WO2009003714A3 - Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina - Google Patents

Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina Download PDF

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Publication number
WO2009003714A3
WO2009003714A3 PCT/EP2008/005468 EP2008005468W WO2009003714A3 WO 2009003714 A3 WO2009003714 A3 WO 2009003714A3 EP 2008005468 W EP2008005468 W EP 2008005468W WO 2009003714 A3 WO2009003714 A3 WO 2009003714A3
Authority
WO
WIPO (PCT)
Prior art keywords
scattered light
sample
electromagnetic radiation
small volumes
measuring static
Prior art date
Application number
PCT/EP2008/005468
Other languages
English (en)
French (fr)
Other versions
WO2009003714A2 (de
Inventor
Christoph Janzen
Reinhard Noll
Walter Uhl
Kurt Hoffmann
Original Assignee
Fraunhofer Ges Forschung
Christoph Janzen
Reinhard Noll
Walter Uhl
Kurt Hoffmann
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fraunhofer Ges Forschung, Christoph Janzen, Reinhard Noll, Walter Uhl, Kurt Hoffmann filed Critical Fraunhofer Ges Forschung
Priority to US12/667,601 priority Critical patent/US20100315635A1/en
Priority to JP2010513791A priority patent/JP2010532468A/ja
Priority to EP08784613A priority patent/EP2165182A2/de
Publication of WO2009003714A2 publication Critical patent/WO2009003714A2/de
Publication of WO2009003714A3 publication Critical patent/WO2009003714A3/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/02—Objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G01N2021/4752—Geometry
    • G01N2021/4759—Annular illumination

Abstract

Die Erfindung betrifft eine Vorrichtung zur Durchführung von Streulichtmessungen, aufweisend mindestens ein Fokussierungselement, mit dem elektromagnetische Strahlung auf eine Probe fokussiert werden kann, einen Detektor, sowie eine Detektionsoptik, mit der von der Probe gestreute elektromagnetische Strahlung zu dem Detektor geleitet werden kann, dadurch gekennzeichnet, dass ein Mittel zur Bildung eines Ringstrahls vorhanden ist, dass durch das mindestens eine Fokussierungselement eine Fokussierung des Ringstrahls auf einen Fokuspunkt innerhalb der Probe bewirkbar ist und dass durch die Detektionsoptik von der Probe gestreute elektromagnetische Strahlung erfassbar ist, welche sich innerhalb des vom Ringstrahl umgebenen Raumes ausbreitet.
PCT/EP2008/005468 2007-07-05 2008-07-04 Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina WO2009003714A2 (de)

Priority Applications (3)

Application Number Priority Date Filing Date Title
US12/667,601 US20100315635A1 (en) 2007-07-05 2008-07-04 Device and method for measuring static and dynamic scattered light in small volumes
JP2010513791A JP2010532468A (ja) 2007-07-05 2008-07-04 低容積で静的錯乱光および動的錯乱光を測定するための装置および方法
EP08784613A EP2165182A2 (de) 2007-07-05 2008-07-04 Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007031244.1 2007-07-05
DE102007031244A DE102007031244B3 (de) 2007-07-05 2007-07-05 Vorrichtung und Verfahren zur Durchführung statischer und dynamischer Streulichtmessungen in kleinen Volumina

Publications (2)

Publication Number Publication Date
WO2009003714A2 WO2009003714A2 (de) 2009-01-08
WO2009003714A3 true WO2009003714A3 (de) 2009-03-19

Family

ID=40076266

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2008/005468 WO2009003714A2 (de) 2007-07-05 2008-07-04 Vorrichtung und verfahren zur durchführung statischer und dynamischer streulichtmessungen in kleinen volumina

Country Status (5)

Country Link
US (1) US20100315635A1 (de)
EP (1) EP2165182A2 (de)
JP (1) JP2010532468A (de)
DE (1) DE102007031244B3 (de)
WO (1) WO2009003714A2 (de)

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JP5911354B2 (ja) 2012-03-30 2016-04-27 オリンパス株式会社 倒立顕微鏡
US9419573B2 (en) 2014-06-27 2016-08-16 Nxp, B.V. Variable gain transimpedance amplifier
US9851200B2 (en) 2015-06-26 2017-12-26 Glasstech, Inc. Non-contact gaging system and method for contoured panels having specular surfaces
US9933251B2 (en) 2015-06-26 2018-04-03 Glasstech, Inc. Non-contact gaging system and method for contoured glass sheets
US9470641B1 (en) * 2015-06-26 2016-10-18 Glasstech, Inc. System and method for measuring reflected optical distortion in contoured glass sheets
US9952039B2 (en) 2015-06-26 2018-04-24 Glasstech, Inc. System and method for measuring reflected optical distortion in contoured panels having specular surfaces
US9841276B2 (en) 2015-06-26 2017-12-12 Glasstech, Inc. System and method for developing three-dimensional surface information corresponding to a contoured glass sheet
US9952037B2 (en) 2015-06-26 2018-04-24 Glasstech, Inc. System and method for developing three-dimensional surface information corresponding to a contoured sheet
SI3150988T1 (sl) 2015-10-01 2021-08-31 Nano Temper Technologies Gmbh Sistem in postopek za optično merjenje stabilnosti in agregacije delcev
EP3309536A1 (de) * 2016-10-11 2018-04-18 Malvern Panalytical Limited Partikelcharakterisierungsinstrument
CN113504203A (zh) * 2016-11-01 2021-10-15 韩国食品研究院 高分辨率太赫兹波聚光模块

Citations (4)

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DE593226C (de) * 1932-06-23 1934-02-28 Zeiss Carl Fa Dunkelfeldkondensor fuer Mikroskope
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DE3421577C2 (de) * 1984-06-09 1986-06-05 Harald Dr.-Ing. 6240 Königstein Krzyminski Gerät zur Reflexionsmessung an farbigen Objekten
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US20050117144A1 (en) * 2002-04-10 2005-06-02 Bryan Greenway Automated protein crystallization imaging
US20060207066A1 (en) * 2005-03-16 2006-09-21 The Regents Of The University Of California Robotic CCD microscope for enhanced crystal recognition
BE1017090A6 (de) * 2006-04-03 2008-02-05 Hoffmann Kurt Mario Victor Virtuelle reaktionsgef sse.

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Also Published As

Publication number Publication date
DE102007031244B3 (de) 2009-01-02
US20100315635A1 (en) 2010-12-16
WO2009003714A2 (de) 2009-01-08
JP2010532468A (ja) 2010-10-07
EP2165182A2 (de) 2010-03-24

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