JP2005315729A - 直流試験装置 - Google Patents

直流試験装置 Download PDF

Info

Publication number
JP2005315729A
JP2005315729A JP2004133955A JP2004133955A JP2005315729A JP 2005315729 A JP2005315729 A JP 2005315729A JP 2004133955 A JP2004133955 A JP 2004133955A JP 2004133955 A JP2004133955 A JP 2004133955A JP 2005315729 A JP2005315729 A JP 2005315729A
Authority
JP
Japan
Prior art keywords
current detection
resistor
current
amplifier
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004133955A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005315729A5 (enExample
Inventor
Hironori Tanaka
宏典 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP2004133955A priority Critical patent/JP2005315729A/ja
Priority to CNA2005800134594A priority patent/CN1947025A/zh
Priority to KR1020067024664A priority patent/KR20070013314A/ko
Priority to PCT/JP2005/007912 priority patent/WO2005106513A1/ja
Priority to DE112005000986T priority patent/DE112005000986T5/de
Publication of JP2005315729A publication Critical patent/JP2005315729A/ja
Priority to US11/589,687 priority patent/US20070103174A1/en
Publication of JP2005315729A5 publication Critical patent/JP2005315729A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/32—Compensating for temperature change

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
JP2004133955A 2004-04-28 2004-04-28 直流試験装置 Pending JP2005315729A (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2004133955A JP2005315729A (ja) 2004-04-28 2004-04-28 直流試験装置
CNA2005800134594A CN1947025A (zh) 2004-04-28 2005-04-26 直流测试装置
KR1020067024664A KR20070013314A (ko) 2004-04-28 2005-04-26 직류 시험 장치
PCT/JP2005/007912 WO2005106513A1 (ja) 2004-04-28 2005-04-26 直流試験装置
DE112005000986T DE112005000986T5 (de) 2004-04-28 2005-04-26 Gleichstrom-Prüfvorrichtung
US11/589,687 US20070103174A1 (en) 2004-04-28 2006-10-30 Direct current test apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004133955A JP2005315729A (ja) 2004-04-28 2004-04-28 直流試験装置

Publications (2)

Publication Number Publication Date
JP2005315729A true JP2005315729A (ja) 2005-11-10
JP2005315729A5 JP2005315729A5 (enExample) 2007-10-18

Family

ID=35241802

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004133955A Pending JP2005315729A (ja) 2004-04-28 2004-04-28 直流試験装置

Country Status (6)

Country Link
US (1) US20070103174A1 (enExample)
JP (1) JP2005315729A (enExample)
KR (1) KR20070013314A (enExample)
CN (1) CN1947025A (enExample)
DE (1) DE112005000986T5 (enExample)
WO (1) WO2005106513A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012149934A (ja) * 2011-01-18 2012-08-09 Toyota Motor Corp 電流検出回路
CN111638480A (zh) * 2020-06-09 2020-09-08 广东省计量科学研究院（华南国家计量测试中心） 一种基于温度补偿的电流传感器校准系统及方法

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI474710B (zh) * 2007-10-18 2015-02-21 Ind Tech Res Inst 行動通訊設備於離線使用數位內容之收費方法及其系統
JP2010054314A (ja) * 2008-08-28 2010-03-11 Yokogawa Electric Corp 半導体試験装置
EP2169412A1 (en) * 2008-09-25 2010-03-31 Ilumab AB Electrical current measurement arrangement
CN101923124B (zh) * 2009-06-17 2012-06-20 上海华虹Nec电子有限公司 确定em测试结构中加速因子的方法
US8779777B2 (en) * 2010-06-04 2014-07-15 Linear Technology Corporation Dynamic compensation of aging drift in current sense resistor
CN101957402A (zh) * 2010-08-31 2011-01-26 上海华岭集成电路技术股份有限公司 瞬时电流的测试系统与方法
JP5467539B2 (ja) * 2012-02-10 2014-04-09 横河電機株式会社 電極の評価装置および評価方法
JP6738236B2 (ja) * 2016-08-12 2020-08-12 東京エレクトロン株式会社 デバイス検査回路、デバイス検査装置及びプローブカード
JP7468266B2 (ja) * 2020-09-16 2024-04-16 オムロン株式会社 電圧検出装置
DE102021214606A1 (de) 2021-12-16 2023-06-22 Vitesco Technologies GmbH Stromerfassungssystem
CN114878033B (zh) * 2022-03-29 2023-12-22 深圳国微感知技术有限公司 一种矩阵式压力分布测量系统及方法
CN114924109B (zh) * 2022-07-20 2022-11-29 深圳市英特瑞半导体科技有限公司 低功耗芯片电流的测试方法、电路及其装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09178782A (ja) * 1995-12-25 1997-07-11 Advantest Corp 電流検出回路及びその回路を用いた直流試験装置
JPH10283044A (ja) * 1997-04-04 1998-10-23 Asia Electron Inc 定電流電源装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3430130A (en) * 1966-05-20 1969-02-25 Carl A Schneider Conductivity measuring circuit utilizing conductivity cell as input resistance of an operational amplifier
US4000643A (en) * 1976-03-29 1977-01-04 Honeywell Inc. Apparatus for producing a compensating voltage
US4438411A (en) * 1981-07-20 1984-03-20 Ford Aerospace & Communications Corporation Temperature compensating method and apparatus for thermally stabilizing amplifier devices
JPS5939105A (ja) * 1982-08-27 1984-03-03 Fujitsu Ltd 制御電圧発生回路
FR2659177B1 (fr) * 1990-03-01 1992-09-04 Merlin Gerin Capteur de courant pour un declencheur electronique d'un disjoncteur electrique.
JP3218106B2 (ja) * 1992-12-28 2001-10-15 日本電波工業株式会社 水晶発振器の温度補償回路
US20030025488A1 (en) * 1996-12-26 2003-02-06 Emc Technology, Inc. Power sensing RF termination apparatus including temperature compensation means
JP2000258472A (ja) * 1999-03-10 2000-09-22 Mitsubishi Electric Corp 電流検出装置
US6688119B2 (en) * 2000-12-22 2004-02-10 General Electric Company Methods and apparatus for increasing appliance measuring system accuracy
US6700365B2 (en) * 2001-12-10 2004-03-02 Intersil Americas Inc. Programmable current-sensing circuit providing discrete step temperature compensation for DC-DC converter

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09178782A (ja) * 1995-12-25 1997-07-11 Advantest Corp 電流検出回路及びその回路を用いた直流試験装置
JPH10283044A (ja) * 1997-04-04 1998-10-23 Asia Electron Inc 定電流電源装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012149934A (ja) * 2011-01-18 2012-08-09 Toyota Motor Corp 電流検出回路
CN111638480A (zh) * 2020-06-09 2020-09-08 广东省计量科学研究院（华南国家计量测试中心） 一种基于温度补偿的电流传感器校准系统及方法
CN111638480B (zh) * 2020-06-09 2022-10-11 广东省计量科学研究院（华南国家计量测试中心） 一种基于温度补偿的电流传感器校准系统及方法

Also Published As

Publication number Publication date
CN1947025A (zh) 2007-04-11
WO2005106513A1 (ja) 2005-11-10
US20070103174A1 (en) 2007-05-10
KR20070013314A (ko) 2007-01-30
DE112005000986T5 (de) 2007-03-29

Similar Documents

Publication Publication Date Title
JP5314686B2 (ja) 試験装置およびドライバ回路
JP4119060B2 (ja) 試験装置
JP2005315729A (ja) 直流試験装置
CN101432630B (zh) 功率外加电路,及测试设备
TWI644107B (zh) 感測器的讀取電路及其讀取方法
CN101128742B (zh) 电流测量装置、测试装置、电流测量方法、及测试方法
JP4735976B2 (ja) 電源装置およびこれを用いた半導体試験システム
CN101689886B (zh) 修正电路以及测试装置
JP4707608B2 (ja) 測定回路及び試験装置
JP5022377B2 (ja) 測定回路及び試験装置
CN103575434B (zh) 压力侦测电路
JP4481983B2 (ja) 電源電流測定装置、及び試験装置
JP4819684B2 (ja) 差動コンパレータ回路、テストヘッド、及び試験装置
JP2006170797A (ja) 不平衝容量の検出装置、及びセンサの不平衝容量の検出方法、並びにこれらに用いる変換器
JP5351029B2 (ja) 電源安定化回路、電子デバイス、および、試験装置
JP2010085319A (ja) センサ信号検出回路、レシオメトリック補正回路及びセンサ装置
JP5172724B2 (ja) サージ試験装置
JPH11304877A (ja) 電圧印加電流測定回路
JP2007040771A (ja) ノイズ測定用半導体装置
CN102236080B (zh) 电压检测电路及其方法
JPWO2009081522A1 (ja) 試験装置および測定装置
RU2161860C1 (ru) Интегральный преобразователь
JP2006025260A (ja) 増幅回路、及び試験装置
CN102931990A (zh) 数字温度信号产生装置及产生方法
JP2000304623A (ja) Ｉｃのジャンクション温度測定回路、及びその測定方法

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070223

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070518

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100525

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20110104