WO2005106513A1 - 直流試験装置 - Google Patents

直流試験装置 Download PDF

Info

Publication number
WO2005106513A1
WO2005106513A1 PCT/JP2005/007912 JP2005007912W WO2005106513A1 WO 2005106513 A1 WO2005106513 A1 WO 2005106513A1 JP 2005007912 W JP2005007912 W JP 2005007912W WO 2005106513 A1 WO2005106513 A1 WO 2005106513A1
Authority
WO
WIPO (PCT)
Prior art keywords
current detection
current
resistor
amplifier
voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2005/007912
Other languages
English (en)
French (fr)
Japanese (ja)
Inventor
Hironori Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to DE112005000986T priority Critical patent/DE112005000986T5/de
Publication of WO2005106513A1 publication Critical patent/WO2005106513A1/ja
Anticipated expiration legal-status Critical
Priority to US11/589,687 priority patent/US20070103174A1/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G01R31/3004—Current or voltage test
    • G01R31/3008—Quiescent current [IDDQ] test or leakage current test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/32—Compensating for temperature change

Definitions

  • a coefficient obtained by dividing the resistance value of the reference resistor 14 by the resistance value of the current detection resistor 32 is multiplied by the potential difference between both ends of the current detection resistor 32. Even if the resistance value changes, it is possible to prevent a decrease in current detection accuracy due to the change in the resistance value.

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Current Or Voltage (AREA)
PCT/JP2005/007912 2004-04-28 2005-04-26 直流試験装置 Ceased WO2005106513A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
DE112005000986T DE112005000986T5 (de) 2004-04-28 2005-04-26 Gleichstrom-Prüfvorrichtung
US11/589,687 US20070103174A1 (en) 2004-04-28 2006-10-30 Direct current test apparatus

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2004133955A JP2005315729A (ja) 2004-04-28 2004-04-28 直流試験装置
JP2004-133955 2004-04-28

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US11/589,687 Continuation US20070103174A1 (en) 2004-04-28 2006-10-30 Direct current test apparatus

Publications (1)

Publication Number Publication Date
WO2005106513A1 true WO2005106513A1 (ja) 2005-11-10

Family

ID=35241802

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/JP2005/007912 Ceased WO2005106513A1 (ja) 2004-04-28 2005-04-26 直流試験装置

Country Status (6)

Country Link
US (1) US20070103174A1 (enExample)
JP (1) JP2005315729A (enExample)
KR (1) KR20070013314A (enExample)
CN (1) CN1947025A (enExample)
DE (1) DE112005000986T5 (enExample)
WO (1) WO2005106513A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010054314A (ja) * 2008-08-28 2010-03-11 Yokogawa Electric Corp 半導体試験装置

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI474710B (zh) * 2007-10-18 2015-02-21 Ind Tech Res Inst 行動通訊設備於離線使用數位內容之收費方法及其系統
EP2169412A1 (en) * 2008-09-25 2010-03-31 Ilumab AB Electrical current measurement arrangement
CN101923124B (zh) * 2009-06-17 2012-06-20 上海华虹Nec电子有限公司 确定em测试结构中加速因子的方法
US8779777B2 (en) * 2010-06-04 2014-07-15 Linear Technology Corporation Dynamic compensation of aging drift in current sense resistor
CN101957402A (zh) * 2010-08-31 2011-01-26 上海华岭集成电路技术股份有限公司 瞬时电流的测试系统与方法
JP5720259B2 (ja) * 2011-01-18 2015-05-20 トヨタ自動車株式会社 電流検出回路
JP5467539B2 (ja) * 2012-02-10 2014-04-09 横河電機株式会社 電極の評価装置および評価方法
JP6738236B2 (ja) * 2016-08-12 2020-08-12 東京エレクトロン株式会社 デバイス検査回路、デバイス検査装置及びプローブカード
CN111638480B (zh) * 2020-06-09 2022-10-11 广东省计量科学研究院（华南国家计量测试中心） 一种基于温度补偿的电流传感器校准系统及方法
JP7468266B2 (ja) * 2020-09-16 2024-04-16 オムロン株式会社 電圧検出装置
DE102021214606A1 (de) 2021-12-16 2023-06-22 Vitesco Technologies GmbH Stromerfassungssystem
CN114878033B (zh) * 2022-03-29 2023-12-22 深圳国微感知技术有限公司 一种矩阵式压力分布测量系统及方法
CN114924109B (zh) * 2022-07-20 2022-11-29 深圳市英特瑞半导体科技有限公司 低功耗芯片电流的测试方法、电路及其装置

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04216472A (ja) * 1990-03-01 1992-08-06 Merlin Gerin 遮断器の電子的引外し装置用の電流センサ
JPH09178782A (ja) * 1995-12-25 1997-07-11 Advantest Corp 電流検出回路及びその回路を用いた直流試験装置
JPH10283044A (ja) * 1997-04-04 1998-10-23 Asia Electron Inc 定電流電源装置
JP2000258472A (ja) * 1999-03-10 2000-09-22 Mitsubishi Electric Corp 電流検出装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3430130A (en) * 1966-05-20 1969-02-25 Carl A Schneider Conductivity measuring circuit utilizing conductivity cell as input resistance of an operational amplifier
US4000643A (en) * 1976-03-29 1977-01-04 Honeywell Inc. Apparatus for producing a compensating voltage
US4438411A (en) * 1981-07-20 1984-03-20 Ford Aerospace & Communications Corporation Temperature compensating method and apparatus for thermally stabilizing amplifier devices
JPS5939105A (ja) * 1982-08-27 1984-03-03 Fujitsu Ltd 制御電圧発生回路
JP3218106B2 (ja) * 1992-12-28 2001-10-15 日本電波工業株式会社 水晶発振器の温度補償回路
US20030025488A1 (en) * 1996-12-26 2003-02-06 Emc Technology, Inc. Power sensing RF termination apparatus including temperature compensation means
US6688119B2 (en) * 2000-12-22 2004-02-10 General Electric Company Methods and apparatus for increasing appliance measuring system accuracy
US6700365B2 (en) * 2001-12-10 2004-03-02 Intersil Americas Inc. Programmable current-sensing circuit providing discrete step temperature compensation for DC-DC converter

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04216472A (ja) * 1990-03-01 1992-08-06 Merlin Gerin 遮断器の電子的引外し装置用の電流センサ
JPH09178782A (ja) * 1995-12-25 1997-07-11 Advantest Corp 電流検出回路及びその回路を用いた直流試験装置
JPH10283044A (ja) * 1997-04-04 1998-10-23 Asia Electron Inc 定電流電源装置
JP2000258472A (ja) * 1999-03-10 2000-09-22 Mitsubishi Electric Corp 電流検出装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010054314A (ja) * 2008-08-28 2010-03-11 Yokogawa Electric Corp 半導体試験装置

Also Published As

Publication number Publication date
JP2005315729A (ja) 2005-11-10
CN1947025A (zh) 2007-04-11
US20070103174A1 (en) 2007-05-10
KR20070013314A (ko) 2007-01-30
DE112005000986T5 (de) 2007-03-29

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