IN2012DN05107A - - Google Patents

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Publication number
IN2012DN05107A
IN2012DN05107A IN5107DEN2012A IN2012DN05107A IN 2012DN05107 A IN2012DN05107 A IN 2012DN05107A IN 5107DEN2012 A IN5107DEN2012 A IN 5107DEN2012A IN 2012DN05107 A IN2012DN05107 A IN 2012DN05107A
Authority
IN
India
Prior art keywords
sample
rays
ray
xrd
xrf
Prior art date
Application number
Other languages
English (en)
Inventor
Ravisekhar Yellepeddi
Pierre-Yves Negro
Original Assignee
Thermo Fisher Scient Ecublens Sarl
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Thermo Fisher Scient Ecublens Sarl filed Critical Thermo Fisher Scient Ecublens Sarl
Publication of IN2012DN05107A publication Critical patent/IN2012DN05107A/en

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2206Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/071Investigating materials by wave or particle radiation secondary emission combination of measurements, at least 1 secondary emission
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
IN5107DEN2012 2009-12-17 2010-12-13 IN2012DN05107A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB0921965.0A GB2476255B (en) 2009-12-17 2009-12-17 Method and apparatus for performing x-ray analysis of a sample
PCT/EP2010/069540 WO2011073148A1 (en) 2009-12-17 2010-12-13 Method and apparatus for performing x-ray analysis of a sample

Publications (1)

Publication Number Publication Date
IN2012DN05107A true IN2012DN05107A (es) 2015-10-09

Family

ID=41717033

Family Applications (1)

Application Number Title Priority Date Filing Date
IN5107DEN2012 IN2012DN05107A (es) 2009-12-17 2010-12-13

Country Status (9)

Country Link
US (1) US9031187B2 (es)
EP (1) EP2513641B1 (es)
JP (1) JP5855573B2 (es)
CN (1) CN102770753B (es)
GB (1) GB2476255B (es)
IN (1) IN2012DN05107A (es)
RU (1) RU2506570C1 (es)
WO (1) WO2011073148A1 (es)
ZA (1) ZA201204142B (es)

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CN103076352B (zh) * 2012-12-28 2015-02-25 中国科学院高能物理研究所 一种获得高品质薄膜样品x射线吸收谱的方法
EP2762862B1 (en) * 2013-01-30 2017-03-08 Bruker AXS GmbH XRF measurement apparatus for detecting contaminations on the bevel of a wafer
US9613728B2 (en) * 2013-03-15 2017-04-04 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
FI125488B (en) * 2014-06-09 2015-10-30 Fenno Aurum Oy Wavelength dispersion spectrometer, X-ray fluorescence apparatus and method
DE102014219601B4 (de) * 2014-08-13 2023-06-29 Bruker Nano Gmbh Verfahren zum Scannen einer Probe mittels einer Röntgenoptik und eine Apparatur zum Scannen einer Probe
US9746432B2 (en) 2014-09-23 2017-08-29 Olympus Scientific Solutions Americas Inc. Spacer accessory for XRF handheld analyzers
US9784699B2 (en) * 2015-03-03 2017-10-10 Panalytical B.V. Quantitative X-ray analysis—matrix thickness correction
WO2016193968A1 (en) * 2015-06-01 2016-12-08 Xwinsys Ltd. Metrology inspection apparatus
CN105092618A (zh) * 2015-09-18 2015-11-25 北京师范大学 一种微束能量色散的x射线衍射仪及其使用方法
CN105651801B (zh) * 2015-12-30 2018-10-16 北京矿冶研究总院 一种矿浆矿物在线分析方法
CN105891246B (zh) * 2016-06-23 2018-11-16 北京至一恒盛技术服务有限公司 一种x射线荧光探测装置
JP7336382B2 (ja) 2016-09-19 2023-08-31 ソレク ニュークリア リサーチ センター 蛍光x線システムおよび試料を識別する方法
CN107228871B (zh) * 2017-07-21 2023-07-04 中国地质大学(武汉) 一种便携式x射线分析装置
IT201700100060A1 (it) * 2017-09-06 2019-03-06 De Tec Tor S R L Apparato di selezione di prodotti in base alla loro composizione tramite spettroscopia a fluorescenza a raggi x e relativo procedimento di selezione
EP3553507A1 (en) * 2018-04-13 2019-10-16 Malvern Panalytical B.V. X-ray analysis apparatus
SE544488C2 (en) * 2018-04-20 2022-06-21 Outotec Finland Oy Floor molding device which on its mold side comprises
US11199513B2 (en) 2018-04-20 2021-12-14 Outotec (Finland) Oy X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing x-ray fluorescence analysis
EA202092348A1 (ru) * 2018-04-20 2021-02-15 Оутотек (Финлэнд) Ой Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа
FI20206178A1 (en) * 2018-04-20 2020-11-20 Outotec Finland Oy X-ray fluorescence analyzer and method for performing X-ray fluorescence analysis
JP6871629B2 (ja) * 2018-06-29 2021-05-12 株式会社リガク X線分析装置及びその光軸調整方法
JP7394464B2 (ja) * 2018-07-04 2023-12-08 株式会社リガク 蛍光x線分析装置
JP7380421B2 (ja) * 2020-05-27 2023-11-15 株式会社島津製作所 X線分析装置およびx線分析方法
EP4019951A1 (en) 2020-12-24 2022-06-29 Inel S.A.S Apparatuses and methods for combined simultaneous analyses of materials
US11885755B2 (en) * 2022-05-02 2024-01-30 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer
CN114705708B (zh) * 2022-06-07 2022-08-23 四川大学 一种样品表面成分智能分析方法及系统
CN114720496B (zh) * 2022-06-08 2022-08-26 四川大学 实现全场x射线荧光成像分析的衍射分析装置及方法
CN116879335B (zh) * 2023-09-08 2023-11-17 四川大学 一种组合扫描式xrd/xrf综合成像方法

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Also Published As

Publication number Publication date
EP2513641A1 (en) 2012-10-24
ZA201204142B (en) 2013-02-27
US20120294418A1 (en) 2012-11-22
CN102770753A (zh) 2012-11-07
GB2476255B (en) 2012-03-07
GB0921965D0 (en) 2010-02-03
JP2013514527A (ja) 2013-04-25
JP5855573B2 (ja) 2016-02-09
RU2506570C1 (ru) 2014-02-10
EP2513641B1 (en) 2019-04-10
WO2011073148A1 (en) 2011-06-23
CN102770753B (zh) 2016-09-14
US9031187B2 (en) 2015-05-12
GB2476255A (en) 2011-06-22

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