc. Memory write error correction circuit
US8077501B2 (en) * 2009-09-11 2011-12-13 Grandis, Inc. Differential read and write architecture
JP4922374B2 (ja) 2009-09-17 2012-04-25 株式会社東芝 磁気メモリ
US8107285B2 (en) * 2010-01-08 2012-01-31 International Business Machines Corporation Read direction for spin-torque based memory device
US8208291B2 (en) * 2010-01-14 2012-06-26 Qualcomm Incorporated System and method to control a direction of a current applied to a magnetic tunnel junction
US8837209B2 (en) * 2010-03-05 2014-09-16 Hitachi, Ltd. Magnetic memory cell and magnetic random access memory
JP2011222829A (ja) * 2010-04-12 2011-11-04 Toshiba Corp 抵抗変化メモリ
US8432727B2 (en) 2010-04-29 2013-04-30 Qualcomm Incorporated Invalid write prevention for STT-MRAM array
US9196341B2 (en) 2010-05-12 2015-11-24 Qualcomm Incorporated Memory device having a local current sink
US9042163B2 (en) 2010-05-12 2015-05-26 Qualcomm Incorporated Memory device having a local current sink
US8723557B2 (en) 2010-06-07 2014-05-13 Grandis, Inc. Multi-supply symmetric driver circuit and timing method
KR101109555B1 (ko) * 2010-06-16 2012-01-31 이화여자대학교 산학협력단 불휘발성 메모리 장치 및 그것의 읽기 방법
US8856614B2 (en) 2010-07-29 2014-10-07 Kabushiki Kaisha Toshiba Semiconductor memory device detecting error
US8570797B2 (en) * 2011-02-25 2013-10-29 Qualcomm Incorporated Magnetic random access memory (MRAM) read with reduced disturb failure
JP5444414B2 (ja) * 2012-06-04 2014-03-19 株式会社東芝 磁気ランダムアクセスメモリ
CN104641417B (zh) * 2012-09-18 2018-04-03 学校法人中央大学 非易失性存储装置及其控制方法
US9058872B2 (en) * 2013-01-31 2015-06-16 Taiwan Semiconductor Manufacturing Company, Ltd. Resistance-based random access memory
JP6256718B2 (ja) * 2013-02-19 2018-01-10 パナソニックＩｐマネジメント株式会社 不揮発性半導体記憶装置
US9424917B2 (en) * 2013-03-07 2016-08-23 Taiwan Semiconductor Manufacturing Company, Ltd. Method for operating RRAM memory
US9268899B2 (en) 2013-03-14 2016-02-23 Silicon Storage Technology, Inc. Transistor design for use in advanced nanometer flash memory devices
KR20150021376A (ko) * 2013-08-20 2015-03-02 에스케이하이닉스 주식회사 전자 장치
CN103730160B (zh) * 2014-01-07 2016-08-24 上海华虹宏力半导体制造有限公司 一种存储器及其读取方法、读取电路
US9437291B2 (en) * 2014-02-26 2016-09-06 Rambus Inc. Distributed cascode current source for RRAM set current limitation
CN103811055B (zh) * 2014-03-07 2017-03-29 上海华虹宏力半导体制造有限公司 Eeprom存储单元的操作方法
US10096361B2 (en) * 2015-08-13 2018-10-09 Arm Ltd. Method, system and device for non-volatile memory device operation
JP6139623B2 (ja) * 2015-09-15 2017-05-31 株式会社東芝 不揮発性半導体メモリ
US9576652B1 (en) * 2016-01-11 2017-02-21 Winbond Electronics Corp. Resistive random access memory apparatus with forward and reverse reading modes
CN110136759B (zh) * 2018-02-09 2021-01-12 上海磁宇信息科技有限公司 降低读操作对数据扰动的电路
US10755780B2 (en) * 2018-03-16 2020-08-25 Taiwan Semiconductor Manufacturing Company, Ltd. Memory sense amplifier with precharge
DE102019103746A1 (de) 2018-03-16 2019-09-19 Taiwan Semiconductor Manufacturing Co., Ltd. Speicher-Leseverstärker mit Vorladung
US10515681B1 (en) * 2018-06-07 2019-12-24 Avalanche Technology, Inc. Power-efficient programming of magnetic memory
KR102559577B1 (ko) * 2018-08-08 2023-07-26 삼성전자주식회사 저항성 메모리 장치
KR102651229B1 (ko) * 2019-07-22 2024-03-25 삼성전자주식회사 자기접합 메모리 장치 및 자기접합 메모리 장치의 데이터 라이트 방법

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JP2004319587A (ja) * 2003-04-11 2004-11-11 Sharp Corp メモリセル、メモリ装置及びメモリセル製造方法
JP4297739B2 (ja) 2003-06-17 2009-07-15 独立行政法人科学技術振興機構 量子サイズ効果を用いたスピン注入磁化反転磁気抵抗素子
JP4192060B2 (ja) 2003-09-12 2008-12-03 シャープ株式会社 不揮発性半導体記憶装置
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