AUPQ893700A0 - On-line x-ray diffraction analyser - Google Patents

On-line x-ray diffraction analyser

Info

Publication number
AUPQ893700A0
AUPQ893700A0 AUPQ8937A AUPQ893700A AUPQ893700A0 AU PQ893700 A0 AUPQ893700 A0 AU PQ893700A0 AU PQ8937 A AUPQ8937 A AU PQ8937A AU PQ893700 A AUPQ893700 A AU PQ893700A AU PQ893700 A0 AUPQ893700 A0 AU PQ893700A0
Authority
AU
Australia
Prior art keywords
line
ray diffraction
diffraction analyser
analyser
ray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AUPQ8937A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Commonwealth Scientific and Industrial Research Organization CSIRO
Original Assignee
CSIRO MINERALS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by CSIRO MINERALS filed Critical CSIRO MINERALS
Priority to AUPQ8937A priority Critical patent/AUPQ893700A0/en
Publication of AUPQ893700A0 publication Critical patent/AUPQ893700A0/en
Priority to PCT/AU2001/000901 priority patent/WO2002008738A1/en
Priority to AU2001276157A priority patent/AU2001276157A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
AUPQ8937A 2000-07-24 2000-07-24 On-line x-ray diffraction analyser Abandoned AUPQ893700A0 (en)

Priority Applications (3)

Application Number Priority Date Filing Date Title
AUPQ8937A AUPQ893700A0 (en) 2000-07-24 2000-07-24 On-line x-ray diffraction analyser
PCT/AU2001/000901 WO2002008738A1 (en) 2000-07-24 2001-07-24 On-line x-ray diffraction analyser
AU2001276157A AU2001276157A1 (en) 2000-07-24 2001-07-24 On-line x-ray diffraction analyser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AUPQ8937A AUPQ893700A0 (en) 2000-07-24 2000-07-24 On-line x-ray diffraction analyser

Publications (1)

Publication Number Publication Date
AUPQ893700A0 true AUPQ893700A0 (en) 2000-08-17

Family

ID=3822998

Family Applications (1)

Application Number Title Priority Date Filing Date
AUPQ8937A Abandoned AUPQ893700A0 (en) 2000-07-24 2000-07-24 On-line x-ray diffraction analyser

Country Status (2)

Country Link
AU (1) AUPQ893700A0 (en)
WO (1) WO2002008738A1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
MX2020011106A (en) * 2018-04-20 2021-01-29 Outotec Finland Oy X-ray fluorescence analyser, and a method for performing x-ray fluorescence analysis.

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI80524C (en) * 1986-06-02 1990-06-11 Outokumpu Oy FOERFARANDE OCH ANORDNING FOER ANALYZING AV SLAMARTADE MATERIAL.
GB9122085D0 (en) * 1991-10-17 1991-11-27 Cambridge Surface Analytics X-ray diffractometer
FR2741155B1 (en) * 1995-11-15 1997-12-05 Commissariat Energie Atomique APPARATUS FOR ANALYZING A FLUORESCENCE X SOLUTION
US5724401A (en) * 1996-01-24 1998-03-03 The Penn State Research Foundation Large angle solid state position sensitive x-ray detector system
US5982847A (en) * 1996-10-28 1999-11-09 Utah State University Compact X-ray fluorescence spectrometer for real-time wear metal analysis of lubrucating oils
US5923720A (en) * 1997-06-17 1999-07-13 Molecular Metrology, Inc. Angle dispersive x-ray spectrometer

Also Published As

Publication number Publication date
WO2002008738A1 (en) 2002-01-31

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Legal Events

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