PL3973275T3 - System libs z automatycznym ogniskowaniem - Google Patents

System libs z automatycznym ogniskowaniem

Info

Publication number
PL3973275T3
PL3973275T3 PL20718827.7T PL20718827T PL3973275T3 PL 3973275 T3 PL3973275 T3 PL 3973275T3 PL 20718827 T PL20718827 T PL 20718827T PL 3973275 T3 PL3973275 T3 PL 3973275T3
Authority
PL
Poland
Prior art keywords
focussing
auto
libs system
libs
focussing libs
Prior art date
Application number
PL20718827.7T
Other languages
English (en)
Inventor
Daniel ADÉN
Ahmed Fadil
Original Assignee
Foss Analytical A/S
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Foss Analytical A/S filed Critical Foss Analytical A/S
Publication of PL3973275T3 publication Critical patent/PL3973275T3/pl

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718Laser microanalysis, i.e. with formation of sample plasma
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/061Sources
    • G01N2201/06113Coherent sources; lasers
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/06Illumination; Optics
    • G01N2201/068Optics, miscellaneous
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00Features of devices classified in G01N21/00
    • G01N2201/12Circuits of general importance; Signal processing
    • G01N2201/126Microprocessor processing

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
PL20718827.7T 2019-05-23 2020-04-05 System libs z automatycznym ogniskowaniem PL3973275T3 (pl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DKPA201900627 2019-05-23
PCT/IB2020/053242 WO2020234657A1 (en) 2019-05-23 2020-04-05 Auto-focussing libs system

Publications (1)

Publication Number Publication Date
PL3973275T3 true PL3973275T3 (pl) 2024-02-26

Family

ID=70285780

Family Applications (1)

Application Number Title Priority Date Filing Date
PL20718827.7T PL3973275T3 (pl) 2019-05-23 2020-04-05 System libs z automatycznym ogniskowaniem

Country Status (6)

Country Link
US (2) US11781990B2 (pl)
EP (1) EP3973275B1 (pl)
CN (1) CN114245871A (pl)
ES (1) ES2963476T3 (pl)
PL (1) PL3973275T3 (pl)
WO (1) WO2020234657A1 (pl)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2022131579A (ja) * 2021-02-26 2022-09-07 キオクシア株式会社 分析装置および分析方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BR112013007877A2 (pt) * 2010-10-01 2016-06-14 Tech Resources Pty Ltd analizador por electroscopia de emissão em plasma induzido por laser
US9267842B2 (en) 2013-01-21 2016-02-23 Sciaps, Inc. Automated focusing, cleaning, and multiple location sampling spectrometer system
US9395243B2 (en) 2013-01-21 2016-07-19 Sciaps, Inc. Handheld LIBS analyzer end plate purging structure
WO2017123551A1 (en) 2016-01-11 2017-07-20 Electro Scientific Industries, Inc. Simultaneous pattern-scan placement during sample processing
CA2950163A1 (en) * 2016-11-30 2018-05-30 National Research Council Of Canada Method and system for characterizing oil sands by using laser-induced breakdown spectroscopy
US10948418B2 (en) 2017-05-19 2021-03-16 National Research Council Of Canada Characterization of a material using combined laser-based IR spectroscopy and laser-induced breakdown spectroscopy
CN107783242B (zh) * 2017-10-24 2020-02-11 太原师范学院 自动对焦装置及采用该装置的块状物libs在线检测装置

Also Published As

Publication number Publication date
EP3973275C0 (en) 2023-11-01
EP3973275B1 (en) 2023-11-01
WO2020234657A1 (en) 2020-11-26
EP3973275A1 (en) 2022-03-30
CN114245871A (zh) 2022-03-25
US20220146432A1 (en) 2022-05-12
US11781990B2 (en) 2023-10-10
US20230408415A1 (en) 2023-12-21
ES2963476T3 (es) 2024-03-27

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