MX2020011105A - Sistema analizador de fluorescencia de rayos-x y un metodo para ejecutar analisis de fluorescencia de rayos-x de un elemento de interes en suspension. - Google Patents

Sistema analizador de fluorescencia de rayos-x y un metodo para ejecutar analisis de fluorescencia de rayos-x de un elemento de interes en suspension.

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Publication number
MX2020011105A
MX2020011105A MX2020011105A MX2020011105A MX2020011105A MX 2020011105 A MX2020011105 A MX 2020011105A MX 2020011105 A MX2020011105 A MX 2020011105A MX 2020011105 A MX2020011105 A MX 2020011105A MX 2020011105 A MX2020011105 A MX 2020011105A
Authority
MX
Mexico
Prior art keywords
ray fluorescence
interest
slurry
analyzer system
wavelength range
Prior art date
Application number
MX2020011105A
Other languages
English (en)
Inventor
Tommi Koskinen
Antti Pelli
Heikki Sipilä
Original Assignee
Outotec Finland Oy
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from PCT/FI2018/050282 external-priority patent/WO2019202198A1/en
Priority claimed from PCT/FI2018/050281 external-priority patent/WO2019202197A1/en
Priority claimed from PCT/FI2018/050283 external-priority patent/WO2019202199A1/en
Application filed by Outotec Finland Oy filed Critical Outotec Finland Oy
Publication of MX2020011105A publication Critical patent/MX2020011105A/es

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B03—SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS; MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLID MATERIALS OR FLUIDS; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS
    • B03B—SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS
    • B03B13/00—Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects
    • B03B13/06—Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects using absorption or reflection of radioactive emanation
    • C—CHEMISTRY; METALLURGY
    • C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
    • C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
    • C22B3/00—Extraction of metal compounds from ores or concentrates by wet processes
    • C22B3/02—Apparatus therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/616—Specific applications or type of materials earth materials
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K2201/00—Arrangements for handling radiation or particles
    • G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
    • G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Molecular Biology (AREA)
  • Environmental & Geological Engineering (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Geology (AREA)
  • Manufacturing & Machinery (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

El sistema analizador de fluorescencia de rayos X comprende un tubo de rayos X (402), una unidad de manejo de suspensión (201), y un difractor de cristal (601) ubicados en una primera dirección desde dicha unidad de manejo de suspensión (201); el difractor de cristal (601) separa un rango de longitud de onda predefinido de los rayos-X fluorescentes (207) que se propagan a dicha primera dirección, y dirige los rayos-X fluorescentes en el rango de longitud de onda predefinido separado a un detector de radiación (602, 1605); el difractor de cristal (601) comprende un cristal de grafito pirolítico (603); dicho rango de longitud de onda predefinido comprende radiación fluorescente característica de un elemento de interés predefinido con su número atómico Z entre 41 y 60, los extremos incluidos; una resolución de energía de dicho detector de radiación (602, 1605) es mejor que 600 eV a la energía de dicha radiación fluorescente característica.
MX2020011105A 2018-04-20 2019-02-18 Sistema analizador de fluorescencia de rayos-x y un metodo para ejecutar analisis de fluorescencia de rayos-x de un elemento de interes en suspension. MX2020011105A (es)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
PCT/FI2018/050282 WO2019202198A1 (en) 2018-04-20 2018-04-20 X-ray fluorescence analyzer, and a method for performing x-ray fluorescence analysis
PCT/FI2018/050281 WO2019202197A1 (en) 2018-04-20 2018-04-20 X-ray fluorescence analyser, and a method for performing x-ray fluorescence analysis
PCT/FI2018/050283 WO2019202199A1 (en) 2018-04-20 2018-04-20 X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing x-ray fluorescence analysis
PCT/FI2019/050126 WO2019202201A1 (en) 2018-04-20 2019-02-18 X-ray fluorescence analyzer system and a method for performing x-ray fluorescence analysis of an element of interest in slurry

Publications (1)

Publication Number Publication Date
MX2020011105A true MX2020011105A (es) 2021-01-29

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
MX2020011105A MX2020011105A (es) 2018-04-20 2019-02-18 Sistema analizador de fluorescencia de rayos-x y un metodo para ejecutar analisis de fluorescencia de rayos-x de un elemento de interes en suspension.

Country Status (11)

Country Link
US (1) US11680913B2 (es)
CN (1) CN112313503B (es)
AU (2) AU2019254727B2 (es)
BR (1) BR112020021488A2 (es)
CA (1) CA3097473C (es)
DK (1) DK202070773A1 (es)
FI (1) FI20206176A1 (es)
MX (1) MX2020011105A (es)
SE (1) SE544488C2 (es)
WO (1) WO2019202201A1 (es)
ZA (1) ZA202007012B (es)

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CN114705708B (zh) * 2022-06-07 2022-08-23 四川大学 一种样品表面成分智能分析方法及系统
CN117129505B (zh) * 2023-10-19 2024-01-30 江苏一六仪器有限公司 一种微小区域检测的高通量能量色散x射线荧光光谱仪
CN117110343B (zh) * 2023-10-23 2024-03-29 中国科学技术大学 元素分布探测装置、标定测试方法及元素分布探测方法
CN117825425A (zh) * 2024-01-11 2024-04-05 安徽科瑞思创晶体材料有限责任公司 一种激光晶体的杂质检测系统与检测方法

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Also Published As

Publication number Publication date
US11680913B2 (en) 2023-06-20
CA3097473C (en) 2023-04-04
WO2019202201A1 (en) 2019-10-24
CN112313503A (zh) 2021-02-02
US20210325321A1 (en) 2021-10-21
BR112020021488A2 (pt) 2021-01-19
SE544488C2 (en) 2022-06-21
CA3097473A1 (en) 2019-10-24
CN112313503B (zh) 2024-07-05
AU2021107551A4 (en) 2022-01-06
SE2051302A1 (en) 2020-11-09
ZA202007012B (en) 2021-10-27
DK202070773A1 (en) 2020-11-30
FI20206176A1 (en) 2020-11-20
AU2019254727A1 (en) 2020-12-03
AU2019254727B2 (en) 2022-03-03

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