EA202092348A1 - Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа - Google Patents
Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализаInfo
- Publication number
- EA202092348A1 EA202092348A1 EA202092348A EA202092348A EA202092348A1 EA 202092348 A1 EA202092348 A1 EA 202092348A1 EA 202092348 A EA202092348 A EA 202092348A EA 202092348 A EA202092348 A EA 202092348A EA 202092348 A1 EA202092348 A1 EA 202092348A1
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- Eurasian Patent Office
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- ray
- fluorescent
- ray tube
- processing unit
- diffractor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B03—SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS; MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLID MATERIALS OR FLUIDS; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS
- B03B—SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS
- B03B13/00—Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects
- B03B13/06—Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects using absorption or reflection of radioactive emanation
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B3/00—Extraction of metal compounds from ores or concentrates by wet processes
- C22B3/02—Apparatus therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/24—Earth materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
- G21K1/067—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators using surface reflection, e.g. grazing incidence mirrors, gratings
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/616—Specific applications or type of materials earth materials
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/635—Specific applications or type of materials fluids, granulates
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/067—Construction details
Landscapes
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- High Energy & Nuclear Physics (AREA)
- General Engineering & Computer Science (AREA)
- Geology (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Remote Sensing (AREA)
- Molecular Biology (AREA)
- Geochemistry & Mineralogy (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
Рентгеновский флуоресцентный анализатор содержит рентгеновскую трубку (402) для испускания падающего рентгеновского излучения (206) в направлении первой оптической оси (204). Блок (201) обработки пульпы выполнен с возможностью поддержания постоянного расстояния между пробой (202) пульпы и указанной рентгеновской трубкой. Первый кристаллический дифрактор (601) расположен в первом направлении от указанного блока (201) обработки пульпы и выполнен с возможностью выделения заданного первого диапазона длин волн от флуоресцентного рентгеновского излучения (207), которое распространяется в указанном первом направлении. Он выполнен с возможностью направления флуоресцентного рентгеновского излучения в выделенном заданном первом диапазоне длин волн на первый детектор (602, 505) излучения. Номинальная входная мощность указанной рентгеновской трубки (402) составляет по меньшей мере 400 Вт. Первый кристаллический дифрактор (601) содержит кристалл (603) пиролитического графита. Оптический путь между рентгеновской трубкой (402) и блоком (201) обработки пульпы является прямым без расположенного между ними дифрактора.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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PCT/FI2018/050281 WO2019202197A1 (en) | 2018-04-20 | 2018-04-20 | X-ray fluorescence analyser, and a method for performing x-ray fluorescence analysis |
Publications (1)
Publication Number | Publication Date |
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EA202092348A1 true EA202092348A1 (ru) | 2021-02-15 |
Family
ID=68239082
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
EA202092348A EA202092348A1 (ru) | 2018-04-20 | 2018-04-20 | Рентгеновский флуоресцентный анализатор и способ выполнения флуоресцентного анализа |
Country Status (12)
Country | Link |
---|---|
US (1) | US11815480B2 (ru) |
CN (1) | CN112313505A (ru) |
AU (2) | AU2018419251B2 (ru) |
BR (1) | BR112020021461A2 (ru) |
CA (1) | CA3097462C (ru) |
DK (1) | DK181181B1 (ru) |
EA (1) | EA202092348A1 (ru) |
FI (1) | FI20206177A1 (ru) |
MX (1) | MX2020011106A (ru) |
SE (1) | SE544318C2 (ru) |
WO (1) | WO2019202197A1 (ru) |
ZA (1) | ZA202007018B (ru) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FI20206176A1 (en) | 2018-04-20 | 2020-11-20 | Outotec Finland Oy | X-ray fluorescence analyzer system and method for performing X-ray fluorescence analysis on an element of interest in a slurry |
MX2020011106A (es) | 2018-04-20 | 2021-01-29 | Outotec Finland Oy | Analizador de fluorescencia de rayos x y un metodo para realizar el analisis de fluorescencia de rayos x. |
US11885755B2 (en) * | 2022-05-02 | 2024-01-30 | Sigray, Inc. | X-ray sequential array wavelength dispersive spectrometer |
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2018
- 2018-04-20 MX MX2020011106A patent/MX2020011106A/es unknown
- 2018-04-20 FI FI20206177A patent/FI20206177A1/en unknown
- 2018-04-20 WO PCT/FI2018/050281 patent/WO2019202197A1/en active Application Filing
- 2018-04-20 EA EA202092348A patent/EA202092348A1/ru unknown
- 2018-04-20 AU AU2018419251A patent/AU2018419251B2/en active Active
- 2018-04-20 CA CA3097462A patent/CA3097462C/en active Active
- 2018-04-20 US US17/049,256 patent/US11815480B2/en active Active
- 2018-04-20 CN CN201880094862.1A patent/CN112313505A/zh active Pending
- 2018-04-20 BR BR112020021461-2A patent/BR112020021461A2/pt unknown
- 2018-04-20 SE SE2051351A patent/SE544318C2/en unknown
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2020
- 2020-11-11 ZA ZA2020/07018A patent/ZA202007018B/en unknown
- 2020-11-19 DK DKPA202070770A patent/DK181181B1/en active IP Right Grant
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2021
- 2021-09-13 AU AU2021107549A patent/AU2021107549A4/en active Active
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CA3097462A1 (en) | 2019-10-24 |
AU2018419251B2 (en) | 2022-02-17 |
DK202070770A1 (en) | 2020-12-01 |
ZA202007018B (en) | 2021-10-27 |
CA3097462C (en) | 2023-09-05 |
FI20206177A1 (en) | 2020-11-20 |
WO2019202197A1 (en) | 2019-10-24 |
BR112020021461A2 (pt) | 2021-01-19 |
MX2020011106A (es) | 2021-01-29 |
US11815480B2 (en) | 2023-11-14 |
AU2018419251A1 (en) | 2020-12-03 |
AU2021107549A4 (en) | 2022-01-06 |
SE544318C2 (en) | 2022-04-05 |
DK181181B1 (en) | 2023-03-28 |
US20210255121A1 (en) | 2021-08-19 |
SE2051351A1 (en) | 2020-11-19 |
CN112313505A (zh) | 2021-02-02 |
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