JP2005512020A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2005512020A5 JP2005512020A5 JP2003505939A JP2003505939A JP2005512020A5 JP 2005512020 A5 JP2005512020 A5 JP 2005512020A5 JP 2003505939 A JP2003505939 A JP 2003505939A JP 2003505939 A JP2003505939 A JP 2003505939A JP 2005512020 A5 JP2005512020 A5 JP 2005512020A5
- Authority
- JP
- Japan
- Prior art keywords
- ray
- ray fluorescence
- fluorescence spectroscopy
- double
- sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 claims description 77
- 238000004876 x-ray fluorescence Methods 0.000 claims description 74
- 239000013078 crystal Substances 0.000 claims description 54
- 238000004846 x-ray emission Methods 0.000 claims description 52
- 230000005284 excitation Effects 0.000 claims description 43
- 238000000034 method Methods 0.000 claims description 30
- 230000005855 radiation Effects 0.000 claims description 28
- 239000007787 solid Substances 0.000 claims description 19
- 239000012491 analyte Substances 0.000 claims description 14
- 238000004611 spectroscopical analysis Methods 0.000 claims description 12
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 claims description 6
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims description 6
- 239000012530 fluid Substances 0.000 claims description 6
- 229910052717 sulfur Inorganic materials 0.000 claims description 6
- 239000011593 sulfur Substances 0.000 claims description 6
- 239000013520 petroleum-based product Substances 0.000 claims description 4
- 239000003502 gasoline Substances 0.000 claims description 3
- 229910052742 iron Inorganic materials 0.000 claims description 3
- 239000010687 lubricating oil Substances 0.000 claims description 3
- 239000010779 crude oil Substances 0.000 claims description 2
- 239000003208 petroleum Substances 0.000 claims 3
- 238000001514 detection method Methods 0.000 description 15
- 238000004458 analytical method Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 7
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000035945 sensitivity Effects 0.000 description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- 229910052804 chromium Inorganic materials 0.000 description 3
- 239000011651 chromium Substances 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 3
- 239000002178 crystalline material Substances 0.000 description 3
- 229910052732 germanium Inorganic materials 0.000 description 3
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000010703 silicon Substances 0.000 description 3
- 239000013077 target material Substances 0.000 description 3
- 239000011573 trace mineral Substances 0.000 description 3
- 235000013619 trace mineral Nutrition 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000000875 corresponding effect Effects 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 239000003921 oil Substances 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 229910052720 vanadium Inorganic materials 0.000 description 2
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 2
- 230000005461 Bremsstrahlung Effects 0.000 description 1
- 238000000441 X-ray spectroscopy Methods 0.000 description 1
- 238000002083 X-ray spectrum Methods 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- QUQFTIVBFKLPCL-UHFFFAOYSA-L copper;2-amino-3-[(2-amino-2-carboxylatoethyl)disulfanyl]propanoate Chemical compound [Cu+2].[O-]C(=O)C(N)CSSCC(N)C([O-])=O QUQFTIVBFKLPCL-UHFFFAOYSA-L 0.000 description 1
- 230000002596 correlated effect Effects 0.000 description 1
- -1 diesel Substances 0.000 description 1
- 239000002283 diesel fuel Substances 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000002149 energy-dispersive X-ray emission spectroscopy Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004445 quantitative analysis Methods 0.000 description 1
- 239000012857 radioactive material Substances 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US29937101P | 2001-06-19 | 2001-06-19 | |
| PCT/US2002/019272 WO2002103710A2 (en) | 2001-06-19 | 2002-06-18 | Wavelength dispersive xrf system using focusing optic for excitation and a focusing monochromator for collection |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007271638A Division JP5489401B2 (ja) | 2001-06-19 | 2007-10-18 | 蛍光ｘ線分光システム及び蛍光ｘ線分光方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005512020A JP2005512020A (ja) | 2005-04-28 |
| JP2005512020A5 true JP2005512020A5 (https=) | 2008-08-14 |
Family
ID=23154489
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003505939A Pending JP2005512020A (ja) | 2001-06-19 | 2002-06-18 | Ｘ線蛍光分光システム及びｘ線蛍光分光方法 |
| JP2007271638A Expired - Lifetime JP5489401B2 (ja) | 2001-06-19 | 2007-10-18 | 蛍光ｘ線分光システム及び蛍光ｘ線分光方法 |
| JP2013258597A Pending JP2014066731A (ja) | 2001-06-19 | 2013-12-13 | 蛍光ｘ線分光システム及び蛍光ｘ線分光方法 |
Family Applications After (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007271638A Expired - Lifetime JP5489401B2 (ja) | 2001-06-19 | 2007-10-18 | 蛍光ｘ線分光システム及び蛍光ｘ線分光方法 |
| JP2013258597A Pending JP2014066731A (ja) | 2001-06-19 | 2013-12-13 | 蛍光ｘ線分光システム及び蛍光ｘ線分光方法 |
Country Status (11)
| Country | Link |
|---|---|
| US (1) | US6934359B2 (https=) |
| EP (1) | EP1402541B1 (https=) |
| JP (3) | JP2005512020A (https=) |
| CN (1) | CN1246858C (https=) |
| AT (1) | ATE336789T1 (https=) |
| AU (1) | AU2002315331A1 (https=) |
| CA (1) | CA2489646C (https=) |
| DE (1) | DE60213994T2 (https=) |
| ES (1) | ES2271277T3 (https=) |
| RU (1) | RU2339974C2 (https=) |
| WO (1) | WO2002103710A2 (https=) |
Families Citing this family (103)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20080220441A1 (en) * | 2001-05-16 | 2008-09-11 | Birnbaum Eva R | Advanced drug development and manufacturing |
| WO2003043498A2 (en) * | 2001-11-17 | 2003-05-30 | Council For The Central Laboratory Of The Research Councils | Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector |
| EP1468428B1 (fr) | 2002-06-19 | 2006-09-27 | Xenocs | Ensemble optique et procede associe |
| FR2850171B1 (fr) * | 2003-01-21 | 2005-04-08 | Xenocs | Dispositif optique pour applications rayons x |
| DE10254026C5 (de) * | 2002-11-20 | 2009-01-29 | Incoatec Gmbh | Reflektor für Röntgenstrahlung |
| US7763820B1 (en) | 2003-01-27 | 2010-07-27 | Spectramet, Llc | Sorting pieces of material based on photonic emissions resulting from multiple sources of stimuli |
| US20060153332A1 (en) * | 2003-03-27 | 2006-07-13 | Hisayuki Kohno | X-ray fluorescence analyzer |
| US7006596B1 (en) * | 2003-05-09 | 2006-02-28 | Kla-Tencor Technologies Corporation | Light element measurement |
| WO2007016484A2 (en) * | 2005-08-01 | 2007-02-08 | The Research Foundation Of State University Of New York | X-ray imaging systems employing point-focusing, curved monochromating optics |
| WO2007019053A1 (en) * | 2005-08-04 | 2007-02-15 | X-Ray Optical Systems, Inc. | Monochromatic x-ray micro beam for trace element mapping |
| JP5159068B2 (ja) * | 2005-09-01 | 2013-03-06 | 独立行政法人科学技術振興機構 | 全反射蛍光ｘ線分析装置 |
| US7519153B1 (en) * | 2006-03-24 | 2009-04-14 | Kla-Tencor Technologies Corporation | X-ray metrology with diffractors |
| JP3950156B1 (ja) * | 2006-04-11 | 2007-07-25 | 理学電機工業株式会社 | 蛍光ｘ線分析装置 |
| US7634052B2 (en) * | 2006-10-24 | 2009-12-15 | Thermo Niton Analyzers Llc | Two-stage x-ray concentrator |
| US7412131B2 (en) * | 2007-01-02 | 2008-08-12 | General Electric Company | Multilayer optic device and system and method for making same |
| JP5039971B2 (ja) * | 2007-01-25 | 2012-10-03 | 国立大学法人東北大学 | 非走査型波長分散型ｘ線分析装置及びそれを用いた測定方法 |
| EP1953537A1 (de) * | 2007-01-30 | 2008-08-06 | KEMMER, Josef, Dr. | Vorrichtung zur Erfassung und/oder Leitung von Röntgenstrahlung unter Verwendung einer Röntgenoptik |
| CN101883980B (zh) * | 2007-03-15 | 2013-06-12 | X射线光学系统公司 | 用于确定样品价态的x射线荧光方法 |
| US7366374B1 (en) | 2007-05-22 | 2008-04-29 | General Electric Company | Multilayer optic device and an imaging system and method using same |
| US20090041198A1 (en) * | 2007-08-07 | 2009-02-12 | General Electric Company | Highly collimated and temporally variable x-ray beams |
| US7508911B1 (en) * | 2007-09-19 | 2009-03-24 | General Electric Company | X-ray imaging system and methods of using and forming an array of optic devices therein |
| US7801272B2 (en) * | 2007-09-28 | 2010-09-21 | Rigaku Corporation | X-ray diffraction apparatus and X-ray diffraction method |
| CN101918821B (zh) * | 2007-11-30 | 2012-05-09 | X射线光学系统公司 | 用于x射线分析仪的预膜精确试样单元 |
| US7742566B2 (en) * | 2007-12-07 | 2010-06-22 | General Electric Company | Multi-energy imaging system and method using optic devices |
| MX2010009713A (es) * | 2008-03-05 | 2011-03-29 | X Ray Optical Sys Inc | Sistema xrf teniendo bandas de energia de excitacion multiples en un paquete altamente alineado. |
| US7933383B2 (en) * | 2008-04-11 | 2011-04-26 | Rigaku Innovative Technologies, Inc. | X-ray generator with polycapillary optic |
| CN101581680A (zh) * | 2008-12-25 | 2009-11-18 | 中国建筑材料检验认证中心 | 一种双曲晶体x荧光光谱分析仪及其工作方法 |
| US20100310041A1 (en) * | 2009-06-03 | 2010-12-09 | Adams William L | X-Ray System and Methods with Detector Interior to Focusing Element |
| US8058621B2 (en) * | 2009-10-26 | 2011-11-15 | General Electric Company | Elemental composition detection system and method |
| US8208602B2 (en) * | 2010-02-22 | 2012-06-26 | General Electric Company | High flux photon beams using optic devices |
| US8311184B2 (en) | 2010-08-30 | 2012-11-13 | General Electric Company | Fan-shaped X-ray beam imaging systems employing graded multilayer optic devices |
| US8744048B2 (en) | 2010-12-28 | 2014-06-03 | General Electric Company | Integrated X-ray source having a multilayer total internal reflection optic device |
| EP2721396B1 (en) * | 2011-06-20 | 2018-04-04 | X-Ray Optical Systems, Inc. | Online monitoring of contaminants in crude and heavy fuels, and refinery applications thereof |
| US8761346B2 (en) | 2011-07-29 | 2014-06-24 | General Electric Company | Multilayer total internal reflection optic devices and methods of making and using the same |
| CA2843850C (en) | 2011-08-06 | 2016-10-04 | Rigaku Innovative Technologies, Inc. | Nanotube based device for guiding x-ray photons and neutrons |
| EP2745101B1 (en) | 2011-08-15 | 2019-11-06 | X-Ray Optical Systems, Inc. | X-ray analysis apparatus |
| CN103946693B (zh) | 2011-10-06 | 2017-05-03 | X射线光学系统公司 | 可移除式x‑射线分析仪用的可移动型运输及屏蔽装置 |
| CN107731337B (zh) * | 2011-10-26 | 2019-11-19 | X射线光学系统公司 | X射线分析引擎和分析仪的支撑结构及高度对准的单色x射线光学器件 |
| JP5990734B2 (ja) * | 2011-11-30 | 2016-09-14 | 株式会社リガク | 蛍光ｘ線分析装置 |
| JP5907375B2 (ja) | 2011-12-28 | 2016-04-26 | 株式会社テクノエックス | 蛍光ｘ線分析装置及び蛍光ｘ線分析方法 |
| CN104272424A (zh) * | 2012-02-28 | 2015-01-07 | X射线光学系统公司 | 具有使用多材料x 射线管阳极和单色光学装置产生的多激励能带的x射线分析器 |
| CN103018266A (zh) * | 2012-12-14 | 2013-04-03 | 上海出入境检验检疫局工业品与原材料检测技术中心 | 全反射x射线荧光光谱法测定润滑油中微量元素的方法 |
| CN103076352B (zh) * | 2012-12-28 | 2015-02-25 | 中国科学院高能物理研究所 | 一种获得高品质薄膜样品x射线吸收谱的方法 |
| JP6082634B2 (ja) * | 2013-03-27 | 2017-02-15 | 株式会社日立ハイテクサイエンス | 蛍光ｘ線分析装置 |
| WO2015027225A1 (en) | 2013-08-23 | 2015-02-26 | The Schepens Eye Research Institute, Inc. | Spatial modeling of visual fields |
| US10295485B2 (en) | 2013-12-05 | 2019-05-21 | Sigray, Inc. | X-ray transmission spectrometer system |
| USRE48612E1 (en) | 2013-10-31 | 2021-06-29 | Sigray, Inc. | X-ray interferometric imaging system |
| CN103985942B (zh) * | 2014-05-15 | 2016-03-30 | 南京航空航天大学 | 一种矩形波导到多米诺等离子波导转换器 |
| JP6397690B2 (ja) * | 2014-08-11 | 2018-09-26 | 株式会社日立ハイテクノロジーズ | Ｘ線透過検査装置及び異物検出方法 |
| WO2016103834A1 (ja) * | 2014-12-25 | 2016-06-30 | 株式会社リガク | 斜入射蛍光ｘ線分析装置および方法 |
| JP6069609B2 (ja) * | 2015-03-26 | 2017-02-01 | 株式会社リガク | 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法 |
| US12109593B2 (en) | 2015-07-16 | 2024-10-08 | Sortera Technologies, Inc. | Classification and sorting with single-board computers |
| US12017255B2 (en) | 2015-07-16 | 2024-06-25 | Sortera Technologies, Inc. | Sorting based on chemical composition |
| US11969764B2 (en) | 2016-07-18 | 2024-04-30 | Sortera Technologies, Inc. | Sorting of plastics |
| US12280403B2 (en) | 2015-07-16 | 2025-04-22 | Sortera Technologies, Inc. | Sorting based on chemical composition |
| US10722922B2 (en) | 2015-07-16 | 2020-07-28 | UHV Technologies, Inc. | Sorting cast and wrought aluminum |
| US12194506B2 (en) | 2015-07-16 | 2025-01-14 | Sortera Technologies, Inc. | Sorting of contaminants |
| US12208421B2 (en) | 2015-07-16 | 2025-01-28 | Sortera Technologies, Inc. | Metal separation in a scrap yard |
| US12290842B2 (en) | 2015-07-16 | 2025-05-06 | Sortera Technologies, Inc. | Sorting of dark colored and black plastics |
| US12103045B2 (en) | 2015-07-16 | 2024-10-01 | Sortera Technologies, Inc. | Removing airbag modules from automotive scrap |
| CN108136445B (zh) | 2015-07-16 | 2020-11-20 | 索特拉合金有限公司 | 材料分拣系统 |
| US12551931B2 (en) | 2015-07-16 | 2026-02-17 | Sortera Technologies, Inc. | Classifying of materials with contaminants |
| US11964304B2 (en) | 2015-07-16 | 2024-04-23 | Sortera Technologies, Inc. | Sorting between metal alloys |
| US11278937B2 (en) | 2015-07-16 | 2022-03-22 | Sortera Alloys, Inc. | Multiple stage sorting |
| US10625304B2 (en) | 2017-04-26 | 2020-04-21 | UHV Technologies, Inc. | Recycling coins from scrap |
| US10823687B2 (en) | 2015-08-03 | 2020-11-03 | UHV Technologies, Inc. | Metal analysis during pharmaceutical manufacturing |
| US10677744B1 (en) * | 2016-06-03 | 2020-06-09 | U.S. Department Of Energy | Multi-cone x-ray imaging Bragg crystal spectrometer |
| CN106248706A (zh) * | 2016-07-13 | 2016-12-21 | 北京师范大学 | 一种微型毛细管x光透镜聚焦同位素放射源的x射线荧光谱仪 |
| JP7418208B2 (ja) | 2016-09-15 | 2024-01-19 | ユニバーシティ オブ ワシントン | Ｘ線分光計及びその使用方法 |
| WO2018200866A1 (en) | 2017-04-26 | 2018-11-01 | UHV Technologies, Inc. | Material sorting using a vision system |
| CN108802081B (zh) * | 2017-04-27 | 2021-07-30 | 北京安科慧生科技有限公司 | X射线荧光(xrf)光谱分析系统和方法 |
| US11815480B2 (en) * | 2018-04-20 | 2023-11-14 | Outotec (Finland) Oy | X-ray fluorescence analyzer and a method for performing an x-ray fluorescence analysis |
| US10845491B2 (en) | 2018-06-04 | 2020-11-24 | Sigray, Inc. | Energy-resolving x-ray detection system |
| JP7394464B2 (ja) * | 2018-07-04 | 2023-12-08 | 株式会社リガク | 蛍光ｘ線分析装置 |
| GB2591630B (en) | 2018-07-26 | 2023-05-24 | Sigray Inc | High brightness x-ray reflection source |
| WO2020051061A1 (en) | 2018-09-04 | 2020-03-12 | Sigray, Inc. | System and method for x-ray fluorescence with filtering |
| WO2020051221A2 (en) | 2018-09-07 | 2020-03-12 | Sigray, Inc. | System and method for depth-selectable x-ray analysis |
| CN109030529B (zh) * | 2018-10-30 | 2021-12-21 | 上海爱斯特电子有限公司 | 单色激发x射线荧光光谱仪 |
| DE112020004169T5 (de) | 2019-09-03 | 2022-05-25 | Sigray, Inc. | System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung |
| US11175243B1 (en) | 2020-02-06 | 2021-11-16 | Sigray, Inc. | X-ray dark-field in-line inspection for semiconductor samples |
| US11217357B2 (en) | 2020-02-10 | 2022-01-04 | Sigray, Inc. | X-ray mirror optics with multiple hyperboloidal/hyperbolic surface profiles |
| JP7395775B2 (ja) | 2020-05-18 | 2023-12-11 | シグレイ、インコーポレイテッド | 結晶解析装置及び複数の検出器素子を使用するｘ線吸収分光法のためのシステム及び方法 |
| JP7380421B2 (ja) * | 2020-05-27 | 2023-11-15 | 株式会社島津製作所 | Ｘ線分析装置およびｘ線分析方法 |
| CN111834029B (zh) * | 2020-08-19 | 2025-09-02 | 北京市辐射中心 | 一种组合式x射线单色会聚系统 |
| WO2022061347A1 (en) | 2020-09-17 | 2022-03-24 | Sigray, Inc. | System and method using x-rays for depth-resolving metrology and analysis |
| JP7100910B2 (ja) * | 2020-12-01 | 2022-07-14 | 株式会社リガク | 全反射蛍光ｘ線分析装置 |
| KR20260030946A (ko) | 2020-12-07 | 2026-03-06 | 시그레이, 아이엔씨. | 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템 |
| US12480892B2 (en) | 2020-12-07 | 2025-11-25 | Sigray, Inc. | High throughput 3D x-ray imaging system using a transmission x-ray source |
| CN113218975A (zh) * | 2021-04-25 | 2021-08-06 | 中科合成油技术有限公司 | 一种表面x射线吸收谱测量装置 |
| WO2023168204A1 (en) | 2022-03-02 | 2023-09-07 | Sigray, Inc. | X-ray fluorescence system and x-ray source with electrically insulative target material |
| WO2023177981A1 (en) | 2022-03-15 | 2023-09-21 | Sigray, Inc. | System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector |
| US12607582B2 (en) * | 2022-04-19 | 2026-04-21 | Thermo Electron Scientific Instruments Llc | Optical extraction probe for electron microscope and other vacuum chambers |
| CN119173759A (zh) | 2022-05-02 | 2024-12-20 | 斯格瑞公司 | X射线顺序阵列波长色散光谱仪 |
| US12247934B2 (en) | 2022-07-29 | 2025-03-11 | X-Ray Optical Systems, Inc. | Polarized, energy dispersive x-ray fluorescence system and method |
| WO2024123241A2 (en) * | 2022-12-05 | 2024-06-13 | Nanyang Technological University | Method and system for generating x-ray emission in the water window regime |
| CN121013975A (zh) | 2023-02-16 | 2025-11-25 | 斯格瑞公司 | 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统 |
| IL301287B2 (en) * | 2023-03-09 | 2026-01-01 | Rigaku Semiconductor Instr Ltd | Dual-head testing system |
| US12181423B1 (en) | 2023-09-07 | 2024-12-31 | Sigray, Inc. | Secondary image removal using high resolution x-ray transmission sources |
| US12429437B2 (en) | 2023-11-07 | 2025-09-30 | Sigray, Inc. | System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes |
| US12429436B2 (en) | 2024-01-08 | 2025-09-30 | Sigray, Inc. | X-ray analysis system with focused x-ray beam and non-x-ray microscope |
| WO2025155719A1 (en) | 2024-01-18 | 2025-07-24 | Sigray, Inc. | Sequential array of x-ray imaging detectors |
| WO2025174966A1 (en) | 2024-02-15 | 2025-08-21 | Sigray, Inc. | System and method for generating a focused x‑ray beam |
| CN119688754B (zh) * | 2025-02-26 | 2025-06-20 | 浙江沃乐科技股份有限公司 | 一种泛半导体产业含氟污泥的快速检测设备和方法 |
Family Cites Families (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU320195A1 (ru) * | 1970-04-13 | 1982-12-30 | Anisovich K V | Флуоресцентный рентгеновский спектрометр |
| DE3125803A1 (de) * | 1981-06-30 | 1983-01-13 | Siemens AG, 1000 Berlin und 8000 München | Kristall-roentgen-sequenzspektrometer |
| SU1117505A1 (ru) * | 1983-05-12 | 1984-10-07 | Ленинградское научно-производственное объединение "Буревестник" | Способ рентгеноспектрального анализа (его варианты) |
| NL8302263A (nl) * | 1983-06-27 | 1985-01-16 | Philips Nv | Roentgen analyse apparaat met dubbel gebogen monochromator kristal. |
| US4599741A (en) * | 1983-11-04 | 1986-07-08 | USC--Dept. of Materials Science | System for local X-ray excitation by monochromatic X-rays |
| JP2742415B2 (ja) * | 1987-11-27 | 1998-04-22 | 株式会社日立製作所 | Ｘ線分析装置 |
| NL8801019A (nl) * | 1988-04-20 | 1989-11-16 | Philips Nv | Roentgen spectrometer met dubbel gebogen kristal. |
| JPH04120500A (ja) * | 1990-09-11 | 1992-04-21 | Shimadzu Corp | Ｘ線単色化集光装置 |
| US5497008A (en) * | 1990-10-31 | 1996-03-05 | X-Ray Optical Systems, Inc. | Use of a Kumakhov lens in analytic instruments |
| US5175755A (en) * | 1990-10-31 | 1992-12-29 | X-Ray Optical System, Inc. | Use of a kumakhov lens for x-ray lithography |
| US5192869A (en) * | 1990-10-31 | 1993-03-09 | X-Ray Optical Systems, Inc. | Device for controlling beams of particles, X-ray and gamma quanta |
| JP3090471B2 (ja) * | 1990-10-31 | 2000-09-18 | エックス−レイ オプティカル システムズ，インコーポレイテッド | 粒子、ｘ線およびガンマ線量子のビーム制御装置 |
| JPH04190148A (ja) * | 1990-11-26 | 1992-07-08 | Hitachi Ltd | 表面分析方法および装置 |
| GB2266040B (en) * | 1992-04-09 | 1996-03-13 | Rigaku Ind Corp | X-ray analysis apparatus |
| RU2089105C1 (ru) * | 1993-05-27 | 1997-09-10 | Виктор Натанович Ингал | Рентгеновская диагностическая установка |
| JP2796067B2 (ja) * | 1994-02-08 | 1998-09-10 | 理学電機工業株式会社 | 蛍光ｘ線分析に使用する試料の調製法 |
| JP2728627B2 (ja) * | 1994-04-13 | 1998-03-18 | 株式会社神戸製鋼所 | 波長分散型ｘ線分光装置 |
| EP0723272B1 (en) * | 1994-07-08 | 2001-04-25 | Muradin Abubekirovich Kumakhov | Method of guiding beams of neutral and charged particles and a device for implementing said method |
| US5570408A (en) * | 1995-02-28 | 1996-10-29 | X-Ray Optical Systems, Inc. | High intensity, small diameter x-ray beam, capillary optic system |
| US5604353A (en) * | 1995-06-12 | 1997-02-18 | X-Ray Optical Systems, Inc. | Multiple-channel, total-reflection optic with controllable divergence |
| US5745547A (en) * | 1995-08-04 | 1998-04-28 | X-Ray Optical Systems, Inc. | Multiple channel optic |
| US5982847A (en) * | 1996-10-28 | 1999-11-09 | Utah State University | Compact X-ray fluorescence spectrometer for real-time wear metal analysis of lubrucating oils |
| JPH10227749A (ja) * | 1997-02-14 | 1998-08-25 | Matsushita Electric Ind Co Ltd | Ｘ線検査装置及びｘ線検査方法 |
| RU2158918C2 (ru) * | 1997-05-07 | 2000-11-10 | Петербургский институт ядерной физики им. Б.П.Константинова РАН | Устройство для рентгенофлуоресцентного анализа |
| EP0884736B1 (en) * | 1997-06-11 | 2004-01-28 | Istituto Nazionale Di Fisica Nucleare | Multi-stepped diffractor constructed with constant step width angle (multi-stepped monochromator) |
| US5892809A (en) * | 1997-09-10 | 1999-04-06 | Wittry; David B. | Simplified system for local excitation by monochromatic x-rays |
| JP3604265B2 (ja) * | 1997-10-27 | 2004-12-22 | 独立行政法人科学技術振興機構 | Ｘ線回折要素及びその製造方法 |
| JP2000155102A (ja) * | 1998-11-19 | 2000-06-06 | Rigaku Corp | Ｘ線測定装置およびその方法 |
| US6285506B1 (en) * | 1999-01-21 | 2001-09-04 | X-Ray Optical Systems, Inc. | Curved optical device and method of fabrication |
| DE69933286T2 (de) * | 1999-07-21 | 2007-04-05 | Lucent Technologies Inc. | Telekommunikationssystem |
| US6381303B1 (en) * | 1999-09-29 | 2002-04-30 | Jordan Valley Applied Radiation Ltd. | X-ray microanalyzer for thin films |
| JP2001124711A (ja) * | 1999-10-27 | 2001-05-11 | Fujitsu Ltd | 蛍光ｘ線分析方法及び試料構造の評価方法 |
| US6317483B1 (en) * | 1999-11-29 | 2001-11-13 | X-Ray Optical Systems, Inc. | Doubly curved optical device with graded atomic planes |
| US6697454B1 (en) * | 2000-06-29 | 2004-02-24 | X-Ray Optical Systems, Inc. | X-ray analytical techniques applied to combinatorial library screening |
| US6829327B1 (en) * | 2000-09-22 | 2004-12-07 | X-Ray Optical Systems, Inc. | Total-reflection x-ray fluorescence apparatus and method using a doubly-curved optic |
-
2002
- 2002-06-18 ES ES02742177T patent/ES2271277T3/es not_active Expired - Lifetime
- 2002-06-18 CA CA2489646A patent/CA2489646C/en not_active Expired - Lifetime
- 2002-06-18 JP JP2003505939A patent/JP2005512020A/ja active Pending
- 2002-06-18 WO PCT/US2002/019272 patent/WO2002103710A2/en not_active Ceased
- 2002-06-18 AT AT02742177T patent/ATE336789T1/de active
- 2002-06-18 CN CNB028161939A patent/CN1246858C/zh not_active Expired - Lifetime
- 2002-06-18 RU RU2004101401/28A patent/RU2339974C2/ru active
- 2002-06-18 AU AU2002315331A patent/AU2002315331A1/en not_active Abandoned
- 2002-06-18 EP EP02742177A patent/EP1402541B1/en not_active Expired - Lifetime
- 2002-06-18 DE DE60213994T patent/DE60213994T2/de not_active Expired - Lifetime
-
2003
- 2003-12-19 US US10/742,414 patent/US6934359B2/en not_active Expired - Lifetime
-
2007
- 2007-10-18 JP JP2007271638A patent/JP5489401B2/ja not_active Expired - Lifetime
-
2013
- 2013-12-13 JP JP2013258597A patent/JP2014066731A/ja active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP5489401B2 (ja) | 蛍光ｘ線分光システム及び蛍光ｘ線分光方法 | |
| JP2005512020A5 (https=) | ||
| US10295486B2 (en) | Detector for X-rays with high spatial and high spectral resolution | |
| US7899154B2 (en) | Small spot and high energy resolution XRF system for valence state determination | |
| US5497008A (en) | Use of a Kumakhov lens in analytic instruments | |
| CN101981651B (zh) | 在高度校准的包装中具有多个激发能量带的xrf系统 | |
| CN1656373B (zh) | 元素特定的x射线荧光显微镜以及操作方法 | |
| US5745543A (en) | Apparatus for simultaneous X-ray diffraction and X-ray fluorescence measurements | |
| JP5990734B2 (ja) | 蛍光ｘ線分析装置 | |
| CN104272424A (zh) | 具有使用多材料x 射线管阳极和单色光学装置产生的多激励能带的x射线分析器 | |
| JP5464419B2 (ja) | 分光結晶、波長分散型ｘ線分析装置および元素分布測定方法 | |
| US10256002B2 (en) | Support structure and highly aligned monochromatic X-ray optics for X-ray analysis engines and analyzers | |
| US9417341B2 (en) | Device and method for determining the energetic composition of electromagnetic waves | |
| CN109030529A (zh) | 单色激发x射线荧光光谱仪 | |
| JP6709814B2 (ja) | 高分解能ｘ線回折方法および装置 | |
| CN110621986B (zh) | 执行x射线光谱分析的方法和x射线吸收光谱仪系统 | |
| Li et al. | Focal construct geometry for high intensity energy dispersive x-ray diffraction based on x-ray capillary optics | |
| JP5646147B2 (ja) | 二次元分布を測定する方法及び装置 | |
| HK1070984B (en) | An x-ray fluorescence spectroscopy system and an xrf spectroscopy method |