JP2005315729A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2005315729A5 JP2005315729A5 JP2004133955A JP2004133955A JP2005315729A5 JP 2005315729 A5 JP2005315729 A5 JP 2005315729A5 JP 2004133955 A JP2004133955 A JP 2004133955A JP 2004133955 A JP2004133955 A JP 2004133955A JP 2005315729 A5 JP2005315729 A5 JP 2005315729A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004133955A JP2005315729A (ja) | 2004-04-28 | 2004-04-28 | 直流試験装置 |
| CNA2005800134594A CN1947025A (zh) | 2004-04-28 | 2005-04-26 | 直流测试装置 |
| KR1020067024664A KR20070013314A (ko) | 2004-04-28 | 2005-04-26 | 직류 시험 장치 |
| PCT/JP2005/007912 WO2005106513A1 (ja) | 2004-04-28 | 2005-04-26 | 直流試験装置 |
| DE112005000986T DE112005000986T5 (de) | 2004-04-28 | 2005-04-26 | Gleichstrom-Prüfvorrichtung |
| US11/589,687 US20070103174A1 (en) | 2004-04-28 | 2006-10-30 | Direct current test apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004133955A JP2005315729A (ja) | 2004-04-28 | 2004-04-28 | 直流試験装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005315729A JP2005315729A (ja) | 2005-11-10 |
| JP2005315729A5 true JP2005315729A5 (enExample) | 2007-10-18 |
Family
ID=35241802
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004133955A Pending JP2005315729A (ja) | 2004-04-28 | 2004-04-28 | 直流試験装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20070103174A1 (enExample) |
| JP (1) | JP2005315729A (enExample) |
| KR (1) | KR20070013314A (enExample) |
| CN (1) | CN1947025A (enExample) |
| DE (1) | DE112005000986T5 (enExample) |
| WO (1) | WO2005106513A1 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI474710B (zh) * | 2007-10-18 | 2015-02-21 | Ind Tech Res Inst | 行動通訊設備於離線使用數位內容之收費方法及其系統 |
| JP2010054314A (ja) * | 2008-08-28 | 2010-03-11 | Yokogawa Electric Corp | 半導体試験装置 |
| EP2169412A1 (en) * | 2008-09-25 | 2010-03-31 | Ilumab AB | Electrical current measurement arrangement |
| CN101923124B (zh) * | 2009-06-17 | 2012-06-20 | 上海华虹Nec电子有限公司 | 确定em测试结构中加速因子的方法 |
| US8779777B2 (en) * | 2010-06-04 | 2014-07-15 | Linear Technology Corporation | Dynamic compensation of aging drift in current sense resistor |
| CN101957402A (zh) * | 2010-08-31 | 2011-01-26 | 上海华岭集成电路技术股份有限公司 | 瞬时电流的测试系统与方法 |
| JP5720259B2 (ja) * | 2011-01-18 | 2015-05-20 | トヨタ自動車株式会社 | 電流検出回路 |
| JP5467539B2 (ja) * | 2012-02-10 | 2014-04-09 | 横河電機株式会社 | 電極の評価装置および評価方法 |
| JP6738236B2 (ja) * | 2016-08-12 | 2020-08-12 | 東京エレクトロン株式会社 | デバイス検査回路、デバイス検査装置及びプローブカード |
| CN111638480B (zh) * | 2020-06-09 | 2022-10-11 | 广东省计量科学研究院（华南国家计量测试中心） | 一种基于温度补偿的电流传感器校准系统及方法 |
| JP7468266B2 (ja) * | 2020-09-16 | 2024-04-16 | オムロン株式会社 | 電圧検出装置 |
| DE102021214606A1 (de) | 2021-12-16 | 2023-06-22 | Vitesco Technologies GmbH | Stromerfassungssystem |
| CN114878033B (zh) * | 2022-03-29 | 2023-12-22 | 深圳国微感知技术有限公司 | 一种矩阵式压力分布测量系统及方法 |
| CN114924109B (zh) * | 2022-07-20 | 2022-11-29 | 深圳市英特瑞半导体科技有限公司 | 低功耗芯片电流的测试方法、电路及其装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3430130A (en) * | 1966-05-20 | 1969-02-25 | Carl A Schneider | Conductivity measuring circuit utilizing conductivity cell as input resistance of an operational amplifier |
| US4000643A (en) * | 1976-03-29 | 1977-01-04 | Honeywell Inc. | Apparatus for producing a compensating voltage |
| US4438411A (en) * | 1981-07-20 | 1984-03-20 | Ford Aerospace & Communications Corporation | Temperature compensating method and apparatus for thermally stabilizing amplifier devices |
| JPS5939105A (ja) * | 1982-08-27 | 1984-03-03 | Fujitsu Ltd | 制御電圧発生回路 |
| FR2659177B1 (fr) * | 1990-03-01 | 1992-09-04 | Merlin Gerin | Capteur de courant pour un declencheur electronique d'un disjoncteur electrique. |
| JP3218106B2 (ja) * | 1992-12-28 | 2001-10-15 | 日本電波工業株式会社 | 水晶発振器の温度補償回路 |
| JPH09178782A (ja) * | 1995-12-25 | 1997-07-11 | Advantest Corp | 電流検出回路及びその回路を用いた直流試験装置 |
| US20030025488A1 (en) * | 1996-12-26 | 2003-02-06 | Emc Technology, Inc. | Power sensing RF termination apparatus including temperature compensation means |
| JPH10283044A (ja) * | 1997-04-04 | 1998-10-23 | Asia Electron Inc | 定電流電源装置 |
| JP2000258472A (ja) * | 1999-03-10 | 2000-09-22 | Mitsubishi Electric Corp | 電流検出装置 |
| US6688119B2 (en) * | 2000-12-22 | 2004-02-10 | General Electric Company | Methods and apparatus for increasing appliance measuring system accuracy |
| US6700365B2 (en) * | 2001-12-10 | 2004-03-02 | Intersil Americas Inc. | Programmable current-sensing circuit providing discrete step temperature compensation for DC-DC converter |
-
2004
- 2004-04-28 JP JP2004133955A patent/JP2005315729A/ja active Pending
-
2005
- 2005-04-26 KR KR1020067024664A patent/KR20070013314A/ko not_active Withdrawn
- 2005-04-26 DE DE112005000986T patent/DE112005000986T5/de not_active Withdrawn
- 2005-04-26 CN CNA2005800134594A patent/CN1947025A/zh active Pending
- 2005-04-26 WO PCT/JP2005/007912 patent/WO2005106513A1/ja not_active Ceased
-
2006
- 2006-10-30 US US11/589,687 patent/US20070103174A1/en not_active Abandoned