MX2010009713A - Sistema xrf teniendo bandas de energia de excitacion multiples en un paquete altamente alineado. - Google Patents

Sistema xrf teniendo bandas de energia de excitacion multiples en un paquete altamente alineado.

Info

Publication number
MX2010009713A
MX2010009713A MX2010009713A MX2010009713A MX2010009713A MX 2010009713 A MX2010009713 A MX 2010009713A MX 2010009713 A MX2010009713 A MX 2010009713A MX 2010009713 A MX2010009713 A MX 2010009713A MX 2010009713 A MX2010009713 A MX 2010009713A
Authority
MX
Mexico
Prior art keywords
ray
energy
diverging
spot
excitation energy
Prior art date
Application number
MX2010009713A
Other languages
English (en)
Inventor
bailey Adam
Chen Zewu
M Gibson David
m gibson Walter
H Burdett John Jr
Scott Semken R
Xin Kai
Original Assignee
X Ray Optical Sys Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by X Ray Optical Sys Inc filed Critical X Ray Optical Sys Inc
Publication of MX2010009713A publication Critical patent/MX2010009713A/es

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/02—Constructional details
    • H05G1/04—Mounting the X-ray tube within a closed housing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/1003—Different kinds of radiation or particles monochromatic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/315—Accessories, mechanical or electrical features monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/423—Imaging multispectral imaging-multiple energy imaging
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Un aparato de análisis de rayos-X para iluminar un punto de muestra con un haz de rayos-X. Un tubo de rayos-X es proporcionado teniendo un punto de fuente desde el cual es producido un haz de rayos-X divergente teniendo una primer energía característica, y una energía de radiación de frenado, un primer óptico de rayos-X recibe el haz de rayos-X divergente y dirige el haz hacia el punto de muestra, mientras que monocromatiza el haz; y un segundo óptico de rayos-X recibe el haz de rayos-X divergente y dirige el haz hacia el punto de muestra, mientras que monocramatiza el haz a una segunda energía. El primer óptico de rayos-X puede monocromatizar la energía característica desde el punto de fuente y el segundo óptico de rayos-X puede monocromatizar la energía de radiación de frenado desde el punto de fuente. Los ópticos de rayos-X pueden ser ópticos de difracción arqueados, para recibir el haz de rayos-X divergente desde el tubo de rayos-X y enfocar el haz en el punto de muestra. La detección también es proporcionada para detectar y medir varias toxinas en, por ejemplo, los productos fabricados incluyendo los juguetes y los electrónicos.
MX2010009713A 2008-03-05 2009-03-03 Sistema xrf teniendo bandas de energia de excitacion multiples en un paquete altamente alineado. MX2010009713A (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US3389908P 2008-03-05 2008-03-05
US3922008P 2008-03-25 2008-03-25
US4297408P 2008-04-07 2008-04-07
PCT/US2009/035847 WO2009111454A1 (en) 2008-03-05 2009-03-03 Xrf system having multiple excitation energy bands in highly aligned package

Publications (1)

Publication Number Publication Date
MX2010009713A true MX2010009713A (es) 2011-03-29

Family

ID=41056347

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2010009713A MX2010009713A (es) 2008-03-05 2009-03-03 Sistema xrf teniendo bandas de energia de excitacion multiples en un paquete altamente alineado.

Country Status (8)

Country Link
US (4) US8559597B2 (es)
EP (1) EP2260501B1 (es)
JP (1) JP5539906B2 (es)
CN (2) CN105044139B (es)
CA (1) CA2753990C (es)
HK (1) HK1153848A1 (es)
MX (1) MX2010009713A (es)
WO (1) WO2009111454A1 (es)

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Also Published As

Publication number Publication date
US20140105363A1 (en) 2014-04-17
JP5539906B2 (ja) 2014-07-02
CA2753990C (en) 2017-11-21
CN101981651A (zh) 2011-02-23
US8559597B2 (en) 2013-10-15
US20110170666A1 (en) 2011-07-14
US9343193B2 (en) 2016-05-17
EP2260501A1 (en) 2010-12-15
HK1153848A1 (en) 2012-04-05
CN105044139A (zh) 2015-11-11
EP2260501A4 (en) 2014-03-19
US20160260514A1 (en) 2016-09-08
WO2009111454A1 (en) 2009-09-11
US20150262722A1 (en) 2015-09-17
CN101981651B (zh) 2015-07-08
CN105044139B (zh) 2019-04-23
CA2753990A1 (en) 2009-09-11
EP2260501B1 (en) 2021-08-25
JP2011513751A (ja) 2011-04-28
US9048001B2 (en) 2015-06-02

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