PE20150791A1 - Analizador de espectroscopia de plasma inducido por laser - Google Patents

Analizador de espectroscopia de plasma inducido por laser

Info

Publication number
PE20150791A1
PE20150791A1 PE2013000768A PE2013000768A PE20150791A1 PE 20150791 A1 PE20150791 A1 PE 20150791A1 PE 2013000768 A PE2013000768 A PE 2013000768A PE 2013000768 A PE2013000768 A PE 2013000768A PE 20150791 A1 PE20150791 A1 PE 20150791A1
Authority
PE
Peru
Prior art keywords
laser
sample
optical path
induced plasma
laser beam
Prior art date
Application number
PE2013000768A
Other languages
English (en)
Inventor
Michael Rutberg
Paolo Moreschini
Original Assignee
Tech Resources Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tech Resources Pty Ltd filed Critical Tech Resources Pty Ltd
Publication of PE20150791A1 publication Critical patent/PE20150791A1/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0237—Adjustable, e.g. focussing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0638—Refractive parts

Abstract

Un analizador de espectroscopia de plasma inducido por laser (LIBS) comprende una trayectoria optica P (mostrada por la linea de rayas P1 y la linea de rayas- puntos P2) y un sistema de enfoque (o seguimiento) automatico. La trayectoria optica P enfoca un rayo laser emitido desde un laser sobre una porcion de una muestra S que va a ser analizada por el analizador, y enfoca la radiacion emitida por la muestra S cuando es irradiada por el rayo laser a un detector. El sistema de enfoque automatico es capaz de variar una longitud de la trayectoria optica P para mantener una relacion espacial constante (es decir, una distancia) entre un punto de enfoque del rayo laser y la muestra S; asi como mantener un campo de vision instantaneo constante (IFOV) del detector sobre el punto focal del laser
PE2013000768A 2010-10-01 2013-04-19 Analizador de espectroscopia de plasma inducido por laser PE20150791A1 (es)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US38872210P 2010-10-01 2010-10-01

Publications (1)

Publication Number Publication Date
PE20150791A1 true PE20150791A1 (es) 2015-06-19

Family

ID=45891714

Family Applications (1)

Application Number Title Priority Date Filing Date
PE2013000768A PE20150791A1 (es) 2010-10-01 2013-04-19 Analizador de espectroscopia de plasma inducido por laser

Country Status (12)

Country Link
US (1) US20130271761A1 (es)
CN (1) CN103210303A (es)
AP (1) AP2013006832A0 (es)
AU (1) AU2011308072B2 (es)
BR (1) BR112013007877A2 (es)
CA (1) CA2813032C (es)
CL (2) CL2013000883A1 (es)
EA (1) EA201390408A1 (es)
PE (1) PE20150791A1 (es)
PL (1) PL404561A1 (es)
WO (1) WO2012040769A1 (es)
ZA (1) ZA201302942B (es)

Families Citing this family (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103091289B (zh) * 2012-12-21 2014-12-03 吉林大学 基于激光诱导击穿光谱分析技术的自动化实验平台
WO2014113824A2 (en) * 2013-01-21 2014-07-24 Sciaps, Inc. Handheld libs spectrometer
US9435742B2 (en) 2013-01-21 2016-09-06 Sciaps, Inc. Automated plasma cleaning system
US9243956B2 (en) 2013-01-21 2016-01-26 Sciaps, Inc. Automated multiple location sampling analysis system
US9952100B2 (en) 2013-01-21 2018-04-24 Sciaps, Inc. Handheld LIBS spectrometer
US9267842B2 (en) * 2013-01-21 2016-02-23 Sciaps, Inc. Automated focusing, cleaning, and multiple location sampling spectrometer system
US11248961B2 (en) * 2013-03-15 2022-02-15 Mat International Holdings, Llc Methods and systems for analyzing samples
CN103278480B (zh) * 2013-04-26 2015-01-28 中国科学院安徽光学精密机械研究所 基于激光诱导击穿光谱手持式固体废弃物重金属探测探头
CZ304598B6 (cs) * 2013-10-03 2014-07-23 Vysoké Učení Technické V Brně Modulární zařízení pro dálkovou chemickou materiálovou analýzu
CN103816976A (zh) * 2014-02-27 2014-05-28 王宏 激光诱导击穿光谱矿石智能分选方法及设备
WO2015200111A1 (en) * 2014-06-23 2015-12-30 Tsi, Inc. Rapid material analysis using libs spectroscopy
FR3031568B1 (fr) * 2015-01-12 2018-11-16 Xyzed Source de lumiere a diodes pour projecteur
US9651424B2 (en) 2015-02-26 2017-05-16 Sciaps, Inc. LIBS analyzer sample presence detection system and method
US9664565B2 (en) 2015-02-26 2017-05-30 Sciaps, Inc. LIBS analyzer sample presence detection system and method
FI20155547A (fi) * 2015-07-10 2017-01-11 Outotec Finland Oy Transparentti suojaava seinäelin käytettäväksi menetelmässä tai laitteessa fluidien laseravusteista optista säteilyspektroskooppia varten
CN105115944B (zh) * 2015-09-07 2017-12-29 北京科技大学 一种用于libs物质成分检测的自动聚焦方法及系统
US10209196B2 (en) 2015-10-05 2019-02-19 Sciaps, Inc. LIBS analysis system and method for liquids
US9939383B2 (en) 2016-02-05 2018-04-10 Sciaps, Inc. Analyzer alignment, sample detection, localization, and focusing method and system
WO2017168211A1 (en) 2016-03-31 2017-10-05 Foss Analytical A/S System for and method of performing laser induced breakdown spectroscopy
CN105784682B (zh) * 2016-05-10 2019-02-15 中国科学院光电研究院 一种激光诱导击穿光谱检测装置及检测方法
CN106338499A (zh) * 2016-08-31 2017-01-18 徐金杰 元素激光检测分析仪器及矿物元素分析方法
CN116047707A (zh) * 2016-10-09 2023-05-02 睿励科学仪器（上海）有限公司 非垂直自动聚焦系统以及相应的光学仪器
CN106442471A (zh) * 2016-10-28 2017-02-22 段忆翔 一种基于libs技术的远程测量装置
CN106568761A (zh) * 2016-10-28 2017-04-19 段忆翔 一种远程libs探头测量装置
US20180156717A1 (en) * 2016-12-05 2018-06-07 Bill & Melinda Gates Foundation Multi-test assay systems and methods of using the same
JP2019060831A (ja) * 2017-09-28 2019-04-18 株式会社島津製作所 レーザ誘起分析装置、および、レーザ誘起分析方法
WO2019219159A1 (de) 2018-05-14 2019-11-21 Trumpf Lasersystems For Semiconductor Manufacturing Gmbh Fokussiereinrichtung und euv-strahlungserzeugungsvorrichtung damit
CN108844926B (zh) * 2018-06-12 2020-10-16 中国科学院上海技术物理研究所 磁光光致发光光调制反射和光调制透射光谱联合测试系统
EP3650842B1 (en) 2018-11-12 2023-03-08 Hitachi High-Tech Analytical Science Finland Oy A light collection arrangement for optical emission spectroscopy
CN109632854B (zh) * 2019-01-14 2022-10-11 东华理工大学 一种双探测结构的块状铀矿多元素在线x荧光分析仪
DE102019109052A1 (de) * 2019-04-05 2020-10-08 Rwe Power Ag Vorrichtung und Verfahren zum Ermitteln einer Elementzusammensetzung eines Bodens
PL3973275T3 (pl) * 2019-05-23 2024-02-26 Foss Analytical A/S System libs z automatycznym ogniskowaniem
JP7368508B2 (ja) * 2019-05-31 2023-10-24 ディーティーイー イーエイチエフ 液体金属及び合金の定量的分析のための非浸漬的な方法及び装置
AU2021103159A4 (en) 2020-09-22 2021-07-22 Foss Analytical A/S Preparing a pellet for laser induced breakdown spectroscopy
CN112304898B (zh) * 2020-10-23 2023-03-24 西安智光物联科技有限公司 一种车载前置式激光气体检测仪
CN112496860B (zh) * 2020-11-27 2022-12-06 广东佩斯智能装备有限公司 一种车削刀具寿命实时监测方法
CN112964695B (zh) * 2021-02-05 2022-08-23 江苏奥文仪器科技有限公司 一种可自动对焦、多激光光源的激光诱导光谱仪及工作方法
CN114486772A (zh) * 2021-12-29 2022-05-13 中国烟草总公司郑州烟草研究院 卷烟产品的重金属检测设备及检测方法
CN114636688B (zh) * 2022-05-18 2022-08-12 合肥金星智控科技股份有限公司 模型校正方法、光谱设备、计算机设备和存储介质

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3983707A (en) * 1975-03-05 1976-10-05 Georgy Mikhailovich Lezgintsev Method and apparatus for moving an object on the bottom of a body of water
DE3718672A1 (de) * 1987-06-04 1988-12-15 Metallgesellschaft Ag Verfahren zur analyse von metallteilchen
JP2870364B2 (ja) * 1993-06-29 1999-03-17 日本鋼管株式会社 レーザー気化分析方法及び装置
JPH09113449A (ja) * 1995-10-17 1997-05-02 Nkk Corp レーザ気化分析装置
US6545240B2 (en) * 1996-02-16 2003-04-08 Huron Valley Steel Corporation Metal scrap sorting system
US6762835B2 (en) * 2002-03-18 2004-07-13 Mississippi State University Fiber optic laser-induced breakdown spectroscopy sensor for molten material analysis
JP4785480B2 (ja) * 2005-09-22 2011-10-05 三鷹光器株式会社 光学計測システム
US7663749B2 (en) * 2007-10-04 2010-02-16 Institut National D'optique Method and system to measure the concentration of constituent elements in an inhomogeneous material using LIBS
CN101187634A (zh) * 2007-11-28 2008-05-28 太原市海通自动化技术有限公司 皮带式激光感生光谱煤质分析仪
US8199321B2 (en) * 2008-05-05 2012-06-12 Applied Spectra, Inc. Laser ablation apparatus and method
CN201575971U (zh) * 2009-12-23 2010-09-08 中国科学院沈阳自动化研究所 一种用于熔融金属的激光诱导击穿光谱装置

Also Published As

Publication number Publication date
EA201390408A1 (ru) 2013-10-30
PL404561A1 (pl) 2014-03-17
AU2011308072B2 (en) 2015-01-22
AU2011308072A1 (en) 2013-05-02
CL2015002828A1 (es) 2016-10-07
US20130271761A1 (en) 2013-10-17
CA2813032C (en) 2019-05-07
CA2813032A1 (en) 2012-04-05
WO2012040769A1 (en) 2012-04-05
CL2013000883A1 (es) 2013-10-18
ZA201302942B (en) 2014-06-25
BR112013007877A2 (pt) 2016-06-14
AP2013006832A0 (en) 2013-04-30
CN103210303A (zh) 2013-07-17

Similar Documents

Publication Publication Date Title
PE20150791A1 (es) Analizador de espectroscopia de plasma inducido por laser
ES2597456T3 (es) Espectrómetro infrarrojo
WO2016010954A3 (en) System for and method of processing transparent materials using laser beam focal lines adjustable in length and diameter
ATE545858T1 (de) Röntgenstrahlvorrichtung
SG152162A1 (en) An optical focus sensor, an inspection apparatus and a lithographic apparatus
WO2012008836A3 (en) Inspection apparatus and replaceable door for a vacuum chamber of such an inspection apparatus and a method for operating an inspection apparatus
WO2014113824A8 (en) Handheld libs spectrometer
JP2010161092A5 (es)
BR112015026028A2 (pt) dispositivo de inspeção de porção de soldagem e método de inspeção para o mesmo, com porção de extração para extrair luminescência de evaporação e radiação térmica
WO2009003714A3 (de) Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina
ATE554416T1 (de) Kalibriervorrichtung und laser-scanning-mikroskop mit einer derartigen kalibriervorrichtung
EP2058688A3 (en) Beam-adjusting optics
GB201213789D0 (en) An X-ray fluorescence analyser
JP2015152405A5 (es)
EP2524260A4 (en) ULTRA DARK FIELD MICROSCOPE
WO2017060385A9 (en) Fluorescence microscope instrument comprising an actively switched beam path separator
JP2014083169A5 (es)
CL2017001752A1 (es) Sistema y método de detección de radiación incidente sobre un receptor solar
WO2014023498A3 (de) Messsystem zur bestimmung von reflexionscharakteristiken von solarspiegelmaterialien und verfahren zur qualitätsbestimmung einer spiegelmaterialprobe
ES2612125T3 (es) Optica láser con seguimiento de costura pasivo
WO2016117796A3 (ko) 광주파수 및 강도 변조 레이저 흡수 분광 장치 및 광주파수 및 강도 변조 레이저 흡수 분광 방법
GB201120579D0 (en) A spectrographic device
TW200834033A (en) A thickness measuring system with astigmatic method for transparent and semi-transparent objects
IN2012DE00519A (es)
GB2517866A (en) Confocal measurement device utilizing elliptical mirror based illumination

Legal Events

Date Code Title Description
FC Refusal