WO2009050993A1 - 非接触膜厚測定方法及び装置 - Google Patents
非接触膜厚測定方法及び装置 Download PDFInfo
- Publication number
- WO2009050993A1 WO2009050993A1 PCT/JP2008/067297 JP2008067297W WO2009050993A1 WO 2009050993 A1 WO2009050993 A1 WO 2009050993A1 JP 2008067297 W JP2008067297 W JP 2008067297W WO 2009050993 A1 WO2009050993 A1 WO 2009050993A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- terahertz wave
- film thickness
- pump light
- thickness measurement
- lpu
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0666—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating using an exciting beam and a detection beam including surface acoustic waves [SAW]
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
光学系の調整が容易な非接触膜厚測定方法及び装置を提供することを目的とする。
ポンプ光Lpu が入射されてテラヘルツ波パルスLt
を発生するテラヘルツ波発生手段4は、ポンプ光Lpu
の内テラヘルツ波パルスの発生に使われないでテラヘルツ波発生手段4から出射される残りのポンプ光LApu
と同軸方向にテラヘルツ波パルスLt
を発生させる。そして、ポンプ光Lpu
の波長が可視域~近赤外域にあるので、ポンプ光Lpu
をガイド光としてテラヘルツ波パルス発生手段4から膜厚測定対象20までの光路及び膜厚測定対象20から検出手段7までの光路が容易に調整(入射光学系5、受光光学系6を容易にアライメント)され得る。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009538027A JPWO2009050993A1 (ja) | 2007-10-16 | 2008-09-25 | 非接触膜厚測定方法及び装置 |
EP08840347A EP2202481A1 (en) | 2007-10-16 | 2008-09-25 | Non-contact film thickness measurement method and device |
US12/669,927 US20100195092A1 (en) | 2007-10-16 | 2008-09-25 | Noncontact film thickness measurement method and device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007-269171 | 2007-10-16 | ||
JP2007269171 | 2007-10-16 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2009050993A1 true WO2009050993A1 (ja) | 2009-04-23 |
Family
ID=40567266
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2008/067297 WO2009050993A1 (ja) | 2007-10-16 | 2008-09-25 | 非接触膜厚測定方法及び装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US20100195092A1 (ja) |
EP (1) | EP2202481A1 (ja) |
JP (1) | JPWO2009050993A1 (ja) |
WO (1) | WO2009050993A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2538200A4 (en) * | 2010-02-26 | 2016-10-05 | Aisin Seiki | APPARATUS AND METHOD FOR INSPECTING COATING FILMS |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2887334B1 (fr) * | 2005-06-20 | 2007-08-24 | Centre Nat Rech Scient | Dispositif et procede de caracterisation de structure par effet de longueur d'onde dans un systeme photo-acoustique |
JP6078870B2 (ja) * | 2012-06-28 | 2017-02-15 | 株式会社Screenホールディングス | 検査装置および検査方法 |
JP2014081285A (ja) * | 2012-10-17 | 2014-05-08 | Aisin Seiki Co Ltd | 多層セラミックの膜厚測定方法 |
JP6091880B2 (ja) * | 2012-12-19 | 2017-03-08 | 株式会社アドバンテスト | 電磁波測定装置、測定方法、プログラム、記録媒体 |
JP6096725B2 (ja) * | 2014-09-09 | 2017-03-15 | アイシン精機株式会社 | 膜厚測定装置及び膜厚測定方法 |
US11060859B2 (en) | 2016-04-04 | 2021-07-13 | Tetechs Inc. | Methods and systems for thickness measurement of multi-layer structures |
CA3017393C (en) * | 2016-04-04 | 2020-07-21 | Tetechs Inc. | Methods and systems for thickness measurement of multilayer structures |
US10508985B2 (en) * | 2017-06-05 | 2019-12-17 | Northwestern University | Systems and methods for pump-probe spectroscopy |
US10323931B2 (en) | 2017-10-27 | 2019-06-18 | Ford Motor Company | Method and system for aligning a terahertz sensor system |
JP6955462B2 (ja) * | 2018-03-02 | 2021-10-27 | 浜松ホトニクス株式会社 | 光学計測装置及び光学計測方法 |
TWI781446B (zh) * | 2020-09-22 | 2022-10-21 | 萬潤科技股份有限公司 | 物件厚度量測裝置 |
TWI775152B (zh) * | 2020-09-22 | 2022-08-21 | 萬潤科技股份有限公司 | 物件厚度量測方法及裝置 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002303574A (ja) * | 2001-04-04 | 2002-10-18 | Tochigi Nikon Corp | テラヘルツ光装置及びこれの調整方法 |
JP2004028618A (ja) | 2002-06-21 | 2004-01-29 | Osaka Industrial Promotion Organization | 塗装膜測定方法及び装置 |
JP2004317573A (ja) * | 2003-04-11 | 2004-11-11 | Institute Of Physical & Chemical Research | テラヘルツ波透過用光学部品、テラヘルツ波光学系、テラヘルツ帯波処理装置および同方法 |
JP2005129732A (ja) * | 2003-10-23 | 2005-05-19 | Tochigi Nikon Corp | テラヘルツ光発生装置およびテラヘルツ光測定装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2003058212A1 (en) * | 2001-12-28 | 2003-07-17 | Nikon Corporation | Spectral measuring device |
JP4147487B2 (ja) * | 2004-04-28 | 2008-09-10 | 独立行政法人科学技術振興機構 | テラヘルツ電磁波を用いた物性測定装置 |
JP4445325B2 (ja) * | 2004-05-19 | 2010-04-07 | アイシン精機株式会社 | テラヘルツ波発生用半導体結晶、その結晶を用いたテラヘルツ波発生装置とその方法及びテラヘルツ波検出装置とその方法 |
JP2006091802A (ja) * | 2004-09-21 | 2006-04-06 | Semiconductor Res Found | テラヘルツ電磁波発生装置及び方法 |
JP5328319B2 (ja) * | 2008-01-29 | 2013-10-30 | キヤノン株式会社 | テラヘルツ波を用いた検査装置及び検査方法 |
US7919764B2 (en) * | 2008-05-06 | 2011-04-05 | The United States Of America As Represented By The Secretary Of The Army | Method and apparatus for enhanced terahertz radiation from high stacking fault density |
-
2008
- 2008-09-25 EP EP08840347A patent/EP2202481A1/en not_active Withdrawn
- 2008-09-25 JP JP2009538027A patent/JPWO2009050993A1/ja active Pending
- 2008-09-25 WO PCT/JP2008/067297 patent/WO2009050993A1/ja active Application Filing
- 2008-09-25 US US12/669,927 patent/US20100195092A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002303574A (ja) * | 2001-04-04 | 2002-10-18 | Tochigi Nikon Corp | テラヘルツ光装置及びこれの調整方法 |
JP2004028618A (ja) | 2002-06-21 | 2004-01-29 | Osaka Industrial Promotion Organization | 塗装膜測定方法及び装置 |
JP2004317573A (ja) * | 2003-04-11 | 2004-11-11 | Institute Of Physical & Chemical Research | テラヘルツ波透過用光学部品、テラヘルツ波光学系、テラヘルツ帯波処理装置および同方法 |
JP2005129732A (ja) * | 2003-10-23 | 2005-05-19 | Tochigi Nikon Corp | テラヘルツ光発生装置およびテラヘルツ光測定装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2538200A4 (en) * | 2010-02-26 | 2016-10-05 | Aisin Seiki | APPARATUS AND METHOD FOR INSPECTING COATING FILMS |
Also Published As
Publication number | Publication date |
---|---|
JPWO2009050993A1 (ja) | 2011-03-03 |
EP2202481A1 (en) | 2010-06-30 |
US20100195092A1 (en) | 2010-08-05 |
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