EA202092348A1 - Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа - Google Patents

Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа

Info

Publication number
EA202092348A1
EA202092348A1 EA202092348A EA202092348A EA202092348A1 EA 202092348 A1 EA202092348 A1 EA 202092348A1 EA 202092348 A EA202092348 A EA 202092348A EA 202092348 A EA202092348 A EA 202092348A EA 202092348 A1 EA202092348 A1 EA 202092348A1
Authority
EA
Eurasian Patent Office
Prior art keywords
ray
fluorescent
ray tube
processing unit
diffractor
Prior art date
Application number
EA202092348A
Other languages
English (en)
Inventor
Томми Коскинен
Антти Пелли
Хейкки Сипиля
Original Assignee
Оутотек (Финлэнд) Ой
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Оутотек (Финлэнд) Ой filed Critical Оутотек (Финлэнд) Ой
Publication of EA202092348A1 publication Critical patent/EA202092348A1/ru

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B03SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS; MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLID MATERIALS OR FLUIDS; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS
    • B03BSEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS
    • B03B13/00Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects
    • B03B13/06Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects using absorption or reflection of radioactive emanation
    • CCHEMISTRY; METALLURGY
    • C22METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22BPRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
    • C22B3/00Extraction of metal compounds from ores or concentrates by wet processes
    • C22B3/02Apparatus therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24Earth materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16Measuring radiation intensity
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G21K1/067Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators using surface reflection, e.g. grazing incidence mirrors, gratings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/616Specific applications or type of materials earth materials
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/635Specific applications or type of materials fluids, granulates
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21KTECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00Arrangements for handling radiation or particles
    • G21K2201/06Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067Construction details

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Geology (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Remote Sensing (AREA)
  • Molecular Biology (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Рентгеновский флуоресцентный анализатор содержит рентгеновскую трубку (402) для испускания падающего рентгеновского излучения (206) в направлении первой оптической оси (204). Блок (201) обработки пульпы выполнен с возможностью поддержания постоянного расстояния между пробой (202) пульпы и указанной рентгеновской трубкой. Первый кристаллический дифрактор (601) расположен в первом направлении от указанного блока (201) обработки пульпы и выполнен с возможностью выделения заданного первого диапазона длин волн от флуоресцентного рентгеновского излучения (207), которое распространяется в указанном первом направлении. Он выполнен с возможностью направления флуоресцентного рентгеновского излучения в выделенном заданном первом диапазоне длин волн на первый детектор (602, 505) излучения. Номинальная входная мощность указанной рентгеновской трубки (402) составляет по меньшей мере 400 Вт. Первый кристаллический дифрактор (601) содержит кристалл (603) пиролитического графита. Оптический путь между рентгеновской трубкой (402) и блоком (201) обработки пульпы является прямым без расположенного между ними дифрактора.
EA202092348A 2018-04-20 2018-04-20 Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа EA202092348A1 (ru)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/FI2018/050281 WO2019202197A1 (en) 2018-04-20 2018-04-20 X-ray fluorescence analyser, and a method for performing x-ray fluorescence analysis

Publications (1)

Publication Number Publication Date
EA202092348A1 true EA202092348A1 (ru) 2021-02-15

Family

ID=68239082

Family Applications (1)

Application Number Title Priority Date Filing Date
EA202092348A EA202092348A1 (ru) 2018-04-20 2018-04-20 Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа

Country Status (12)

Country Link
US (1) US11815480B2 (ru)
CN (1) CN112313505A (ru)
AU (2) AU2018419251B2 (ru)
BR (1) BR112020021461A2 (ru)
CA (1) CA3097462C (ru)
DK (1) DK181181B1 (ru)
EA (1) EA202092348A1 (ru)
FI (1) FI20206177A1 (ru)
MX (1) MX2020011106A (ru)
SE (1) SE544318C2 (ru)
WO (1) WO2019202197A1 (ru)
ZA (1) ZA202007018B (ru)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20206176A1 (en) 2018-04-20 2020-11-20 Outotec Finland Oy X-ray fluorescence analyzer system and method for performing X-ray fluorescence analysis on an element of interest in a slurry
MX2020011106A (es) 2018-04-20 2021-01-29 Outotec Finland Oy Analizador de fluorescencia de rayos x y un metodo para realizar el analisis de fluorescencia de rayos x.
US11885755B2 (en) * 2022-05-02 2024-01-30 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer

Family Cites Families (70)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE137533C (ru)
US3198944A (en) 1961-11-06 1965-08-03 Gen Electric X-ray emission analyzer with standardizing system and novel switch means
NL289708A (ru) 1962-03-05
US3354308A (en) 1965-04-30 1967-11-21 Philips Electronic Pharma Apparatus with means to measure the characteristic X-ray emission from and the density of a material
US3424428A (en) 1965-08-09 1969-01-28 Thiokol Chemical Corp X-ray spectroscope assembly having an analyzer block composed of annealed pyrolytic graphite on an optically accurate surface
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
US4417355A (en) * 1981-01-08 1983-11-22 Leningradskoe Npo "Burevestnik" X-Ray fluorescence spectrometer
SU1242785A2 (ru) * 1985-01-24 1986-07-07 Комплексный Научно-Исследовательский Институт Обогащения Твердых Горючих Ископаемых Устройство дл исследовани глубинности рентгенофлуоресцентного анализатора зольности угл
CN1003946B (zh) * 1985-10-10 1989-04-19 中国科学院福建物质结构研究所 三羟甲基甲胺(tam)晶体与生长方法及在x射线光谱仪中的应用
FI873627A (fi) * 1987-08-25 1989-02-22 Leningradskoe Nauchno-Proizvodstvennoe Obiedinenie/Çburevestnikç Flerkanalsroentgenspektrometer.
JPH0744967Y2 (ja) * 1988-11-17 1995-10-11 セイコー電子工業株式会社 蛍光x線膜厚計
JPH07140093A (ja) * 1993-11-17 1995-06-02 Ricoh Co Ltd X線評価装置
JP3085070B2 (ja) 1993-12-27 2000-09-04 松下電器産業株式会社 X線照射装置
US5778039A (en) * 1996-02-21 1998-07-07 Advanced Micro Devices, Inc. Method and apparatus for the detection of light elements on the surface of a semiconductor substrate using x-ray fluorescence (XRF)
US5754620A (en) * 1996-09-13 1998-05-19 Advanced Micro Devices, Inc. Apparatus and method for characterizing particles embedded within a thin film configured upon a semiconductor wafer
JP2000504422A (ja) * 1996-11-05 2000-04-11 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 2つのコリメータマスクを有するx線分析装置
US6173036B1 (en) * 1997-08-01 2001-01-09 Advanced Micro Devices, Inc. Depth profile metrology using grazing incidence X-ray fluorescence
JPH1151883A (ja) * 1997-08-04 1999-02-26 Rigaku Ind Co 蛍光x線分析装置および方法
DE19820321B4 (de) * 1998-05-07 2004-09-16 Bruker Axs Gmbh Kompaktes Röntgenspektrometer
JP2001137223A (ja) * 1999-11-08 2001-05-22 Ge Medical Systems Global Technology Co Llc X線透視撮影装置、x線撮影方法およびx線透視撮影方法
US6697454B1 (en) * 2000-06-29 2004-02-24 X-Ray Optical Systems, Inc. X-ray analytical techniques applied to combinatorial library screening
AUPQ893700A0 (en) * 2000-07-24 2000-08-17 Commonwealth Scientific And Industrial Research Organisation On-line x-ray diffraction analyser
GB0027429D0 (en) 2000-11-09 2000-12-27 Oxford Instr Analytical Ltd Apparatus for analysing a sample
JP4777539B2 (ja) * 2001-05-29 2011-09-21 エスアイアイ・ナノテクノロジー株式会社 複合x線分析装置
CN1246858C (zh) * 2001-06-19 2006-03-22 X射线光学系统公司 X射线荧光(xrf)光谱测定系统和方法
US7200200B2 (en) * 2001-09-04 2007-04-03 Quality Control, Inc. X-ray fluorescence measuring system and methods for trace elements
CN100479753C (zh) * 2003-03-07 2009-04-22 皇家飞利浦电子股份有限公司 对x射线荧光标记的空间分布成像的方法和成像系统
US7092843B2 (en) * 2003-10-21 2006-08-15 X-Ray Optical Systems, Inc. Apparatus and method for suppressing insignificant variations in measured sample composition data, including data measured from dynamically changing samples using x-ray analysis techniques
US7298817B2 (en) * 2003-12-01 2007-11-20 X-Ray Optical Systems, Inc. Portable and on-line arsenic analyzer for drinking water
US7796726B1 (en) * 2006-02-14 2010-09-14 University Of Maryland, Baltimore County Instrument and method for X-ray diffraction, fluorescence, and crystal texture analysis without sample preparation
US7634052B2 (en) * 2006-10-24 2009-12-15 Thermo Niton Analyzers Llc Two-stage x-ray concentrator
US7440541B2 (en) * 2006-12-27 2008-10-21 Innov-X-Systems, Inc. Dual source XRF system
GB2447252B (en) * 2007-03-06 2012-03-14 Thermo Fisher Scientific Inc X-ray analysis instrument
FR2914424B1 (fr) * 2007-03-30 2012-07-27 Centre Nat Rech Scient Dispositif d'analyse d'un echantillon par rayons x comprenant un systeme analyseur par diffraction filtrant en energie et en angle.
EP1978354A1 (en) * 2007-04-05 2008-10-08 Panalytical B.V. Wavelength dispersive X-ray Fluorescence Apparatus with energy dispersive detector in the form of a silicon drift detector to improve background supression
WO2009108628A2 (en) * 2008-02-25 2009-09-03 X-Ray Optical Systems, Inc. Sample module with sample stream spaced from window, for x-ray analysis system
EP2438431A4 (en) * 2009-06-03 2013-10-23 Thermo Scient Portable Analytical Instr Inc METHODS AND X-RAY SYSTEM IMPERATING A DETECTOR CONTENT IN A FOCUSING ELEMENT
CN101614684B (zh) * 2009-07-27 2011-06-29 北京矿冶研究总院 一种x射线荧光激发检测装置
GB2476255B (en) * 2009-12-17 2012-03-07 Thermo Fisher Scient Ecublens Sarl Method and apparatus for performing x-ray analysis of a sample
CN101788508A (zh) * 2010-02-03 2010-07-28 北京矿冶研究总院 矿浆品位在线测量装置
US8625737B2 (en) * 2010-02-09 2014-01-07 X-Ray Optical Systems, Inc. Sample module with sample stream supported and spaced from window, for X-ray analysis system
JP5813923B2 (ja) * 2010-03-15 2015-11-17 株式会社日立ハイテクサイエンス X線透過検査装置及びx線透過検査方法
US9063066B2 (en) * 2010-10-14 2015-06-23 Xrpro Sciences, Inc. Method for analysis using X-ray fluorescence
EP2745101B1 (en) * 2011-08-15 2019-11-06 X-Ray Optical Systems, Inc. X-ray analysis apparatus
WO2013063253A1 (en) 2011-10-26 2013-05-02 X-Ray Optical Systems, Inc. Support structure and highly aligned monochromating x-ray optics for x-ray analysis engines and analyzers
JP5907375B2 (ja) * 2011-12-28 2016-04-26 株式会社テクノエックス 蛍光x線分析装置及び蛍光x線分析方法
WO2013130525A1 (en) 2012-02-28 2013-09-06 X-Ray Optical Systems, Inc. X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics
CN202599877U (zh) * 2012-03-09 2012-12-12 深圳市华唯计量技术开发有限公司 一种多通道波长色散荧光光谱仪
GB201213789D0 (en) * 2012-08-02 2012-09-12 Commw Scient Ind Res Org An X-ray fluorescence analyser
US9261469B2 (en) * 2013-03-07 2016-02-16 Farida A. Selim Luminescence based spectrometers
CN103323478B (zh) * 2013-05-21 2015-07-29 杨东华 一种全反射x射线荧光光谱仪
RU137951U1 (ru) * 2013-06-18 2014-02-27 Российская Федерация, от имени которой выступает Федеральное государственное казенное учреждение "Войсковая часть 68240" Устройство для рентгеновского микроанализа
US10295485B2 (en) * 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
FI125488B (en) * 2014-06-09 2015-10-30 Fenno Aurum Oy Wavelength dispersion spectrometer, X-ray fluorescence apparatus and method
JP6305247B2 (ja) * 2014-06-13 2018-04-04 株式会社日立ハイテクサイエンス 蛍光x線分析装置
US9739730B2 (en) * 2015-03-03 2017-08-22 Panalytical B.V. Quantitative X-ray analysis—multi optical path instrument
CN105628720B (zh) * 2015-03-10 2019-01-25 深圳市禾苗分析仪器有限公司 连续衍射分光与探测装置及顺序式x射线荧光光谱仪
CN204556542U (zh) * 2015-04-24 2015-08-12 北京邦鑫伟业技术开发有限公司 一种用于x荧光光谱分析仪的热解石墨晶体分光器
WO2016193687A1 (en) * 2015-05-29 2016-12-08 University Of Leicester X-ray analysis device
RU2594646C1 (ru) * 2015-06-29 2016-08-20 Совместное предприятие в форме закрытого акционерного общества "Изготовление, внедрение, сервис" Автоматический рентгеновский анализатор пульп и растворов в потоке
CN204789414U (zh) * 2015-06-29 2015-11-18 中国建材检验认证集团股份有限公司 一种单波长射线激发的能量色散型x射线荧光仪
PL3322544T3 (pl) * 2015-07-16 2022-08-29 Sortera Technologies, Inc. Układ sortujący materiały
US10295486B2 (en) * 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
WO2017160705A1 (en) * 2016-03-14 2017-09-21 X-Ray Optical Systems, Inc. Sample handling apparatus for pressurized fluids and x-ray analyzer applications thereof
CA3034063A1 (en) * 2016-08-30 2018-03-08 Soreq Nuclear Research Center Method for marking and authenticating diamonds and precious stones
US10578566B2 (en) * 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
MX2020011106A (es) 2018-04-20 2021-01-29 Outotec Finland Oy Analizador de fluorescencia de rayos x y un metodo para realizar el analisis de fluorescencia de rayos x.
FI20206176A1 (en) * 2018-04-20 2020-11-20 Outotec Finland Oy X-ray fluorescence analyzer system and method for performing X-ray fluorescence analysis on an element of interest in a slurry
CN112292593A (zh) 2018-04-20 2021-01-29 奥图泰(芬兰)公司 X射线荧光分析仪和用于执行x射线荧光分析的方法
WO2019202199A1 (en) 2018-04-20 2019-10-24 Outotec (Finland) Oy X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing x-ray fluorescence analysis

Also Published As

Publication number Publication date
CA3097462A1 (en) 2019-10-24
AU2018419251B2 (en) 2022-02-17
DK202070770A1 (en) 2020-12-01
ZA202007018B (en) 2021-10-27
CA3097462C (en) 2023-09-05
FI20206177A1 (en) 2020-11-20
WO2019202197A1 (en) 2019-10-24
BR112020021461A2 (pt) 2021-01-19
MX2020011106A (es) 2021-01-29
US11815480B2 (en) 2023-11-14
AU2018419251A1 (en) 2020-12-03
AU2021107549A4 (en) 2022-01-06
SE544318C2 (en) 2022-04-05
DK181181B1 (en) 2023-03-28
US20210255121A1 (en) 2021-08-19
SE2051351A1 (en) 2020-11-19
CN112313505A (zh) 2021-02-02

Similar Documents

Publication Publication Date Title
EA202092311A1 (ru) Рентгеновский флуоресцентный анализатор и способ выполнения рентгеновского флуоресцентного анализа
EA202092310A1 (ru) Система рентгеновского флуоресцентного анализатора и способ выполнения флуоресцентного анализа представляющего интерес элемента в пульпе
EA202092348A1 (ru) Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа
KR100690457B1 (ko) X선 측정 및 검사용 복합체
TW201614226A (en) X-ray thin film inspection apparatus
MX2020011105A (es) Sistema analizador de fluorescencia de rayos-x y un metodo para ejecutar analisis de fluorescencia de rayos-x de un elemento de interes en suspension.
KR101281105B1 (ko) 수용액 내 존재하는 우라늄 농도의 정량방법
DE60213994D1 (de) Wellenlängen-dispersives röntgenfluoreszenz-system mit fokusierender anregungsoptik und einem fokusierenden monochromator zum auffangen
Fittschen et al. A new micro X‐ray fluorescence spectrometer for in vivo elemental analysis in plants
PE20150791A1 (es) Analizador de espectroscopia de plasma inducido por laser
Stevenson et al. Phase-contrast X-ray imaging with synchrotron radiation for materials science applications
JP2015524047A5 (ru)
RU2012136878A (ru) Усовершенствованный анализатор комбинационного рассеяния с высокими входной угловой апертурой, разрешением, пропусканием, квантовым эффективным и фоноподавлением
Mazuritskiy et al. Wave propagation of induced radiation in microcapillary holes of a glass microchannel plate
EP3748339A3 (en) Device for gas analysis using raman spectroscopy
Zeng et al. Enhanced remote filament-induced breakdown spectroscopy with spatio-temporally chirped pulses
Fuchs et al. Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources
US10012603B2 (en) Combined handheld XRF and OES systems and methods
Zhang et al. Using monochromatic light to measure attenuation length of liquid scintillator solvent LAB
Garmatina et al. Vacuum-free femtosecond fiber laser microplasma X-ray source for radiography
WO2018007469A3 (de) Verfahren zum untersuchen einer probe sowie vorrichtung zum ausführen eines solchen verfahrens
BR112023016119A2 (pt) Dispositivo para determinação da composição química de um produto metalúrgico líquido e método para determinação da composição química de um produto metalúrgico líquido
RU2367978C1 (ru) Способ калибровки сцинтилляционного тракта
RU109364U1 (ru) Устройство для получения рентгеновского излучения
Dzyuba et al. Optical efficiency and spectral resolution of the Grand, Grand-1500, and STE-1 spectrometers