EA202092311A1 - Рентгеновский флуоресцентный анализатор и способ выполнения рентгеновского флуоресцентного анализа - Google Patents

Рентгеновский флуоресцентный анализатор и способ выполнения рентгеновского флуоресцентного анализа

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Publication number
EA202092311A1
EA202092311A1 EA202092311A EA202092311A EA202092311A1 EA 202092311 A1 EA202092311 A1 EA 202092311A1 EA 202092311 A EA202092311 A EA 202092311A EA 202092311 A EA202092311 A EA 202092311A EA 202092311 A1 EA202092311 A1 EA 202092311A1
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EA
Eurasian Patent Office
Prior art keywords
ray
radiation
ray fluorescent
crystal
detector
Prior art date
Application number
EA202092311A
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English (en)
Inventor
Томми Коскинен
Антти Пелли
Хейкки Сипиля
Original Assignee
Оутотек (Финлэнд) Ой
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Publication date
Application filed by Оутотек (Финлэнд) Ой filed Critical Оутотек (Финлэнд) Ой
Publication of EA202092311A1 publication Critical patent/EA202092311A1/ru

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/24—Earth materials
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/616—Specific applications or type of materials earth materials
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/064—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements having a curved surface
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/067—Construction details

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  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geology (AREA)
  • Remote Sensing (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

Рентгеновский флуоресцентный анализатор содержит рентгеновскую трубку (402) для испускания падающего рентгеновского излучения (206) в направлении первой оптической оси (204). Блок (201) обработки пульпы выполнен с возможностью поддержания постоянного расстояния между пробой (202) пульпы и указанной рентгеновской трубкой. Первый кристаллический дифрактор (601) расположен в первом направлении от указанного блока (201) обработки пульпы и выполнен с возможностью выделения заданного первого диапазона длин волн из флуоресцентного рентгеновского излучения (207), которое распространяется в указанном первом направлении. Первый кристаллический дифрактор выполнен с возможностью направления флуоресцентного рентгеновского излучения в выделенном заданном первом диапазоне длин волн на первый детектор (602, 1505) излучения. Первый кристаллический дифрактор (601) содержит кристалл (603, 802, 804) пиролитического графита, имеющий дифракционную поверхность (801, 803, 805), которая является односвязной поверхностью. Указанный первый детектор (602) излучения представляет собой твердотельный полупроводниковый детектор.
EA202092311A 2018-04-20 2018-04-20 Рентгеновский флуоресцентный анализатор и способ выполнения рентгеновского флуоресцентного анализа EA202092311A1 (ru)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/FI2018/050282 WO2019202198A1 (en) 2018-04-20 2018-04-20 X-ray fluorescence analyzer, and a method for performing x-ray fluorescence analysis

Publications (1)

Publication Number Publication Date
EA202092311A1 true EA202092311A1 (ru) 2021-03-09

Family

ID=68239072

Family Applications (1)

Application Number Title Priority Date Filing Date
EA202092311A EA202092311A1 (ru) 2018-04-20 2018-04-20 Рентгеновский флуоресцентный анализатор и способ выполнения рентгеновского флуоресцентного анализа

Country Status (12)

Country Link
US (1) US11360036B2 (ru)
CN (1) CN112292593A (ru)
AU (2) AU2018419252B2 (ru)
BR (1) BR112020021448B1 (ru)
CA (1) CA3097466A1 (ru)
DK (1) DK181581B1 (ru)
EA (1) EA202092311A1 (ru)
FI (1) FI20206178A1 (ru)
MX (1) MX2020011022A (ru)
SE (1) SE545836C2 (ru)
WO (1) WO2019202198A1 (ru)
ZA (1) ZA202007013B (ru)

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US11815480B2 (en) 2018-04-20 2023-11-14 Outotec (Finland) Oy X-ray fluorescence analyzer and a method for performing an x-ray fluorescence analysis
AU2019322935B2 (en) * 2018-08-17 2022-03-10 MicroTrace Pty. Ltd. Apparatus for the measurement of mineral slurries
KR20210076942A (ko) * 2018-10-18 2021-06-24 시큐리티 매터스 엘티디. 물질 내의 이물의 검출 및 식별을 위한 시스템 및 방법
JP7380421B2 (ja) * 2020-05-27 2023-11-15 株式会社島津製作所 Ｘ線分析装置およびｘ線分析方法
US11992350B2 (en) 2022-03-15 2024-05-28 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
US11885755B2 (en) * 2022-05-02 2024-01-30 Sigray, Inc. X-ray sequential array wavelength dispersive spectrometer

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DE137533C (ru)
US3198944A (en) 1961-11-06 1965-08-03 Gen Electric X-ray emission analyzer with standardizing system and novel switch means
NL289708A (ru) 1962-03-05
US3354308A (en) * 1965-04-30 1967-11-21 Philips Electronic Pharma Apparatus with means to measure the characteristic X-ray emission from and the density of a material
DD137533B1 (de) * 1978-07-21 1981-05-27 Gottfried Krueger Anordnung zur kontinuierlichen bestimmung des metallinhaltes in suspensionen
JP3085070B2 (ja) 1993-12-27 2000-09-04 松下電器産業株式会社 Ｘ線照射装置
GB0027429D0 (en) * 2000-11-09 2000-12-27 Oxford Instr Analytical Ltd Apparatus for analysing a sample
WO2003049510A2 (en) 2001-12-04 2003-06-12 X-Ray Optical Systems, Inc. X-ray source assembly having enhanced output stability, and fluid stream analysis applications thereof
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WO2013130525A1 (en) * 2012-02-28 2013-09-06 X-Ray Optical Systems, Inc. X-ray analyzer having multiple excitation energy bands produced using multi-material x-ray tube anodes and monochromating optics
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RU137951U1 (ru) * 2013-06-18 2014-02-27 Российская Федерация, от имени которой выступает Федеральное государственное казенное учреждение "Войсковая часть 68240" Устройство для рентгеновского микроанализа
JP6305247B2 (ja) * 2014-06-13 2018-04-04 株式会社日立ハイテクサイエンス 蛍光ｘ線分析装置
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RU2594646C1 (ru) * 2015-06-29 2016-08-20 Совместное предприятие в форме закрытого акционерного общества "Изготовление, внедрение, сервис" Автоматический рентгеновский анализатор пульп и растворов в потоке
RU185791U1 (ru) * 2016-02-15 2018-12-19 Оутотек (Финлэнд) Ой Устройство для анализа образца технологического потока гидросмеси

Also Published As

Publication number Publication date
FI20206178A1 (en) 2020-11-20
US11360036B2 (en) 2022-06-14
CN112292593A (zh) 2021-01-29
DK202070772A1 (en) 2020-12-01
BR112020021448A2 (pt) 2021-01-19
DK181581B1 (en) 2024-06-07
MX2020011022A (es) 2021-01-29
SE545836C2 (en) 2024-02-20
AU2018419252B2 (en) 2022-02-24
BR112020021448B1 (pt) 2023-12-26
SE2051301A1 (en) 2020-11-09
WO2019202198A1 (en) 2019-10-24
AU2021107550A4 (en) 2022-01-06
US20210255123A1 (en) 2021-08-19
CA3097466A1 (en) 2019-10-24
ZA202007013B (en) 2021-10-27
AU2018419252A1 (en) 2020-12-03

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