MX2020011105A - Sistema analizador de fluorescencia de rayos-x y un metodo para ejecutar analisis de fluorescencia de rayos-x de un elemento de interes en suspension. - Google Patents
Sistema analizador de fluorescencia de rayos-x y un metodo para ejecutar analisis de fluorescencia de rayos-x de un elemento de interes en suspension.Info
- Publication number
- MX2020011105A MX2020011105A MX2020011105A MX2020011105A MX2020011105A MX 2020011105 A MX2020011105 A MX 2020011105A MX 2020011105 A MX2020011105 A MX 2020011105A MX 2020011105 A MX2020011105 A MX 2020011105A MX 2020011105 A MX2020011105 A MX 2020011105A
- Authority
- MX
- Mexico
- Prior art keywords
- ray fluorescence
- interest
- slurry
- analyzer system
- wavelength range
- Prior art date
Links
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B03—SEPARATION OF SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS; MAGNETIC OR ELECTROSTATIC SEPARATION OF SOLID MATERIALS FROM SOLID MATERIALS OR FLUIDS; SEPARATION BY HIGH-VOLTAGE ELECTRIC FIELDS
- B03B—SEPARATING SOLID MATERIALS USING LIQUIDS OR USING PNEUMATIC TABLES OR JIGS
- B03B13/00—Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects
- B03B13/06—Control arrangements specially adapted for wet-separating apparatus or for dressing plant, using physical effects using absorption or reflection of radioactive emanation
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- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22B—PRODUCTION AND REFINING OF METALS; PRETREATMENT OF RAW MATERIALS
- C22B3/00—Extraction of metal compounds from ores or concentrates by wet processes
- C22B3/02—Apparatus therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/16—Measuring radiation intensity
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
- G01N2223/616—Specific applications or type of materials earth materials
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/062—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements the element being a crystal
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Immunology (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- High Energy & Nuclear Physics (AREA)
- General Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Molecular Biology (AREA)
- Environmental & Geological Engineering (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geochemistry & Mineralogy (AREA)
- Geology (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
El sistema analizador de fluorescencia de rayos X comprende un tubo de rayos X (402), una unidad de manejo de suspensión (201), y un difractor de cristal (601) ubicados en una primera dirección desde dicha unidad de manejo de suspensión (201); el difractor de cristal (601) separa un rango de longitud de onda predefinido de los rayos-X fluorescentes (207) que se propagan a dicha primera dirección, y dirige los rayos-X fluorescentes en el rango de longitud de onda predefinido separado a un detector de radiación (602, 1605); el difractor de cristal (601) comprende un cristal de grafito pirolítico (603); dicho rango de longitud de onda predefinido comprende radiación fluorescente característica de un elemento de interés predefinido con su número atómico Z entre 41 y 60, los extremos incluidos; una resolución de energía de dicho detector de radiación (602, 1605) es mejor que 600 eV a la energía de dicha radiación fluorescente característica.
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/FI2018/050282 WO2019202198A1 (en) | 2018-04-20 | 2018-04-20 | X-ray fluorescence analyzer, and a method for performing x-ray fluorescence analysis |
PCT/FI2018/050281 WO2019202197A1 (en) | 2018-04-20 | 2018-04-20 | X-ray fluorescence analyser, and a method for performing x-ray fluorescence analysis |
PCT/FI2018/050283 WO2019202199A1 (en) | 2018-04-20 | 2018-04-20 | X-ray fluorescence analyzer with a plurality of measurement channels, and a method for performing x-ray fluorescence analysis |
PCT/FI2019/050126 WO2019202201A1 (en) | 2018-04-20 | 2019-02-18 | X-ray fluorescence analyzer system and a method for performing x-ray fluorescence analysis of an element of interest in slurry |
Publications (1)
Publication Number | Publication Date |
---|---|
MX2020011105A true MX2020011105A (es) | 2021-01-29 |
Family
ID=68239070
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
MX2020011105A MX2020011105A (es) | 2018-04-20 | 2019-02-18 | Sistema analizador de fluorescencia de rayos-x y un metodo para ejecutar analisis de fluorescencia de rayos-x de un elemento de interes en suspension. |
Country Status (11)
Country | Link |
---|---|
US (1) | US11680913B2 (es) |
CN (1) | CN112313503B (es) |
AU (2) | AU2019254727B2 (es) |
BR (1) | BR112020021488A2 (es) |
CA (1) | CA3097473C (es) |
DK (1) | DK202070773A1 (es) |
FI (1) | FI20206176A1 (es) |
MX (1) | MX2020011105A (es) |
SE (1) | SE544488C2 (es) |
WO (1) | WO2019202201A1 (es) |
ZA (1) | ZA202007012B (es) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
AU2018419251B2 (en) * | 2018-04-20 | 2022-02-17 | Outotec (Finland) Oy | X-ray fluorescence analyser, and a method for performing X-ray fluorescence analysis |
EP3867634A2 (en) * | 2018-10-18 | 2021-08-25 | Security Matters Ltd. | System and method for detection and identification of foreign elements in a substance |
CN114705708B (zh) * | 2022-06-07 | 2022-08-23 | 四川大学 | 一种样品表面成分智能分析方法及系统 |
CN117129505B (zh) * | 2023-10-19 | 2024-01-30 | 江苏一六仪器有限公司 | 一种微小区域检测的高通量能量色散x射线荧光光谱仪 |
CN117110343B (zh) * | 2023-10-23 | 2024-03-29 | 中国科学技术大学 | 元素分布探测装置、标定测试方法及元素分布探测方法 |
CN117825425A (zh) * | 2024-01-11 | 2024-04-05 | 安徽科瑞思创晶体材料有限责任公司 | 一种激光晶体的杂质检测系统与检测方法 |
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-
2019
- 2019-02-18 MX MX2020011105A patent/MX2020011105A/es unknown
- 2019-02-18 CA CA3097473A patent/CA3097473C/en active Active
- 2019-02-18 AU AU2019254727A patent/AU2019254727B2/en active Active
- 2019-02-18 WO PCT/FI2019/050126 patent/WO2019202201A1/en active Application Filing
- 2019-02-18 SE SE2051302A patent/SE544488C2/en unknown
- 2019-02-18 CN CN201980041872.3A patent/CN112313503B/zh active Active
- 2019-02-18 BR BR112020021488-4A patent/BR112020021488A2/pt unknown
- 2019-02-18 FI FI20206176A patent/FI20206176A1/en unknown
- 2019-02-18 US US17/049,261 patent/US11680913B2/en active Active
-
2020
- 2020-11-11 ZA ZA2020/07012A patent/ZA202007012B/en unknown
- 2020-11-19 DK DKPA202070773A patent/DK202070773A1/en unknown
-
2021
- 2021-09-13 AU AU2021107551A patent/AU2021107551A4/en active Active
Also Published As
Publication number | Publication date |
---|---|
US11680913B2 (en) | 2023-06-20 |
CA3097473C (en) | 2023-04-04 |
WO2019202201A1 (en) | 2019-10-24 |
CN112313503A (zh) | 2021-02-02 |
US20210325321A1 (en) | 2021-10-21 |
BR112020021488A2 (pt) | 2021-01-19 |
SE544488C2 (en) | 2022-06-21 |
CA3097473A1 (en) | 2019-10-24 |
CN112313503B (zh) | 2024-07-05 |
AU2021107551A4 (en) | 2022-01-06 |
SE2051302A1 (en) | 2020-11-09 |
ZA202007012B (en) | 2021-10-27 |
DK202070773A1 (en) | 2020-11-30 |
FI20206176A1 (en) | 2020-11-20 |
AU2019254727A1 (en) | 2020-12-03 |
AU2019254727B2 (en) | 2022-03-03 |
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