BR112013007877A2 - analizador por electroscopia de emissão em plasma induzido por laser - Google Patents

analizador por electroscopia de emissão em plasma induzido por laser

Info

Publication number
BR112013007877A2
BR112013007877A2 BR112013007877A BR112013007877A BR112013007877A2 BR 112013007877 A2 BR112013007877 A2 BR 112013007877A2 BR 112013007877 A BR112013007877 A BR 112013007877A BR 112013007877 A BR112013007877 A BR 112013007877A BR 112013007877 A2 BR112013007877 A2 BR 112013007877A2
Authority
BR
Brazil
Prior art keywords
laser
analyzer
electroscopy
plasma emission
induced plasma
Prior art date
Application number
BR112013007877A
Other languages
English (en)
Inventor
Michael Rutberg
Paolo Moreschini
Original Assignee
Tech Resources Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tech Resources Pty Ltd filed Critical Tech Resources Pty Ltd
Publication of BR112013007877A2 publication Critical patent/BR112013007877A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0237—Adjustable, e.g. focussing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/443—Emission spectrometry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0638—Refractive parts

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

analizador por electroscopia de emissão em plasma induzido por laser. a presente invenção refere-se a um analisador (10) por electroscopia de emissão em plasma induzido por laser (libs) que compreende um trajeto ótico (p) (representado por linhas tracejadas (p1) e linhas de ponto e traço (p2) e um sitema de focalização automática (ou rastreamento) (12). o trajeto óptcio (p) incide incide um feixe de laser (5) emitindo a partir de um laser (14) sobre um aparte da amostra (s) que deve ser analsiada pela analisador (10) focaliza a radiação emitida pela amostra s, quando irradiada pelo feixe de laser para um detector (16). o sistema de focalização automática (12) é capaz de variar o comprimento do trajeto ótico (p) para manter uma relação espacial constante (ou seja, uma distância) entre um ponto focal (18) do feixe de laser e a amostra (s), assim como manter um campo de visão instantânea constante (ifov) do detector (16) sobre o ponto de foco do laser.
BR112013007877A 2010-10-01 2011-09-15 analizador por electroscopia de emissão em plasma induzido por laser BR112013007877A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US38872210P 2010-10-01 2010-10-01
PCT/AU2011/001192 WO2012040769A1 (en) 2010-10-01 2011-09-15 Laser induced breakdown spectroscopy analyser

Publications (1)

Publication Number Publication Date
BR112013007877A2 true BR112013007877A2 (pt) 2016-06-14

Family

ID=45891714

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112013007877A BR112013007877A2 (pt) 2010-10-01 2011-09-15 analizador por electroscopia de emissão em plasma induzido por laser

Country Status (12)

Country Link
US (1) US20130271761A1 (pt)
CN (1) CN103210303A (pt)
AP (1) AP2013006832A0 (pt)
AU (1) AU2011308072B2 (pt)
BR (1) BR112013007877A2 (pt)
CA (1) CA2813032C (pt)
CL (2) CL2013000883A1 (pt)
EA (1) EA201390408A1 (pt)
PE (1) PE20150791A1 (pt)
PL (1) PL404561A1 (pt)
WO (1) WO2012040769A1 (pt)
ZA (1) ZA201302942B (pt)

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US9435742B2 (en) 2013-01-21 2016-09-06 Sciaps, Inc. Automated plasma cleaning system
WO2014113824A2 (en) 2013-01-21 2014-07-24 Sciaps, Inc. Handheld libs spectrometer
US9243956B2 (en) 2013-01-21 2016-01-26 Sciaps, Inc. Automated multiple location sampling analysis system
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CZ304598B6 (cs) * 2013-10-03 2014-07-23 Vysoké Učení Technické V Brně Modulární zařízení pro dálkovou chemickou materiálovou analýzu
CN103816976A (zh) * 2014-02-27 2014-05-28 王宏 激光诱导击穿光谱矿石智能分选方法及设备
BR112016030481A2 (pt) 2014-06-23 2021-01-12 Tsi Inc Análise rápida de materiais com o uso de espectroscopia libs
FR3031568B1 (fr) * 2015-01-12 2018-11-16 Xyzed Source de lumiere a diodes pour projecteur
US9651424B2 (en) 2015-02-26 2017-05-16 Sciaps, Inc. LIBS analyzer sample presence detection system and method
US9664565B2 (en) 2015-02-26 2017-05-30 Sciaps, Inc. LIBS analyzer sample presence detection system and method
FI20155547A (fi) * 2015-07-10 2017-01-11 Outotec Finland Oy Transparentti suojaava seinäelin käytettäväksi menetelmässä tai laitteessa fluidien laseravusteista optista säteilyspektroskooppia varten
CN105115944B (zh) * 2015-09-07 2017-12-29 北京科技大学 一种用于libs物质成分检测的自动聚焦方法及系统
US10209196B2 (en) 2015-10-05 2019-02-19 Sciaps, Inc. LIBS analysis system and method for liquids
US9939383B2 (en) 2016-02-05 2018-04-10 Sciaps, Inc. Analyzer alignment, sample detection, localization, and focusing method and system
EP3436806B1 (en) 2016-03-31 2020-05-13 FOSS Analytical A/S System for and method of performing laser induced breakdown spectroscopy
CN105784682B (zh) * 2016-05-10 2019-02-15 中国科学院光电研究院 一种激光诱导击穿光谱检测装置及检测方法
CN106338499A (zh) * 2016-08-31 2017-01-18 徐金杰 元素激光检测分析仪器及矿物元素分析方法
CN107918184A (zh) * 2016-10-09 2018-04-17 睿励科学仪器（上海）有限公司 非垂直自动聚焦系统以及相应的光学仪器
CN106568761A (zh) * 2016-10-28 2017-04-19 段忆翔 一种远程libs探头测量装置
CN106442471A (zh) * 2016-10-28 2017-02-22 段忆翔 一种基于libs技术的远程测量装置
US20180156717A1 (en) * 2016-12-05 2018-06-07 Bill & Melinda Gates Foundation Multi-test assay systems and methods of using the same
JP2019060831A (ja) * 2017-09-28 2019-04-18 株式会社島津製作所 レーザ誘起分析装置、および、レーザ誘起分析方法
CN112189160A (zh) * 2018-05-14 2021-01-05 通快激光系统半导体制造有限公司 聚焦装置和具有该聚焦装置的euv辐射产生设备
CN108844926B (zh) * 2018-06-12 2020-10-16 中国科学院上海技术物理研究所 磁光光致发光光调制反射和光调制透射光谱联合测试系统
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CN109632854B (zh) * 2019-01-14 2022-10-11 东华理工大学 一种双探测结构的块状铀矿多元素在线x荧光分析仪
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JP7368508B2 (ja) * 2019-05-31 2023-10-24 ディーティーイー イーエイチエフ 液体金属及び合金の定量的分析のための非浸漬的な方法及び装置
AU2021103159A4 (en) 2020-09-22 2021-07-22 Foss Analytical A/S Preparing a pellet for laser induced breakdown spectroscopy
CN112304898B (zh) * 2020-10-23 2023-03-24 西安智光物联科技有限公司 一种车载前置式激光气体检测仪
CN112496860B (zh) * 2020-11-27 2022-12-06 广东佩斯智能装备有限公司 一种车削刀具寿命实时监测方法
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Also Published As

Publication number Publication date
WO2012040769A1 (en) 2012-04-05
CN103210303A (zh) 2013-07-17
EA201390408A1 (ru) 2013-10-30
AU2011308072B2 (en) 2015-01-22
CA2813032C (en) 2019-05-07
AP2013006832A0 (en) 2013-04-30
ZA201302942B (en) 2014-06-25
CL2015002828A1 (es) 2016-10-07
PE20150791A1 (es) 2015-06-19
PL404561A1 (pl) 2014-03-17
CA2813032A1 (en) 2012-04-05
AU2011308072A1 (en) 2013-05-02
CL2013000883A1 (es) 2013-10-18
US20130271761A1 (en) 2013-10-17

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Legal Events

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B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06U Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B09W Correction of the decision to grant [chapter 9.1.4 patent gazette]

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B11D Dismissal acc. art. 38, par 2 of ipl - failure to pay fee after grant in time