GB2403388A - X-ray inspection system having X-ray source with compound fluorescent secondary target - Google Patents
X-ray inspection system having X-ray source with compound fluorescent secondary target Download PDFInfo
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- GB2403388A GB2403388A GB0314678A GB0314678A GB2403388A GB 2403388 A GB2403388 A GB 2403388A GB 0314678 A GB0314678 A GB 0314678A GB 0314678 A GB0314678 A GB 0314678A GB 2403388 A GB2403388 A GB 2403388A
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- inspection system
- ray
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- 238000007689 inspection Methods 0.000 title claims abstract description 23
- 150000001875 compounds Chemical class 0.000 title claims abstract description 12
- 239000000463 material Substances 0.000 claims abstract description 25
- 230000005855 radiation Effects 0.000 claims abstract description 11
- 238000001228 spectrum Methods 0.000 claims abstract description 10
- 238000000034 method Methods 0.000 claims description 12
- 238000003384 imaging method Methods 0.000 claims description 7
- 238000010521 absorption reaction Methods 0.000 claims description 4
- 229910052751 metal Inorganic materials 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims description 4
- 150000002739 metals Chemical class 0.000 claims description 4
- 230000001419 dependent effect Effects 0.000 claims description 3
- 230000000694 effects Effects 0.000 claims description 3
- 230000007246 mechanism Effects 0.000 claims description 3
- 239000000126 substance Substances 0.000 abstract description 4
- 229910052737 gold Inorganic materials 0.000 abstract description 2
- 229910052693 Europium Inorganic materials 0.000 abstract 1
- 229910052776 Thorium Inorganic materials 0.000 abstract 1
- 229910052802 copper Inorganic materials 0.000 abstract 1
- 229910052709 silver Inorganic materials 0.000 abstract 1
- 229910052721 tungsten Inorganic materials 0.000 abstract 1
- 230000005461 Bremsstrahlung Effects 0.000 description 5
- 239000013077 target material Substances 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- QWUZMTJBRUASOW-UHFFFAOYSA-N cadmium tellanylidenezinc Chemical compound [Zn].[Cd].[Te] QWUZMTJBRUASOW-UHFFFAOYSA-N 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 230000014509 gene expression Effects 0.000 description 2
- 239000012925 reference material Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 238000002083 X-ray spectrum Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 239000010405 anode material Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000002050 diffraction method Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 231100000252 nontoxic Toxicity 0.000 description 1
- 230000003000 nontoxic effect Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 230000002285 radioactive effect Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
- 238000004876 x-ray fluorescence Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
- G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
- G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
- G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
- G01V5/224—Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Biochemistry (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Immunology (AREA)
- Pathology (AREA)
- High Energy & Nuclear Physics (AREA)
- General Life Sciences & Earth Sciences (AREA)
- Geophysics (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
An X-ray inspection system has an X-ray source 1 that comprises a primary target 24 and a compound secondary target 29. The secondary target 29 is made from a number of fluorescent materials and comprises at least three materials selected from Cu, Ag, Eu, ER, Th, TA, W and Au. The source produces a spectrum of X-ray radiation dominated by a plurality of substantially monochromatic fluorescent peaks.. The attenuation coefficient of a particular substance is determined at a plurality of well defined energies and this attenuation compared with known data to identify the substance. The determination of the attenuation at well defined energies increases the discriminative ability of the system. A collimator (2, figure 1) may be used to direct X-ray beam and another collimator (10, figure 1) may be provided to shield detector elements (6, figure 1) from scattered radiation. The system may be used for baggage inspection.
Description
X-RAY INSPECTION SYSTEM
This invention relates to the field of X-ray inspection systems and particularly to transmission-imaging systems for detecting the presence of specific substances within closed containers such as baggage.
It is well known to inspect baggage, for example at airports, using an Xray transmission-imaging device to produce a shadow image of the baggage contents. The shadow image is converted to a screen image which is then scrutinised by an operator.
0 However, such X-ray transmission systems are not reliable at differentiating target materials from non-target materials having similar density or atomic number, or at detecting low density materials, particularly if present in thin cross-section, since such materials cause very little attenuation of X-rays.
It is also known to use diffraction systems which detect forward scatter of radiation from a target to identify the molecular structure of the target material. However, such techniques are voxel (volume element) specific and scanning every voxel results in prolonged data acquisition times. The alternative is to use a primary system to detect anomalies before subjecting a limited volume to diffraction analysis. Although diffraction systems will produce high quality analysis of the target materials the cost of the equipment and the acquisition times are also extremely high.
Some inspection systems utilise dual-energy X-ray radiation to produce transmission imaging data. In this method of screening, images of the baggage are taken at two different X-ray energies. This data is then analysed by an algorithm that determines the mean attenuation coefficient for the target bag along the line-of-sight and compares the result with known material values.
The linear attenuation coefficient is a measure of the probability of the photons interacting with a material. In the energy range of interest, approximately 10-100 keV, the photoelectric effect is the dominating process by which the incident radioactive beam Io interacts with the sample material and transmits beam I. ::: ::: Àe;:: À :. À À
The relation between the intensity of the incident and emergent X-ray beams is given by Equation 1: I = IOe-t Equation 1 3 where is the linear attenuation coefficient of the material, and t its thickness. The 0 advantage of the dual-energy technique is that Equation I can be applied to the intensities of the two different energy X-rays to obtain data that is independent of the thickness of the material. Applying Equation I to each of the two available energies, E' and E2 gives: f IE]- I E e E] t IS | IE2-IOE2 e 'E2 Equation 2 These expressions can be rewritten so that the thickness of the material, t, is extracted: I ( IE! them = in ( 4) Equation 3 Once one of the expressions in Equation 3 is divided by the other, the result is independent of t: E1 _ HE2 in (I Equation 4 e..e ate;:: À :..
An example of a dual-energy system is described in US 5044002 (Stein) in which an alternating high and low voltage is applied to the X-ray tube to produce two different levels of X-ray radiation energy. By comparing the resulting attenuation at the two energy levels with that caused by a reference material an indication of the presence or absence of the reference material in the target can be achieved. A further example is provided by US 5838758 (Krug, et al) in which the dual-energy attenuation data is compared with pre-determined values in a look-up table.
However, known dual-energy inspection systems rely on conventional Bremsstrahlung lo X-ray tubes to produce the incident beam. The X-ray spectrum produced by such a source comprises a continuous spectrum ("continuum") superimposed with peaks at energies characteristic of the anode material. The continuum emission is, however, the dominant feature. Since the precision of the measured attenuation coefficient in the dualenergy technique depends on the accuracy to which the selected energy is determined, the use of a broad Bremsstrahlung input spectrum means that the discriminative ability of the dual-energy technique is limited. Consequently, the level of material discrimination that the dual-energy technique provides is accompanied by high false alarm rates.
It is an object of this invention to provide an X-ray transmissionimaging inspection system for detecting the presence of specific substances having improved discriminative ability relative to prior art transmission systems.
Accordingly this invention provides an inspection system for imaging an object comprising an X-ray source for illuminating an object with a beam of X-ray radiation, detector means for detecting X-rays transmitted through an object and signal processing means for processing a spatially resolved output signal from the detector means such that absorption properties of an object can be determined, wherein the X-ray source comprises a primary target and a compound secondary target comprising a plurality of fluorescent materials, so that in use the source produces a spectrum of X-ray radiation dominated by a plurality of substantially monochromatic ::: ::: ace c:: À :e À . fluorescence peaks so that energy-dependent absorption properties can be determined at a plurality of energies.
Using a fluorescence source with a compound secondary target has the benefit of producing a spectrum dominated by a plurality of nearmonochromatic peaks containing very little Bremsstrahlung radiation or background events. The energy lines produced are significantly narrower than can be achieved even by filtering a traditional Bremsstrahlung spectrum. Since the precision of the measured attenuation coefficient in the dual-energy technique depends on the accuracy to which the selected energy is lo determined, the invention has the advantage of enabling more accurate measurement.
Furthermore, it is advantageous to use a compound secondary target comprising at least 3 different materials. In this way at least three substantially monochromatic fluorescence peaks can be produced. This enables the attenuation coefficient to be calculated at at least 3 different energies, which significantly improves the discriminative ability of the system.
The compound secondary target preferably comprises at least 3 metals selected from the group: Cu. Ag, Eu, Er, Th, Ta, W. Au. These metals all display a reasonable fluorescent yield, are non-toxic and lend themselves to ready manufacture of the compound secondary target. However, it will be apparent to the skilled practitioner that alternative materials may be selected. Ideally the particular combination is selected to provide a spread of characteristic fluorescence peaks across the energy range of interest.
In order to further improve the resolution of the system the signal processing means is adapted to apply an algorithm to effect the background subtraction technique to neighbouring components of the spatially resolved output signal from the detector means. This X-ray imaging technique provides a straightforward way to effectively subtract the background from one pixel from another when two adjacent pixels straddle the boundary of a threat material.
i.' A. '.e.. .:e::e In the situation where a threat material B partially overlaps a background material A, one pixel sees the composite material AB, while a neighbouring pixel sees material A only. The aim of the background subtraction technique is to enable material B to be identified without being able to measure directly the attenuation resulting from B alone. s
It is possible to write the transmitted flux through B. IB, as a function of the intensity of the incident X-ray beam In and the emerging X-ray beams IA, and JAB.
The number of transmitted photons, IA, IB, and JAB, is proportional to the number of lo incident photons, Io, as given below: IA = xJ4Io
LAB-CAB IO
IB -TRIO
Equation 5 It is also true that: fold -.B IA Equation 6 IB is not known because it cannot be measured. However, from Equations 5 and 6 it is straightforward to write it as a function of what is known, namely IO, IA and JAB: I IB =B10=-IO t4 Equation 7 This relationship relates IB to IO, IA and IAB and does not require a knowledge of the thickness, x, of any of the materials.
There are several known ways to achieve the required spatial resolution of the output 2s signal from the detector means. These include providing relative movement between the X-ray beam and the object and/or using a collimator between the object and the detector means. In particular, a collimator may be positioned between the source means and an object to be inspected such that the incident X-ray beam is fan-shaped or formed l c:: :: ::: 'se::..
into a pencil beam. Furthermore, the source may incorporate a scanning mechanism and/or the object may be moved relative to the X-ray source for example by means of a conveyor belt.
s The detector means preferably comprises a one or two dimensional array of detector elements which may be HPGe, CZT or any other detector element having sufficient spatial dimensions, efficiency and energy resolution.
A collimator may also be positioned between the object and the detector means to shield lo the detector element(s) from scatter from outside the volume of interest.
The invention will now be described, by way of example, with reference to the accompanying drawings, in which: Figure 1 is a schematic diagram of an X-ray inspection system according to the invention; Figure 2 is a schematic diagram of the X-ray source of the inspection system of Figure 1; Figure 3 illustrates a comparison between the spectra from a conventional X-ray tube and a fluorescence tube; Figure 4 illustrates an X-ray beam produced from a compound secondary target of a fluorescence source; and Figure 5 illustrates the characteristic plot for water of attenuation coefficient against energy.
With reference to Figure 1, an object 4 to be inspected is moved between an X-ray source 1 and an X-ray detection system, for example, by means of a conveyor belt 8. A collimator 2 positioned on the source side of the object 4 causes a fan-shaped beam of . e.e À. ;:: À - : X-rays 3 to be projected towards the object 4. The detector system comprises a linear array of detector elements 6. A collimator 10 is positioned relative to the detector array to prevent scatter from outside the particular volume of interest from reaching the detector elements. The detector elements used in this embodiment are High Purity Germarnum (HPGe) detectors, although it will be apparent that alternative detector elements, such as Cadmium Zinc Telluride (CZT) detectors could be used.
Signal processing means 12 is used to calculate the attenuation coefficient at each well defined energy, apply the background subtraction technique and compare the results lo with a set of library data. Display 14 is used to alert an operator to a positive identification.
The X-ray source 1 is a fluorescence source available from PANalytical fitted with a modified secondary target. The source is illustrated schematically in Figure 2. In use the cathode 20 emits an electron beam 22 which generates a primary X-ray beam 26 at the cooled anode 24. The primary X-ray beam 26 generates X-ray fluorescence 28 at the secondary target 29. The PANalytical source is a novel X-ray generator that uses a secondary target to produce a near-monochromatic X-ray beam. The spectral shape of the beam is dominated by characteristic X-rays produced by fluorescence from the secondary target, and contains very little Bremsstrahlung radiation or background events. The energy of the emitted fluorescence line depends on the material out of which the secondary target is formed. The difference between the emitted spectra of a conventional X-ray tube and the PANalytical source as measured with a single HPGe detector is shown in Figure 3. It has been calculated that for the PANalytical tube 2s operating at 160 kV and 0.5 mA, 50% of the total emission is in the fluorescence line compared to only 15% of the total emission for the conventional tube operated at the same voltage and current.
The secondary target of the PANalytical source has been replaced by a modified compound secondary target 29 comprising, Ag, Eu, Er, Ta and Au to provide multiple energy fluorescent peaks in the output spectrum as shown in Table 1 below and as illustrated in Figure 4. À c
: :: À À a:: ::: : :. . . Element X-ray Energy of X-ray I l AgKal 22.2 keV I Ka' 22.0 keV Kpl 24.9 keV EuI K,> 41.5 keV! Ko2 40.9 keV i _ _K, 47.0 keV Er Kal 49.1 ke.V Ka2 48.2 keV Kin 55.7 keV Ta K<,l 57.5 keV Ka. 56.3 keV KBI 65.2 keV Au KQ1 68.8 keV ka2 G7.0 keV K15, 1 78.0 keV I
Table 1
o These metals have been selected to provide a spread of characteristic fluorescence peaks across the energy range, but it will be apparent that other combinations of materials could be selected.
The emission flux of the fluorescence tube is a function of the filament current, which for the purposes of Figure 4 was 0.5 mA, and of the applied high voltage. Whereas the filament current is directly related to the count rate observed by the detector, varying the high voltage adds another control mechanism to the emission of the X-ray tube. As the high voltage is increased over 60 keV, the emission of low-energy characteristic X-rays (see Table 1) is triggered. The larger the applied high voltage, the greater the number of emitted high-energy characteristic X-rays. The tube may typically be operated in the range 0-160kV.
Since the attenuation coefflcient of any given material is energy dependent the ability to calculate its value at more discrete energy levels provides greater discrimination in the 2s identification of a material against a library set of data. This leads to a reduction in the false alann rate. Figure 5 illustrates the characteristic plot of attenuation coefficient against incident X-ray energy for water. It will be apparent that by measuring attenuation coefficient at an increased number of well defined energies more points on
-
À e.e.- À . . À À À À À À . e À * C À such a plot can be determined. This enables more accurate comparison with known data, thereby increasing the discriminative ability of the system and reducing false alann rates.
Claims (12)
1. An inspection system for imaging an object comprising an X-ray source for illuminating an object with a beam of X-ray radiation, detector means for detecting X-rays transmitted through an object and signal processing means for processing a spatially resolved output signal from the detector means such that absorption properties of an object can be determined, wherein the X-ray source comprises a primary target and a compound secondary target comprising a plurality of fluorescent materials, so that in use the source produces a spectrum of X-ray radiation dominated by a plurality of substantially monochromatic fluorescence peaks so that energy-dependent absorption properties can be determined at a plurality of energies.
2. An inspection system according to claim 1 wherein the compound secondary target comprises at least 3 different materials.
3. An inspection system according to claim 2 wherein the compound secondary target comprises at least 3 metals selected from the group: Cu. Ag, En, Er, Th, Ta, W. Au.
4. An inspection system according to any preceding claim wherein the signal processing means is adapted to apply an algorithm to effect the background subtraction technique to neighbouring components of the spatially resolved output signal from the detector means.
5. An inspection system according to any preceding claim wherein a collimator is positioned between the X-ray source and an object to be inspected such that the incident X-ray beam is fan-shaped.
6. An inspection system according to any of claims 1 to 4 wherein a collimator is positioned between the X-ray source and an object to be inspected such that the incident X-ray beam is a pencil beam.
À:: . : . :: e. A: : : À : À À.e
7. An inspection system according to any preceding claim wherein the source means incorporates a scanning mechanism.
8. An inspection system according to any preceding claim wherein an object to be inspected is moved relative to the X-ray source by means of a conveyor belt.
9. An inspection system according to any preceding claim wherein the detector means comprises an array of HPGe detector elements.
10. An inspection system according to any of claims 1-8 wherein the detector means comprises an array of CZT detector elements.
11. An inspection system according to any preceding claim wherein a collimator is positioned between an object to be inspected and the detector means to shield the detector element(s) from scatter from outside the volume of interest.
12. An inspection system for imaging an object substantially as hereinbefore described with reference to Figures 1 to 5 of the accompanying drawings.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0314678A GB2403388A (en) | 2003-06-24 | 2003-06-24 | X-ray inspection system having X-ray source with compound fluorescent secondary target |
| PCT/GB2004/002551 WO2005001514A1 (en) | 2003-06-24 | 2004-06-14 | X-ray inspection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GB0314678A GB2403388A (en) | 2003-06-24 | 2003-06-24 | X-ray inspection system having X-ray source with compound fluorescent secondary target |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| GB0314678D0 GB0314678D0 (en) | 2003-07-30 |
| GB2403388A true GB2403388A (en) | 2004-12-29 |
Family
ID=27637218
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| GB0314678A Withdrawn GB2403388A (en) | 2003-06-24 | 2003-06-24 | X-ray inspection system having X-ray source with compound fluorescent secondary target |
Country Status (2)
| Country | Link |
|---|---|
| GB (1) | GB2403388A (en) |
| WO (1) | WO2005001514A1 (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100389313C (en) * | 2005-05-20 | 2008-05-21 | 中国印钞造币总公司 | Pure gold standard sampler of emitting spectroscopy and production thereof |
| WO2008142446A2 (en) * | 2007-05-17 | 2008-11-27 | Durham Scientific Crystals Ltd | Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands |
| US7693261B2 (en) | 2007-05-17 | 2010-04-06 | Durham Scientific Crystals Limited | Method and apparatus for inspection of materials |
| CN102478661A (en) * | 2010-11-19 | 2012-05-30 | 西门子公司 | Device and method for calibrating x-ray detector, calibration apparatus and x-ray apparatus |
| GB2552537A (en) * | 2016-07-28 | 2018-01-31 | Smiths Heimann Sas | Inspection system with source of radiation and method |
| CN110199209A (en) * | 2016-07-28 | 2019-09-03 | 德国史密斯海曼简化股份公司 | Scattering imaging |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CA3097473C (en) * | 2018-04-20 | 2023-04-04 | Outotec (Finland) Oy | X-ray fluorescence analyzer system and a method for performing x-ray fluorescence analysis of an element of interest in slurry |
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| JPS60119410A (en) * | 1983-11-30 | 1985-06-26 | Sumitomo Metal Ind Ltd | Radiation thickness measuring device |
| JPH01274746A (en) * | 1988-04-26 | 1989-11-02 | Horiba Ltd | Measurement of bone salt concentration |
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| EP0942295A2 (en) * | 1990-08-10 | 1999-09-15 | Vivid Technologies, Inc. | Device and method for inspection of baggage and other objects |
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2003
- 2003-06-24 GB GB0314678A patent/GB2403388A/en not_active Withdrawn
-
2004
- 2004-06-14 WO PCT/GB2004/002551 patent/WO2005001514A1/en active Application Filing
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| US3882310A (en) * | 1972-11-01 | 1975-05-06 | Raytheon Co | Spatially modulated imaging system |
| JPS60119410A (en) * | 1983-11-30 | 1985-06-26 | Sumitomo Metal Ind Ltd | Radiation thickness measuring device |
| JPH01274746A (en) * | 1988-04-26 | 1989-11-02 | Horiba Ltd | Measurement of bone salt concentration |
| EP0942295A2 (en) * | 1990-08-10 | 1999-09-15 | Vivid Technologies, Inc. | Device and method for inspection of baggage and other objects |
| JPH11108861A (en) * | 1997-10-02 | 1999-04-23 | Technos Kenkyusho:Kk | Fluorescent x-ray analyzer and fluorescent x-ray detector |
| EP1102302A1 (en) * | 1999-11-18 | 2001-05-23 | Philips Patentverwaltung GmbH | Monochromatic x-ray source |
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| WO2002099167A1 (en) * | 2001-05-31 | 2002-12-12 | Honeywell International Inc. | Crystalline compositions, radiation detector elements, and methods of formation |
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100389313C (en) * | 2005-05-20 | 2008-05-21 | 中国印钞造币总公司 | Pure gold standard sampler of emitting spectroscopy and production thereof |
| WO2008142446A2 (en) * | 2007-05-17 | 2008-11-27 | Durham Scientific Crystals Ltd | Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands |
| WO2008142446A3 (en) * | 2007-05-17 | 2009-01-15 | Durham Scient Crystals Ltd | Energy dispersive x-ray absorption spectroscopy in scanning transmission mode involving the calculation of the intensity ratios between successive frequency bands |
| US7693261B2 (en) | 2007-05-17 | 2010-04-06 | Durham Scientific Crystals Limited | Method and apparatus for inspection of materials |
| CN102478661A (en) * | 2010-11-19 | 2012-05-30 | 西门子公司 | Device and method for calibrating x-ray detector, calibration apparatus and x-ray apparatus |
| GB2552537A (en) * | 2016-07-28 | 2018-01-31 | Smiths Heimann Sas | Inspection system with source of radiation and method |
| WO2018020257A1 (en) * | 2016-07-28 | 2018-02-01 | Smiths Heimann Sas | Inspection system with source of radiation and method |
| US20190219730A1 (en) * | 2016-07-28 | 2019-07-18 | Smiths Heimann Sas | Inspection system with source of radiation and method |
| CN110121666A (en) * | 2016-07-28 | 2019-08-13 | 德国史密斯海曼简化股份公司 | Inspection system and method with radiation source |
| CN110199209A (en) * | 2016-07-28 | 2019-09-03 | 德国史密斯海曼简化股份公司 | Scattering imaging |
| GB2552537B (en) * | 2016-07-28 | 2020-05-27 | Smiths Heimann Sas | Inspection system with source of radiation and method |
| US10962677B2 (en) | 2016-07-28 | 2021-03-30 | Smiths Heimann Sas | Inspection system with source of radiation and method |
| CN110199209B (en) * | 2016-07-28 | 2021-07-30 | 德国史密斯海曼简化股份公司 | Scatter imaging |
| CN110121666B (en) * | 2016-07-28 | 2022-04-05 | 德国史密斯海曼简化股份公司 | Inspection system and method with radiation source |
Also Published As
| Publication number | Publication date |
|---|---|
| GB0314678D0 (en) | 2003-07-30 |
| WO2005001514A1 (en) | 2005-01-06 |
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