WO2014023498A3 - Messsystem zur bestimmung von reflexionscharakteristiken von solarspiegelmaterialien und verfahren zur qualitätsbestimmung einer spiegelmaterialprobe - Google Patents

Messsystem zur bestimmung von reflexionscharakteristiken von solarspiegelmaterialien und verfahren zur qualitätsbestimmung einer spiegelmaterialprobe Download PDF

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Publication number
WO2014023498A3
WO2014023498A3 PCT/EP2013/064366 EP2013064366W WO2014023498A3 WO 2014023498 A3 WO2014023498 A3 WO 2014023498A3 EP 2013064366 W EP2013064366 W EP 2013064366W WO 2014023498 A3 WO2014023498 A3 WO 2014023498A3
Authority
WO
WIPO (PCT)
Prior art keywords
mirror
material sample
focal point
cap
measuring system
Prior art date
Application number
PCT/EP2013/064366
Other languages
English (en)
French (fr)
Other versions
WO2014023498A2 (de
Inventor
Stephanie Meyen
Peter Heller
Martin Hagmann
Original Assignee
Deutsches Zentrum für Luft- und Raumfahrt e.V.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Deutsches Zentrum für Luft- und Raumfahrt e.V. filed Critical Deutsches Zentrum für Luft- und Raumfahrt e.V.
Publication of WO2014023498A2 publication Critical patent/WO2014023498A2/de
Publication of WO2014023498A3 publication Critical patent/WO2014023498A3/de

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/005—Testing of reflective surfaces, e.g. mirrors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4752—Geometry
    • G01N2021/4761—Mirror arrangements, e.g. in IR range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N2021/4776—Miscellaneous in diffuse reflection devices
    • G01N2021/4783—Examining under varying incidence; Angularly adjustable head
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/555—Measuring total reflection power, i.e. scattering and specular
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N2021/556—Measuring separately scattering and specular
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors
    • G01N2201/0637—Elliptic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/064—Stray light conditioning
    • G01N2201/0646—Light seals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

Ein Messsystem (1), das insbesondere zur Bestimmung von Reflexionscharakteristiken von Solarspiegelmaterialien geeignet ist, weist einen Spiegelhalter (17) zur Aufnahme einer Spiegelmaterialprobe (19), einen Strahlungsdetektor (23) mit Bildsensor (25) und einer Empfangsoptik (27) zur Aufnahme von von der Spiegelmaterialprobe (19) reflektiertem Licht, eine Haube (3), die einen Innenraum (5) und die eine verspiegelte Innenfläche (7) aufweist, auf, wobei die verspiegelte Innenfläche (7) semi-ellipsoid-förmig ausgebildet ist und einen ersten Brennpunkt (11) und einen zweiten Brennpunkt (13) aufweist, wobei der erste und der zweite Brennpunkt (11, 13) in dem Innenraum (5) der Haube (3) angeordnet sind, wobei die Spiegelmaterialprobe (19) über den Spiegelhalter (17) in dem ersten Brennpunkt (11) anordenbar ist und die Empfangsoptik (27) des Strahlungsdetektors (23) in dem zweiten Brennpunkt (13) angeordnet ist, mit einer Lichtquelle (35) und einem mit der Lichtquelle (35) verbundenen Strahlungseinkoppler (39) zur Erzeugung eines auf die Spiegelmaterialprobe (19) gerichteten Lichtstrahls (31), wobei der Strahlungseinkoppler (39) an einer Führungsvorrichtung (43) zur Führung des Strahlungseinkopplers (39) entlang einer vorgegebenen Führungsbahn (45) angeordnet ist, und wobei die Haube (3) mindestens eine Aussparung (29) oder mindestens einen transparenten Bereich aufweist, über den der Lichtstrahl (31) in den Innenraum (5) der Haube (3) einleitbar ist.
PCT/EP2013/064366 2012-08-07 2013-07-08 Messsystem zur bestimmung von reflexionscharakteristiken von solarspiegelmaterialien und verfahren zur qualitätsbestimmung einer spiegelmaterialprobe WO2014023498A2 (de)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE102012214019.0 2012-08-07
DE201210214019 DE102012214019B3 (de) 2012-08-07 2012-08-07 Messsystem zur Bestimmung von Reflexionscharakteristiken von Solarspiegelmaterialien und Verfahren zur Qualitätsbestimmung einer Spiegelmaterialprobe
US201261711896P 2012-10-10 2012-10-10
US61/711,896 2012-10-10

Publications (2)

Publication Number Publication Date
WO2014023498A2 WO2014023498A2 (de) 2014-02-13
WO2014023498A3 true WO2014023498A3 (de) 2014-04-10

Family

ID=49384694

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2013/064366 WO2014023498A2 (de) 2012-08-07 2013-07-08 Messsystem zur bestimmung von reflexionscharakteristiken von solarspiegelmaterialien und verfahren zur qualitätsbestimmung einer spiegelmaterialprobe

Country Status (2)

Country Link
DE (1) DE102012214019B3 (de)
WO (1) WO2014023498A2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3263233A1 (de) * 2016-06-28 2018-01-03 Buhler Sortex Ltd. Beleuchtungsvorrichtungen
FR3073943B1 (fr) * 2017-11-22 2020-05-29 Commissariat A L'energie Atomique Et Aux Energies Alternatives Systeme de surveillance de la degradation et de l'encrassement d'un miroir
CN114354544A (zh) * 2021-12-03 2022-04-15 河南师范大学 一种半透明材料双向散射分布函数测量装置及方法
CN114166748B (zh) * 2021-12-03 2024-01-02 渤海大学 一种基于积分球反射法的半球发射率测量装置
CN117169273B (zh) * 2023-09-07 2024-04-26 华南理工大学 一种基于反射法测量材料常温方向发射率的装置及方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4988205A (en) * 1987-10-09 1991-01-29 The United States Of America As Represented By The Secretary Of The Navy Reflectometers
JP2000321205A (ja) * 1999-05-14 2000-11-24 Japan Science & Technology Corp 反射スペクトル測定方法及びその装置
DE102005056106A1 (de) * 2005-11-23 2007-05-24 Spheron Vr Ag Zweirichtungsreflektanzverteilungsmessgerät
DE102010008738A1 (de) * 2010-02-20 2011-08-25 Deutsches Zentrum für Luft- und Raumfahrt e.V., 51147 Vorrichtung und Verfahren zur Bestimmung von Reflexionseigenschaften eines Reflektors

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4763134B2 (ja) * 1998-12-21 2011-08-31 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ スキャッタメータ

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4988205A (en) * 1987-10-09 1991-01-29 The United States Of America As Represented By The Secretary Of The Navy Reflectometers
JP2000321205A (ja) * 1999-05-14 2000-11-24 Japan Science & Technology Corp 反射スペクトル測定方法及びその装置
DE102005056106A1 (de) * 2005-11-23 2007-05-24 Spheron Vr Ag Zweirichtungsreflektanzverteilungsmessgerät
DE102010008738A1 (de) * 2010-02-20 2011-08-25 Deutsches Zentrum für Luft- und Raumfahrt e.V., 51147 Vorrichtung und Verfahren zur Bestimmung von Reflexionseigenschaften eines Reflektors

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
E. KAWATE ET AL: "New Scatterometer for Spatial Distribution Measurements of Light Scattering from Materials", MEASUREMENT SCIENCE REVIEW, vol. 12, no. 2, 1 January 2012 (2012-01-01), XP055098093, ISSN: 1335-8871, DOI: 10.2478/v10048-012-0012-y *
WARD G J: "Measuring and Modeling Anisotropic Reflection", COMPUTER GRAPHICS, ACM, US, vol. 26, no. 2, 26 July 1992 (1992-07-26), pages 265 - 272, XP002255102, ISSN: 0097-8930, DOI: 10.1145/142920.134078 *

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WO2014023498A2 (de) 2014-02-13
DE102012214019B3 (de) 2013-11-07

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