CN1246858C - X射线荧光(xrf)光谱测定系统和方法 - Google Patents

X射线荧光(xrf)光谱测定系统和方法 Download PDF

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Publication number
CN1246858C
CN1246858C CNB028161939A CN02816193A CN1246858C CN 1246858 C CN1246858 C CN 1246858C CN B028161939 A CNB028161939 A CN B028161939A CN 02816193 A CN02816193 A CN 02816193A CN 1246858 C CN1246858 C CN 1246858C
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hyperbolic
optic
xrf
sample
xrf spectrometry
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CN1543653A (zh
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陈泽武
戴维·M·吉布森
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X Ray Optical Systems Inc
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X Ray Optical Systems Inc
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    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/062—Devices having a multilayer structure
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—HANDLING OF PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Nanotechnology (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CNB028161939A 2001-06-19 2002-06-18 X射线荧光(xrf)光谱测定系统和方法 Expired - Lifetime CN1246858C (zh)

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US29937101P 2001-06-19 2001-06-19
US60/299,371 2001-06-19

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CN1543653A CN1543653A (zh) 2004-11-03
CN1246858C true CN1246858C (zh) 2006-03-22

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Country Link
US (1) US6934359B2 (https=)
EP (1) EP1402541B1 (https=)
JP (3) JP2005512020A (https=)
CN (1) CN1246858C (https=)
AT (1) ATE336789T1 (https=)
AU (1) AU2002315331A1 (https=)
CA (1) CA2489646C (https=)
DE (1) DE60213994T2 (https=)
ES (1) ES2271277T3 (https=)
RU (1) RU2339974C2 (https=)
WO (1) WO2002103710A2 (https=)

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JP2005512020A (ja) 2005-04-28
JP2008032749A (ja) 2008-02-14
CN1543653A (zh) 2004-11-03
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JP5489401B2 (ja) 2014-05-14
JP2014066731A (ja) 2014-04-17
RU2339974C2 (ru) 2008-11-27
CA2489646C (en) 2010-02-09
US6934359B2 (en) 2005-08-23
EP1402541B1 (en) 2006-08-16
CA2489646A1 (en) 2002-12-27
WO2002103710A2 (en) 2002-12-27
DE60213994D1 (de) 2006-09-28
RU2004101401A (ru) 2005-02-27
EP1402541A2 (en) 2004-03-31
DE60213994T2 (de) 2006-12-07
ES2271277T3 (es) 2007-04-16
HK1070984A1 (en) 2005-06-30
US20040131146A1 (en) 2004-07-08
WO2002103710A3 (en) 2003-05-01

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